JP6619014B2 - 検査接触装置 - Google Patents
検査接触装置 Download PDFInfo
- Publication number
- JP6619014B2 JP6619014B2 JP2017540958A JP2017540958A JP6619014B2 JP 6619014 B2 JP6619014 B2 JP 6619014B2 JP 2017540958 A JP2017540958 A JP 2017540958A JP 2017540958 A JP2017540958 A JP 2017540958A JP 6619014 B2 JP6619014 B2 JP 6619014B2
- Authority
- JP
- Japan
- Prior art keywords
- probe
- hole
- guide plate
- intermediate plate
- pin
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07357—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with flexible bodies, e.g. buckling beams
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (7)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2015-0000357 | 2015-01-04 | ||
KR1020150000357A KR20160084014A (ko) | 2015-01-04 | 2015-01-04 | 검사접촉장치 |
KR1020150003880A KR101613810B1 (ko) | 2015-01-11 | 2015-01-11 | 검사접촉장치 |
KR10-2015-0003880 | 2015-01-11 | ||
KR1020150011727A KR101662937B1 (ko) | 2015-01-25 | 2015-01-25 | 공간변형기능을 가진 검사접촉장치 |
KR10-2015-0011727 | 2015-01-25 | ||
PCT/KR2015/014262 WO2016108520A1 (ko) | 2015-01-04 | 2015-12-24 | 검사접촉장치 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2017533446A JP2017533446A (ja) | 2017-11-09 |
JP6619014B2 true JP6619014B2 (ja) | 2019-12-11 |
Family
ID=56284599
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2017540958A Active JP6619014B2 (ja) | 2015-01-04 | 2015-12-24 | 検査接触装置 |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP6619014B2 (ko) |
CN (1) | CN107003335B (ko) |
TW (1) | TWI585416B (ko) |
WO (1) | WO2016108520A1 (ko) |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6855185B2 (ja) * | 2016-07-27 | 2021-04-07 | 株式会社日本マイクロニクス | 電気的接続装置 |
JP2018179721A (ja) * | 2017-04-12 | 2018-11-15 | 株式会社日本マイクロニクス | 電気的接続装置 |
JP7148212B2 (ja) * | 2017-04-27 | 2022-10-05 | 日本電産リード株式会社 | 検査治具、及び基板検査装置 |
TWI620938B (zh) * | 2017-07-21 | 2018-04-11 | 中華精測科技股份有限公司 | 探針裝置 |
CN110568231A (zh) * | 2018-06-06 | 2019-12-13 | 中华精测科技股份有限公司 | 探针卡装置及其立体式信号转接结构 |
TW202006366A (zh) * | 2018-07-04 | 2020-02-01 | 旺矽科技股份有限公司 | 具有線型探針之探針頭 |
IT201800010071A1 (it) * | 2018-11-06 | 2020-05-06 | Technoprobe Spa | Testa di misura a sonde verticali con migliorate proprietà di contatto con un dispositivo di test |
IT201800021253A1 (it) * | 2018-12-27 | 2020-06-27 | Technoprobe Spa | Testa di misura a sonde verticali avente un contatto perfezionato con un dispositivo da testare |
TWI712802B (zh) * | 2020-01-21 | 2020-12-11 | 中華精測科技股份有限公司 | 探針卡裝置及其類頸式探針 |
KR20210121553A (ko) * | 2020-03-30 | 2021-10-08 | (주)포인트엔지니어링 | 프로브 헤드 및 이를 포함하는 프로브 카드 |
CN111351970B (zh) * | 2020-05-08 | 2022-05-10 | 沈阳圣仁电子科技有限公司 | 一种使多个探针具有均匀弹性的垂直探针卡 |
CN113707366B (zh) * | 2020-05-20 | 2024-03-19 | 汉辰科技股份有限公司 | 馈通装置 |
CN113721051B (zh) * | 2020-05-26 | 2023-12-01 | 旺矽科技股份有限公司 | 具有线型探针的探针头 |
JP7516962B2 (ja) | 2020-07-31 | 2024-07-17 | ニデックアドバンステクノロジー株式会社 | 検査治具、及び検査装置 |
JP7477393B2 (ja) * | 2020-08-03 | 2024-05-01 | 株式会社日本マイクロニクス | 検査用接続装置 |
CN113030700B (zh) * | 2021-03-04 | 2022-03-08 | 强一半导体(苏州)有限公司 | 一种晶圆级测试探针卡及晶圆级测试探针卡装配方法 |
EP4261547A1 (en) * | 2022-04-12 | 2023-10-18 | Microtest S.p.A. | Testing head with vertical probes for a probe card and corresponding method of assembly |
Family Cites Families (26)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4837507A (en) * | 1984-06-08 | 1989-06-06 | American Telephone And Telegraph Company At&T Technologies, Inc. | High frequency in-circuit test fixture |
US4622514A (en) * | 1984-06-15 | 1986-11-11 | Ibm | Multiple mode buckling beam probe assembly |
US4963822A (en) * | 1988-06-01 | 1990-10-16 | Manfred Prokopp | Method of testing circuit boards and the like |
DE3909284A1 (de) * | 1989-03-21 | 1990-09-27 | Nixdorf Computer Ag | Steckkontaktanordnung |
JP2972595B2 (ja) * | 1996-09-25 | 1999-11-08 | 日本電気ファクトリエンジニアリング株式会社 | プローブカード |
US5945836A (en) * | 1996-10-29 | 1999-08-31 | Hewlett-Packard Company | Loaded-board, guided-probe test fixture |
ATE260470T1 (de) * | 1997-11-05 | 2004-03-15 | Feinmetall Gmbh | Prüfkopf für mikrostrukturen mit schnittstelle |
JP2002202337A (ja) * | 2001-01-04 | 2002-07-19 | Takashi Nansai | ファインピッチ基板検査用治具 |
JP2004347427A (ja) * | 2003-05-21 | 2004-12-09 | Innotech Corp | プローブカード装置及びその製造方法 |
JP2005055343A (ja) * | 2003-08-06 | 2005-03-03 | Tokyo Cathode Laboratory Co Ltd | フラットパネルディスプレイ検査用プローブ装置 |
JP2005055368A (ja) * | 2003-08-06 | 2005-03-03 | Nidec-Read Corp | 基板検査用治具及びこれを用いた基板検査装置 |
TW200636250A (en) * | 2003-10-13 | 2006-10-16 | Technoprobe Spa | Contact probe for a testing head having vertical probes for semiconductor integrated electronic devices |
CN100343968C (zh) * | 2004-04-09 | 2007-10-17 | 矽统科技股份有限公司 | 测试装置的探测头 |
DE102006005522A1 (de) * | 2006-02-07 | 2007-08-16 | Feinmetall Gmbh | Elektrische Kontaktiervorrichtung sowie elektrisches Kontaktierverfahren |
KR101306654B1 (ko) * | 2006-12-11 | 2013-09-10 | (주) 미코에스앤피 | 프로브 모듈 및 그 제조 방법, 상기 프로브 모듈을 갖는프로브 카드 및 그 제조 방법 |
KR20080100601A (ko) * | 2007-05-14 | 2008-11-19 | 정영석 | 반도체 소자 테스트용 프로브 카드 |
JP4965341B2 (ja) * | 2007-05-31 | 2012-07-04 | 日置電機株式会社 | プローブユニットおよび回路基板検査装置 |
JP5222038B2 (ja) * | 2008-06-20 | 2013-06-26 | 東京エレクトロン株式会社 | プローブ装置 |
JP2010281583A (ja) * | 2009-06-02 | 2010-12-16 | Nidec-Read Corp | 検査用治具 |
JP5323741B2 (ja) * | 2010-02-19 | 2013-10-23 | 日置電機株式会社 | プローブユニットおよび回路基板検査装置 |
JP5530312B2 (ja) * | 2010-09-03 | 2014-06-25 | 株式会社エンプラス | 電気部品用ソケット |
KR101187421B1 (ko) * | 2010-09-27 | 2012-10-02 | 주식회사 알에스에프 | 니들모듈 및 이를 포함하는 프로브카드 |
ITMI20110615A1 (it) * | 2011-04-12 | 2012-10-13 | Technoprobe Spa | Testa di misura per un apparecchiatura di test di dispositivi elettronici |
US8723538B2 (en) * | 2011-06-17 | 2014-05-13 | Taiwan Semiconductor Manufacturing Company, Ltd. | Probe head formation methods employing guide plate raising assembly mechanism |
KR101199016B1 (ko) * | 2011-06-29 | 2012-11-08 | 주식회사 엔아이씨테크 | 엘이디 검사용 프로브 카드 |
KR101299715B1 (ko) * | 2012-06-22 | 2013-08-28 | 디플러스(주) | 양방향 좌굴핀을 이용한 검사용 소켓 |
-
2015
- 2015-12-24 WO PCT/KR2015/014262 patent/WO2016108520A1/ko active Application Filing
- 2015-12-24 JP JP2017540958A patent/JP6619014B2/ja active Active
- 2015-12-24 CN CN201580060261.5A patent/CN107003335B/zh active Active
- 2015-12-31 TW TW104144764A patent/TWI585416B/zh active
Also Published As
Publication number | Publication date |
---|---|
TWI585416B (zh) | 2017-06-01 |
CN107003335B (zh) | 2020-05-22 |
CN107003335A (zh) | 2017-08-01 |
JP2017533446A (ja) | 2017-11-09 |
WO2016108520A1 (ko) | 2016-07-07 |
TW201629498A (zh) | 2016-08-16 |
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