JPH0430175B2 - - Google Patents

Info

Publication number
JPH0430175B2
JPH0430175B2 JP57122026A JP12202682A JPH0430175B2 JP H0430175 B2 JPH0430175 B2 JP H0430175B2 JP 57122026 A JP57122026 A JP 57122026A JP 12202682 A JP12202682 A JP 12202682A JP H0430175 B2 JPH0430175 B2 JP H0430175B2
Authority
JP
Japan
Prior art keywords
pattern
reticle
stage
patterns
reticle pattern
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP57122026A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5913324A (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP57122026A priority Critical patent/JPS5913324A/ja
Publication of JPS5913324A publication Critical patent/JPS5913324A/ja
Publication of JPH0430175B2 publication Critical patent/JPH0430175B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F9/00Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
    • G03F9/70Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
JP57122026A 1982-07-15 1982-07-15 縮小投影露光装置 Granted JPS5913324A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57122026A JPS5913324A (ja) 1982-07-15 1982-07-15 縮小投影露光装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57122026A JPS5913324A (ja) 1982-07-15 1982-07-15 縮小投影露光装置

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP3131647A Division JPH05234845A (ja) 1991-05-08 1991-05-08 縮小投影露光装置

Publications (2)

Publication Number Publication Date
JPS5913324A JPS5913324A (ja) 1984-01-24
JPH0430175B2 true JPH0430175B2 (th) 1992-05-21

Family

ID=14825746

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57122026A Granted JPS5913324A (ja) 1982-07-15 1982-07-15 縮小投影露光装置

Country Status (1)

Country Link
JP (1) JPS5913324A (th)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0789534B2 (ja) * 1986-07-04 1995-09-27 キヤノン株式会社 露光方法
JP2592475B2 (ja) * 1987-12-30 1997-03-19 株式会社日立製作所 投影露光装置及びそのパターンオフセツト補正方法
JPH0666244B2 (ja) * 1989-12-15 1994-08-24 キヤノン株式会社 半導体製造方法

Also Published As

Publication number Publication date
JPS5913324A (ja) 1984-01-24

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