JP6242185B2 - 補正情報生成方法および補正情報生成装置 - Google Patents

補正情報生成方法および補正情報生成装置 Download PDF

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Publication number
JP6242185B2
JP6242185B2 JP2013242291A JP2013242291A JP6242185B2 JP 6242185 B2 JP6242185 B2 JP 6242185B2 JP 2013242291 A JP2013242291 A JP 2013242291A JP 2013242291 A JP2013242291 A JP 2013242291A JP 6242185 B2 JP6242185 B2 JP 6242185B2
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ray
detector
correction information
information generation
correction
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JP2015102397A5 (enExample
JP2015102397A (ja
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拓人 作村
拓人 作村
保一 中江
保一 中江
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Rigaku Corp
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Rigaku Corp
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Priority to JP2013242291A priority Critical patent/JP6242185B2/ja
Priority to US14/523,226 priority patent/US9341583B2/en
Priority to GB1419200.9A priority patent/GB2521734B/en
Priority to DE102014223692.4A priority patent/DE102014223692A1/de
Priority to CN201410675937.9A priority patent/CN104656120B/zh
Publication of JP2015102397A publication Critical patent/JP2015102397A/ja
Publication of JP2015102397A5 publication Critical patent/JP2015102397A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/303—Accessories, mechanical or electrical features calibrating, standardising

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  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Theoretical Computer Science (AREA)
  • Engineering & Computer Science (AREA)
  • Pulmonology (AREA)
  • Radiology & Medical Imaging (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Measurement Of Radiation (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
JP2013242291A 2013-11-22 2013-11-22 補正情報生成方法および補正情報生成装置 Active JP6242185B2 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2013242291A JP6242185B2 (ja) 2013-11-22 2013-11-22 補正情報生成方法および補正情報生成装置
US14/523,226 US9341583B2 (en) 2013-11-22 2014-10-24 Correction information generation method and correction information generation apparatus
GB1419200.9A GB2521734B (en) 2013-11-22 2014-10-29 Correction information generation method and correction information generation apparatus
DE102014223692.4A DE102014223692A1 (de) 2013-11-22 2014-11-20 Korrekturinformationserzeugungsverfahren und Korrekturinformationserzeugungsvorrichtung
CN201410675937.9A CN104656120B (zh) 2013-11-22 2014-11-21 校正信息生成方法以及校正信息生成装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2013242291A JP6242185B2 (ja) 2013-11-22 2013-11-22 補正情報生成方法および補正情報生成装置

Publications (3)

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JP2015102397A JP2015102397A (ja) 2015-06-04
JP2015102397A5 JP2015102397A5 (enExample) 2016-03-24
JP6242185B2 true JP6242185B2 (ja) 2017-12-06

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US (1) US9341583B2 (enExample)
JP (1) JP6242185B2 (enExample)
CN (1) CN104656120B (enExample)
DE (1) DE102014223692A1 (enExample)
GB (1) GB2521734B (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10295484B2 (en) * 2017-04-05 2019-05-21 Bruker Axs, Inc. Method and apparatus for extending angular coverage for a scanning two-dimensional X-ray detector
JP6775777B2 (ja) * 2017-08-29 2020-10-28 株式会社リガク Ｘ線回折測定における測定結果の表示方法
JP6860463B2 (ja) * 2017-10-03 2021-04-14 国立大学法人東海国立大学機構 繊維配向度の測定方法、繊維配向度測定装置、および繊維配向度測定装置の制御プログラム
GB2585673B (en) * 2019-07-10 2022-05-04 The Nottingham Trent Univ A sample inspection system
JP7300718B2 (ja) * 2019-12-13 2023-06-30 株式会社リガク 制御装置、システム、方法およびプログラム
JP2023102462A (ja) * 2022-01-12 2023-07-25 株式会社不二越 Ｘ線回折測定装置及びプログラム
CN119006613B (zh) * 2024-10-22 2025-03-21 合肥埃科光电科技股份有限公司 一种面光源标定方法、相机平场矫正方法、系统及介质

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6431042A (en) * 1987-07-27 1989-02-01 Shimadzu Corp X-ray deffraction method
JPH01265146A (ja) * 1988-04-16 1989-10-23 Mc Sci:Kk Ｘ線回折装置
JPH04138325A (ja) * 1990-09-28 1992-05-12 Shimadzu Corp アレイ検出器の感度補正装置
US6118846A (en) * 1999-02-23 2000-09-12 Direct Radiography Corp. Bad pixel column processing in a radiation detection panel
US6350985B1 (en) 1999-04-26 2002-02-26 Direct Radiography Corp. Method for calculating gain correction factors in a digital imaging system
JP2002098656A (ja) * 2000-09-27 2002-04-05 Kawasaki Steel Corp めっき層に含まれる金属相の付着量のオンライン測定方法および装置
JP2002250704A (ja) * 2001-02-26 2002-09-06 Rigaku Corp Ｘ線測定装置及びｘ線測定方法
US6995347B2 (en) * 2002-09-25 2006-02-07 Agfa-Gevaert N. V. Shading correction method and apparatus
JP4008328B2 (ja) 2002-09-30 2007-11-14 富士フイルム株式会社 放射線画像情報読取方法および装置
JP2004191789A (ja) 2002-12-12 2004-07-08 Foundation For Advancement Of International Science 物質構造解析用画像情報収集装置
US7433507B2 (en) * 2003-07-03 2008-10-07 Ge Medical Systems Global Technology Co. Imaging chain for digital tomosynthesis on a flat panel detector
DE102004025121A1 (de) 2004-05-21 2005-12-15 Bruker Axs Gmbh Verfahren zum Betrieb eines Röntgenanalysegeräts mit zweidimensionalem Array-Detektor und Röntgenanalysegerät zum Durchführen des Verfahrens
US9609243B2 (en) * 2007-05-25 2017-03-28 Uti Limited Partnership Systems and methods for providing low-noise readout of an optical sensor
US8642978B2 (en) * 2008-05-22 2014-02-04 Vladimir Balakin Charged particle cancer therapy dose distribution method and apparatus
JP2010038722A (ja) * 2008-08-05 2010-02-18 Rigaku Corp Ｘ線回折装置およびｘ線回折方法
EP2442722B1 (en) * 2009-06-16 2017-03-29 Koninklijke Philips N.V. Correction method for differential phase contrast imaging
US8687766B2 (en) * 2010-07-13 2014-04-01 Jordan Valley Semiconductors Ltd. Enhancing accuracy of fast high-resolution X-ray diffractometry
JP5475737B2 (ja) * 2011-10-04 2014-04-16 富士フイルム株式会社 放射線撮影装置及び画像処理方法

Also Published As

Publication number Publication date
US9341583B2 (en) 2016-05-17
DE102014223692A1 (de) 2015-05-28
GB2521734B (en) 2017-01-18
GB201419200D0 (en) 2014-12-10
CN104656120A (zh) 2015-05-27
GB2521734A (en) 2015-07-01
CN104656120B (zh) 2018-03-23
US20150146960A1 (en) 2015-05-28
JP2015102397A (ja) 2015-06-04

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