JPH09129779A - 超微細電導極を有する半導体パッケージ - Google Patents
超微細電導極を有する半導体パッケージInfo
- Publication number
- JPH09129779A JPH09129779A JP25296A JP25296A JPH09129779A JP H09129779 A JPH09129779 A JP H09129779A JP 25296 A JP25296 A JP 25296A JP 25296 A JP25296 A JP 25296A JP H09129779 A JPH09129779 A JP H09129779A
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor
- semiconductor package
- semiconductor substrate
- fine
- conductive electrode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 56
- 239000000758 substrate Substances 0.000 claims abstract description 20
- 239000004020 conductor Substances 0.000 claims abstract description 12
- 239000004593 Epoxy Substances 0.000 claims abstract description 7
- 239000002313 adhesive film Substances 0.000 claims description 6
- 239000002184 metal Substances 0.000 claims description 5
- 229910052751 metal Inorganic materials 0.000 claims description 5
- 239000010931 gold Substances 0.000 claims description 3
- 238000000465 moulding Methods 0.000 claims description 3
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims description 2
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 2
- 229910052737 gold Inorganic materials 0.000 claims description 2
- 229910052709 silver Inorganic materials 0.000 claims description 2
- 239000004332 silver Substances 0.000 claims description 2
- 229910000679 solder Inorganic materials 0.000 abstract description 14
- 238000004519 manufacturing process Methods 0.000 abstract description 3
- 239000000853 adhesive Substances 0.000 description 2
- 230000001070 adhesive effect Effects 0.000 description 2
- 238000007689 inspection Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000004140 cleaning Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 229920000728 polyester Polymers 0.000 description 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/31—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
- H01L23/3107—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed
- H01L23/3121—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed a substrate forming part of the encapsulation
- H01L23/3128—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed a substrate forming part of the encapsulation the substrate having spherical bumps for external connection
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/02—Containers; Seals
- H01L23/04—Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
- H01L23/49811—Additional leads joined to the metallisation on the insulating substrate, e.g. pins, bumps, wires, flat leads
- H01L23/49816—Spherical bumps on the substrate for external connection, e.g. ball grid arrays [BGA]
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/321—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by conductive adhesives
- H05K3/323—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by conductive adhesives by applying an anisotropic conductive adhesive layer over an array of pads
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/45001—Core members of the connector
- H01L2224/45099—Material
- H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L24/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L24/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01078—Platinum [Pt]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01079—Gold [Au]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/06—Polymers
- H01L2924/078—Adhesive characteristics other than chemical
- H01L2924/0781—Adhesive characteristics other than chemical being an ohmic electrical conductor
- H01L2924/07811—Extrinsic, i.e. with electrical conductive fillers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/153—Connection portion
- H01L2924/1531—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
- H01L2924/15311—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/30—Technical effects
- H01L2924/301—Electrical effects
- H01L2924/3011—Impedance
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
- H05K2201/10613—Details of electrical connections of non-printed components, e.g. special leads
- H05K2201/10621—Components characterised by their electrical contacts
- H05K2201/10719—Land grid array [LGA]
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/09—Treatments involving charged particles
- H05K2203/095—Plasma, e.g. for treating a substrate to improve adhesion with a conductor or for cleaning holes
Abstract
微細電極及びインターフェース電導体を用いて、生産性
を向上し得る超微細電導極を有した半導体パッケージを
提供しようとするものである。 【解決手段】エポキシ成形体の半導体基板下面露出部位
に複数の微細電極が形成され、そえら微細電極下面にイ
ンターフェース電導体が形成され、該インターフェース
電導体により印刷回路基板上の各微細電極に半導体パッ
ケージが電気的連結されるように、超微細電導極を有す
る半導体パッケージが構成される。
Description
する半導体パッケージに係るもので、詳しくは、従来B
GA(Ball Grid Array )半導体パッケージの電導性ボ
ールの代わりに、微細な電極及びインタフェース伝導体
を用い、生産性を向上させた超微細電導極を有する半導
体パッケージに関するものである。
は、文献(1994年5月号、NEKKEIELECTRONICS 誌、
P42−45)に記載され、図3に示したように、半導
体基板1上に半導体チップ3を接着剤2により接着し、
該半導体チップ3上両方側部位と前記半導体基板1上の
導電部位(図示されず)とを金属ワイヤー4によりボン
ディングし、それら半導体基板1、半導体チップ3及び
金属ワイヤー4をエポキシ樹脂によりモールディングし
た後、該エポキシ成形体7の半導体基板1下面に電極端
子5を夫々露出させる。次いで、それら電極端子5にソ
ルダーボール6を夫々掛合し、リフロー(reflow)接合
を施してそれらソルダーボール6を半導体基板1下面の
電極端子5に夫々接着させていた。
来BGA半導体パッケージにおいては、半導体パッケー
ジの製造後に電気的検査を施し、電気的連結の不良状態
が発生した場合は、半導体パッケージ下面の各ソルダー
ボールを全て除去し、クリーニングを施した後、それら
ソルダーボールの付着工程を再施行するようになるた
め、極めて煩雑になり、生産性が低下するという不都合
な点があった。且つ、半導体パッケージ下面の電極露出
部位に各ソルダーボールを一々付着するようになってい
るため、それらソルダーボールの付着ピッチ間隔が1.
0−1.5mmに制限され、それら付着動作が極めて煩
雑であるという不都合な点があった。
ソルダーボールを使用せず、微細電極及びインタフェー
ス伝導体を用いて生産性を向上し得る超微細電導極を有
した半導体パッケージを提供しようとするものである。
叉、本発明の他の目的は、半導体パッケージの製造工程
を簡単化し、原価を減少し得る超微細電導極を有した半
導体パッケージを提供しようとするものである。
体パッケージのエポキシ成形体基板下面露出部位に1.
0mm以下のピッチ間隔を有する複数の微細電極を形成
し、それら微細電極に対応して印刷回路基板上にも同様
な1.0mm以下のピッチ間隔を有する複数の微細電極
を形成し、それら微細電極間に厚さ5ー200μm以下
の異方性電導フィールムと厚さ200μm以下の光分解
性接着フィールムとでなるインタフェース伝導体を熱圧
着させ、超微細電極を有する半導体パッケージを構成す
ることにより達成される。
図面を用いて説明する。本発明に係る超微細電導極を有
する半導体パッケージにおいては、図1及び図2に示し
たように、先ず、半導体基板11上中央部位に接着剤2
により半導体チップ3が接着され、それら半導体チップ
3両方側辺部位と半導体基板11上所定部位とが金属ワ
イヤー4によりボンディングされ、エポキシモールディ
ングされた後該エポキシ成形体基板下面露出部位に複数
の微細電極12が1mm以下のピッチ間隔を有し0.0
1cm2 程度の面積を有して形成される。このとき、そ
れら微細電極12には金Au叉は銀Agの鍍金が施され
る。
半導体基板11下面叉は半導体下面全ての部位に5ー2
00μmの厚さの異方性電導フィールム13を熱圧着し
て複数の微細な可用性電導ボール18を形成し、再びノ
ーブラックポリエステル系の光分解性接着フィールム1
4をコーティングして該異方性電導フィールム13の寿
命を延長し得るインタフェース電導体が形成される。次
いで、印刷回路基板20上に前記各微細電極12に対応
する複数の微細電極12aが夫々所定ピッチ間隔を有し
て形成され、前記半導体パッケージ基板下面の各微細電
極12を印刷回路基板20上の各微細電極12aに連結
するとき、前記光分解性接着フィールム14が露光に露
出され、ドライエッチングが施行されて連結される。
細電導極を有する半導体パッケージにおいては、従来の
ソルダーボールを使用せず、微細電極とインターフェー
ス電導体とを用いて半導体パッケージを構成し、印刷回
路基板上に電気的連結し得るようになっているため、従
来半導体基板下面に一々ソルダーボールを付着した後、
電気的検査を施してソルダーボールの付着不良が発生し
た時、全てのソルダーボールを除去して再施行していた
煩雑な工程が省かれ、半導体パッケージの製造工程が簡
単化されて生産性が向上し、原価が低廉になるという効
果がある。
ケージの構造を示した概略縦断面図である。
図1A部の縦断面図である。
略縦断面図である。
Claims (6)
- 【請求項1】超微細電導極を有する半導体パッケージで
あって、 半導体基板上に接着された半導体チップと、該半導体チ
ップと前記半導体基板上の導電部位とにボンディングさ
れた金属ワイヤーと、それら半導体チップ、金属ワイヤ
ー及び半導体基板上部がエポキシモールディングされて
成形されたエポキシ成形体の半導体基板露出部位に夫々
形成された複数の微細電極と、それら微細電極下面に形
成され印刷回路基板上の微細電極に電気的連結されるイ
ンタフェース伝導体と、を備えた超微細電導極を有する
半導体パッケージ。 - 【請求項2】前記インタフェース伝導体は、前記半導体
基板の各微細電極下面に熱圧着された異方性電導フィー
ルムと光分解性接着フィールムとでなる請求項1記載の
超微細電導極を有する半導体パッケージ。 - 【請求項3】前記各微細電極は、前記半導体基板下面に
1mm以下のピッチ間隔を有して形成される請求項1記
載の超微細電導極を有する半導体パッケージ。 - 【請求項4】前記各微細電極は、金An叉は銀Agにて
鍍金される請求項1記載の超微細電導極を有する半導体
パッケージ。 - 【請求項5】前記異方性電導フィールムは、5ー200
mmの厚さに形成される請求項2記載の超微細電導極を
有する半導体パッケージ。 - 【請求項6】前記光分解性接着フィールムは、200μ
m以下の厚さに形成される請求項2記載の超微細電導極
を有する半導体パッケージ。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019950036163A KR100201383B1 (ko) | 1995-10-19 | 1995-10-19 | 인터페이스 조립체를 구비한 유에프비지에이 패키지 |
KR95P36163 | 1995-10-19 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH09129779A true JPH09129779A (ja) | 1997-05-16 |
JP2844058B2 JP2844058B2 (ja) | 1999-01-06 |
Family
ID=19430674
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP25296A Expired - Fee Related JP2844058B2 (ja) | 1995-10-19 | 1996-01-05 | 半導体パッケージ |
Country Status (3)
Country | Link |
---|---|
US (1) | US5877549A (ja) |
JP (1) | JP2844058B2 (ja) |
KR (1) | KR100201383B1 (ja) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6001672A (en) * | 1997-02-25 | 1999-12-14 | Micron Technology, Inc. | Method for transfer molding encapsulation of a semiconductor die with attached heat sink |
US7220615B2 (en) * | 2001-06-11 | 2007-05-22 | Micron Technology, Inc. | Alternative method used to package multimedia card by transfer molding |
KR100429856B1 (ko) * | 2001-11-15 | 2004-05-03 | 페어차일드코리아반도체 주식회사 | 스터드 범프가 있는 웨이퍼 레벨 칩 스케일 패키지 및 그 제조 방법 |
US20050176233A1 (en) * | 2002-11-15 | 2005-08-11 | Rajeev Joshi | Wafer-level chip scale package and method for fabricating and using the same |
US20050012225A1 (en) * | 2002-11-15 | 2005-01-20 | Choi Seung-Yong | Wafer-level chip scale package and method for fabricating and using the same |
US20040191955A1 (en) * | 2002-11-15 | 2004-09-30 | Rajeev Joshi | Wafer-level chip scale package and method for fabricating and using the same |
US7728437B2 (en) * | 2005-11-23 | 2010-06-01 | Fairchild Korea Semiconductor, Ltd. | Semiconductor package form within an encapsulation |
CN103901236B (zh) * | 2014-03-06 | 2016-04-20 | 广东工业大学 | 一种超精细无极金属丝栅网封装环 |
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JPH06209155A (ja) * | 1992-09-30 | 1994-07-26 | American Teleph & Telegr Co <Att> | 電子部品の異方性導電部材による接続方法 |
JPH0714966A (ja) * | 1993-06-17 | 1995-01-17 | Ibiden Co Ltd | 多端子複合リードフレームとその製造方法 |
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US4731282A (en) * | 1983-10-14 | 1988-03-15 | Hitachi Chemical Co., Ltd. | Anisotropic-electroconductive adhesive film |
DE3852563T2 (de) * | 1987-05-01 | 1995-05-11 | Canon Kk | Verfahren zum Anschliessen eines externen Schaltkreises und Verpackungsstruktur. |
US5283468A (en) * | 1988-05-30 | 1994-02-01 | Canon Kabushiki Kaisha | Electric circuit apparatus |
EP0368262B1 (en) * | 1988-11-09 | 2001-02-14 | Nitto Denko Corporation | Wiring substrate, film carrier, semiconductor device made by using the film carrier, and mounting structure comprising the semiconductor device |
US5001542A (en) * | 1988-12-05 | 1991-03-19 | Hitachi Chemical Company | Composition for circuit connection, method for connection using the same, and connected structure of semiconductor chips |
AU634334B2 (en) * | 1990-01-23 | 1993-02-18 | Sumitomo Electric Industries, Ltd. | Packaging structure and method for packaging a semiconductor device |
US5291062A (en) * | 1993-03-01 | 1994-03-01 | Motorola, Inc. | Area array semiconductor device having a lid with functional contacts |
US5434452A (en) * | 1993-11-01 | 1995-07-18 | Motorola, Inc. | Z-axis compliant mechanical IC wiring substrate and method for making the same |
-
1995
- 1995-10-19 KR KR1019950036163A patent/KR100201383B1/ko not_active IP Right Cessation
-
1996
- 1996-01-02 US US08/581,956 patent/US5877549A/en not_active Expired - Lifetime
- 1996-01-05 JP JP25296A patent/JP2844058B2/ja not_active Expired - Fee Related
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH06209155A (ja) * | 1992-09-30 | 1994-07-26 | American Teleph & Telegr Co <Att> | 電子部品の異方性導電部材による接続方法 |
JPH0714966A (ja) * | 1993-06-17 | 1995-01-17 | Ibiden Co Ltd | 多端子複合リードフレームとその製造方法 |
Also Published As
Publication number | Publication date |
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JP2844058B2 (ja) | 1999-01-06 |
US5877549A (en) | 1999-03-02 |
KR970024032A (ko) | 1997-05-30 |
KR100201383B1 (ko) | 1999-06-15 |
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