JPH07225261A - 半導体試験装置用パターン発生器 - Google Patents

半導体試験装置用パターン発生器

Info

Publication number
JPH07225261A
JPH07225261A JP6036526A JP3652694A JPH07225261A JP H07225261 A JPH07225261 A JP H07225261A JP 6036526 A JP6036526 A JP 6036526A JP 3652694 A JP3652694 A JP 3652694A JP H07225261 A JPH07225261 A JP H07225261A
Authority
JP
Japan
Prior art keywords
signal
address
pattern generator
pattern
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6036526A
Other languages
English (en)
Japanese (ja)
Inventor
Naohiro Ikeda
直博 池田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to JP6036526A priority Critical patent/JPH07225261A/ja
Priority to DE19502828A priority patent/DE19502828C2/de
Priority to KR1019950002048A priority patent/KR950025447A/ko
Publication of JPH07225261A publication Critical patent/JPH07225261A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31919—Storing and outputting test patterns
    • G01R31/31921—Storing and outputting test patterns using compression techniques, e.g. patterns sequencer

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
JP6036526A 1994-02-09 1994-02-09 半導体試験装置用パターン発生器 Pending JPH07225261A (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP6036526A JPH07225261A (ja) 1994-02-09 1994-02-09 半導体試験装置用パターン発生器
DE19502828A DE19502828C2 (de) 1994-02-09 1995-01-30 Testmustergenerator für ein Halbleiterschaltungs-Testgerät
KR1019950002048A KR950025447A (ko) 1994-02-09 1995-02-06 반도체 시험장치용 패턴 발생기

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6036526A JPH07225261A (ja) 1994-02-09 1994-02-09 半導体試験装置用パターン発生器

Publications (1)

Publication Number Publication Date
JPH07225261A true JPH07225261A (ja) 1995-08-22

Family

ID=12472248

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6036526A Pending JPH07225261A (ja) 1994-02-09 1994-02-09 半導体試験装置用パターン発生器

Country Status (3)

Country Link
JP (1) JPH07225261A (ko)
KR (1) KR950025447A (ko)
DE (1) DE19502828C2 (ko)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR19990023805A (ko) * 1997-08-26 1999-03-25 윤종용 압축된 디지털 테스트데이터를 이용한 ｉｃ칩 검사장치 및 이 검사장치를 이용한 ｉｃ칩 검사방법
KR100379721B1 (ko) * 2001-05-23 2003-04-10 송동섭 경계주사 테스트용 테스트벡터의 생성방법

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0750159B2 (ja) * 1985-10-11 1995-05-31 株式会社日立製作所 テストパタ−ン発生装置
JPH02181677A (ja) * 1989-01-06 1990-07-16 Sharp Corp Ｌｓｉのテストモード切替方式
WO1990015999A1 (en) * 1989-06-16 1990-12-27 Advantest Corporation Test pattern generator
EP0432292A1 (en) * 1989-12-12 1991-06-19 Advantest Corporation Logic IC tester
JPH04147069A (ja) * 1990-10-09 1992-05-20 Yokogawa Hewlett Packard Ltd テスト波形生成器

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR19990023805A (ko) * 1997-08-26 1999-03-25 윤종용 압축된 디지털 테스트데이터를 이용한 ｉｃ칩 검사장치 및 이 검사장치를 이용한 ｉｃ칩 검사방법
KR100379721B1 (ko) * 2001-05-23 2003-04-10 송동섭 경계주사 테스트용 테스트벡터의 생성방법

Also Published As

Publication number Publication date
DE19502828C2 (de) 1999-04-29
DE19502828A1 (de) 1995-08-10
KR950025447A (ko) 1995-09-15

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Effective date: 20030708