JPH07321608A - 時間を安定化された出力パルスを発生する回路 - Google Patents

時間を安定化された出力パルスを発生する回路

Info

Publication number
JPH07321608A
JPH07321608A JP6164514A JP16451494A JPH07321608A JP H07321608 A JPH07321608 A JP H07321608A JP 6164514 A JP6164514 A JP 6164514A JP 16451494 A JP16451494 A JP 16451494A JP H07321608 A JPH07321608 A JP H07321608A
Authority
JP
Japan
Prior art keywords
transistor
current
circuit
pulse
capacitor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP6164514A
Other languages
English (en)
Japanese (ja)
Inventor
Sylvie Wuidart
ヴィダル シルヴィー
Tien-Dung Do
ドゥ ティエン−ダン
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics SA
STMicroelectronics lnc USA
Original Assignee
SGS Thomson Microelectronics SA
SGS Thomson Microelectronics Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SGS Thomson Microelectronics SA, SGS Thomson Microelectronics Inc filed Critical SGS Thomson Microelectronics SA
Publication of JPH07321608A publication Critical patent/JPH07321608A/ja
Withdrawn legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K3/00Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/353Generators characterised by the type of circuit or by the means used for producing pulses by the use, as active elements, of field-effect transistors with internal or external positive feedback
    • H03K3/355Monostable circuits
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K5/00Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/01Shaping pulses
    • H03K5/04Shaping pulses by increasing duration; by decreasing duration

Landscapes

  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Manipulation Of Pulses (AREA)
  • Amplifiers (AREA)
  • Electronic Switches (AREA)
JP6164514A 1993-06-23 1994-06-23 時間を安定化された出力パルスを発生する回路 Withdrawn JPH07321608A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR9307601A FR2707058B1 (en, 2012) 1993-06-23 1993-06-23
FR9307601 1993-06-23

Publications (1)

Publication Number Publication Date
JPH07321608A true JPH07321608A (ja) 1995-12-08

Family

ID=9448449

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6164514A Withdrawn JPH07321608A (ja) 1993-06-23 1994-06-23 時間を安定化された出力パルスを発生する回路

Country Status (5)

Country Link
US (2) US5469100A (en, 2012)
EP (1) EP0631388B1 (en, 2012)
JP (1) JPH07321608A (en, 2012)
DE (1) DE69406199T2 (en, 2012)
FR (1) FR2707058B1 (en, 2012)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2707058B1 (en, 2012) * 1993-06-23 1995-09-15 Sgs Thomson Microelectronics
US5627488A (en) * 1994-06-23 1997-05-06 Kabushiki Kaisha Toshiba Delay circuit, oscillation circuit and semiconductor memory device
US5760655A (en) * 1995-06-21 1998-06-02 Micron Quantum Devices, Inc. Stable frequency oscillator having two capacitors that are alternately charged and discharged
US5668483A (en) * 1995-06-21 1997-09-16 Micron Quantum Devices, Inc. CMOS buffer having stable threshold voltage
US5723990A (en) * 1995-06-21 1998-03-03 Micron Quantum Devices, Inc. Integrated circuit having high voltage detection circuit
US5629644A (en) * 1995-07-28 1997-05-13 Micron Quantum Devices, Inc. Adjustable timer circuit
US5581206A (en) * 1995-07-28 1996-12-03 Micron Quantum Devices, Inc. Power level detection circuit
US5579356A (en) * 1995-07-28 1996-11-26 Micron Quantum Devices, Inc. Timer circuit with programmable decode circuitry
US5627784A (en) * 1995-07-28 1997-05-06 Micron Quantum Devices, Inc. Memory system having non-volatile data storage structure for memory control parameters and method
US5793775A (en) * 1996-01-26 1998-08-11 Micron Quantum Devices, Inc. Low voltage test mode operation enable scheme with hardware safeguard
TW358283B (en) * 1996-06-26 1999-05-11 Oki Electric Ind Co Ltd Remote testing device
JP3557059B2 (ja) * 1996-11-27 2004-08-25 富士通株式会社 パルス幅制御装置
KR100240423B1 (ko) * 1997-02-05 2000-01-15 윤종용 반도체 장치의 레벨 검출 회로
FR2761214B1 (fr) * 1997-03-19 1999-05-21 Sgs Thomson Microelectronics Circuit elevateur de tension du type pompe de charge a nombre d'etages controle
JPH117783A (ja) * 1997-06-13 1999-01-12 Seiko Instr Inc 半導体集積回路装置
US7548104B2 (en) * 2006-06-09 2009-06-16 Cosmic Circuits Private Limited Delay line with delay cells having improved gain and in built duty cycle control and method thereof
US7859317B1 (en) * 2007-04-17 2010-12-28 Marvell International Ltd. Low power high slew non-linear amplifier for use in clock generation circuitry for noisy environments

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3996482A (en) * 1975-05-09 1976-12-07 Ncr Corporation One shot multivibrator circuit
US4047057A (en) * 1976-08-23 1977-09-06 Rca Corporation Monostable switching circuit
US4321484A (en) * 1979-02-28 1982-03-23 International Business Machines Corporation Field effect transistor multivibrator
US4305010A (en) * 1979-08-23 1981-12-08 The United States Of America As Represented By The Secretary Of The Army Excessive duty cycle and pulse width limiter
US4421994A (en) * 1981-11-02 1983-12-20 Ibm Corporation High speed line driver with ground output capability
KR900004191B1 (ko) * 1987-03-18 1990-06-18 삼성전자 주식회사 Rc시정수를 이용한 가변 클럭 지연회로
JPH01137817A (ja) * 1987-11-25 1989-05-30 Toshiba Corp 遅延回路
JPH0812986B2 (ja) * 1989-06-20 1996-02-07 日本電気株式会社 遅延回路
US5081380A (en) * 1989-10-16 1992-01-14 Advanced Micro Devices, Inc. Temperature self-compensated time delay circuits
JP2693874B2 (ja) * 1991-03-18 1997-12-24 日本電気アイシーマイコンシステム株式会社 遅延パルス発生回路
FR2707058B1 (en, 2012) * 1993-06-23 1995-09-15 Sgs Thomson Microelectronics

Also Published As

Publication number Publication date
DE69406199D1 (de) 1997-11-20
DE69406199T2 (de) 1998-02-12
US5714899A (en) 1998-02-03
EP0631388B1 (fr) 1997-10-15
US5469100A (en) 1995-11-21
FR2707058A1 (en, 2012) 1994-12-30
FR2707058B1 (en, 2012) 1995-09-15
EP0631388A1 (fr) 1994-12-28

Similar Documents

Publication Publication Date Title
JPH07321608A (ja) 時間を安定化された出力パルスを発生する回路
EP0901127B1 (en) Temperature independent oscillator
US6885177B2 (en) Switching regulator and slope correcting circuit
KR100818105B1 (ko) 내부 전압 발생 회로
US7268639B2 (en) Pulse width modulation circuit
US6304148B1 (en) Oscillator circuit for a semiconductor memory having a temperature dependent cycle
US4785262A (en) Pulse generator producing pulses having a width free from a power voltage and a threshold voltage of an inverter used therein
KR19990045290A (ko) 발진 회로
EP0433724B1 (en) Voltage regulator with power boost system
US6977828B2 (en) DC-DC converter applied to semiconductor device
EP1180689A2 (en) Frequency determination circuit for a data processing unit
JP3816736B2 (ja) 半導体装置
JP3963421B2 (ja) 制御発振システムとその方法
JP3408851B2 (ja) 同期信号検出装置
KR100379555B1 (ko) 반도체 소자의 내부 전원 발생기
JP3141810B2 (ja) 発振回路
US3967216A (en) Pulse generator stabilized for change of ambient temperature and source voltage
JPH11214971A (ja) デューティー比制限機能付きパルス発生回路及びdc/dcコンバータ
JP2897706B2 (ja) 基準電圧発生回路
JP3671773B2 (ja) 発振回路
KR100335490B1 (ko) 음극 선관 구동용 전압 발생 장치 및 방법
JPWO2005008895A1 (ja) チャージポンプ回路
CN120049836B (zh) 弛豫振荡器、芯片和电子设备
KR20060077179A (ko) 밴드갭 레퍼런스 회로를 이용한 발진기
CN110943497B (zh) 一种充放电电路及振荡器

Legal Events

Date Code Title Description
A300 Application deemed to be withdrawn because no request for examination was validly filed

Free format text: JAPANESE INTERMEDIATE CODE: A300

Effective date: 20010904