JPH0584062B2 - - Google Patents

Info

Publication number
JPH0584062B2
JPH0584062B2 JP58123284A JP12328483A JPH0584062B2 JP H0584062 B2 JPH0584062 B2 JP H0584062B2 JP 58123284 A JP58123284 A JP 58123284A JP 12328483 A JP12328483 A JP 12328483A JP H0584062 B2 JPH0584062 B2 JP H0584062B2
Authority
JP
Japan
Prior art keywords
fuse
mosfet
voltage
power supply
resistance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58123284A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6015946A (ja
Inventor
Fumiaki Fujii
Koichi Kodera
Hideya Ootani
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Microcomputer System Ltd
Hitachi Ltd
Original Assignee
Hitachi Microcomputer System Ltd
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Microcomputer System Ltd, Hitachi Ltd filed Critical Hitachi Microcomputer System Ltd
Priority to JP58123284A priority Critical patent/JPS6015946A/ja
Publication of JPS6015946A publication Critical patent/JPS6015946A/ja
Publication of JPH0584062B2 publication Critical patent/JPH0584062B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/74—Testing of fuses

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
JP58123284A 1983-07-08 1983-07-08 集積回路 Granted JPS6015946A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58123284A JPS6015946A (ja) 1983-07-08 1983-07-08 集積回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58123284A JPS6015946A (ja) 1983-07-08 1983-07-08 集積回路

Publications (2)

Publication Number Publication Date
JPS6015946A JPS6015946A (ja) 1985-01-26
JPH0584062B2 true JPH0584062B2 (en:Method) 1993-11-30

Family

ID=14856754

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58123284A Granted JPS6015946A (ja) 1983-07-08 1983-07-08 集積回路

Country Status (1)

Country Link
JP (1) JPS6015946A (en:Method)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4837520A (en) * 1985-03-29 1989-06-06 Honeywell Inc. Fuse status detection circuit
JP2004265523A (ja) * 2003-03-03 2004-09-24 Renesas Technology Corp 半導体装置

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5617059A (en) * 1979-07-20 1981-02-18 Fujitsu Ltd Semiconductor switching element

Also Published As

Publication number Publication date
JPS6015946A (ja) 1985-01-26

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