JP6991673B2 - 剥離方法 - Google Patents
剥離方法 Download PDFInfo
- Publication number
- JP6991673B2 JP6991673B2 JP2018033502A JP2018033502A JP6991673B2 JP 6991673 B2 JP6991673 B2 JP 6991673B2 JP 2018033502 A JP2018033502 A JP 2018033502A JP 2018033502 A JP2018033502 A JP 2018033502A JP 6991673 B2 JP6991673 B2 JP 6991673B2
- Authority
- JP
- Japan
- Prior art keywords
- support plate
- substrate
- holding
- peeling
- starting point
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000000034 method Methods 0.000 title claims description 41
- 239000000758 substrate Substances 0.000 claims description 144
- 239000011347 resin Substances 0.000 claims description 21
- 229920005989 resin Polymers 0.000 claims description 21
- 239000012530 fluid Substances 0.000 claims description 19
- 239000002184 metal Substances 0.000 claims description 17
- 238000005507 spraying Methods 0.000 claims description 4
- 230000002745 absorbent Effects 0.000 claims description 2
- 239000002250 absorbent Substances 0.000 claims description 2
- 239000010410 layer Substances 0.000 description 57
- 239000002131 composite material Substances 0.000 description 42
- 230000004048 modification Effects 0.000 description 9
- 238000012986 modification Methods 0.000 description 9
- 238000007789 sealing Methods 0.000 description 7
- 235000012431 wafers Nutrition 0.000 description 6
- 239000000463 material Substances 0.000 description 5
- 239000012790 adhesive layer Substances 0.000 description 4
- 238000002347 injection Methods 0.000 description 4
- 239000007924 injection Substances 0.000 description 4
- 239000011521 glass Substances 0.000 description 3
- 230000002093 peripheral effect Effects 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- CDBYLPFSWZWCQE-UHFFFAOYSA-L Sodium Carbonate Chemical compound [Na+].[Na+].[O-]C([O-])=O CDBYLPFSWZWCQE-UHFFFAOYSA-L 0.000 description 2
- 239000000853 adhesive Substances 0.000 description 2
- 230000001070 adhesive effect Effects 0.000 description 2
- 239000005388 borosilicate glass Substances 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 239000011810 insulating material Substances 0.000 description 2
- 230000001678 irradiating effect Effects 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 239000003566 sealing material Substances 0.000 description 2
- 239000006061 abrasive grain Substances 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 239000011230 binding agent Substances 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 239000008393 encapsulating agent Substances 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- 238000012536 packaging technology Methods 0.000 description 1
- 239000011148 porous material Substances 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6835—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
- H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
- H01L21/7806—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices involving the separation of the active layers from a substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
- H01L21/3043—Making grooves, e.g. cutting
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/36—Removing material
- B23K26/38—Removing material by boring or cutting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
- H01L21/561—Batch processing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
- H01L21/568—Temporary substrate used as encapsulation process aid
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/76—Making of isolation regions between components
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
- H01L21/76838—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the conductors
- H01L21/76841—Barrier, adhesion or liner layers
- H01L21/76853—Barrier, adhesion or liner layers characterized by particular after-treatment steps
- H01L21/76865—Selective removal of parts of the layer
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
- H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2221/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
- H01L2221/67—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
- H01L2221/683—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L2221/68304—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L2221/68327—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support used during dicing or grinding
- H01L2221/68331—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support used during dicing or grinding of passive members, e.g. die mounting substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2221/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
- H01L2221/67—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
- H01L2221/683—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L2221/68304—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L2221/6834—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support used to protect an active side of a device or wafer
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2221/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
- H01L2221/67—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
- H01L2221/683—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L2221/68304—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L2221/68381—Details of chemical or physical process used for separating the auxiliary support from a device or wafer
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2221/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
- H01L2221/67—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
- H01L2221/683—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L2221/68304—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L2221/68381—Details of chemical or physical process used for separating the auxiliary support from a device or wafer
- H01L2221/68386—Separation by peeling
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Power Engineering (AREA)
- Optics & Photonics (AREA)
- Plasma & Fusion (AREA)
- Mechanical Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Laser Beam Processing (AREA)
- Dicing (AREA)
Description
3 支持板(キャリア板)
3a 第1面(表面)
3b 第2面(裏面)
5 剥離層(仮接着層)
7 基板(封止基板)
7a 第1面(表面)
9 デバイスチップ
11 封止材(モールド樹脂層)
13 パッケージデバイス(小片)
2 剥離装置
4 チャックテーブル(第1保持ユニット)
6 枠体
6a 流路
8 保持板
8a 保持面
10 バルブ
12 吸引源
14 ノズル
16 吸引パッド(第2保持ユニット)
16a 保持面
18 切削ユニット
20 スピンドル
22 切削ブレード
24 コレット(ピックアップツール、第2保持ユニット)
24a 保持面
Claims (2)
- 支持板の表面に剥離層を介して設けられた基板を、該支持板から剥離する剥離方法であって、
該支持板と該基板との一方を第1保持ユニットで保持する第1保持工程と、
該支持板と該基板との端部で露出する該剥離層の端部に流体を吹き付け、該基板を該支持板から剥離する際の起点となる起点領域を形成する起点領域形成工程と、
該支持板と該基板との他方を第2保持ユニットで保持する第2保持工程と、
該第1保持ユニットと該第2保持ユニットとを互いに離れる方向に相対的に移動させて該基板を該支持板から剥離する剥離工程と、を含み、
該支持板の端部の該表面側には、該剥離層を構成する金属膜又は樹脂膜の一部が被覆しており、
該起点領域形成工程の前に、該支持板の端部の該表面側を覆う該金属膜又は樹脂膜を切削ブレード又はレーザービームによって除去する除去工程を含むことを特徴とする剥離方法。 - 支持板の表面に剥離層を介して設けられた基板を、複数の小片へと分割した上で、該支持板から剥離する剥離方法であって、
該支持板を第1保持ユニットで保持する第1保持工程と、
該基板に設定された分割予定ラインに沿って該基板側から切削ブレードを切り込ませ、又は該基板に対して吸収性を有する波長のレーザービームを照射して、該基板を該複数の小片に分割する分割工程と、
該小片の端部で露出する該剥離層に流体を吹き付け、該小片を該支持板から剥離する際の起点となる起点領域を形成する起点領域形成工程と、
該小片を第2保持ユニットで保持する第2保持工程と、
該第1保持ユニットと該第2保持ユニットとを互いに離れる方向に相対的に移動させて該小片を該支持板から剥離する剥離工程と、を含むことを特徴とする剥離方法。
Priority Applications (8)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2018033502A JP6991673B2 (ja) | 2018-02-27 | 2018-02-27 | 剥離方法 |
KR1020190007365A KR102670600B1 (ko) | 2018-02-27 | 2019-01-21 | 박리 방법 |
SG10201901152VA SG10201901152VA (en) | 2018-02-27 | 2019-02-11 | Peeling method for peeling off substrate from support plate |
CN201910125779.2A CN110197794B (zh) | 2018-02-27 | 2019-02-20 | 剥离方法 |
US16/281,872 US10998196B2 (en) | 2018-02-27 | 2019-02-21 | Peeling method for peeling off substrate from support plate |
TW108106101A TWI782189B (zh) | 2018-02-27 | 2019-02-22 | 剝離方法 |
DE102019202564.1A DE102019202564B4 (de) | 2018-02-27 | 2019-02-26 | Ablöseverfahren zum Ablösen eines Substrats von einer Trägerplatte |
US17/180,295 US11764066B2 (en) | 2018-02-27 | 2021-02-19 | Peeling method for peeling off substrate from support plate |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2018033502A JP6991673B2 (ja) | 2018-02-27 | 2018-02-27 | 剥離方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2019149470A JP2019149470A (ja) | 2019-09-05 |
JP6991673B2 true JP6991673B2 (ja) | 2022-01-12 |
Family
ID=67550228
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2018033502A Active JP6991673B2 (ja) | 2018-02-27 | 2018-02-27 | 剥離方法 |
Country Status (7)
Country | Link |
---|---|
US (2) | US10998196B2 (ja) |
JP (1) | JP6991673B2 (ja) |
KR (1) | KR102670600B1 (ja) |
CN (1) | CN110197794B (ja) |
DE (1) | DE102019202564B4 (ja) |
SG (1) | SG10201901152VA (ja) |
TW (1) | TWI782189B (ja) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP7025171B2 (ja) * | 2017-10-12 | 2022-02-24 | 株式会社ディスコ | 被加工物の研削方法 |
CN114323827A (zh) * | 2020-09-30 | 2022-04-12 | 中国科学院微电子研究所 | 透射电镜样品的制备方法及装置 |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2015217421A (ja) | 2014-05-19 | 2015-12-07 | 株式会社ディスコ | リフトオフ方法 |
JP2016021464A (ja) | 2014-07-14 | 2016-02-04 | 株式会社ディスコ | リフトオフ方法及び超音波ホーン |
JP2016063057A (ja) | 2014-09-18 | 2016-04-25 | ファスフォードテクノロジ株式会社 | ダイボンダ並びにボンディング方法及びピックアップ装置 |
US20160343601A1 (en) | 2015-05-21 | 2016-11-24 | Tokyo Ohka Kogyo Co., Ltd. | Method of preparing laminate, and method of separating support |
JP2016207801A (ja) | 2015-04-21 | 2016-12-08 | 株式会社ディスコ | リフトオフ方法及び超音波ホーン |
JP2017208453A (ja) | 2016-05-18 | 2017-11-24 | 東京応化工業株式会社 | 封止体の製造方法、及び、積層体 |
Family Cites Families (33)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR0165467B1 (ko) * | 1995-10-31 | 1999-02-01 | 김광호 | 웨이퍼 디본더 및 이를 이용한 웨이퍼 디본딩법 |
FR2752332B1 (fr) * | 1996-08-12 | 1998-09-11 | Commissariat Energie Atomique | Dispositif de decollement de plaquettes et procede de mise en oeuvre de ce dispositif |
SG68035A1 (en) * | 1997-03-27 | 1999-10-19 | Canon Kk | Method and apparatus for separating composite member using fluid |
JP3031904B2 (ja) * | 1998-02-18 | 2000-04-10 | キヤノン株式会社 | 複合部材とその分離方法、及びそれを利用した半導体基体の製造方法 |
TW437078B (en) * | 1998-02-18 | 2001-05-28 | Canon Kk | Composite member, its separation method, and preparation method of semiconductor substrate by utilization thereof |
US6391743B1 (en) * | 1998-09-22 | 2002-05-21 | Canon Kabushiki Kaisha | Method and apparatus for producing photoelectric conversion device |
JP4365920B2 (ja) * | 1999-02-02 | 2009-11-18 | キヤノン株式会社 | 分離方法及び半導体基板の製造方法 |
JP2000223683A (ja) * | 1999-02-02 | 2000-08-11 | Canon Inc | 複合部材及びその分離方法、貼り合わせ基板及びその分離方法、移設層の移設方法、並びにsoi基板の製造方法 |
US6375738B1 (en) * | 1999-03-26 | 2002-04-23 | Canon Kabushiki Kaisha | Process of producing semiconductor article |
JP4708577B2 (ja) * | 2001-01-31 | 2011-06-22 | キヤノン株式会社 | 薄膜半導体装置の製造方法 |
JP4803884B2 (ja) * | 2001-01-31 | 2011-10-26 | キヤノン株式会社 | 薄膜半導体装置の製造方法 |
JP2002353423A (ja) | 2001-05-25 | 2002-12-06 | Canon Inc | 板部材の分離装置及び処理方法 |
TW564471B (en) * | 2001-07-16 | 2003-12-01 | Semiconductor Energy Lab | Semiconductor device and peeling off method and method of manufacturing semiconductor device |
TW558743B (en) * | 2001-08-22 | 2003-10-21 | Semiconductor Energy Lab | Peeling method and method of manufacturing semiconductor device |
FR2850390B1 (fr) * | 2003-01-24 | 2006-07-14 | Soitec Silicon On Insulator | Procede d'elimination d'une zone peripherique de colle lors de la fabrication d'un substrat composite |
JP4838504B2 (ja) | 2004-09-08 | 2011-12-14 | キヤノン株式会社 | 半導体装置の製造方法 |
TWI463580B (zh) * | 2007-06-19 | 2014-12-01 | Renesas Electronics Corp | Manufacturing method of semiconductor integrated circuit device |
JP5122893B2 (ja) * | 2007-09-14 | 2013-01-16 | 株式会社ディスコ | デバイスの製造方法 |
JP2010103416A (ja) | 2008-10-27 | 2010-05-06 | Sumitomo Metal Fine Technology Co Ltd | 半導体ウエハ製造方法 |
US8507322B2 (en) * | 2010-06-24 | 2013-08-13 | Akihiro Chida | Semiconductor substrate and method for manufacturing semiconductor device |
JP5752933B2 (ja) * | 2010-12-17 | 2015-07-22 | 株式会社ディスコ | 光デバイスウエーハの加工方法 |
WO2014003056A1 (ja) * | 2012-06-29 | 2014-01-03 | 日立化成株式会社 | 半導体装置の製造方法 |
KR102029646B1 (ko) * | 2013-01-31 | 2019-11-08 | 삼성전자 주식회사 | 반도체 장치 제조 방법 |
KR101503325B1 (ko) * | 2013-06-27 | 2015-03-18 | 코스텍시스템(주) | 디바이스 웨이퍼와 캐리어 웨이퍼의 디본딩 방법 및 본딩/디본딩 장치 |
JP2015145306A (ja) | 2014-02-04 | 2015-08-13 | 旭硝子株式会社 | 積層体の剥離開始部作成方法及び剥離開始部作成装置並びに電子デバイスの製造方法 |
JP2016063012A (ja) | 2014-09-17 | 2016-04-25 | 株式会社東芝 | 半導体装置の製造方法 |
JP2016127232A (ja) | 2015-01-08 | 2016-07-11 | 株式会社ディスコ | ウェーハの加工方法 |
JP6529321B2 (ja) | 2015-04-14 | 2019-06-12 | 株式会社ディスコ | デバイスパッケージの製造方法 |
US20180233385A1 (en) | 2015-08-11 | 2018-08-16 | Tokyo Ohka Kogyo Co., Ltd. | Support body separating device and support body separating method |
US9337098B1 (en) * | 2015-08-14 | 2016-05-10 | Semiconductor Components Industries, Llc | Semiconductor die back layer separation method |
US9997391B2 (en) * | 2015-10-19 | 2018-06-12 | QROMIS, Inc. | Lift off process for chip scale package solid state devices on engineered substrate |
JP2017103406A (ja) * | 2015-12-04 | 2017-06-08 | 株式会社ディスコ | ウエーハの加工方法 |
JP6695227B2 (ja) * | 2016-07-19 | 2020-05-20 | 東京応化工業株式会社 | 支持体分離装置および支持体分離方法 |
-
2018
- 2018-02-27 JP JP2018033502A patent/JP6991673B2/ja active Active
-
2019
- 2019-01-21 KR KR1020190007365A patent/KR102670600B1/ko active IP Right Grant
- 2019-02-11 SG SG10201901152VA patent/SG10201901152VA/en unknown
- 2019-02-20 CN CN201910125779.2A patent/CN110197794B/zh active Active
- 2019-02-21 US US16/281,872 patent/US10998196B2/en active Active
- 2019-02-22 TW TW108106101A patent/TWI782189B/zh active
- 2019-02-26 DE DE102019202564.1A patent/DE102019202564B4/de active Active
-
2021
- 2021-02-19 US US17/180,295 patent/US11764066B2/en active Active
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2015217421A (ja) | 2014-05-19 | 2015-12-07 | 株式会社ディスコ | リフトオフ方法 |
JP2016021464A (ja) | 2014-07-14 | 2016-02-04 | 株式会社ディスコ | リフトオフ方法及び超音波ホーン |
JP2016063057A (ja) | 2014-09-18 | 2016-04-25 | ファスフォードテクノロジ株式会社 | ダイボンダ並びにボンディング方法及びピックアップ装置 |
JP2016207801A (ja) | 2015-04-21 | 2016-12-08 | 株式会社ディスコ | リフトオフ方法及び超音波ホーン |
US20160343601A1 (en) | 2015-05-21 | 2016-11-24 | Tokyo Ohka Kogyo Co., Ltd. | Method of preparing laminate, and method of separating support |
JP2017208453A (ja) | 2016-05-18 | 2017-11-24 | 東京応化工業株式会社 | 封止体の製造方法、及び、積層体 |
Also Published As
Publication number | Publication date |
---|---|
DE102019202564A1 (de) | 2019-08-29 |
US11764066B2 (en) | 2023-09-19 |
SG10201901152VA (en) | 2019-09-27 |
US20190267245A1 (en) | 2019-08-29 |
CN110197794B (zh) | 2024-02-20 |
TWI782189B (zh) | 2022-11-01 |
TW201936476A (zh) | 2019-09-16 |
KR20190102990A (ko) | 2019-09-04 |
US10998196B2 (en) | 2021-05-04 |
JP2019149470A (ja) | 2019-09-05 |
CN110197794A (zh) | 2019-09-03 |
KR102670600B1 (ko) | 2024-05-29 |
DE102019202564B4 (de) | 2024-03-07 |
US20210175085A1 (en) | 2021-06-10 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP7187112B2 (ja) | キャリア板の除去方法 | |
JP7146354B2 (ja) | キャリア板の除去方法 | |
US11764066B2 (en) | Peeling method for peeling off substrate from support plate | |
JP7511980B2 (ja) | キャリア板の除去方法 | |
JP7262904B2 (ja) | キャリア板の除去方法 | |
TWI831886B (zh) | 裝置晶片的製造方法 | |
TWI845749B (zh) | 載板之除去方法 | |
JP7511979B2 (ja) | キャリア板の除去方法 | |
JP2023018321A (ja) | キャリア板の除去方法 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20201209 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20210927 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20211005 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20211126 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20211207 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20211207 |
|
R150 | Certificate of patent or registration of utility model |
Ref document number: 6991673 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |