JP6278605B2 - 位置測定装置とこのような位置測定装置を備えた構造体 - Google Patents

位置測定装置とこのような位置測定装置を備えた構造体 Download PDF

Info

Publication number
JP6278605B2
JP6278605B2 JP2013056864A JP2013056864A JP6278605B2 JP 6278605 B2 JP6278605 B2 JP 6278605B2 JP 2013056864 A JP2013056864 A JP 2013056864A JP 2013056864 A JP2013056864 A JP 2013056864A JP 6278605 B2 JP6278605 B2 JP 6278605B2
Authority
JP
Japan
Prior art keywords
measurement
measuring device
position measuring
reflector
along
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2013056864A
Other languages
English (en)
Japanese (ja)
Other versions
JP2013195432A (ja
JP2013195432A5 (https=
Inventor
ヴォルフガング・ホルツアプフェル
イェルク・ドレシャー
マルクス・マイスナー
ラルフ・イェルガー
ベルンハルト・ムシュ
トーマス・ケルベラー
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dr Johannes Heidenhain GmbH
Original Assignee
Dr Johannes Heidenhain GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dr Johannes Heidenhain GmbH filed Critical Dr Johannes Heidenhain GmbH
Publication of JP2013195432A publication Critical patent/JP2013195432A/ja
Publication of JP2013195432A5 publication Critical patent/JP2013195432A5/ja
Application granted granted Critical
Publication of JP6278605B2 publication Critical patent/JP6278605B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/14Measuring arrangements characterised by the use of optical techniques for measuring distance or clearance between spaced objects or spaced apertures
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01SRADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/02Systems using the reflection of electromagnetic waves other than radio waves
    • G01S17/06Systems determining position data of a target
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01DMEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G01D5/26Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light
    • G01D5/32Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light
    • G01D5/34Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells
    • G01D5/347Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells using displacement encoding scales
    • G01D5/34746Linear encoders
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/26Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26Testing of individual semiconductor devices
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P74/00Testing or measuring during manufacture or treatment of wafers, substrates or devices
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01DMEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D2205/00Indexing scheme relating to details of means for transferring or converting the output of a sensing member
    • G01D2205/90Two-dimensional encoders, i.e. having one or two codes extending in two directions
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01DMEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G01D5/26Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light
    • G01D5/32Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light
    • G01D5/34Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells
    • G01D5/347Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells using displacement encoding scales
    • G01D5/34707Scales; Discs, e.g. fixation, fabrication, compensation
    • G01D5/34715Scale reading or illumination devices

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Optical Transform (AREA)
JP2013056864A 2012-03-22 2013-03-19 位置測定装置とこのような位置測定装置を備えた構造体 Active JP6278605B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102012204572A DE102012204572A1 (de) 2012-03-22 2012-03-22 Positionsmesseinrichtung und Anordnung mit einer derartigen Positionsmesseinrichtung
DE102012204572.4 2012-03-22

Publications (3)

Publication Number Publication Date
JP2013195432A JP2013195432A (ja) 2013-09-30
JP2013195432A5 JP2013195432A5 (https=) 2016-01-07
JP6278605B2 true JP6278605B2 (ja) 2018-02-14

Family

ID=47827024

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2013056864A Active JP6278605B2 (ja) 2012-03-22 2013-03-19 位置測定装置とこのような位置測定装置を備えた構造体

Country Status (6)

Country Link
US (1) US9389065B2 (https=)
EP (1) EP2642254B1 (https=)
JP (1) JP6278605B2 (https=)
KR (1) KR101864770B1 (https=)
CN (1) CN103322910B (https=)
DE (1) DE102012204572A1 (https=)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9389315B2 (en) 2012-12-19 2016-07-12 Basf Se Detector comprising a transversal optical sensor for detecting a transversal position of a light beam from an object and a longitudinal optical sensor sensing a beam cross-section of the light beam in a sensor region
AU2014280332B2 (en) 2013-06-13 2017-09-07 Basf Se Detector for optically detecting at least one object
US10353049B2 (en) 2013-06-13 2019-07-16 Basf Se Detector for optically detecting an orientation of at least one object
JP6483127B2 (ja) 2013-08-19 2019-03-13 ビーエーエスエフ ソシエタス・ヨーロピアBasf Se 少なくとも1つの対象物の位置を求めるための検出器
AU2014310703B2 (en) 2013-08-19 2018-09-27 Basf Se Optical detector
WO2016005893A1 (en) 2014-07-08 2016-01-14 Basf Se Detector for determining a position of at least one object
KR102452393B1 (ko) * 2014-09-29 2022-10-11 바스프 에스이 적어도 하나의 물체의 포지션을 광학적으로 결정하기 위한 방법 및 검출기 및 이를 이용한 휴먼 머신 인터페이스, 엔터테인먼트 장치, 추적 시스템, 스캐닝 시스템, 입체 시스템 및 카메라
US11125880B2 (en) 2014-12-09 2021-09-21 Basf Se Optical detector
EP3251152B1 (en) 2015-01-30 2023-08-16 Trinamix GmbH Detector for an optical detection of at least one object
WO2017012986A1 (en) 2015-07-17 2017-01-26 Trinamix Gmbh Detector for optically detecting at least one object
JP6755316B2 (ja) 2015-09-14 2020-09-16 トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング 少なくとも1つの物体の少なくとも1つの画像を記録するカメラ
KR102492134B1 (ko) 2016-07-29 2023-01-27 트리나미엑스 게엠베하 광학 센서 및 광학적 검출용 검출기
US11428787B2 (en) 2016-10-25 2022-08-30 Trinamix Gmbh Detector for an optical detection of at least one object
JP2019532517A (ja) 2016-10-25 2019-11-07 トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング 光学的に検出するための光検出器
US11860292B2 (en) 2016-11-17 2024-01-02 Trinamix Gmbh Detector and methods for authenticating at least one object
EP3542179B1 (en) 2016-11-17 2021-03-24 trinamiX GmbH Detector for optically detecting at least one object
JP7204667B2 (ja) 2017-04-20 2023-01-16 トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング 光検出器
JP7237024B2 (ja) 2017-06-26 2023-03-10 トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング 少なくとも1つの物体の位置を決定するための検出器
JP7141313B2 (ja) * 2018-11-06 2022-09-22 Dmg森精機株式会社 変位検出装置
CN111721210B (zh) * 2020-06-19 2021-11-12 深圳市汉森软件有限公司 变换逻辑光栅分辨率后的初始化方法、装置、设备及介质

Family Cites Families (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08247790A (ja) * 1995-03-10 1996-09-27 Sefuto Kenkyusho:Kk 位置検出装置
DE19633337A1 (de) * 1996-08-07 1998-02-12 Harry Prof Dr Ing Trumpold Positionsmeßsystem
JP4576014B2 (ja) * 1999-12-21 2010-11-04 オリンパス株式会社 光学式エンコーダー
CN1248058C (zh) * 2000-09-14 2006-03-29 约翰尼斯海登海恩博士股份有限公司 位置测量装置
US7102729B2 (en) * 2004-02-03 2006-09-05 Asml Netherlands B.V. Lithographic apparatus, measurement system, and device manufacturing method
DE102005029917A1 (de) * 2005-06-28 2007-01-04 Dr. Johannes Heidenhain Gmbh Positionsmesseinrichtung
US7821626B2 (en) * 2005-09-21 2010-10-26 Panasonic Corporation Angle measuring device and method
JP4932284B2 (ja) * 2006-03-03 2012-05-16 株式会社ミツトヨ 光電式エンコーダ
JP4601006B2 (ja) 2006-09-29 2010-12-22 本田技研工業株式会社 エアクリーナ装置
JP2008108906A (ja) * 2006-10-25 2008-05-08 Canon Inc 位置決め装置
DE102007035345A1 (de) * 2006-11-20 2008-05-21 Dr. Johannes Heidenhain Gmbh Positionsmesseinrichtung
JP5147368B2 (ja) * 2006-11-20 2013-02-20 ドクトル・ヨハネス・ハイデンハイン・ゲゼルシヤフト・ミツト・ベシユレンクテル・ハフツング エンコーダ
DE102008008873A1 (de) * 2007-05-16 2008-11-20 Dr. Johannes Heidenhain Gmbh Positionsmesseinrichtung
US7804579B2 (en) * 2007-06-21 2010-09-28 Asml Netherlands B.V. Control system, lithographic projection apparatus, method of controlling a support structure, and a computer program product
US8174671B2 (en) * 2007-06-21 2012-05-08 Asml Netherlands B.V. Lithographic projection apparatus and method for controlling a support structure
WO2009098891A1 (ja) * 2008-02-08 2009-08-13 Nikon Corporation 位置計測システム及び位置計測方法、移動体装置、移動体駆動方法、露光装置及び露光方法、パターン形成装置、並びにデバイス製造方法
KR20100041024A (ko) * 2008-10-13 2010-04-22 한국표준과학연구원 2차원 회절 격자를 이용한 6 자유도 측정 장치
JP4283878B2 (ja) 2008-10-24 2009-06-24 キヤノンアネルバ株式会社 マグネトロンスパッタリング装置
JP2010205867A (ja) * 2009-03-03 2010-09-16 Canon Inc 位置検出装置及び露光装置
KR101078781B1 (ko) * 2010-02-01 2011-11-01 주식회사 고영테크놀러지 3차원 형상 검사방법
JP5814339B2 (ja) * 2010-03-30 2015-11-17 ザイゴ コーポレーションZygo Corporation 干渉計エンコーダ・システム
JP5656467B2 (ja) * 2010-06-17 2015-01-21 Dmg森精機株式会社 位置検出装置
JP5754971B2 (ja) * 2011-02-14 2015-07-29 キヤノン株式会社 形状測定装置及び形状測定方法
DE102012201393A1 (de) 2012-02-01 2013-08-01 Dr. Johannes Heidenhain Gmbh Positionsmesseinrichtung und Anordnung mit mehreren Positionsmesseinrichtungen

Also Published As

Publication number Publication date
CN103322910A (zh) 2013-09-25
JP2013195432A (ja) 2013-09-30
DE102012204572A1 (de) 2013-09-26
US9389065B2 (en) 2016-07-12
EP2642254B1 (de) 2015-11-25
EP2642254A2 (de) 2013-09-25
CN103322910B (zh) 2017-10-27
KR20130108121A (ko) 2013-10-02
EP2642254A3 (de) 2015-04-15
US20130235390A1 (en) 2013-09-12
KR101864770B1 (ko) 2018-06-05

Similar Documents

Publication Publication Date Title
JP6278605B2 (ja) 位置測定装置とこのような位置測定装置を備えた構造体
TWI784265B (zh) 位移測量裝置、位移測量方法及光刻設備
JP5079874B2 (ja) 位置測定装置
JP5628048B2 (ja) 位置決定用測定装置のxyテーブル
KR101959341B1 (ko) 위치 측정 장치와 복수의 위치 측정 장치를 구비하는 시스템
JP2010281635A (ja) 力覚センサ
JP6329456B2 (ja) 光学式位置測定装置
CN103309177A (zh) 一种光刻机工件台系统
KR102221482B1 (ko) 워크피스에 대하여 도구의 위치를 결정하는 장치
US20140009580A1 (en) Three-dimensional measurement system
CN107017179B (zh) 具有位置测量装置的x-y工作台
CN103246172B (zh) 具有位置测量装置的多个扫描单元的装置
US9291481B2 (en) Optical position-measuring device
CN108180844A (zh) 一种基于双频激光干涉原理的多自由度精确位移监测系统
JP2022135679A5 (https=)
JP2018185272A (ja) スケール装置および二軸変位検出装置
JP2022521573A (ja) ステージシステム及びリソグラフィ装置
EP2754992A1 (en) Optical profilometer
JP2006010645A (ja) 検出装置及びステージ装置
JP2011145150A (ja) 光学式エンコーダの設計方法
JP4978597B2 (ja) 移動ステージ装置
JP5135183B2 (ja) 三次元形状測定装置
CN115248533A (zh) 运动台系统及光刻设备

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20151111

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20151111

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20160928

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20161005

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20170524

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20171220

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20180116

R150 Certificate of patent or registration of utility model

Ref document number: 6278605

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250