JPH10340279A5 - - Google Patents
Info
- Publication number
- JPH10340279A5 JPH10340279A5 JP1997149519A JP14951997A JPH10340279A5 JP H10340279 A5 JPH10340279 A5 JP H10340279A5 JP 1997149519 A JP1997149519 A JP 1997149519A JP 14951997 A JP14951997 A JP 14951997A JP H10340279 A5 JPH10340279 A5 JP H10340279A5
- Authority
- JP
- Japan
- Prior art keywords
- logic
- oscillation
- event
- self
- incoming event
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14951997A JP3992786B2 (ja) | 1997-06-06 | 1997-06-06 | 論理検証方法、論理検証装置及び記録媒体 |
| US09/026,530 US6032277A (en) | 1997-06-06 | 1998-02-20 | Method and apparatus for logic testing an integrated circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14951997A JP3992786B2 (ja) | 1997-06-06 | 1997-06-06 | 論理検証方法、論理検証装置及び記録媒体 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JPH10340279A JPH10340279A (ja) | 1998-12-22 |
| JPH10340279A5 true JPH10340279A5 (enExample) | 2005-04-14 |
| JP3992786B2 JP3992786B2 (ja) | 2007-10-17 |
Family
ID=15476921
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14951997A Expired - Lifetime JP3992786B2 (ja) | 1997-06-06 | 1997-06-06 | 論理検証方法、論理検証装置及び記録媒体 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US6032277A (enExample) |
| JP (1) | JP3992786B2 (enExample) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6226765B1 (en) * | 1999-02-26 | 2001-05-01 | Advantest Corp. | Event based test system data memory compression |
| US7171602B2 (en) | 2001-12-31 | 2007-01-30 | Advantest Corp. | Event processing apparatus and method for high speed event based test system |
| CN100477528C (zh) * | 2002-07-03 | 2009-04-08 | 艾利森电话股份有限公司 | 锁相环电路、包括锁相环电路的电子设备以及产生周期信号的方法 |
| KR100910086B1 (ko) | 2004-12-29 | 2009-07-30 | 텔레폰악티에볼라겟 엘엠 에릭슨(펍) | 위상 고정 루프 회로, 위상 고정 루프 회로를 포함하는전자 장치 및 주기 신호를 발생시키는 방법 |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5212443A (en) * | 1990-09-05 | 1993-05-18 | Schlumberger Technologies, Inc. | Event sequencer for automatic test equipment |
| JPH095397A (ja) * | 1995-06-21 | 1997-01-10 | Fujitsu Ltd | 論理シミュレーション方法 |
-
1997
- 1997-06-06 JP JP14951997A patent/JP3992786B2/ja not_active Expired - Lifetime
-
1998
- 1998-02-20 US US09/026,530 patent/US6032277A/en not_active Expired - Lifetime
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