JPH0530225B2 - - Google Patents

Info

Publication number
JPH0530225B2
JPH0530225B2 JP56002976A JP297681A JPH0530225B2 JP H0530225 B2 JPH0530225 B2 JP H0530225B2 JP 56002976 A JP56002976 A JP 56002976A JP 297681 A JP297681 A JP 297681A JP H0530225 B2 JPH0530225 B2 JP H0530225B2
Authority
JP
Japan
Prior art keywords
test
test pattern
register
pattern
lsi
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP56002976A
Other languages
English (en)
Japanese (ja)
Other versions
JPS57116269A (en
Inventor
Kyosato Izawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP56002976A priority Critical patent/JPS57116269A/ja
Publication of JPS57116269A publication Critical patent/JPS57116269A/ja
Publication of JPH0530225B2 publication Critical patent/JPH0530225B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP56002976A 1981-01-12 1981-01-12 Lsi test pattern generating part Granted JPS57116269A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56002976A JPS57116269A (en) 1981-01-12 1981-01-12 Lsi test pattern generating part

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56002976A JPS57116269A (en) 1981-01-12 1981-01-12 Lsi test pattern generating part

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP8112646A Division JP2653648B2 (ja) 1996-05-07 1996-05-07 Ｌｓｉ試験パターン発生器

Publications (2)

Publication Number Publication Date
JPS57116269A JPS57116269A (en) 1982-07-20
JPH0530225B2 true JPH0530225B2 (enExample) 1993-05-07

Family

ID=11544395

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56002976A Granted JPS57116269A (en) 1981-01-12 1981-01-12 Lsi test pattern generating part

Country Status (1)

Country Link
JP (1) JPS57116269A (enExample)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0695133B2 (ja) * 1985-04-22 1994-11-24 横河電機株式会社 Ｉｃテストシステム
JP2673602B2 (ja) * 1990-07-13 1997-11-05 ソニー・テクトロニクス株式会社 制御装置
KR0137630B1 (ko) * 1992-03-31 1998-06-15 오오우라 히로시 Ic시험장치
JP4228061B2 (ja) 2000-12-07 2009-02-25 富士通マイクロエレクトロニクス株式会社 集積回路の試験装置および試験方法

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5552967A (en) * 1978-10-13 1980-04-17 Advantest Corp Pattern signal generator

Also Published As

Publication number Publication date
JPS57116269A (en) 1982-07-20

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