JPH056139B2 - - Google Patents

Info

Publication number
JPH056139B2
JPH056139B2 JP58069814A JP6981483A JPH056139B2 JP H056139 B2 JPH056139 B2 JP H056139B2 JP 58069814 A JP58069814 A JP 58069814A JP 6981483 A JP6981483 A JP 6981483A JP H056139 B2 JPH056139 B2 JP H056139B2
Authority
JP
Japan
Prior art keywords
fluorescent
plating film
ray
layer
angle
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58069814A
Other languages
English (en)
Japanese (ja)
Other versions
JPS59195146A (ja
Inventor
Yoshiro Matsumoto
Masakatsu Fujino
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Sumitomo Metal Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Metal Industries Ltd filed Critical Sumitomo Metal Industries Ltd
Priority to JP6981483A priority Critical patent/JPS59195146A/ja
Publication of JPS59195146A publication Critical patent/JPS59195146A/ja
Publication of JPH056139B2 publication Critical patent/JPH056139B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP6981483A 1983-04-19 1983-04-19 メツキ被膜の螢光ｘ線分析法 Granted JPS59195146A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6981483A JPS59195146A (ja) 1983-04-19 1983-04-19 メツキ被膜の螢光ｘ線分析法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6981483A JPS59195146A (ja) 1983-04-19 1983-04-19 メツキ被膜の螢光ｘ線分析法

Publications (2)

Publication Number Publication Date
JPS59195146A JPS59195146A (ja) 1984-11-06
JPH056139B2 true JPH056139B2 (OSRAM) 1993-01-25

Family

ID=13413601

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6981483A Granted JPS59195146A (ja) 1983-04-19 1983-04-19 メツキ被膜の螢光ｘ線分析法

Country Status (1)

Country Link
JP (1) JPS59195146A (OSRAM)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0610660B2 (ja) * 1984-10-05 1994-02-09 川崎製鉄株式会社 合金被膜の膜厚及び組成測定方法
JPS61132847A (ja) * 1984-11-30 1986-06-20 Sumitomo Metal Ind Ltd ２層メツキ被膜の螢光ｘ線分析方法及び装置
GB8811459D0 (en) * 1988-05-13 1988-06-15 Dmc Boyle Ltd Method & apparatus for measuring thickness of coating on substrate
WO2012008513A1 (ja) * 2010-07-15 2012-01-19 株式会社堀場製作所 蛍光ｘ線検出方法及び蛍光ｘ線検出装置

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5429843A (en) * 1977-08-10 1979-03-06 Nippon Steel Corp Controlling method for composition and thickness of plated multicomponent alloy films
JPS5636045A (en) * 1979-08-31 1981-04-09 Sumitomo Metal Ind Ltd Quantity determination method for sticking quantity of plating metal and quantity of component in ni-zn alloy-plated steel plate

Also Published As

Publication number Publication date
JPS59195146A (ja) 1984-11-06

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