JP6627501B2 - 計測装置、減衰特性算出方法、プログラム、および計測システム - Google Patents

計測装置、減衰特性算出方法、プログラム、および計測システム Download PDF

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JP6627501B2
JP6627501B2 JP2015256335A JP2015256335A JP6627501B2 JP 6627501 B2 JP6627501 B2 JP 6627501B2 JP 2015256335 A JP2015256335 A JP 2015256335A JP 2015256335 A JP2015256335 A JP 2015256335A JP 6627501 B2 JP6627501 B2 JP 6627501B2
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vehicle
floor slab
distance
unit
moving body
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JP2017120208A5 (enExample
JP2017120208A (ja
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祥宏 小林
祥宏 小林
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Seiko Epson Corp
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Seiko Epson Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P3/00—Measuring linear or angular speed; Measuring differences of linear or angular speeds
    • G01P3/64—Devices characterised by the determination of the time taken to traverse a fixed distance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/11—Analysing solids by measuring attenuation of acoustic waves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01H—MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES
    • G01H1/00—Measuring characteristics of vibrations in solids by using direct conduction to the detector
    • G01H1/04—Measuring characteristics of vibrations in solids by using direct conduction to the detector of vibrations which are transverse to direction of propagation
    • G01H1/06—Frequency
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M5/00—Investigating the elasticity of structures, e.g. deflection of bridges or air-craft wings
    • G01M5/0008—Investigating the elasticity of structures, e.g. deflection of bridges or air-craft wings of bridges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M5/00—Investigating the elasticity of structures, e.g. deflection of bridges or air-craft wings
    • G01M5/0066—Investigating the elasticity of structures, e.g. deflection of bridges or air-craft wings by exciting or detecting vibration or acceleration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/12—Analysing solids by measuring frequency or resonance of acoustic waves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/14—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object using acoustic emission techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/36—Detecting the response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/42—Detecting the response signal, e.g. electronic circuits specially adapted therefor by frequency filtering or by tuning to resonant frequency
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/4409—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by comparison
    • G01N29/4418—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by comparison with a model, e.g. best-fit, regression analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/4472—Mathematical theories or simulation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P3/00—Measuring linear or angular speed; Measuring differences of linear or angular speeds
    • G01P3/02—Devices characterised by the use of mechanical means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/01—Indexing codes associated with the measuring variable
    • G01N2291/015—Attenuation, scattering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G01N2291/025—Change of phase or condition
    • G01N2291/0258—Structural degradation, e.g. fatigue of composites, ageing of oils
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G01N2291/028—Material parameters
    • G01N2291/0289—Internal structure, e.g. defects, grain size, texture

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Acoustics & Sound (AREA)
  • Aviation & Aerospace Engineering (AREA)
  • Mathematical Analysis (AREA)
  • Pure & Applied Mathematics (AREA)
  • Mathematical Physics (AREA)
  • Algebra (AREA)
  • Mathematical Optimization (AREA)
  • Measurement Of Mechanical Vibrations Or Ultrasonic Waves (AREA)
JP2015256335A 2015-12-28 2015-12-28 計測装置、減衰特性算出方法、プログラム、および計測システム Active JP6627501B2 (ja)

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JP2015256335A JP6627501B2 (ja) 2015-12-28 2015-12-28 計測装置、減衰特性算出方法、プログラム、および計測システム
US15/381,547 US10768145B2 (en) 2015-12-28 2016-12-16 Measurement apparatus, attenuation characteristic calculation method, program, and measurement system

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JP2015256335A JP6627501B2 (ja) 2015-12-28 2015-12-28 計測装置、減衰特性算出方法、プログラム、および計測システム

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JP2017120208A5 JP2017120208A5 (enExample) 2019-01-24
JP6627501B2 true JP6627501B2 (ja) 2020-01-08

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GB2533817A (en) 2015-01-05 2016-07-06 Bae Systems Plc Mobile bridge module
GB2533818B (en) * 2015-01-05 2021-03-03 Bae Systems Plc Mobile bridge apparatus
JP6604200B2 (ja) 2015-12-28 2019-11-13 セイコーエプソン株式会社 加速度センサー、計測システム、および計測装置
JP6587194B2 (ja) * 2016-02-15 2019-10-09 パナソニックＩｐマネジメント株式会社 応力分布測定方法及び応力分布測定システム
JP2019215203A (ja) * 2018-06-12 2019-12-19 セイコーエプソン株式会社 表示装置、表示方法、プログラム、記録媒体、および構造物監視システム
CN109357822B (zh) * 2018-08-13 2021-06-01 东南大学 一种基于车桥耦合系统时变动力特征改变的桥梁快速测试与评估方法
JP7400566B2 (ja) 2020-03-18 2023-12-19 セイコーエプソン株式会社 計測方法、計測装置、計測システム及び計測プログラム
JP2021147819A (ja) 2020-03-18 2021-09-27 セイコーエプソン株式会社 計測方法、計測装置、計測システム及び計測プログラム
JP7375637B2 (ja) 2020-03-18 2023-11-08 セイコーエプソン株式会社 計測方法、計測装置、計測システム及び計測プログラム
JP7447586B2 (ja) * 2020-03-18 2024-03-12 セイコーエプソン株式会社 計測方法、計測装置、計測システム及び計測プログラム
JP2021148537A (ja) 2020-03-18 2021-09-27 セイコーエプソン株式会社 計測方法、計測装置、計測システム及び計測プログラム
JP7396139B2 (ja) 2020-03-18 2023-12-12 セイコーエプソン株式会社 計測方法、計測装置、計測システム及び計測プログラム
FR3115177B1 (fr) * 2020-10-12 2023-02-24 Sercel Rech Const Elect Système et procédé de génération et de collecte de données vibratoires en vue de la surveillance d’une structure
AT524382B1 (de) * 2020-10-16 2022-07-15 Plasser & Theurer Export Von Bahnbaumaschinen Gmbh Verfahren und System zur Ermittlung einer Erschütterungsübertragung im Bereich eines Gleises
JP7600901B2 (ja) * 2021-06-30 2024-12-17 セイコーエプソン株式会社 計測方法、計測装置、計測システム及び計測プログラム
JP7647396B2 (ja) * 2021-06-30 2025-03-18 セイコーエプソン株式会社 計測方法、計測装置、計測システム及び計測プログラム
JP7643210B2 (ja) * 2021-06-30 2025-03-11 セイコーエプソン株式会社 導出方法、導出装置、導出システム、プログラム
JP7647395B2 (ja) * 2021-06-30 2025-03-18 セイコーエプソン株式会社 計測方法、計測装置、計測システム及び計測プログラム
JP7635654B2 (ja) * 2021-06-30 2025-02-26 セイコーエプソン株式会社 計測方法、計測装置、計測システム及び計測プログラム

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