DE102014223692A1 - Korrekturinformationserzeugungsverfahren und Korrekturinformationserzeugungsvorrichtung - Google Patents
Korrekturinformationserzeugungsverfahren und Korrekturinformationserzeugungsvorrichtung Download PDFInfo
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- DE102014223692A1 DE102014223692A1 DE102014223692.4A DE102014223692A DE102014223692A1 DE 102014223692 A1 DE102014223692 A1 DE 102014223692A1 DE 102014223692 A DE102014223692 A DE 102014223692A DE 102014223692 A1 DE102014223692 A1 DE 102014223692A1
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- 238000003860 storage Methods 0.000 description 4
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- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/303—Accessories, mechanical or electrical features calibrating, standardising
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- Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Pathology (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Analytical Chemistry (AREA)
- Immunology (AREA)
- Crystallography & Structural Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Pulmonology (AREA)
- Radiology & Medical Imaging (AREA)
- Measurement Of Radiation (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2013242291A JP6242185B2 (ja) | 2013-11-22 | 2013-11-22 | 補正情報生成方法および補正情報生成装置 |
| JP2013-242291 | 2013-11-22 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE102014223692A1 true DE102014223692A1 (de) | 2015-05-28 |
Family
ID=53045703
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE102014223692.4A Pending DE102014223692A1 (de) | 2013-11-22 | 2014-11-20 | Korrekturinformationserzeugungsverfahren und Korrekturinformationserzeugungsvorrichtung |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US9341583B2 (enExample) |
| JP (1) | JP6242185B2 (enExample) |
| CN (1) | CN104656120B (enExample) |
| DE (1) | DE102014223692A1 (enExample) |
| GB (1) | GB2521734B (enExample) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10295484B2 (en) * | 2017-04-05 | 2019-05-21 | Bruker Axs, Inc. | Method and apparatus for extending angular coverage for a scanning two-dimensional X-ray detector |
| JP6775777B2 (ja) * | 2017-08-29 | 2020-10-28 | 株式会社リガク | Ｘ線回折測定における測定結果の表示方法 |
| JP6860463B2 (ja) * | 2017-10-03 | 2021-04-14 | 国立大学法人東海国立大学機構 | 繊維配向度の測定方法、繊維配向度測定装置、および繊維配向度測定装置の制御プログラム |
| GB2585673B (en) * | 2019-07-10 | 2022-05-04 | The Nottingham Trent Univ | A sample inspection system |
| JP7300718B2 (ja) * | 2019-12-13 | 2023-06-30 | 株式会社リガク | 制御装置、システム、方法およびプログラム |
| JP2023102462A (ja) * | 2022-01-12 | 2023-07-25 | 株式会社不二越 | Ｘ線回折測定装置及びプログラム |
| CN119006613B (zh) * | 2024-10-22 | 2025-03-21 | 合肥埃科光电科技股份有限公司 | 一种面光源标定方法、相机平场矫正方法、系统及介质 |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004128695A (ja) | 2002-09-30 | 2004-04-22 | Fuji Photo Film Co Ltd | 放射線画像情報読取方法および装置 |
| JP2004191789A (ja) | 2002-12-12 | 2004-07-08 | Foundation For Advancement Of International Science | 物質構造解析用画像情報収集装置 |
| US20050259790A1 (en) | 2004-05-21 | 2005-11-24 | Bruker Axs Gmbh | Method for operating an X-ray analysis apparatus with two-dimensional array detector and X-ray analysis apparatus for carrying out the method |
Family Cites Families (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6431042A (en) * | 1987-07-27 | 1989-02-01 | Shimadzu Corp | X-ray deffraction method |
| JPH01265146A (ja) * | 1988-04-16 | 1989-10-23 | Mc Sci:Kk | Ｘ線回折装置 |
| JPH04138325A (ja) * | 1990-09-28 | 1992-05-12 | Shimadzu Corp | アレイ検出器の感度補正装置 |
| US6118846A (en) * | 1999-02-23 | 2000-09-12 | Direct Radiography Corp. | Bad pixel column processing in a radiation detection panel |
| US6350985B1 (en) | 1999-04-26 | 2002-02-26 | Direct Radiography Corp. | Method for calculating gain correction factors in a digital imaging system |
| JP2002098656A (ja) * | 2000-09-27 | 2002-04-05 | Kawasaki Steel Corp | めっき層に含まれる金属相の付着量のオンライン測定方法および装置 |
| JP2002250704A (ja) * | 2001-02-26 | 2002-09-06 | Rigaku Corp | Ｘ線測定装置及びｘ線測定方法 |
| US6995347B2 (en) * | 2002-09-25 | 2006-02-07 | Agfa-Gevaert N. V. | Shading correction method and apparatus |
| US7433507B2 (en) * | 2003-07-03 | 2008-10-07 | Ge Medical Systems Global Technology Co. | Imaging chain for digital tomosynthesis on a flat panel detector |
| US9609243B2 (en) * | 2007-05-25 | 2017-03-28 | Uti Limited Partnership | Systems and methods for providing low-noise readout of an optical sensor |
| US8642978B2 (en) * | 2008-05-22 | 2014-02-04 | Vladimir Balakin | Charged particle cancer therapy dose distribution method and apparatus |
| JP2010038722A (ja) * | 2008-08-05 | 2010-02-18 | Rigaku Corp | Ｘ線回折装置およびｘ線回折方法 |
| EP2442722B1 (en) * | 2009-06-16 | 2017-03-29 | Koninklijke Philips N.V. | Correction method for differential phase contrast imaging |
| US8687766B2 (en) * | 2010-07-13 | 2014-04-01 | Jordan Valley Semiconductors Ltd. | Enhancing accuracy of fast high-resolution X-ray diffractometry |
| JP5475737B2 (ja) * | 2011-10-04 | 2014-04-16 | 富士フイルム株式会社 | 放射線撮影装置及び画像処理方法 |
-
2013
- 2013-11-22 JP JP2013242291A patent/JP6242185B2/ja active Active
-
2014
- 2014-10-24 US US14/523,226 patent/US9341583B2/en active Active
- 2014-10-29 GB GB1419200.9A patent/GB2521734B/en not_active Expired - Fee Related
- 2014-11-20 DE DE102014223692.4A patent/DE102014223692A1/de active Pending
- 2014-11-21 CN CN201410675937.9A patent/CN104656120B/zh active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004128695A (ja) | 2002-09-30 | 2004-04-22 | Fuji Photo Film Co Ltd | 放射線画像情報読取方法および装置 |
| JP2004191789A (ja) | 2002-12-12 | 2004-07-08 | Foundation For Advancement Of International Science | 物質構造解析用画像情報収集装置 |
| US20050259790A1 (en) | 2004-05-21 | 2005-11-24 | Bruker Axs Gmbh | Method for operating an X-ray analysis apparatus with two-dimensional array detector and X-ray analysis apparatus for carrying out the method |
Also Published As
| Publication number | Publication date |
|---|---|
| US9341583B2 (en) | 2016-05-17 |
| US20150146960A1 (en) | 2015-05-28 |
| CN104656120B (zh) | 2018-03-23 |
| JP2015102397A (ja) | 2015-06-04 |
| GB2521734B (en) | 2017-01-18 |
| JP6242185B2 (ja) | 2017-12-06 |
| GB201419200D0 (en) | 2014-12-10 |
| GB2521734A (en) | 2015-07-01 |
| CN104656120A (zh) | 2015-05-27 |
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