JP7555171B2 - 自動分析システム - Google Patents

自動分析システム Download PDF

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Publication number
JP7555171B2
JP7555171B2 JP2021574504A JP2021574504A JP7555171B2 JP 7555171 B2 JP7555171 B2 JP 7555171B2 JP 2021574504 A JP2021574504 A JP 2021574504A JP 2021574504 A JP2021574504 A JP 2021574504A JP 7555171 B2 JP7555171 B2 JP 7555171B2
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Japan
Prior art keywords
quality control
sample
unit
storage
analysis system
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JP2021574504A
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English (en)
Japanese (ja)
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JPWO2021153028A1 (https=
JPWO2021153028A5 (https=
Inventor
茂 矢野
健太 今井
秀人 為實
早織 千田
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Hitachi High Tech Corp
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Hitachi High Tech Corp
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Publication of JPWO2021153028A1 publication Critical patent/JPWO2021153028A1/ja
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Priority to JP2024153627A priority Critical patent/JP7760675B2/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00594—Quality control, including calibration or testing of components of the analyser
    • G01N35/00613—Quality control
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00594—Quality control, including calibration or testing of components of the analyser
    • G01N35/00613—Quality control
    • G01N35/00623—Quality control of instruments
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/0092—Scheduling
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04—Details of the conveyor system
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/10—Devices for transferring samples or any liquids to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
    • G01N35/1002—Reagent dispensers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/0092—Scheduling
    • G01N2035/0094—Scheduling optimisation; experiment design
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04—Details of the conveyor system
    • G01N2035/0401—Sample carriers, cuvettes or reaction vessels
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04—Details of the conveyor system
    • G01N2035/046—General conveyor features
    • G01N2035/0462—Buffers [FIFO] or stacks [LIFO] for holding carriers between operations

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  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Quality & Reliability (AREA)
  • Engineering & Computer Science (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
JP2021574504A 2020-01-30 2020-12-10 自動分析システム Active JP7555171B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2024153627A JP7760675B2 (ja) 2020-01-30 2024-09-06 自動分析システム

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020013416 2020-01-30
JP2020013416 2020-01-30
PCT/JP2020/046110 WO2021153028A1 (ja) 2020-01-30 2020-12-10 自動分析システム

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2024153627A Division JP7760675B2 (ja) 2020-01-30 2024-09-06 自動分析システム

Publications (3)

Publication Number Publication Date
JPWO2021153028A1 JPWO2021153028A1 (https=) 2021-08-05
JPWO2021153028A5 JPWO2021153028A5 (https=) 2022-11-07
JP7555171B2 true JP7555171B2 (ja) 2024-09-24

Family

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Family Applications (2)

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JP2021574504A Active JP7555171B2 (ja) 2020-01-30 2020-12-10 自動分析システム
JP2024153627A Active JP7760675B2 (ja) 2020-01-30 2024-09-06 自動分析システム

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2024153627A Active JP7760675B2 (ja) 2020-01-30 2024-09-06 自動分析システム

Country Status (5)

Country Link
US (1) US20230123687A1 (https=)
EP (1) EP4099019A4 (https=)
JP (2) JP7555171B2 (https=)
CN (1) CN114846333A (https=)
WO (1) WO2021153028A1 (https=)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117795345A (zh) * 2021-09-15 2024-03-29 株式会社日立高新技术 自动分析装置和自动分析系统
WO2024053256A1 (ja) * 2022-09-06 2024-03-14 株式会社日立ハイテク 容器保管装置、自動分析システム及び試料容器取り出し方法
JP2024049206A (ja) * 2022-09-28 2024-04-09 アークレイ株式会社 精度管理方法、保持具及び測定装置
WO2024166520A1 (ja) * 2023-02-10 2024-08-15 株式会社日立ハイテク 容器保管装置、容器保管方法および自動分析システム
EP4697026A1 (en) * 2023-04-11 2026-02-18 Hitachi High-Tech Corporation Container storage device, analysis system, and container transfer method
CN121941927A (zh) * 2024-03-21 2026-04-28 株式会社日立高新技术 自动分析系统

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JP2007502412A (ja) 2003-08-11 2007-02-08 デイド・ベーリング・インコーポレイテッド 多段アナライザ・システムにおける自動品質管理プロトコル
JP2008209338A (ja) 2007-02-28 2008-09-11 Hitachi High-Technologies Corp 自動分析装置
JP2008281453A (ja) 2007-05-11 2008-11-20 Hitachi High-Technologies Corp 自動分析システム
JP2009008558A (ja) 2007-06-28 2009-01-15 A & T Corp 分注装置、検体検査システム、分注方法、検体検査方法、分注プログラム、検体検査プログラム
JP2009150859A (ja) 2007-12-25 2009-07-09 Hitachi High-Technologies Corp 自動分析装置および検体処理システム
JP2010121936A (ja) 2008-10-23 2010-06-03 Sysmex Corp 検体処理システム
WO2011093442A1 (ja) 2010-01-28 2011-08-04 株式会社日立ハイテクノロジーズ 自動分析システム
JP2015135282A (ja) 2014-01-17 2015-07-27 株式会社日立ハイテクノロジーズ 自動分析装置
JP2016148571A (ja) 2015-02-12 2016-08-18 日本電子株式会社 自動分析装置及び自動分析方法
JP2020204610A (ja) 2019-06-14 2020-12-24 エフ．ホフマン−ラ ロシュ アーゲーＦ． Ｈｏｆｆｍａｎｎ−Ｌａ Ｒｏｃｈｅ Ａｋｔｉｅｎｇｅｓｅｌｌｓｃｈａｆｔ 診断検査の有効性を判断するために対照試料を供給する方法および実験室システム

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JP2007502412A (ja) 2003-08-11 2007-02-08 デイド・ベーリング・インコーポレイテッド 多段アナライザ・システムにおける自動品質管理プロトコル
JP2008209338A (ja) 2007-02-28 2008-09-11 Hitachi High-Technologies Corp 自動分析装置
JP2008281453A (ja) 2007-05-11 2008-11-20 Hitachi High-Technologies Corp 自動分析システム
JP2009008558A (ja) 2007-06-28 2009-01-15 A & T Corp 分注装置、検体検査システム、分注方法、検体検査方法、分注プログラム、検体検査プログラム
JP2009150859A (ja) 2007-12-25 2009-07-09 Hitachi High-Technologies Corp 自動分析装置および検体処理システム
JP2010121936A (ja) 2008-10-23 2010-06-03 Sysmex Corp 検体処理システム
WO2011093442A1 (ja) 2010-01-28 2011-08-04 株式会社日立ハイテクノロジーズ 自動分析システム
JP2015135282A (ja) 2014-01-17 2015-07-27 株式会社日立ハイテクノロジーズ 自動分析装置
JP2016148571A (ja) 2015-02-12 2016-08-18 日本電子株式会社 自動分析装置及び自動分析方法
JP2020204610A (ja) 2019-06-14 2020-12-24 エフ．ホフマン−ラ ロシュ アーゲーＦ． Ｈｏｆｆｍａｎｎ−Ｌａ Ｒｏｃｈｅ Ａｋｔｉｅｎｇｅｓｅｌｌｓｃｈａｆｔ 診断検査の有効性を判断するために対照試料を供給する方法および実験室システム

Also Published As

Publication number Publication date
EP4099019A1 (en) 2022-12-07
JPWO2021153028A1 (https=) 2021-08-05
EP4099019A4 (en) 2024-03-06
WO2021153028A1 (ja) 2021-08-05
JP7760675B2 (ja) 2025-10-27
JP2024170565A (ja) 2024-12-10
US20230123687A1 (en) 2023-04-20
CN114846333A (zh) 2022-08-02

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