JPH0330326B2 - - Google Patents
Info
- Publication number
- JPH0330326B2 JPH0330326B2 JP55064567A JP6456780A JPH0330326B2 JP H0330326 B2 JPH0330326 B2 JP H0330326B2 JP 55064567 A JP55064567 A JP 55064567A JP 6456780 A JP6456780 A JP 6456780A JP H0330326 B2 JPH0330326 B2 JP H0330326B2
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- terminal
- mode
- lsi
- gate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000012360 testing method Methods 0.000 claims description 22
- 239000000758 substrate Substances 0.000 claims 1
- 238000007689 inspection Methods 0.000 description 12
- 238000010586 diagram Methods 0.000 description 6
- 230000000630 rising effect Effects 0.000 description 3
- 230000003247 decreasing effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Semiconductor Integrated Circuits (AREA)
- Logic Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6456780A JPS56160049A (en) | 1980-05-14 | 1980-05-14 | Mode change-over circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6456780A JPS56160049A (en) | 1980-05-14 | 1980-05-14 | Mode change-over circuit |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS56160049A JPS56160049A (en) | 1981-12-09 |
| JPH0330326B2 true JPH0330326B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1991-04-30 |
Family
ID=13261930
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP6456780A Granted JPS56160049A (en) | 1980-05-14 | 1980-05-14 | Mode change-over circuit |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS56160049A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58207648A (ja) * | 1982-05-28 | 1983-12-03 | Toshiba Corp | 集積回路のテストモ−ド設定回路 |
| JPS58194348U (ja) * | 1982-06-15 | 1983-12-24 | シャープ株式会社 | 燃焼器の燃焼筒 |
| JPS61287315A (ja) * | 1985-06-13 | 1986-12-17 | Mitsubishi Electric Corp | 半導体集積回路 |
-
1980
- 1980-05-14 JP JP6456780A patent/JPS56160049A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS56160049A (en) | 1981-12-09 |