JPH0235445B2 - - Google Patents
Info
- Publication number
- JPH0235445B2 JPH0235445B2 JP56091800A JP9180081A JPH0235445B2 JP H0235445 B2 JPH0235445 B2 JP H0235445B2 JP 56091800 A JP56091800 A JP 56091800A JP 9180081 A JP9180081 A JP 9180081A JP H0235445 B2 JPH0235445 B2 JP H0235445B2
- Authority
- JP
- Japan
- Prior art keywords
- mask
- photo
- exposed
- suction
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/707—Chucks, e.g. chucking or un-chucking operations or structural details
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56091800A JPS57205728A (en) | 1981-06-15 | 1981-06-15 | Exposure device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56091800A JPS57205728A (en) | 1981-06-15 | 1981-06-15 | Exposure device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS57205728A JPS57205728A (en) | 1982-12-16 |
JPH0235445B2 true JPH0235445B2 (enrdf_load_stackoverflow) | 1990-08-10 |
Family
ID=14036687
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP56091800A Granted JPS57205728A (en) | 1981-06-15 | 1981-06-15 | Exposure device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57205728A (enrdf_load_stackoverflow) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2750554B2 (ja) * | 1992-03-31 | 1998-05-13 | 日本電信電話株式会社 | 真空吸着装置 |
JP2009206235A (ja) * | 2008-02-27 | 2009-09-10 | Fuji Electric Holdings Co Ltd | 薄膜太陽電池の製造方法 |
JP4952764B2 (ja) * | 2009-10-19 | 2012-06-13 | 株式会社村田製作所 | 露光装置及び露光方法 |
DE102012111114B4 (de) | 2012-11-19 | 2018-10-04 | Ev Group E. Thallner Gmbh | Halbleiterbearbeitungsvorrichtung und -verfahren |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3729966A (en) * | 1972-02-02 | 1973-05-01 | Ibm | Apparatus for contouring the surface of thin elements |
JPS52143771A (en) * | 1976-05-26 | 1977-11-30 | Hitachi Ltd | Aligning method for reticle datum plane |
JPS5617354A (en) * | 1979-07-20 | 1981-02-19 | Nec Corp | Reticle frame for semiconductor device |
-
1981
- 1981-06-15 JP JP56091800A patent/JPS57205728A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS57205728A (en) | 1982-12-16 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US5948572A (en) | Mixed mode photomask for nikon stepper | |
US6317197B1 (en) | Mask pellicle remove tool | |
JPH0235445B2 (enrdf_load_stackoverflow) | ||
TW559884B (en) | Divided exposure method | |
US4669871A (en) | Photographic printing plate and method of exposing a coated sheet using same | |
JPS6344824Y2 (enrdf_load_stackoverflow) | ||
US5451488A (en) | Reticle having sub-patterns and a method of exposure using the same | |
JPS58100852A (ja) | フオトマスク | |
JPH0664337B2 (ja) | 半導体集積回路用ホトマスク | |
JPH0812416B2 (ja) | マスク | |
JP3158515B2 (ja) | 露光用マスク、露光用マスクの使用方法、露光用マスクの製造方法、及び半導体装置の製造方法 | |
CN217821246U (zh) | 一种用于光罩防尘膜的透气孔空气隔离结构 | |
TW516098B (en) | Light source generation apparatus and exposure method of contact hole | |
JPS5984245A (ja) | フオトマスク | |
JPH07181670A (ja) | レチクルの製造方法およびその製造装置 | |
JPH0322904Y2 (enrdf_load_stackoverflow) | ||
JPH03242633A (ja) | 密着露光におけるホトマスクの密着方法 | |
JP2003015324A (ja) | 露光装置 | |
JP2623951B2 (ja) | プリント基板の露光装置 | |
JPS61148449A (ja) | ホトマスク | |
JPS6244740A (ja) | パタ−ン形成方法 | |
TW525222B (en) | Method of using the same light source as alignment source and exposure source | |
JPS61174734A (ja) | 基体吸着法 | |
JPH09330866A (ja) | プロキシミティー露光方法及びプロキシミティー露光装置 | |
JPH07219234A (ja) | 露光機の密着装置 |