JPH09129779A - 超微細電導極を有する半導体パッケージ - Google Patents

超微細電導極を有する半導体パッケージ

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Publication number
JPH09129779A
JPH09129779A JP25296A JP25296A JPH09129779A JP H09129779 A JPH09129779 A JP H09129779A JP 25296 A JP25296 A JP 25296A JP 25296 A JP25296 A JP 25296A JP H09129779 A JPH09129779 A JP H09129779A
Authority
JP
Japan
Prior art keywords
semiconductor
semiconductor package
semiconductor substrate
fine
conductive electrode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP25296A
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English (en)
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JP2844058B2 (ja
Inventor
Shinsei Kin
振聖 金
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SK Hynix Inc
Original Assignee
LG Semicon Co Ltd
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Filing date
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Application filed by LG Semicon Co Ltd filed Critical LG Semicon Co Ltd
Publication of JPH09129779A publication Critical patent/JPH09129779A/ja
Application granted granted Critical
Publication of JP2844058B2 publication Critical patent/JP2844058B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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    • HELECTRICITY
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    • H01L23/31Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
    • H01L23/3107Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed
    • H01L23/3121Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed a substrate forming part of the encapsulation
    • H01L23/3128Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed a substrate forming part of the encapsulation the substrate having spherical bumps for external connection
    • HELECTRICITY
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    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/498Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
    • H01L23/49811Additional leads joined to the metallisation on the insulating substrate, e.g. pins, bumps, wires, flat leads
    • H01L23/49816Spherical bumps on the substrate for external connection, e.g. ball grid arrays [BGA]
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/321Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by conductive adhesives
    • H05K3/323Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by conductive adhesives by applying an anisotropic conductive adhesive layer over an array of pads
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/44Structure, shape, material or disposition of the wire connectors prior to the connecting process
    • H01L2224/45Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
    • H01L2224/45001Core members of the connector
    • H01L2224/45099Material
    • H01L2224/451Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/42Wire connectors; Manufacturing methods related thereto
    • H01L24/44Structure, shape, material or disposition of the wire connectors prior to the connecting process
    • H01L24/45Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/42Wire connectors; Manufacturing methods related thereto
    • H01L24/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L24/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
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    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/00014Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
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    • H01L2924/151Die mounting substrate
    • H01L2924/153Connection portion
    • H01L2924/1531Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
    • H01L2924/15311Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA
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    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/10Details of components or other objects attached to or integrated in a printed circuit board
    • H05K2201/10613Details of electrical connections of non-printed components, e.g. special leads
    • H05K2201/10621Components characterised by their electrical contacts
    • H05K2201/10719Land grid array [LGA]
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/09Treatments involving charged particles
    • H05K2203/095Plasma, e.g. for treating a substrate to improve adhesion with a conductor or for cleaning holes

Abstract

(57)【要約】 【課題】本発明の目的は、ソルダーボールを使用せず、
微細電極及びインターフェース電導体を用いて、生産性
を向上し得る超微細電導極を有した半導体パッケージを
提供しようとするものである。 【解決手段】エポキシ成形体の半導体基板下面露出部位
に複数の微細電極が形成され、そえら微細電極下面にイ
ンターフェース電導体が形成され、該インターフェース
電導体により印刷回路基板上の各微細電極に半導体パッ
ケージが電気的連結されるように、超微細電導極を有す
る半導体パッケージが構成される。

Description

【発明の詳細な説明】
【0001】
【発明の属する技術分野】本発明は、超微細電導極を有
する半導体パッケージに係るもので、詳しくは、従来B
GA(Ball Grid Array )半導体パッケージの電導性ボ
ールの代わりに、微細な電極及びインタフェース伝導体
を用い、生産性を向上させた超微細電導極を有する半導
体パッケージに関するものである。
【0002】
【従来の技術】従来BGA半導体パッケージにおいて
は、文献(1994年5月号、NEKKEIELECTRONICS 誌、
P42−45)に記載され、図3に示したように、半導
体基板1上に半導体チップ3を接着剤2により接着し、
該半導体チップ3上両方側部位と前記半導体基板1上の
導電部位(図示されず)とを金属ワイヤー4によりボン
ディングし、それら半導体基板1、半導体チップ3及び
金属ワイヤー4をエポキシ樹脂によりモールディングし
た後、該エポキシ成形体7の半導体基板1下面に電極端
子5を夫々露出させる。次いで、それら電極端子5にソ
ルダーボール6を夫々掛合し、リフロー(reflow)接合
を施してそれらソルダーボール6を半導体基板1下面の
電極端子5に夫々接着させていた。
【0003】
【発明が解決しようとする課題】然るに、このような従
来BGA半導体パッケージにおいては、半導体パッケー
ジの製造後に電気的検査を施し、電気的連結の不良状態
が発生した場合は、半導体パッケージ下面の各ソルダー
ボールを全て除去し、クリーニングを施した後、それら
ソルダーボールの付着工程を再施行するようになるた
め、極めて煩雑になり、生産性が低下するという不都合
な点があった。且つ、半導体パッケージ下面の電極露出
部位に各ソルダーボールを一々付着するようになってい
るため、それらソルダーボールの付着ピッチ間隔が1.
0−1.5mmに制限され、それら付着動作が極めて煩
雑であるという不都合な点があった。
【0004】
【課題を解決するための手段】本発明の目的は、従来の
ソルダーボールを使用せず、微細電極及びインタフェー
ス伝導体を用いて生産性を向上し得る超微細電導極を有
した半導体パッケージを提供しようとするものである。
叉、本発明の他の目的は、半導体パッケージの製造工程
を簡単化し、原価を減少し得る超微細電導極を有した半
導体パッケージを提供しようとするものである。
【0005】そして、このような本発明の目的は、半導
体パッケージのエポキシ成形体基板下面露出部位に1.
0mm以下のピッチ間隔を有する複数の微細電極を形成
し、それら微細電極に対応して印刷回路基板上にも同様
な1.0mm以下のピッチ間隔を有する複数の微細電極
を形成し、それら微細電極間に厚さ5ー200μm以下
の異方性電導フィールムと厚さ200μm以下の光分解
性接着フィールムとでなるインタフェース伝導体を熱圧
着させ、超微細電極を有する半導体パッケージを構成す
ることにより達成される。
【0006】
【発明の実施の形態】以下、本発明の実施の形態に対し
図面を用いて説明する。本発明に係る超微細電導極を有
する半導体パッケージにおいては、図1及び図2に示し
たように、先ず、半導体基板11上中央部位に接着剤2
により半導体チップ3が接着され、それら半導体チップ
3両方側辺部位と半導体基板11上所定部位とが金属ワ
イヤー4によりボンディングされ、エポキシモールディ
ングされた後該エポキシ成形体基板下面露出部位に複数
の微細電極12が1mm以下のピッチ間隔を有し0.0
1cm2 程度の面積を有して形成される。このとき、そ
れら微細電極12には金Au叉は銀Agの鍍金が施され
る。
【0007】次いで、それら微細電極12の形成された
半導体基板11下面叉は半導体下面全ての部位に5ー2
00μmの厚さの異方性電導フィールム13を熱圧着し
て複数の微細な可用性電導ボール18を形成し、再びノ
ーブラックポリエステル系の光分解性接着フィールム1
4をコーティングして該異方性電導フィールム13の寿
命を延長し得るインタフェース電導体が形成される。次
いで、印刷回路基板20上に前記各微細電極12に対応
する複数の微細電極12aが夫々所定ピッチ間隔を有し
て形成され、前記半導体パッケージ基板下面の各微細電
極12を印刷回路基板20上の各微細電極12aに連結
するとき、前記光分解性接着フィールム14が露光に露
出され、ドライエッチングが施行されて連結される。
【0008】
【発明の効果】以上説明したように、本発明に係る超微
細電導極を有する半導体パッケージにおいては、従来の
ソルダーボールを使用せず、微細電極とインターフェー
ス電導体とを用いて半導体パッケージを構成し、印刷回
路基板上に電気的連結し得るようになっているため、従
来半導体基板下面に一々ソルダーボールを付着した後、
電気的検査を施してソルダーボールの付着不良が発生し
た時、全てのソルダーボールを除去して再施行していた
煩雑な工程が省かれ、半導体パッケージの製造工程が簡
単化されて生産性が向上し、原価が低廉になるという効
果がある。
【図面の簡単な説明】
【図1】本発明に係る超微細電導極を有する半導体パッ
ケージの構造を示した概略縦断面図である。
【図2】本発明に係るインターフェース電導体を示した
図1A部の縦断面図である。
【図3】従来BGA半導体パッケージの構造を示した概
略縦断面図である。
【符号の説明】
1、11:半導体基板 3:半導体チップ 6:ソルダーボール 7:エポキシ成形体 13:異方性電導フィールム 14:光分解性接着フィールム 18:電導ボール 20:印刷回路基板

Claims (6)

    【特許請求の範囲】
  1. 【請求項1】超微細電導極を有する半導体パッケージで
    あって、 半導体基板上に接着された半導体チップと、該半導体チ
    ップと前記半導体基板上の導電部位とにボンディングさ
    れた金属ワイヤーと、それら半導体チップ、金属ワイヤ
    ー及び半導体基板上部がエポキシモールディングされて
    成形されたエポキシ成形体の半導体基板露出部位に夫々
    形成された複数の微細電極と、それら微細電極下面に形
    成され印刷回路基板上の微細電極に電気的連結されるイ
    ンタフェース伝導体と、を備えた超微細電導極を有する
    半導体パッケージ。
  2. 【請求項2】前記インタフェース伝導体は、前記半導体
    基板の各微細電極下面に熱圧着された異方性電導フィー
    ルムと光分解性接着フィールムとでなる請求項1記載の
    超微細電導極を有する半導体パッケージ。
  3. 【請求項3】前記各微細電極は、前記半導体基板下面に
    1mm以下のピッチ間隔を有して形成される請求項1記
    載の超微細電導極を有する半導体パッケージ。
  4. 【請求項4】前記各微細電極は、金An叉は銀Agにて
    鍍金される請求項1記載の超微細電導極を有する半導体
    パッケージ。
  5. 【請求項5】前記異方性電導フィールムは、5ー200
    mmの厚さに形成される請求項2記載の超微細電導極を
    有する半導体パッケージ。
  6. 【請求項6】前記光分解性接着フィールムは、200μ
    m以下の厚さに形成される請求項2記載の超微細電導極
    を有する半導体パッケージ。
JP25296A 1995-10-19 1996-01-05 半導体パッケージ Expired - Fee Related JP2844058B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR1019950036163A KR100201383B1 (ko) 1995-10-19 1995-10-19 인터페이스 조립체를 구비한 유에프비지에이 패키지
KR95P36163 1995-10-19

Publications (2)

Publication Number Publication Date
JPH09129779A true JPH09129779A (ja) 1997-05-16
JP2844058B2 JP2844058B2 (ja) 1999-01-06

Family

ID=19430674

Family Applications (1)

Application Number Title Priority Date Filing Date
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Country Link
US (1) US5877549A (ja)
JP (1) JP2844058B2 (ja)
KR (1) KR100201383B1 (ja)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
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