DE102012204572A1 - Positionsmesseinrichtung und Anordnung mit einer derartigen Positionsmesseinrichtung - Google Patents
Positionsmesseinrichtung und Anordnung mit einer derartigen Positionsmesseinrichtung Download PDFInfo
- Publication number
- DE102012204572A1 DE102012204572A1 DE102012204572A DE102012204572A DE102012204572A1 DE 102012204572 A1 DE102012204572 A1 DE 102012204572A1 DE 102012204572 A DE102012204572 A DE 102012204572A DE 102012204572 A DE102012204572 A DE 102012204572A DE 102012204572 A1 DE102012204572 A1 DE 102012204572A1
- Authority
- DE
- Germany
- Prior art keywords
- measuring
- measuring device
- along
- track
- movement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/14—Measuring arrangements characterised by the use of optical techniques for measuring distance or clearance between spaced objects or spaced apertures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
- G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
- G01S17/06—Systems determining position data of a target
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
- G01D5/26—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light
- G01D5/32—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light
- G01D5/34—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells
- G01D5/347—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells using displacement encoding scales
- G01D5/34746—Linear encoders
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P74/00—Testing or measuring during manufacture or treatment of wafers, substrates or devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D2205/00—Indexing scheme relating to details of means for transferring or converting the output of a sensing member
- G01D2205/90—Two-dimensional encoders, i.e. having one or two codes extending in two directions
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
- G01D5/26—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light
- G01D5/32—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light
- G01D5/34—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells
- G01D5/347—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells using displacement encoding scales
- G01D5/34707—Scales; Discs, e.g. fixation, fabrication, compensation
- G01D5/34715—Scale reading or illumination devices
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Engineering & Computer Science (AREA)
- Computer Networks & Wireless Communication (AREA)
- Radar, Positioning & Navigation (AREA)
- Remote Sensing (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Optical Transform (AREA)
Priority Applications (6)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE102012204572A DE102012204572A1 (de) | 2012-03-22 | 2012-03-22 | Positionsmesseinrichtung und Anordnung mit einer derartigen Positionsmesseinrichtung |
| EP13157956.7A EP2642254B1 (de) | 2012-03-22 | 2013-03-06 | Anordnung mit einer ersten und einer zweiten Positionsmesseinrichtung |
| KR1020130025270A KR101864770B1 (ko) | 2012-03-22 | 2013-03-08 | 위치 측정 장치 및 이러한 위치 측정 장치를 포함하는 시스템 |
| US13/845,988 US9389065B2 (en) | 2012-03-22 | 2013-03-18 | Position-measuring device and system having such a position-measuring device |
| JP2013056864A JP6278605B2 (ja) | 2012-03-22 | 2013-03-19 | 位置測定装置とこのような位置測定装置を備えた構造体 |
| CN201310093649.8A CN103322910B (zh) | 2012-03-22 | 2013-03-22 | 位置测量设备和具有这种位置测量设备的装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE102012204572A DE102012204572A1 (de) | 2012-03-22 | 2012-03-22 | Positionsmesseinrichtung und Anordnung mit einer derartigen Positionsmesseinrichtung |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE102012204572A1 true DE102012204572A1 (de) | 2013-09-26 |
Family
ID=47827024
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE102012204572A Withdrawn DE102012204572A1 (de) | 2012-03-22 | 2012-03-22 | Positionsmesseinrichtung und Anordnung mit einer derartigen Positionsmesseinrichtung |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US9389065B2 (https=) |
| EP (1) | EP2642254B1 (https=) |
| JP (1) | JP6278605B2 (https=) |
| KR (1) | KR101864770B1 (https=) |
| CN (1) | CN103322910B (https=) |
| DE (1) | DE102012204572A1 (https=) |
Families Citing this family (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9389315B2 (en) | 2012-12-19 | 2016-07-12 | Basf Se | Detector comprising a transversal optical sensor for detecting a transversal position of a light beam from an object and a longitudinal optical sensor sensing a beam cross-section of the light beam in a sensor region |
| EP3008485A1 (en) | 2013-06-13 | 2016-04-20 | Basf Se | Detector for optically detecting at least one object |
| EP3008421A1 (en) | 2013-06-13 | 2016-04-20 | Basf Se | Detector for optically detecting an orientation of at least one object |
| WO2015024870A1 (en) | 2013-08-19 | 2015-02-26 | Basf Se | Detector for determining a position of at least one object |
| EP3036503B1 (en) | 2013-08-19 | 2019-08-07 | Basf Se | Optical detector |
| CN106662636B (zh) | 2014-07-08 | 2020-12-25 | 巴斯夫欧洲公司 | 用于确定至少一个对象的位置的检测器 |
| WO2016051323A1 (en) * | 2014-09-29 | 2016-04-07 | Basf Se | Detector for optically determining a position of at least one object |
| US11125880B2 (en) | 2014-12-09 | 2021-09-21 | Basf Se | Optical detector |
| JP6841769B2 (ja) | 2015-01-30 | 2021-03-10 | トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング | 少なくとも1個の物体を光学的に検出する検出器 |
| EP3325917B1 (en) | 2015-07-17 | 2020-02-26 | trinamiX GmbH | Detector for optically detecting at least one object |
| KR102539263B1 (ko) | 2015-09-14 | 2023-06-05 | 트리나미엑스 게엠베하 | 적어도 하나의 물체의 적어도 하나의 이미지를 기록하는 카메라 |
| JP2019523562A (ja) | 2016-07-29 | 2019-08-22 | トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング | 光学的検出のための光センサおよび検出器 |
| EP3532864B1 (en) | 2016-10-25 | 2024-08-28 | trinamiX GmbH | Detector for an optical detection of at least one object |
| CN109923372B (zh) | 2016-10-25 | 2021-12-21 | 特里纳米克斯股份有限公司 | 采用集成滤波器的红外光学检测器 |
| US11860292B2 (en) | 2016-11-17 | 2024-01-02 | Trinamix Gmbh | Detector and methods for authenticating at least one object |
| CN109964144B (zh) | 2016-11-17 | 2023-07-18 | 特里纳米克斯股份有限公司 | 用于光学探测至少一个对象的检测器 |
| CN110770555A (zh) | 2017-04-20 | 2020-02-07 | 特里纳米克斯股份有限公司 | 光学检测器 |
| EP3645965B1 (en) | 2017-06-26 | 2022-04-27 | trinamiX GmbH | Detector for determining a position of at least one object |
| JP7141313B2 (ja) * | 2018-11-06 | 2022-09-22 | Dmg森精機株式会社 | 変位検出装置 |
| CN111721210B (zh) * | 2020-06-19 | 2021-11-12 | 深圳市汉森软件有限公司 | 变换逻辑光栅分辨率后的初始化方法、装置、设备及介质 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102012201393A1 (de) | 2012-02-01 | 2013-08-01 | Dr. Johannes Heidenhain Gmbh | Positionsmesseinrichtung und Anordnung mit mehreren Positionsmesseinrichtungen |
Family Cites Families (23)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH08247790A (ja) * | 1995-03-10 | 1996-09-27 | Sefuto Kenkyusho:Kk | 位置検出装置 |
| DE19633337A1 (de) * | 1996-08-07 | 1998-02-12 | Harry Prof Dr Ing Trumpold | Positionsmeßsystem |
| JP4576014B2 (ja) * | 1999-12-21 | 2010-11-04 | オリンパス株式会社 | 光学式エンコーダー |
| EP1319170B1 (de) * | 2000-09-14 | 2005-03-09 | Dr. Johannes Heidenhain GmbH | Positionsmesseinrichtung |
| US7102729B2 (en) * | 2004-02-03 | 2006-09-05 | Asml Netherlands B.V. | Lithographic apparatus, measurement system, and device manufacturing method |
| DE102005029917A1 (de) * | 2005-06-28 | 2007-01-04 | Dr. Johannes Heidenhain Gmbh | Positionsmesseinrichtung |
| US7821626B2 (en) * | 2005-09-21 | 2010-10-26 | Panasonic Corporation | Angle measuring device and method |
| JP4932284B2 (ja) * | 2006-03-03 | 2012-05-16 | 株式会社ミツトヨ | 光電式エンコーダ |
| JP4601006B2 (ja) * | 2006-09-29 | 2010-12-22 | 本田技研工業株式会社 | エアクリーナ装置 |
| JP2008108906A (ja) * | 2006-10-25 | 2008-05-08 | Canon Inc | 位置決め装置 |
| DE102007035345A1 (de) | 2006-11-20 | 2008-05-21 | Dr. Johannes Heidenhain Gmbh | Positionsmesseinrichtung |
| US7858922B2 (en) * | 2006-11-20 | 2010-12-28 | Dr. Johannes Heidenhain Gmbh | Position-measuring device |
| DE102008008873A1 (de) * | 2007-05-16 | 2008-11-20 | Dr. Johannes Heidenhain Gmbh | Positionsmesseinrichtung |
| US8174671B2 (en) * | 2007-06-21 | 2012-05-08 | Asml Netherlands B.V. | Lithographic projection apparatus and method for controlling a support structure |
| US7804579B2 (en) * | 2007-06-21 | 2010-09-28 | Asml Netherlands B.V. | Control system, lithographic projection apparatus, method of controlling a support structure, and a computer program product |
| WO2009098891A1 (ja) * | 2008-02-08 | 2009-08-13 | Nikon Corporation | 位置計測システム及び位置計測方法、移動体装置、移動体駆動方法、露光装置及び露光方法、パターン形成装置、並びにデバイス製造方法 |
| KR20100041024A (ko) * | 2008-10-13 | 2010-04-22 | 한국표준과학연구원 | 2차원 회절 격자를 이용한 6 자유도 측정 장치 |
| JP4283878B2 (ja) * | 2008-10-24 | 2009-06-24 | キヤノンアネルバ株式会社 | マグネトロンスパッタリング装置 |
| JP2010205867A (ja) * | 2009-03-03 | 2010-09-16 | Canon Inc | 位置検出装置及び露光装置 |
| KR101078781B1 (ko) * | 2010-02-01 | 2011-11-01 | 주식회사 고영테크놀러지 | 3차원 형상 검사방법 |
| EP2553401B1 (en) * | 2010-03-30 | 2015-09-02 | Zygo Corporation | Interferometric encoder systems |
| JP5656467B2 (ja) * | 2010-06-17 | 2015-01-21 | Dmg森精機株式会社 | 位置検出装置 |
| JP5754971B2 (ja) * | 2011-02-14 | 2015-07-29 | キヤノン株式会社 | 形状測定装置及び形状測定方法 |
-
2012
- 2012-03-22 DE DE102012204572A patent/DE102012204572A1/de not_active Withdrawn
-
2013
- 2013-03-06 EP EP13157956.7A patent/EP2642254B1/de active Active
- 2013-03-08 KR KR1020130025270A patent/KR101864770B1/ko active Active
- 2013-03-18 US US13/845,988 patent/US9389065B2/en active Active
- 2013-03-19 JP JP2013056864A patent/JP6278605B2/ja active Active
- 2013-03-22 CN CN201310093649.8A patent/CN103322910B/zh active Active
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102012201393A1 (de) | 2012-02-01 | 2013-08-01 | Dr. Johannes Heidenhain Gmbh | Positionsmesseinrichtung und Anordnung mit mehreren Positionsmesseinrichtungen |
Non-Patent Citations (1)
| Title |
|---|
| "Exact wavefront reconstruction from two lateral shearing interferograms", C. Elster, I. Weingärtner in Vol. 16, No. 9, Sept 1999, J. Opt. Soc. Am. A, 2281-2285 |
Also Published As
| Publication number | Publication date |
|---|---|
| KR20130108121A (ko) | 2013-10-02 |
| US9389065B2 (en) | 2016-07-12 |
| US20130235390A1 (en) | 2013-09-12 |
| KR101864770B1 (ko) | 2018-06-05 |
| EP2642254A2 (de) | 2013-09-25 |
| EP2642254B1 (de) | 2015-11-25 |
| JP6278605B2 (ja) | 2018-02-14 |
| CN103322910B (zh) | 2017-10-27 |
| CN103322910A (zh) | 2013-09-25 |
| EP2642254A3 (de) | 2015-04-15 |
| JP2013195432A (ja) | 2013-09-30 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| EP2642254B1 (de) | Anordnung mit einer ersten und einer zweiten Positionsmesseinrichtung | |
| EP2623937B1 (de) | Positionsmesseinrichtung und Anordnung mit mehreren Positionsmesseinrichtungen | |
| EP2660566B1 (de) | Optische Positionsmesseinrichtung zur Erfassung der Position zweier zueinander beweglicher Teile in zwei Bewegungsrichtungen | |
| EP2450672B1 (de) | Optische Winkelmesseinrichtung | |
| EP3175949B1 (de) | Werkzeugmaschine | |
| EP2857802B1 (de) | Optische Positionsmesseinrichtung | |
| EP2450673B1 (de) | Optische Positionsmesseinrichtung | |
| DE102011011065B4 (de) | Verfahren und Vorrichtung zur hochpräzisen Vermessung von Oberflächen | |
| EP2848899B1 (de) | Optische Positionsmesseinrichtung | |
| DE10214490A1 (de) | Verfahren zur Bestimmung und Korrektur von Führungsfehlern bei einem Koordinatenmeßgerät | |
| EP2857901B1 (de) | Anordnung zur Positionierung eines Werkzeugs relativ zu einem Werkstück | |
| DE102009028068A1 (de) | Positionsmessvorrichtung | |
| DE102015203188A1 (de) | Optische Positionsmesseinrichtung | |
| EP2746731B1 (de) | Optische Positionsmesseinrichtung | |
| DE102013201484A1 (de) | Anordnung mit mehreren Abtasteinheiten einer Positionsmesseinrichtung | |
| EP3869161B1 (de) | Optische positionsmesseinrichtung | |
| DE102014215633A1 (de) | Positionsmesseinrichtung | |
| DE102016206144A1 (de) | Positionsmessanordnung und Verfahren zum Betrieb einer Positionsmessanordnung | |
| DE102019134939B4 (de) | Vorrichtung und Verfahren zur Erfassung einer Lage eines Körpers sowie Koordinatenmessgerät | |
| DE19828815A1 (de) | Laserinterferometer zur zweiachsigen Positionsmessung von bewegten Maschinenkomponenten | |
| DE102008043540A1 (de) | Optische Positionsmesseinrichtung | |
| DE102021201986A1 (de) | Optoelektronische Vorrichtung zur Verfolgung eines Retroreflektors und Verfahren zum Betrieb einer derartigen Vorrichtung | |
| DE19822129A1 (de) | Anordnung und Meßverfahren zur Fluchtung höchster Präzision mit zweidimensionalen optischen Symmetrierelementen | |
| DE102012021935A1 (de) | Optische Positionsmesseinrichtung |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| R119 | Application deemed withdrawn, or ip right lapsed, due to non-payment of renewal fee |