JP6985260B2 - ハイブリッド構造を製造するための方法 - Google Patents
ハイブリッド構造を製造するための方法 Download PDFInfo
- Publication number
- JP6985260B2 JP6985260B2 JP2018520188A JP2018520188A JP6985260B2 JP 6985260 B2 JP6985260 B2 JP 6985260B2 JP 2018520188 A JP2018520188 A JP 2018520188A JP 2018520188 A JP2018520188 A JP 2018520188A JP 6985260 B2 JP6985260 B2 JP 6985260B2
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- JP
- Japan
- Prior art keywords
- thickness
- layer
- support substrate
- thinned
- hybrid structure
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N30/00—Piezoelectric or electrostrictive devices
- H10N30/01—Manufacture or treatment
- H10N30/07—Forming of piezoelectric or electrostrictive parts or bodies on an electrical element or another base
- H10N30/072—Forming of piezoelectric or electrostrictive parts or bodies on an electrical element or another base by laminating or bonding of piezoelectric or electrostrictive bodies
- H10N30/073—Forming of piezoelectric or electrostrictive parts or bodies on an electrical element or another base by laminating or bonding of piezoelectric or electrostrictive bodies by fusion of metals or by adhesives
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
- H03H9/02—Details
- H03H9/02535—Details of surface acoustic wave devices
- H03H9/02543—Characteristics of substrate, e.g. cutting angles
- H03H9/02574—Characteristics of substrate, e.g. cutting angles of combined substrates, multilayered substrates, piezoelectrical layers on not-piezoelectrical substrate
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N30/00—Piezoelectric or electrostrictive devices
- H10N30/01—Manufacture or treatment
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N30/00—Piezoelectric or electrostrictive devices
- H10N30/01—Manufacture or treatment
- H10N30/07—Forming of piezoelectric or electrostrictive parts or bodies on an electrical element or another base
- H10N30/072—Forming of piezoelectric or electrostrictive parts or bodies on an electrical element or another base by laminating or bonding of piezoelectric or electrostrictive bodies
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N30/00—Piezoelectric or electrostrictive devices
- H10N30/50—Piezoelectric or electrostrictive devices having a stacked or multilayer structure
- H10N30/508—Piezoelectric or electrostrictive devices having a stacked or multilayer structure adapted for alleviating internal stress, e.g. cracking control layers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N30/00—Piezoelectric or electrostrictive devices
- H10N30/704—Piezoelectric or electrostrictive devices based on piezoelectric or electrostrictive films or coatings
- H10N30/706—Piezoelectric or electrostrictive devices based on piezoelectric or electrostrictive films or coatings characterised by the underlying bases, e.g. substrates
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N30/00—Piezoelectric or electrostrictive devices
- H10N30/80—Constructional details
- H10N30/88—Mounts; Supports; Enclosures; Casings
Landscapes
- Physics & Mathematics (AREA)
- Acoustics & Sound (AREA)
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Surface Acoustic Wave Elements And Circuit Networks Thereof (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2021191041A JP2022043057A (ja) | 2015-10-20 | 2021-11-25 | ハイブリッド構造 |
| JP2023213109A JP7668864B2 (ja) | 2015-10-20 | 2023-12-18 | ハイブリッド構造 |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR1559993 | 2015-10-20 | ||
| FR1559993A FR3042649B1 (fr) | 2015-10-20 | 2015-10-20 | Procede de fabrication d'une structure hybride |
| PCT/FR2016/052674 WO2017068269A1 (fr) | 2015-10-20 | 2016-10-17 | Procédé de fabrication d'une structure hybride |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2021191041A Division JP2022043057A (ja) | 2015-10-20 | 2021-11-25 | ハイブリッド構造 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2018534863A JP2018534863A (ja) | 2018-11-22 |
| JP2018534863A5 JP2018534863A5 (https=) | 2019-11-28 |
| JP6985260B2 true JP6985260B2 (ja) | 2021-12-22 |
Family
ID=54848787
Family Applications (3)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2018520188A Active JP6985260B2 (ja) | 2015-10-20 | 2016-10-17 | ハイブリッド構造を製造するための方法 |
| JP2021191041A Pending JP2022043057A (ja) | 2015-10-20 | 2021-11-25 | ハイブリッド構造 |
| JP2023213109A Active JP7668864B2 (ja) | 2015-10-20 | 2023-12-18 | ハイブリッド構造 |
Family Applications After (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2021191041A Pending JP2022043057A (ja) | 2015-10-20 | 2021-11-25 | ハイブリッド構造 |
| JP2023213109A Active JP7668864B2 (ja) | 2015-10-20 | 2023-12-18 | ハイブリッド構造 |
Country Status (8)
| Country | Link |
|---|---|
| US (3) | US11349065B2 (https=) |
| EP (1) | EP3365929B1 (https=) |
| JP (3) | JP6985260B2 (https=) |
| KR (1) | KR102639433B1 (https=) |
| CN (1) | CN108292699B (https=) |
| FR (1) | FR3042649B1 (https=) |
| SG (1) | SG11201803333RA (https=) |
| WO (1) | WO2017068269A1 (https=) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR3042649B1 (fr) | 2015-10-20 | 2019-06-21 | Soitec | Procede de fabrication d'une structure hybride |
| JP7103528B2 (ja) * | 2019-09-27 | 2022-07-20 | 株式会社村田製作所 | 弾性波装置 |
Family Cites Families (31)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2848116B2 (ja) * | 1992-05-26 | 1999-01-20 | 松下電器産業株式会社 | 水晶素板の加工方法 |
| US5759753A (en) * | 1995-07-19 | 1998-06-02 | Matsushita Electric Industrial Co., Ltd. | Piezoelectric device and method of manufacturing the same |
| FR2816445B1 (fr) * | 2000-11-06 | 2003-07-25 | Commissariat Energie Atomique | Procede de fabrication d'une structure empilee comprenant une couche mince adherant a un substrat cible |
| US20020158947A1 (en) * | 2001-04-27 | 2002-10-31 | Isaku Kanno | Piezoelectric element, method for manufacturing piezoelectric element, and ink jet head and ink jet recording apparatus having piezoelectric element |
| JP2004186868A (ja) | 2002-12-02 | 2004-07-02 | Fujitsu Media Device Kk | 弾性表面波素子、それを有する送信フィルタ及び受信フィルタ、並びにそれらを有するデュプレクサ |
| FR2858461B1 (fr) * | 2003-07-30 | 2005-11-04 | Soitec Silicon On Insulator | Realisation d'une structure comprenant une couche protegeant contre des traitements chimiques |
| US7601271B2 (en) * | 2005-11-28 | 2009-10-13 | S.O.I.Tec Silicon On Insulator Technologies | Process and equipment for bonding by molecular adhesion |
| US20080203137A1 (en) * | 2007-02-28 | 2008-08-28 | International Business Machines Corporation | Substrate bonding methods and system including monitoring |
| FR2926671B1 (fr) * | 2008-01-17 | 2010-04-02 | Soitec Silicon On Insulator | Procede de traitement de defauts lors de collage de plaques |
| JP4821834B2 (ja) | 2008-10-31 | 2011-11-24 | 株式会社村田製作所 | 圧電性複合基板の製造方法 |
| FR2938702B1 (fr) * | 2008-11-19 | 2011-03-04 | Soitec Silicon On Insulator | Preparation de surface d'un substrat saphir pour la realisation d'heterostructures |
| US8644451B2 (en) | 2009-03-27 | 2014-02-04 | Shozo Aoki | X-ray generating apparatus and inspection apparatus using the same therein |
| JP5359615B2 (ja) * | 2009-07-02 | 2013-12-04 | 株式会社村田製作所 | 複合基板の製造方法 |
| FR2949606B1 (fr) * | 2009-08-26 | 2011-10-28 | Commissariat Energie Atomique | Procede de detachement par fracture d'un film mince de silicium mettant en oeuvre une triple implantation |
| CN102652354B (zh) * | 2009-12-15 | 2015-02-18 | 索泰克公司 | 用于重复利用衬底的处理 |
| FR2954585B1 (fr) * | 2009-12-23 | 2012-03-02 | Soitec Silicon Insulator Technologies | Procede de realisation d'une heterostructure avec minimisation de contrainte |
| WO2011139852A2 (en) * | 2010-04-29 | 2011-11-10 | Skyline Solar, Inc. | Thin film coating pinning arrangement |
| CN103262410B (zh) * | 2010-12-24 | 2016-08-10 | 株式会社村田制作所 | 弹性波装置及其制造方法 |
| JP5796316B2 (ja) * | 2011-03-22 | 2015-10-21 | 株式会社村田製作所 | 圧電デバイスの製造方法 |
| CN104365019B (zh) * | 2012-06-13 | 2017-08-25 | 日本碍子株式会社 | 复合基板 |
| KR101636220B1 (ko) * | 2012-07-12 | 2016-07-04 | 엔지케이 인슐레이터 엘티디 | 복합 기판, 압전 디바이스 및 복합 기판의 제법 |
| WO2014027538A1 (ja) * | 2012-08-17 | 2014-02-20 | 日本碍子株式会社 | 複合基板,弾性表面波デバイス及び複合基板の製造方法 |
| WO2014077213A1 (ja) * | 2012-11-14 | 2014-05-22 | 日本碍子株式会社 | 複合基板 |
| JP2014147054A (ja) | 2013-01-30 | 2014-08-14 | Sumitomo Electric Ind Ltd | 圧電基板及び弾性表面波素子 |
| TWI635632B (zh) | 2013-02-19 | 2018-09-11 | 日本碍子股份有限公司 | 複合基板、彈性波裝置及彈性波裝置的製法 |
| CN104272592B (zh) * | 2013-03-27 | 2016-12-07 | 日本碍子株式会社 | 复合基板及弹性波装置 |
| DE112014003430B4 (de) * | 2013-07-25 | 2025-10-16 | Ngk Ceramic Device Co.,Ltd., | Kompositsubstrat und Verfahren zum Herstellen desselben |
| JP2015073082A (ja) * | 2013-09-03 | 2015-04-16 | 住友電気工業株式会社 | 積層体の設計方法 |
| US10103317B2 (en) * | 2015-01-05 | 2018-10-16 | Inston, Inc. | Systems and methods for implementing efficient magnetoelectric junctions |
| FR3042649B1 (fr) * | 2015-10-20 | 2019-06-21 | Soitec | Procede de fabrication d'une structure hybride |
| EP3196952B1 (en) * | 2016-01-21 | 2019-06-19 | AT & S Austria Technologie & Systemtechnik Aktiengesellschaft | Mems piezoelectric transducer formed at a pcb support structure |
-
2015
- 2015-10-20 FR FR1559993A patent/FR3042649B1/fr not_active Expired - Fee Related
-
2016
- 2016-10-17 SG SG11201803333RA patent/SG11201803333RA/en unknown
- 2016-10-17 US US15/769,690 patent/US11349065B2/en active Active
- 2016-10-17 CN CN201680067866.1A patent/CN108292699B/zh active Active
- 2016-10-17 KR KR1020187013180A patent/KR102639433B1/ko active Active
- 2016-10-17 EP EP16795121.9A patent/EP3365929B1/fr active Active
- 2016-10-17 JP JP2018520188A patent/JP6985260B2/ja active Active
- 2016-10-17 WO PCT/FR2016/052674 patent/WO2017068269A1/fr not_active Ceased
-
2021
- 2021-11-25 JP JP2021191041A patent/JP2022043057A/ja active Pending
-
2022
- 2022-05-16 US US17/663,569 patent/US11930710B2/en active Active
-
2023
- 2023-12-18 JP JP2023213109A patent/JP7668864B2/ja active Active
-
2024
- 2024-01-03 US US18/403,485 patent/US12490656B2/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| EP3365929A1 (fr) | 2018-08-29 |
| KR102639433B1 (ko) | 2024-02-23 |
| WO2017068269A1 (fr) | 2017-04-27 |
| US20220278269A1 (en) | 2022-09-01 |
| JP2024022682A (ja) | 2024-02-16 |
| JP2018534863A (ja) | 2018-11-22 |
| CN108292699A (zh) | 2018-07-17 |
| FR3042649B1 (fr) | 2019-06-21 |
| US20180309045A1 (en) | 2018-10-25 |
| FR3042649A1 (fr) | 2017-04-21 |
| US11930710B2 (en) | 2024-03-12 |
| CN108292699B (zh) | 2021-06-29 |
| SG11201803333RA (en) | 2018-05-30 |
| US11349065B2 (en) | 2022-05-31 |
| KR20180074702A (ko) | 2018-07-03 |
| JP2022043057A (ja) | 2022-03-15 |
| JP7668864B2 (ja) | 2025-04-25 |
| US20240147864A1 (en) | 2024-05-02 |
| US12490656B2 (en) | 2025-12-02 |
| EP3365929B1 (fr) | 2019-09-25 |
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