JPH08330921A - 可変遅延回路 - Google Patents

可変遅延回路

Info

Publication number
JPH08330921A
JPH08330921A JP7136408A JP13640895A JPH08330921A JP H08330921 A JPH08330921 A JP H08330921A JP 7136408 A JP7136408 A JP 7136408A JP 13640895 A JP13640895 A JP 13640895A JP H08330921 A JPH08330921 A JP H08330921A
Authority
JP
Japan
Prior art keywords
field effect
effect transistor
delay circuit
delay time
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7136408A
Other languages
English (en)
Japanese (ja)
Inventor
Hiroo Suzuki
博夫 鈴木
Toshiyuki Okayasu
俊幸 岡安
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to JP7136408A priority Critical patent/JPH08330921A/ja
Priority to PCT/JP1996/001482 priority patent/WO1996038912A1/ja
Priority to KR1019970700673A priority patent/KR970705234A/ko
Priority to DE19680525T priority patent/DE19680525T1/de
Priority to TW085107303A priority patent/TW307955B/zh
Publication of JPH08330921A publication Critical patent/JPH08330921A/ja
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/13—Arrangements having a single output and transforming input signals into pulses delivered at desired time intervals
    • H03K5/133—Arrangements having a single output and transforming input signals into pulses delivered at desired time intervals using a chain of active delay devices
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/13—Arrangements having a single output and transforming input signals into pulses delivered at desired time intervals
    • H03K5/133—Arrangements having a single output and transforming input signals into pulses delivered at desired time intervals using a chain of active delay devices
    • H03K5/134—Arrangements having a single output and transforming input signals into pulses delivered at desired time intervals using a chain of active delay devices with field-effect transistors

Landscapes

  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Pulse Circuits (AREA)
  • Logic Circuits (AREA)
JP7136408A 1995-06-02 1995-06-02 可変遅延回路 Pending JPH08330921A (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP7136408A JPH08330921A (ja) 1995-06-02 1995-06-02 可変遅延回路
PCT/JP1996/001482 WO1996038912A1 (fr) 1995-06-02 1996-05-31 Circuit a retard variable
KR1019970700673A KR970705234A (ko) 1995-06-02 1996-05-31 가변지연회로
DE19680525T DE19680525T1 (de) 1995-06-02 1996-05-31 Veränderbare Verzögerungsschaltung
TW085107303A TW307955B (enrdf_load_stackoverflow) 1995-06-02 1996-06-17

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7136408A JPH08330921A (ja) 1995-06-02 1995-06-02 可変遅延回路

Publications (1)

Publication Number Publication Date
JPH08330921A true JPH08330921A (ja) 1996-12-13

Family

ID=15174470

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7136408A Pending JPH08330921A (ja) 1995-06-02 1995-06-02 可変遅延回路

Country Status (5)

Country Link
JP (1) JPH08330921A (enrdf_load_stackoverflow)
KR (1) KR970705234A (enrdf_load_stackoverflow)
DE (1) DE19680525T1 (enrdf_load_stackoverflow)
TW (1) TW307955B (enrdf_load_stackoverflow)
WO (1) WO1996038912A1 (enrdf_load_stackoverflow)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2004077673A1 (ja) * 2003-02-25 2004-09-10 Matsushita Electric Industrial Co., Ltd. 半導体集積回路
JP2005159963A (ja) * 2003-11-28 2005-06-16 Advantest Corp 高周波遅延回路、及び試験装置
WO2007013577A1 (ja) * 2005-07-29 2007-02-01 Advantest Corporation タイミング発生器及び半導体試験装置
JP2007509541A (ja) * 2003-10-16 2007-04-12 インテル・コーポレーション 適応型入力／出力バッファ及びその方法
JPWO2006134837A1 (ja) * 2005-06-17 2009-01-08 株式会社アドバンテスト 遅延回路、試験装置、タイミング発生器、テストモジュール、及び電子デバイス
JP2009268058A (ja) * 2008-04-28 2009-11-12 Hynix Semiconductor Inc センシング遅延回路及びこれを用いた半導体メモリー装置

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100489587B1 (ko) * 1997-12-29 2005-08-23 주식회사 하이닉스반도체 시간지연회로

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62272619A (ja) * 1986-05-21 1987-11-26 Hitachi Ltd 遅延回路
JPS63246916A (ja) * 1987-04-02 1988-10-13 Mitsubishi Electric Corp インバ−タ回路
US5352945A (en) * 1993-03-18 1994-10-04 Micron Semiconductor, Inc. Voltage compensating delay element

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2004077673A1 (ja) * 2003-02-25 2004-09-10 Matsushita Electric Industrial Co., Ltd. 半導体集積回路
CN100340062C (zh) * 2003-02-25 2007-09-26 松下电器产业株式会社 半导体集成电路
US7498865B2 (en) 2003-02-25 2009-03-03 Panasonic Corporation Semiconductor integrated circuit with reduced speed variations
JP2007509541A (ja) * 2003-10-16 2007-04-12 インテル・コーポレーション 適応型入力／出力バッファ及びその方法
JP2005159963A (ja) * 2003-11-28 2005-06-16 Advantest Corp 高周波遅延回路、及び試験装置
JPWO2006134837A1 (ja) * 2005-06-17 2009-01-08 株式会社アドバンテスト 遅延回路、試験装置、タイミング発生器、テストモジュール、及び電子デバイス
JP4850176B2 (ja) * 2005-06-17 2012-01-11 株式会社アドバンテスト 遅延回路、試験装置、タイミング発生器、テストモジュール、及び電子デバイス
WO2007013577A1 (ja) * 2005-07-29 2007-02-01 Advantest Corporation タイミング発生器及び半導体試験装置
JP2007033385A (ja) * 2005-07-29 2007-02-08 Advantest Corp タイミング発生器及び半導体試験装置
KR100966701B1 (ko) * 2005-07-29 2010-06-29 가부시키가이샤 어드밴티스트 타이밍 발생기 및 반도체 시험 장치
US7940072B2 (en) 2005-07-29 2011-05-10 Advantest Corp. Timing generator and semiconductor test apparatus
JP2009268058A (ja) * 2008-04-28 2009-11-12 Hynix Semiconductor Inc センシング遅延回路及びこれを用いた半導体メモリー装置

Also Published As

Publication number Publication date
WO1996038912A1 (fr) 1996-12-05
KR970705234A (ko) 1997-09-06
TW307955B (enrdf_load_stackoverflow) 1997-06-11
DE19680525T1 (de) 1997-07-24

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