JPH082629Y2 - Ｌｓｉテスタ - Google Patents

Ｌｓｉテスタ

Info

Publication number
JPH082629Y2
JPH082629Y2 JP8446690U JP8446690U JPH082629Y2 JP H082629 Y2 JPH082629 Y2 JP H082629Y2 JP 8446690 U JP8446690 U JP 8446690U JP 8446690 U JP8446690 U JP 8446690U JP H082629 Y2 JPH082629 Y2 JP H082629Y2
Authority
JP
Japan
Prior art keywords
data
input
timing
terminal
memory
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP8446690U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0443276U (enrdf_load_stackoverflow
Inventor
明男 杉村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yokogawa Electric Corp
Original Assignee
Yokogawa Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokogawa Electric Corp filed Critical Yokogawa Electric Corp
Priority to JP8446690U priority Critical patent/JPH082629Y2/ja
Publication of JPH0443276U publication Critical patent/JPH0443276U/ja
Application granted granted Critical
Publication of JPH082629Y2 publication Critical patent/JPH082629Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
JP8446690U 1990-08-09 1990-08-09 Ｌｓｉテスタ Expired - Lifetime JPH082629Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8446690U JPH082629Y2 (ja) 1990-08-09 1990-08-09 Ｌｓｉテスタ

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8446690U JPH082629Y2 (ja) 1990-08-09 1990-08-09 Ｌｓｉテスタ

Publications (2)

Publication Number Publication Date
JPH0443276U JPH0443276U (enrdf_load_stackoverflow) 1992-04-13
JPH082629Y2 true JPH082629Y2 (ja) 1996-01-29

Family

ID=31632974

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8446690U Expired - Lifetime JPH082629Y2 (ja) 1990-08-09 1990-08-09 Ｌｓｉテスタ

Country Status (1)

Country Link
JP (1) JPH082629Y2 (enrdf_load_stackoverflow)

Also Published As

Publication number Publication date
JPH0443276U (enrdf_load_stackoverflow) 1992-04-13

Similar Documents

Publication Publication Date Title
US4888715A (en) Semiconductor test system
JPH082629Y2 (ja) Ｌｓｉテスタ
US6683470B2 (en) DC testing apparatus and semiconductor testing apparatus
JP3134409B2 (ja) Ｌｓｉテスタ
JPH06265596A (ja) 多機能デバイス試験方法
JPH06258405A (ja) 半導体試験装置
JP3163568B2 (ja) Ｉｃ試験装置
JP2001153915A (ja) Ｉｃテスタ、及びｉｃ試験方法
JPH0377543B2 (enrdf_load_stackoverflow)
JP2944307B2 (ja) Ａ／ｄコンバータの非直線性の検査方法
JPS6398576A (ja) 波形パタ−ン発生装置
CN117851150A (zh) Gpio驱动测试系统、方法、装置及存储介质
JPH03120697A (ja) 集積回路装置
JPH06180349A (ja) 実力評価試験装置
JPS63279180A (ja) 論理回路試験機
JPH08129057A (ja) タイマ割込機能を持つシーケンス制御回路
JPH11311657A (ja) 半導体試験装置
JPH0843480A (ja) Ｉｃ試験装置のｄｃユニットとｄｕｔおよびｄｕｔピンの接続選択制御方法
JPS6140574A (ja) 試験条件設定装置
JPH04240578A (ja) Ｉｃテスター
JPH01123173A (ja) 半導体集積回路テスト装置
JPH11142483A (ja) Ｌｓｉとｌｓｉの内部観測方法
JPS6045375B2 (ja) Ｉｃ試験器用タイミング発生装置
JPS5984536A (ja) 集積回路
JPH0553855A (ja) コンピユータシステムの性能測定回路