JPH041338B2 - - Google Patents
Info
- Publication number
- JPH041338B2 JPH041338B2 JP22613985A JP22613985A JPH041338B2 JP H041338 B2 JPH041338 B2 JP H041338B2 JP 22613985 A JP22613985 A JP 22613985A JP 22613985 A JP22613985 A JP 22613985A JP H041338 B2 JPH041338 B2 JP H041338B2
- Authority
- JP
- Japan
- Prior art keywords
- photomask
- protective film
- photoresist
- contact
- minutes
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/68—Preparation processes not covered by groups G03F1/20 - G03F1/50
- G03F1/82—Auxiliary processes, e.g. cleaning or inspecting
- G03F1/84—Inspecting
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/38—Masks having auxiliary features, e.g. special coatings or marks for alignment or testing; Preparation thereof
- G03F1/48—Protective coatings
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Photosensitive Polymer And Photoresist Processing (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60226139A JPS6285251A (ja) | 1985-10-09 | 1985-10-09 | ホトマスクの保護膜形成方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60226139A JPS6285251A (ja) | 1985-10-09 | 1985-10-09 | ホトマスクの保護膜形成方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6285251A JPS6285251A (ja) | 1987-04-18 |
| JPH041338B2 true JPH041338B2 (enExample) | 1992-01-10 |
Family
ID=16840459
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP60226139A Granted JPS6285251A (ja) | 1985-10-09 | 1985-10-09 | ホトマスクの保護膜形成方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6285251A (enExample) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01123232A (ja) * | 1987-11-09 | 1989-05-16 | Mitsubishi Electric Corp | パターン形成方法 |
| DE69029503T2 (de) * | 1989-10-13 | 1997-05-22 | Toshiba Kawasaki Kk | Aperturenmuster-Flachdruckplatte zur Herstellung einer Schattenmaske und Verfahren zur Herstellung dieser Maske |
| JP2002214761A (ja) * | 2001-01-16 | 2002-07-31 | Dainippon Printing Co Ltd | フォトリソグラフィー用フォトマスクおよびその製造方法 |
| US6566021B2 (en) | 2001-07-26 | 2003-05-20 | Micro Lithography, Inc. | Fluoropolymer-coated photomasks for photolithography |
| JP2011206720A (ja) * | 2010-03-30 | 2011-10-20 | Hitachi High-Technologies Corp | ドライ完結型有機el用マスククリーナ装置及びそのためのマスククリーニング方法 |
| KR102138960B1 (ko) | 2016-01-27 | 2020-07-28 | 주식회사 엘지화학 | 필름 마스크, 이의 제조방법, 이를 이용한 패턴 형성 방법 및 이를 이용하여 형성된 패턴 |
| WO2017131499A1 (ko) | 2016-01-27 | 2017-08-03 | 주식회사 엘지화학 | 필름 마스크, 이의 제조방법, 이를 이용한 패턴 형성 방법 및 이를 이용하여 형성된 패턴 |
| EP3410213B1 (en) * | 2016-01-27 | 2021-05-26 | LG Chem, Ltd. | Film mask, method for manufacturing same, and method for forming pattern using film mask |
-
1985
- 1985-10-09 JP JP60226139A patent/JPS6285251A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6285251A (ja) | 1987-04-18 |
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