JP6290544B2 - 二酸化珪素フィルムを付着させる方法 - Google Patents
二酸化珪素フィルムを付着させる方法 Download PDFInfo
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- JP6290544B2 JP6290544B2 JP2013092954A JP2013092954A JP6290544B2 JP 6290544 B2 JP6290544 B2 JP 6290544B2 JP 2013092954 A JP2013092954 A JP 2013092954A JP 2013092954 A JP2013092954 A JP 2013092954A JP 6290544 B2 JP6290544 B2 JP 6290544B2
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- deposition
- silicon dioxide
- hydrogen
- film
- dioxide film
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/50—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/63—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the formation processes
- H10P14/6326—Deposition processes
- H10P14/6328—Deposition from the gas or vapour phase
- H10P14/6334—Deposition from the gas or vapour phase using decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition
- H10P14/6336—Deposition from the gas or vapour phase using decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition in the presence of a plasma [PECVD]
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/40—Oxides
- C23C16/401—Oxides containing silicon
- C23C16/402—Silicon dioxide
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/448—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/50—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
- C23C16/505—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/56—After-treatment
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/65—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by treatments performed before or after the formation of the materials
- H10P14/6516—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by treatments performed before or after the formation of the materials of treatments performed after formation of the materials
- H10P14/6529—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by treatments performed before or after the formation of the materials of treatments performed after formation of the materials by exposure to a gas or vapour
- H10P14/6532—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by treatments performed before or after the formation of the materials of treatments performed after formation of the materials by exposure to a gas or vapour by exposure to a plasma
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/69—Inorganic materials
- H10P14/692—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses
- H10P14/6921—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses containing silicon
- H10P14/69215—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses containing silicon the material being a silicon oxide, e.g. SiO2
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Plasma & Fusion (AREA)
- Physics & Mathematics (AREA)
- Inorganic Chemistry (AREA)
- Formation Of Insulating Films (AREA)
- Chemical Vapour Deposition (AREA)
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201261638598P | 2012-04-26 | 2012-04-26 | |
| GBGB1207448.0A GB201207448D0 (en) | 2012-04-26 | 2012-04-26 | Method of depositing silicon dioxide films |
| US61/638,598 | 2012-04-26 | ||
| GB1207448.0 | 2012-04-26 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2013229608A JP2013229608A (ja) | 2013-11-07 |
| JP2013229608A5 JP2013229608A5 (https=) | 2016-05-19 |
| JP6290544B2 true JP6290544B2 (ja) | 2018-03-07 |
Family
ID=46330494
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2013092954A Active JP6290544B2 (ja) | 2012-04-26 | 2013-04-25 | 二酸化珪素フィルムを付着させる方法 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US9165762B2 (https=) |
| EP (1) | EP2657363B1 (https=) |
| JP (1) | JP6290544B2 (https=) |
| KR (1) | KR102221064B1 (https=) |
| CN (1) | CN103540908A (https=) |
| GB (1) | GB201207448D0 (https=) |
| TW (1) | TWI581334B (https=) |
Families Citing this family (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2015146807A1 (ja) * | 2014-03-26 | 2015-10-01 | コニカミノルタ株式会社 | ガスバリア性フィルムの製造方法 |
| JP6183965B2 (ja) * | 2014-03-27 | 2017-08-23 | Sppテクノロジーズ株式会社 | シリコン酸化膜及びその製造方法、並びにシリコン酸化膜の製造装置 |
| US9460915B2 (en) * | 2014-09-12 | 2016-10-04 | Lam Research Corporation | Systems and methods for reducing backside deposition and mitigating thickness changes at substrate edges |
| CN105063576A (zh) * | 2015-08-24 | 2015-11-18 | 沈阳拓荆科技有限公司 | 一种采用teos源的低温镀膜方法 |
| GB201522552D0 (en) * | 2015-12-21 | 2016-02-03 | Spts Technologies Ltd | Method of improving adhesion |
| US10032868B2 (en) * | 2016-09-09 | 2018-07-24 | Texas Instruments Incorporated | High performance super-beta NPN (SBNPN) |
| US10358717B2 (en) * | 2017-04-21 | 2019-07-23 | Lam Research Corporation | Method for depositing high deposition rate, thick tetraethyl orthosilicate film with low compressive stress, high film stability and low shrinkage |
| KR102364476B1 (ko) * | 2020-05-08 | 2022-02-18 | 주식회사 한솔케미칼 | 실리콘 전구체 및 이를 이용한 실리콘 함유 박막의 제조방법 |
| CN112342531A (zh) * | 2020-10-19 | 2021-02-09 | 绍兴同芯成集成电路有限公司 | 一种利用低频射频电浆制备ild绝缘层的晶圆制造工艺 |
| CN113667964B (zh) * | 2021-08-31 | 2023-01-20 | 陛通半导体设备(苏州)有限公司 | Teos膜的制作方法 |
| CN114000123A (zh) * | 2021-11-02 | 2022-02-01 | 浙江光特科技有限公司 | 一种制备SiO2薄膜的方法、芯片及装置 |
| CN115020221A (zh) * | 2022-06-10 | 2022-09-06 | 广东越海集成技术有限公司 | 一种二氧化硅及其低温制备方法 |
| GB202213794D0 (en) * | 2022-09-21 | 2022-11-02 | Spts Technologies Ltd | Deposition of thick layers of silicon dioxide |
| KR102896684B1 (ko) * | 2022-12-16 | 2025-12-09 | 주식회사 원익아이피에스 | 실리콘 산화막 형성 방법 |
| CN116479405A (zh) * | 2023-06-08 | 2023-07-25 | 上海陛通半导体能源科技股份有限公司 | 一种12英寸超高均匀性非晶氧化硅薄膜的化学气相沉积方法 |
| CN116804270B (zh) * | 2023-08-29 | 2023-11-10 | 上海陛通半导体能源科技股份有限公司 | 二氧化硅薄膜的低温沉积方法及器件制备方法 |
| CN117888080A (zh) * | 2024-03-14 | 2024-04-16 | 之江实验室 | 二氧化硅薄膜及其制备方法 |
Family Cites Families (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2684942B2 (ja) | 1992-11-30 | 1997-12-03 | 日本電気株式会社 | 化学気相成長法と化学気相成長装置および多層配線の製造方法 |
| US5382550A (en) * | 1993-08-05 | 1995-01-17 | Micron Semiconductor, Inc. | Method of depositing SiO2 on a semiconductor substrate |
| US6037274A (en) * | 1995-02-17 | 2000-03-14 | Fujitsu Limited | Method for forming insulating film |
| JP4476984B2 (ja) * | 1995-09-08 | 2010-06-09 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
| US6001728A (en) * | 1996-03-15 | 1999-12-14 | Applied Materials, Inc. | Method and apparatus for improving film stability of halogen-doped silicon oxide films |
| US5939831A (en) * | 1996-11-13 | 1999-08-17 | Applied Materials, Inc. | Methods and apparatus for pre-stabilized plasma generation for microwave clean applications |
| US6028014A (en) * | 1997-11-10 | 2000-02-22 | Lsi Logic Corporation | Plasma-enhanced oxide process optimization and material and apparatus therefor |
| JP4101340B2 (ja) * | 1997-12-12 | 2008-06-18 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
| JP3184177B2 (ja) * | 1999-03-26 | 2001-07-09 | キヤノン販売株式会社 | 層間絶縁膜の形成方法、半導体製造装置、及び半導体装置 |
| US6565759B1 (en) * | 1999-08-16 | 2003-05-20 | Vanguard International Semiconductor Corporation | Etching process |
| US6300219B1 (en) * | 1999-08-30 | 2001-10-09 | Micron Technology, Inc. | Method of forming trench isolation regions |
| US7544625B2 (en) * | 2003-01-31 | 2009-06-09 | Sharp Laboratories Of America, Inc. | Silicon oxide thin-films with embedded nanocrystalline silicon |
| US7807225B2 (en) * | 2003-01-31 | 2010-10-05 | Sharp Laboratories Of America, Inc. | High density plasma non-stoichiometric SiOxNy films |
| US6867086B1 (en) | 2003-03-13 | 2005-03-15 | Novellus Systems, Inc. | Multi-step deposition and etch back gap fill process |
| JP2004336019A (ja) * | 2003-04-18 | 2004-11-25 | Advanced Lcd Technologies Development Center Co Ltd | 成膜方法、半導体素子の形成方法、半導体素子、表示装置の形成方法及び表示装置 |
| US7199061B2 (en) * | 2003-04-21 | 2007-04-03 | Applied Materials, Inc. | Pecvd silicon oxide thin film deposition |
| KR100653994B1 (ko) * | 2005-03-14 | 2006-12-05 | 주식회사 하이닉스반도체 | 반도체 소자의 층간절연막 형성방법 |
| US20110318502A1 (en) * | 2009-12-24 | 2011-12-29 | Spp Process Technology Systems Uk Limited | Methods of depositing sio2 films |
| GB0922647D0 (en) * | 2009-12-24 | 2010-02-10 | Aviza Technologies Ltd | Methods of depositing SiO² films |
| TWI448576B (zh) * | 2010-11-17 | 2014-08-11 | Nanmat Technology Co Ltd | 低介電材料及其薄膜之製備方法 |
-
2012
- 2012-04-26 GB GBGB1207448.0A patent/GB201207448D0/en not_active Ceased
-
2013
- 2013-04-24 US US13/869,369 patent/US9165762B2/en active Active
- 2013-04-24 EP EP13165092.1A patent/EP2657363B1/en active Active
- 2013-04-25 JP JP2013092954A patent/JP6290544B2/ja active Active
- 2013-04-25 TW TW102114803A patent/TWI581334B/zh active
- 2013-04-26 CN CN201310150780.3A patent/CN103540908A/zh active Pending
- 2013-04-26 KR KR1020130046872A patent/KR102221064B1/ko active Active
Also Published As
| Publication number | Publication date |
|---|---|
| EP2657363A1 (en) | 2013-10-30 |
| GB201207448D0 (en) | 2012-06-13 |
| TWI581334B (zh) | 2017-05-01 |
| CN103540908A (zh) | 2014-01-29 |
| TW201403714A (zh) | 2014-01-16 |
| KR102221064B1 (ko) | 2021-02-25 |
| US9165762B2 (en) | 2015-10-20 |
| JP2013229608A (ja) | 2013-11-07 |
| KR20130121061A (ko) | 2013-11-05 |
| EP2657363B1 (en) | 2019-02-20 |
| US20130288486A1 (en) | 2013-10-31 |
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|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |