JPS6015946A - 集積回路 - Google Patents

集積回路

Info

Publication number
JPS6015946A
JPS6015946A JP58123284A JP12328483A JPS6015946A JP S6015946 A JPS6015946 A JP S6015946A JP 58123284 A JP58123284 A JP 58123284A JP 12328483 A JP12328483 A JP 12328483A JP S6015946 A JPS6015946 A JP S6015946A
Authority
JP
Japan
Prior art keywords
fuse
power supply
voltage
setting means
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP58123284A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0584062B2 (en:Method
Inventor
Fumiaki Fujii
文明 藤井
Koichi Kodera
浩一 小寺
Hideya Otani
大谷　秀弥
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Microcomputer System Ltd
Hitachi Ltd
Original Assignee
Hitachi Ltd
Hitachi Microcomputer Engineering Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd, Hitachi Microcomputer Engineering Ltd filed Critical Hitachi Ltd
Priority to JP58123284A priority Critical patent/JPS6015946A/ja
Publication of JPS6015946A publication Critical patent/JPS6015946A/ja
Publication of JPH0584062B2 publication Critical patent/JPH0584062B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/74—Testing of fuses

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
JP58123284A 1983-07-08 1983-07-08 集積回路 Granted JPS6015946A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58123284A JPS6015946A (ja) 1983-07-08 1983-07-08 集積回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58123284A JPS6015946A (ja) 1983-07-08 1983-07-08 集積回路

Publications (2)

Publication Number Publication Date
JPS6015946A true JPS6015946A (ja) 1985-01-26
JPH0584062B2 JPH0584062B2 (en:Method) 1993-11-30

Family

ID=14856754

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58123284A Granted JPS6015946A (ja) 1983-07-08 1983-07-08 集積回路

Country Status (1)

Country Link
JP (1) JPS6015946A (en:Method)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH021145A (ja) * 1987-11-12 1990-01-05 Honeywell Inc ヒューズ状態検出回路
JP2004265523A (ja) * 2003-03-03 2004-09-24 Renesas Technology Corp 半導体装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5617059A (en) * 1979-07-20 1981-02-18 Fujitsu Ltd Semiconductor switching element

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5617059A (en) * 1979-07-20 1981-02-18 Fujitsu Ltd Semiconductor switching element

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH021145A (ja) * 1987-11-12 1990-01-05 Honeywell Inc ヒューズ状態検出回路
JP2004265523A (ja) * 2003-03-03 2004-09-24 Renesas Technology Corp 半導体装置

Also Published As

Publication number Publication date
JPH0584062B2 (en:Method) 1993-11-30

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