JPH026278U - - Google Patents

Info

Publication number
JPH026278U
JPH026278U JP8462488U JP8462488U JPH026278U JP H026278 U JPH026278 U JP H026278U JP 8462488 U JP8462488 U JP 8462488U JP 8462488 U JP8462488 U JP 8462488U JP H026278 U JPH026278 U JP H026278U
Authority
JP
Japan
Prior art keywords
tester
ics
wafer
performs
repair
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP8462488U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0741156Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1988084624U priority Critical patent/JPH0741156Y2/ja
Publication of JPH026278U publication Critical patent/JPH026278U/ja
Application granted granted Critical
Publication of JPH0741156Y2 publication Critical patent/JPH0741156Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
JP1988084624U 1988-06-27 1988-06-27 Ｉｃ測定装置 Expired - Lifetime JPH0741156Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1988084624U JPH0741156Y2 (ja) 1988-06-27 1988-06-27 Ｉｃ測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1988084624U JPH0741156Y2 (ja) 1988-06-27 1988-06-27 Ｉｃ測定装置

Publications (2)

Publication Number Publication Date
JPH026278U true JPH026278U (ko) 1990-01-16
JPH0741156Y2 JPH0741156Y2 (ja) 1995-09-20

Family

ID=31309305

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1988084624U Expired - Lifetime JPH0741156Y2 (ja) 1988-06-27 1988-06-27 Ｉｃ測定装置

Country Status (1)

Country Link
JP (1) JPH0741156Y2 (ko)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5967645A (ja) * 1982-10-12 1984-04-17 Hitachi Ltd 半導体装置の欠陥救済装置
JPS6049643A (ja) * 1983-08-29 1985-03-18 Tokyo Seimitsu Co Ltd ウエハ検査装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5967645A (ja) * 1982-10-12 1984-04-17 Hitachi Ltd 半導体装置の欠陥救済装置
JPS6049643A (ja) * 1983-08-29 1985-03-18 Tokyo Seimitsu Co Ltd ウエハ検査装置

Also Published As

Publication number Publication date
JPH0741156Y2 (ja) 1995-09-20

Similar Documents

Publication Publication Date Title
JPS62141699A (ja) 半導体メモリ装置の検査方法
JPH026278U (ko)
JPH1098082A (ja) 最適プロ−ビングモ−ド設定方法
JPH0252446A (ja) 集積回路の試験装置
JPH084102B2 (ja) 半導体検査装置
JPH07153298A (ja) フェイルデータ処理装置
JPS593537U (ja) 半導体素子検査装置の測子カ−ド
JPS62268000A (ja) 半導体メモリ装置の検査方法
JPS62169342A (ja) メモリｉｃテスト装置
JPS6065542A (ja) 半導体集積回路の検査方法及びその検査装置
JPH0376186U (ko)
JPS5891176U (ja) 半導体素子の特性測定装置
JPS59180300U (ja) メモリ試験装置
JPH02271273A (ja) Ｌｓｉ評価装置
SU1610422A1 (ru) Испытательный комплекс микропроцессорных приборов неразрушающего контрол
JPH0195529A (ja) ウエーハのテスト方法
JPH07140198A (ja) 半導体試験方法および装置
JPH01110383U (ko)
JPS5858339U (ja) ウエ−ハプロ−バ
JPH03110380U (ko)
JPH0475976U (ko)
JPH025083U (ko)
JPS58169924A (ja) Ｉｃウエハの試験装置
JPS6220640B2 (ko)
JPS59148251U (ja) ウエハプロ−バの測定針研磨装置