JPH04107832U - 半導体装置 - Google Patents
半導体装置Info
- Publication number
- JPH04107832U JPH04107832U JP1991009777U JP977791U JPH04107832U JP H04107832 U JPH04107832 U JP H04107832U JP 1991009777 U JP1991009777 U JP 1991009777U JP 977791 U JP977791 U JP 977791U JP H04107832 U JPH04107832 U JP H04107832U
- Authority
- JP
- Japan
- Prior art keywords
- external connection
- lead
- semiconductor chip
- connection lead
- island
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 title claims description 20
- 239000000853 adhesive Substances 0.000 claims abstract description 11
- 230000001070 adhesive effect Effects 0.000 claims abstract description 11
- 239000011347 resin Substances 0.000 claims description 8
- 229920005989 resin Polymers 0.000 claims description 8
- 238000000034 method Methods 0.000 claims description 2
- 238000000465 moulding Methods 0.000 claims description 2
- 238000012986 modification Methods 0.000 abstract 1
- 230000004048 modification Effects 0.000 abstract 1
- 238000005516 engineering process Methods 0.000 description 4
- 239000002245 particle Substances 0.000 description 3
- 229920000049 Carbon (fiber) Polymers 0.000 description 2
- 239000004917 carbon fiber Substances 0.000 description 2
- 239000004020 conductor Substances 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000005496 eutectics Effects 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000004080 punching Methods 0.000 description 2
- 229910000679 solder Inorganic materials 0.000 description 2
- 229910015365 Au—Si Inorganic materials 0.000 description 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 239000004593 Epoxy Substances 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 239000013256 coordination polymer Substances 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- VKYKSIONXSXAKP-UHFFFAOYSA-N hexamethylenetetramine Chemical compound C1N(C2)CN3CN1CN2C3 VKYKSIONXSXAKP-UHFFFAOYSA-N 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 238000001259 photo etching Methods 0.000 description 1
- 229920001296 polysiloxane Polymers 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 229920001187 thermosetting polymer Polymers 0.000 description 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/93—Batch processes
- H01L24/95—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips
- H01L24/97—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips the devices being connected to a common substrate, e.g. interposer, said common substrate being separable into individual assemblies after connecting
-
- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/32245—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
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- H01L2224/34—Strap connectors, e.g. copper straps for grounding power devices; Manufacturing methods related thereto
- H01L2224/36—Structure, shape, material or disposition of the strap connectors prior to the connecting process
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- H01L2224/36—Structure, shape, material or disposition of the strap connectors prior to the connecting process
- H01L2224/37—Structure, shape, material or disposition of the strap connectors prior to the connecting process of an individual strap connector
- H01L2224/37001—Core members of the connector
- H01L2224/37099—Material
- H01L2224/371—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
- H01L2224/37138—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
- H01L2224/37147—Copper [Cu] as principal constituent
-
- H—ELECTRICITY
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- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/34—Strap connectors, e.g. copper straps for grounding power devices; Manufacturing methods related thereto
- H01L2224/36—Structure, shape, material or disposition of the strap connectors prior to the connecting process
- H01L2224/37—Structure, shape, material or disposition of the strap connectors prior to the connecting process of an individual strap connector
- H01L2224/3754—Coating
- H01L2224/37599—Material
- H01L2224/376—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
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- H—ELECTRICITY
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- H01L2224/34—Strap connectors, e.g. copper straps for grounding power devices; Manufacturing methods related thereto
- H01L2224/36—Structure, shape, material or disposition of the strap connectors prior to the connecting process
- H01L2224/37—Structure, shape, material or disposition of the strap connectors prior to the connecting process of an individual strap connector
- H01L2224/3754—Coating
- H01L2224/37599—Material
- H01L2224/376—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
- H01L2224/37663—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof the principal constituent melting at a temperature of greater than 1550°C
- H01L2224/37666—Titanium [Ti] as principal constituent
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- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
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- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73251—Location after the connecting process on different surfaces
- H01L2224/73265—Layer and wire connectors
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- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/838—Bonding techniques
- H01L2224/83801—Soldering or alloying
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- H01L2224/84—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a strap connector
- H01L2224/848—Bonding techniques
- H01L2224/8485—Bonding techniques using a polymer adhesive, e.g. an adhesive based on silicone, epoxy, polyimide, polyester
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- H01L2224/93—Batch processes
- H01L2224/95—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips
- H01L2224/97—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips the devices being connected to a common substrate, e.g. interposer, said common substrate being separable into individual assemblies after connecting
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- H01L24/34—Strap connectors, e.g. copper straps for grounding power devices; Manufacturing methods related thereto
- H01L24/36—Structure, shape, material or disposition of the strap connectors prior to the connecting process
- H01L24/37—Structure, shape, material or disposition of the strap connectors prior to the connecting process of an individual strap connector
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- Engineering & Computer Science (AREA)
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Abstract
(57)【要約】 (修正有)
【目的】外形寸法を小さくできる表面実装型のミニモー
ルドパッケージを提供する。 【構成】接続パッド(15)と外部接続リード(16)
とを異方性導電接着剤(17)にて固着することによ
り、外形寸法を一層小型化した。
ルドパッケージを提供する。 【構成】接続パッド(15)と外部接続リード(16)
とを異方性導電接着剤(17)にて固着することによ
り、外形寸法を一層小型化した。
Description
【0001】
本考案は外形寸法を小さくできる表面実装型の半導体装置に関する。
【0002】
従来より軽薄短小化を実現する1つの手段として、プリント基板の導電パター
ン上にリードを対向接着する所謂CP、MCPと称される表面実装型のミニモー
ルドパッケージがある(例えば、特開平02−184059号)。
図5にその例を示す。同図において、(1)は半導体チップ、(2)はチップ
(1)を搭載するアイランド、(3)はチップ(1)上の電極パッドにワイヤ(
4)で接続された外部接続リード、(5)は主要部を封止する樹脂である。
【0003】
上記ミニモールドパッケージは、微細化が押し進められた結果、外形寸法が1
.6×0.8mm程度まで小型化されている。
【0004】
しかしながら、従来の半導体装置はワイヤ(4)の位置精度を保つため、リー
ドフレームの打ち抜き加工に要する抜きしろ寸法(a)、ワイヤ(4)のセカン
ドボンドエリアに要する外部接続リード(3)の寸法(b)、ワイヤ(4)のル
ープ高さに要する寸法(c)、およびワイヤ(4)ループ高さからの樹脂(5)
の余裕に要する寸法(d)が必要になる。そのため外形寸法の更なる縮小が困難
である欠点があった。
【0005】
本考案は上記従来の欠点に鑑み成されたもので、半導体チップ(11)を搭載
するアイランド(12)と、アイランド(12)に一体化した外部接続リード(
14)と、チップ(11)の表面に形成した電極パッド(15)と、電極パッド
(15)に異方性導電接着剤(17)にて対向接着された外部接続リード(16
)と、主要部を封止する樹脂(18)とを具備することにより、外形寸法を縮小
できるミニモールド型の半導体装置を提供するものである。
【0006】
本考案によれば、ワイヤ(4)を使用せず外部接続リード(16)を電極パッ
ド(15)に直付けするので、ワイヤボンドに要する寸法を無くすことができる
。そのため、樹脂(18)の外形寸法を縮小できる。
【0007】
以下に本考案の一実施例を図面を参照しながら詳細に説明する。
図1と図2は夫々本考案の半導体装置を示す断面図と平面図である。同図にお
いて、(11)は表面に通常のプレーナ技術によってトランジスタ等の回路素子
を形成した半導体チップ、(12)は半導体チップ(11)を共晶半田(13)
等で固着するアイランド、(14)はアイランド(12)と一体化されて外部に
延在し、前記トランジスタのコレクタ取出しとなる外部接続リード、(15)は
半導体チップ(11)の表面にAlのホトエッチで形成された電極取出し用の接
続パッド、(16)は接続パッド(15)に対向接着されて外部に延在し、前記
トランジスタのベースおよびエミッタの取出しとなる外部接続リード、(17)
は接続パッド(15)と外部接続リード(16)とを電気的機械的に接続するた
めの異方性導電接着剤、(18)は主要部を封止するエポキシ系熱硬化性樹脂で
ある。
【0008】
アイランド(12)と外部接続リード(14)(16)とは、肉厚0.1〜0
.3mmの銅系板状素材から打ち抜き加工したリードフレームにより形成され、そ
の表面にはAg、Ni等の金属メッキが処される。アイランド(12)上への半
導体チップ(11)の固着は、Au−Si共晶等で行われている。
異方性導電接着剤(17)は、母材としての絶縁材である厚さ0.3mmのシリ
コーンゴムに導電繊維を縦に配向して埋め込んだものか、又は厚さ20〜30μ
mの絶縁性接着剤中に直径7μm、長さ50〜100μmのカーボン繊維を並列
配列したものである。カーボン繊維の代わりにハンダ粒子やNi粒子等の導電粒
子を用いたものもある。両者共、接続パッド(15)と外部接続リード(16)
との間に挟み込み、加圧又は加圧加熱することにより、接続パッド(15)と外
部接続リード(16)との電気的機械的な接続を果たす
外部接続リード(16)の接着部付近には、リードフレームのコイニング加工
によって段差(19)が付けられている。この段差(19)は、異方性導電接着
剤(17)が流出するのを防止する役割を果たす段差(19)以降はやや上方に
折り曲げられ、樹脂(18)外部に露出してから表面実装用にリードフォーミン
グされる。尚、アイランド(12)に一体化した外部接続リード(14)も同様
にリードフォーミングされる。
【0009】
上記半導体装置は、図3に示すリードフレームA(20)と、図4に示すリー
ドフレームB(21)とに分離されたリードフレームで製造される。先ずアイラ
ンド(12)を形成したリードフレームA(20)に半導体チップ(11)をダ
イボンドし、外部接続リード(16)を形成したリードフレームB(21)の接
続部にあらかじめ異方性導電接着剤(17)を塗布し、そしてリードフレームA
(20)とリードフレームB(21)とを重ね合わせるようにして接続パッド(
15)と外部接続リード(16)を接続し、樹脂モールド、リードフォーミング
という工程で完成する。
【0010】
斯る本願の半導体装置は、従来のAuワイヤを使用しないので、セカンドボン
ドエリアに要する寸法bとループ高さに要する寸法cが不要となる。さらに、リ
ードフレームを2体に分離するので、抜きしろaも不要となる。従って従来の半
導体装置に比べて大幅に小型化できる。
【0011】
このように、本発明によれば、ワイヤを用いたことによる寸法の制限が無いの
で、従来の半導体装置より一層小型化を押し進めることができる利点を有する。
さらに、外部接続リード(16)に段差(19)を設けておけば、接着剤(17
)の流出による短絡事故を未然に防止できる利点をも有する。さらに、Auバン
プ技術と比較して、チップ(11)の設計変更が不要であり、且つ製造が容易で
ある利点をも有する。
【図1】本考案を説明するための断面図である。
【図2】本考案を説明するための断面図である。
【図3】リードフレームA(20)を示す平面図であ
る。
る。
【図4】リードフレームB(21)を示す平面図であ
る。
る。
【図5】従来例を説明する断面図である。
Claims (2)
- 【請求項1】 回路素子を形成した半導体チップと、前
記半導体チップを固着するアイランドと、前記アイラン
ドに連続して延在する外部接続リードと、前記半導体チ
ップの表面に形成した電極取出し用の電極パッドと、前
記電極パッドに先端が異方性導電接着剤にて固着され延
在する外部接続リードと、前記半導体チップを含む主要
部をモールドする樹脂とを具備することを特徴とする半
導体装置。 - 【請求項2】 前記外部接続リードの表面に前記異方性
導電接着剤の流動を停止するためのコイニング加工を処
したことを特徴とする請求項1記載の半導体装置。
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1991009777U JP2513044Y2 (ja) | 1991-02-27 | 1991-02-27 | 半導体装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1991009777U JP2513044Y2 (ja) | 1991-02-27 | 1991-02-27 | 半導体装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH04107832U true JPH04107832U (ja) | 1992-09-17 |
JP2513044Y2 JP2513044Y2 (ja) | 1996-10-02 |
Family
ID=31899996
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1991009777U Expired - Lifetime JP2513044Y2 (ja) | 1991-02-27 | 1991-02-27 | 半導体装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2513044Y2 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108511188A (zh) * | 2018-05-15 | 2018-09-07 | 山东晶导微电子股份有限公司 | 一种贴片电容封装结构 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5271177A (en) * | 1975-12-10 | 1977-06-14 | Seiko Epson Corp | Semiconductor device |
JPS59128934A (ja) * | 1983-01-13 | 1984-07-25 | Diesel Kiki Co Ltd | 燃料制御方法 |
JPS63152160A (ja) * | 1986-12-17 | 1988-06-24 | Sumitomo Electric Ind Ltd | 半導体装置用リ−ドフレ−ム |
-
1991
- 1991-02-27 JP JP1991009777U patent/JP2513044Y2/ja not_active Expired - Lifetime
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5271177A (en) * | 1975-12-10 | 1977-06-14 | Seiko Epson Corp | Semiconductor device |
JPS59128934A (ja) * | 1983-01-13 | 1984-07-25 | Diesel Kiki Co Ltd | 燃料制御方法 |
JPS63152160A (ja) * | 1986-12-17 | 1988-06-24 | Sumitomo Electric Ind Ltd | 半導体装置用リ−ドフレ−ム |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108511188A (zh) * | 2018-05-15 | 2018-09-07 | 山东晶导微电子股份有限公司 | 一种贴片电容封装结构 |
CN108511188B (zh) * | 2018-05-15 | 2024-02-27 | 山东晶导微电子股份有限公司 | 一种贴片电容封装结构 |
Also Published As
Publication number | Publication date |
---|---|
JP2513044Y2 (ja) | 1996-10-02 |
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