JPH0575985B2 - - Google Patents

Info

Publication number
JPH0575985B2
JPH0575985B2 JP58005361A JP536183A JPH0575985B2 JP H0575985 B2 JPH0575985 B2 JP H0575985B2 JP 58005361 A JP58005361 A JP 58005361A JP 536183 A JP536183 A JP 536183A JP H0575985 B2 JPH0575985 B2 JP H0575985B2
Authority
JP
Japan
Prior art keywords
address
instruction
test
order information
pattern
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58005361A
Other languages
English (en)
Japanese (ja)
Other versions
JPS59132376A (ja
Inventor
Shuji Kikuchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP58005361A priority Critical patent/JPS59132376A/ja
Publication of JPS59132376A publication Critical patent/JPS59132376A/ja
Publication of JPH0575985B2 publication Critical patent/JPH0575985B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/263—Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
JP58005361A 1983-01-18 1983-01-18 パターン読出し試験装置 Granted JPS59132376A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58005361A JPS59132376A (ja) 1983-01-18 1983-01-18 パターン読出し試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58005361A JPS59132376A (ja) 1983-01-18 1983-01-18 パターン読出し試験装置

Publications (2)

Publication Number Publication Date
JPS59132376A JPS59132376A (ja) 1984-07-30
JPH0575985B2 true JPH0575985B2 (ko) 1993-10-21

Family

ID=11609030

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58005361A Granted JPS59132376A (ja) 1983-01-18 1983-01-18 パターン読出し試験装置

Country Status (1)

Country Link
JP (1) JPS59132376A (ko)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61274280A (ja) * 1985-05-30 1986-12-04 Hitachi Electronics Eng Co Ltd パタ−ン発生装置
US4696005A (en) * 1985-06-03 1987-09-22 International Business Machines Corporation Apparatus for reducing test data storage requirements for high speed VLSI circuit testing
JPH0599985A (ja) * 1991-10-08 1993-04-23 Mitsubishi Electric Corp 半導体試験装置のテストパターン発生装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5552967A (en) * 1978-10-13 1980-04-17 Advantest Corp Pattern signal generator

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5552967A (en) * 1978-10-13 1980-04-17 Advantest Corp Pattern signal generator

Also Published As

Publication number Publication date
JPS59132376A (ja) 1984-07-30

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