GB2521734B - Correction information generation method and correction information generation apparatus - Google Patents

Correction information generation method and correction information generation apparatus

Info

Publication number
GB2521734B
GB2521734B GB1419200.9A GB201419200A GB2521734B GB 2521734 B GB2521734 B GB 2521734B GB 201419200 A GB201419200 A GB 201419200A GB 2521734 B GB2521734 B GB 2521734B
Authority
GB
United Kingdom
Prior art keywords
information generation
correction information
generation method
generation apparatus
correction
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
GB1419200.9A
Other languages
English (en)
Other versions
GB2521734A (en
GB201419200D0 (en
Inventor
Sakumura Takuto
Nakaye Yasukazu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rigaku Denki Co Ltd
Rigaku Corp
Original Assignee
Rigaku Denki Co Ltd
Rigaku Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rigaku Denki Co Ltd, Rigaku Corp filed Critical Rigaku Denki Co Ltd
Publication of GB201419200D0 publication Critical patent/GB201419200D0/en
Publication of GB2521734A publication Critical patent/GB2521734A/en
Application granted granted Critical
Publication of GB2521734B publication Critical patent/GB2521734B/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/303—Accessories, mechanical or electrical features calibrating, standardising

Landscapes

  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Pulmonology (AREA)
  • Radiology & Medical Imaging (AREA)
  • Measurement Of Radiation (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
GB1419200.9A 2013-11-22 2014-10-29 Correction information generation method and correction information generation apparatus Expired - Fee Related GB2521734B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2013242291A JP6242185B2 (ja) 2013-11-22 2013-11-22 補正情報生成方法および補正情報生成装置

Publications (3)

Publication Number Publication Date
GB201419200D0 GB201419200D0 (en) 2014-12-10
GB2521734A GB2521734A (en) 2015-07-01
GB2521734B true GB2521734B (en) 2017-01-18

Family

ID=53045703

Family Applications (1)

Application Number Title Priority Date Filing Date
GB1419200.9A Expired - Fee Related GB2521734B (en) 2013-11-22 2014-10-29 Correction information generation method and correction information generation apparatus

Country Status (5)

Country Link
US (1) US9341583B2 (enExample)
JP (1) JP6242185B2 (enExample)
CN (1) CN104656120B (enExample)
DE (1) DE102014223692A1 (enExample)
GB (1) GB2521734B (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10295484B2 (en) * 2017-04-05 2019-05-21 Bruker Axs, Inc. Method and apparatus for extending angular coverage for a scanning two-dimensional X-ray detector
JP6775777B2 (ja) * 2017-08-29 2020-10-28 株式会社リガク Ｘ線回折測定における測定結果の表示方法
JP6860463B2 (ja) * 2017-10-03 2021-04-14 国立大学法人東海国立大学機構 繊維配向度の測定方法、繊維配向度測定装置、および繊維配向度測定装置の制御プログラム
GB2585673B (en) 2019-07-10 2022-05-04 The Nottingham Trent Univ A sample inspection system
JP7300718B2 (ja) * 2019-12-13 2023-06-30 株式会社リガク 制御装置、システム、方法およびプログラム
JP2023102462A (ja) * 2022-01-12 2023-07-25 株式会社不二越 Ｘ線回折測定装置及びプログラム
CN119006613B (zh) * 2024-10-22 2025-03-21 合肥埃科光电科技股份有限公司 一种面光源标定方法、相机平场矫正方法、系统及介质

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2000050879A1 (en) * 1999-02-23 2000-08-31 Direct Radiography Corp. Radiation detector bad pixel processing
WO2000065374A1 (en) * 1999-04-26 2000-11-02 Direct Radiography Corp. A method for calculating gain correction factors in a digital imaging system
US20040155209A1 (en) * 2002-09-25 2004-08-12 Luc Struye Shading correction method and apparatus
US20060291711A1 (en) * 2003-07-03 2006-12-28 Ge Medical Systems Global Technology Company, Inc. Imaging chain for digital tomosynthesis on a flat panel detector

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6431042A (en) * 1987-07-27 1989-02-01 Shimadzu Corp X-ray deffraction method
JPH01265146A (ja) * 1988-04-16 1989-10-23 Mc Sci:Kk Ｘ線回折装置
JPH04138325A (ja) * 1990-09-28 1992-05-12 Shimadzu Corp アレイ検出器の感度補正装置
JP2002098656A (ja) * 2000-09-27 2002-04-05 Kawasaki Steel Corp めっき層に含まれる金属相の付着量のオンライン測定方法および装置
JP2002250704A (ja) * 2001-02-26 2002-09-06 Rigaku Corp Ｘ線測定装置及びｘ線測定方法
JP4008328B2 (ja) 2002-09-30 2007-11-14 富士フイルム株式会社 放射線画像情報読取方法および装置
JP2004191789A (ja) 2002-12-12 2004-07-08 Foundation For Advancement Of International Science 物質構造解析用画像情報収集装置
DE102004025121A1 (de) 2004-05-21 2005-12-15 Bruker Axs Gmbh Verfahren zum Betrieb eines Röntgenanalysegeräts mit zweidimensionalem Array-Detektor und Röntgenanalysegerät zum Durchführen des Verfahrens
US9609243B2 (en) * 2007-05-25 2017-03-28 Uti Limited Partnership Systems and methods for providing low-noise readout of an optical sensor
US8642978B2 (en) * 2008-05-22 2014-02-04 Vladimir Balakin Charged particle cancer therapy dose distribution method and apparatus
JP2010038722A (ja) * 2008-08-05 2010-02-18 Rigaku Corp Ｘ線回折装置およびｘ線回折方法
CN102802529B (zh) * 2009-06-16 2015-09-16 皇家飞利浦电子股份有限公司 用于微分相衬成像的校正方法
US8687766B2 (en) * 2010-07-13 2014-04-01 Jordan Valley Semiconductors Ltd. Enhancing accuracy of fast high-resolution X-ray diffractometry
JP5475737B2 (ja) * 2011-10-04 2014-04-16 富士フイルム株式会社 放射線撮影装置及び画像処理方法

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2000050879A1 (en) * 1999-02-23 2000-08-31 Direct Radiography Corp. Radiation detector bad pixel processing
WO2000065374A1 (en) * 1999-04-26 2000-11-02 Direct Radiography Corp. A method for calculating gain correction factors in a digital imaging system
US20040155209A1 (en) * 2002-09-25 2004-08-12 Luc Struye Shading correction method and apparatus
US20060291711A1 (en) * 2003-07-03 2006-12-28 Ge Medical Systems Global Technology Company, Inc. Imaging chain for digital tomosynthesis on a flat panel detector

Also Published As

Publication number Publication date
JP2015102397A (ja) 2015-06-04
JP6242185B2 (ja) 2017-12-06
CN104656120A (zh) 2015-05-27
GB2521734A (en) 2015-07-01
GB201419200D0 (en) 2014-12-10
US20150146960A1 (en) 2015-05-28
CN104656120B (zh) 2018-03-23
US9341583B2 (en) 2016-05-17
DE102014223692A1 (de) 2015-05-28

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 20181029