JPS57116269A - Lsi test pattern generating part - Google Patents

Lsi test pattern generating part

Info

Publication number
JPS57116269A
JPS57116269A JP56002976A JP297681A JPS57116269A JP S57116269 A JPS57116269 A JP S57116269A JP 56002976 A JP56002976 A JP 56002976A JP 297681 A JP297681 A JP 297681A JP S57116269 A JPS57116269 A JP S57116269A
Authority
JP
Japan
Prior art keywords
test
test pattern
pattern
algorithmic
constitution
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56002976A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0530225B2 (enExample
Inventor
Kiyosato Izawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP56002976A priority Critical patent/JPS57116269A/ja
Publication of JPS57116269A publication Critical patent/JPS57116269A/ja
Publication of JPH0530225B2 publication Critical patent/JPH0530225B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP56002976A 1981-01-12 1981-01-12 Lsi test pattern generating part Granted JPS57116269A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56002976A JPS57116269A (en) 1981-01-12 1981-01-12 Lsi test pattern generating part

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56002976A JPS57116269A (en) 1981-01-12 1981-01-12 Lsi test pattern generating part

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP8112646A Division JP2653648B2 (ja) 1996-05-07 1996-05-07 Ｌｓｉ試験パターン発生器

Publications (2)

Publication Number Publication Date
JPS57116269A true JPS57116269A (en) 1982-07-20
JPH0530225B2 JPH0530225B2 (enExample) 1993-05-07

Family

ID=11544395

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56002976A Granted JPS57116269A (en) 1981-01-12 1981-01-12 Lsi test pattern generating part

Country Status (1)

Country Link
JP (1) JPS57116269A (enExample)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61243379A (ja) * 1985-04-22 1986-10-29 Yokogawa Electric Corp Ｉｃテストシステム
JPH0477825A (ja) * 1990-07-13 1992-03-11 Sony Tektronix Corp 制御装置
WO1993020457A1 (fr) * 1992-03-31 1993-10-14 Advantest Corporation Dispositif de controle de circuits integres
US7178078B2 (en) 2000-12-07 2007-02-13 Fujitsu Limited Testing apparatus and testing method for an integrated circuit, and integrated circuit

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5552967A (en) * 1978-10-13 1980-04-17 Advantest Corp Pattern signal generator

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5552967A (en) * 1978-10-13 1980-04-17 Advantest Corp Pattern signal generator

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61243379A (ja) * 1985-04-22 1986-10-29 Yokogawa Electric Corp Ｉｃテストシステム
JPH0477825A (ja) * 1990-07-13 1992-03-11 Sony Tektronix Corp 制御装置
WO1993020457A1 (fr) * 1992-03-31 1993-10-14 Advantest Corporation Dispositif de controle de circuits integres
US5579251A (en) * 1992-03-31 1996-11-26 Advantest Corporation IC tester
US7178078B2 (en) 2000-12-07 2007-02-13 Fujitsu Limited Testing apparatus and testing method for an integrated circuit, and integrated circuit
US7734973B2 (en) 2000-12-07 2010-06-08 Fujitsu Microelectronics Limited Testing apparatus and testing method for an integrated circuit, and integrated circuit

Also Published As

Publication number Publication date
JPH0530225B2 (enExample) 1993-05-07

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