JP6108671B2 - 放射線撮影装置 - Google Patents

放射線撮影装置 Download PDF

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Publication number
JP6108671B2
JP6108671B2 JP2012055717A JP2012055717A JP6108671B2 JP 6108671 B2 JP6108671 B2 JP 6108671B2 JP 2012055717 A JP2012055717 A JP 2012055717A JP 2012055717 A JP2012055717 A JP 2012055717A JP 6108671 B2 JP6108671 B2 JP 6108671B2
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Japan
Prior art keywords
radiation
ray
imaging apparatus
source
detector
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Expired - Fee Related
Application number
JP2012055717A
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English (en)
Japanese (ja)
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JP2013190269A (ja
JP2013190269A5 (enExample
Inventor
塚本　健夫
健夫 塚本
野村　一郎
一郎 野村
光陽 雨宮
光陽 雨宮
三宅　明
明 三宅
辻井　修
修 辻井
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Canon Inc
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Canon Inc
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Publication date
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Priority to JP2012055717A priority Critical patent/JP6108671B2/ja
Priority to US13/791,070 priority patent/US9020098B2/en
Publication of JP2013190269A publication Critical patent/JP2013190269A/ja
Publication of JP2013190269A5 publication Critical patent/JP2013190269A5/ja
Application granted granted Critical
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00—Arrangements for handling radiation or particles
    • G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/064—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements having a curved surface

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
JP2012055717A 2012-03-13 2012-03-13 放射線撮影装置 Expired - Fee Related JP6108671B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2012055717A JP6108671B2 (ja) 2012-03-13 2012-03-13 放射線撮影装置
US13/791,070 US9020098B2 (en) 2012-03-13 2013-03-08 Radiation imaging apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2012055717A JP6108671B2 (ja) 2012-03-13 2012-03-13 放射線撮影装置

Publications (3)

Publication Number Publication Date
JP2013190269A JP2013190269A (ja) 2013-09-26
JP2013190269A5 JP2013190269A5 (enExample) 2015-04-23
JP6108671B2 true JP6108671B2 (ja) 2017-04-05

Family

ID=49157649

Family Applications (1)

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JP2012055717A Expired - Fee Related JP6108671B2 (ja) 2012-03-13 2012-03-13 放射線撮影装置

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US (1) US9020098B2 (enExample)
JP (1) JP6108671B2 (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013128661A (ja) 2011-12-21 2013-07-04 Canon Inc ステレオｘ線撮影装置、ステレオｘ線撮影方法
JP6016386B2 (ja) 2012-03-09 2016-10-26 キヤノン株式会社 Ｘ線光学装置
JP6579652B2 (ja) * 2015-06-22 2019-09-25 幸則 永谷 Ｘ線透視装置

Family Cites Families (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0219760Y2 (enExample) * 1981-06-15 1990-05-30
ATE89097T1 (de) * 1986-08-15 1993-05-15 Commw Scient Ind Res Org Instrumente zur konditionierung von roentgenoder neutronenstrahlen.
DE69129117T2 (de) * 1990-10-31 1998-08-06 X-Ray Optical Systems, Inc., Voorheesville, N.Y. Vorrichtung zur steuerung von strahlung und ihre verwendungen
EP0723272B1 (en) * 1994-07-08 2001-04-25 Muradin Abubekirovich Kumakhov Method of guiding beams of neutral and charged particles and a device for implementing said method
US5570408A (en) * 1995-02-28 1996-10-29 X-Ray Optical Systems, Inc. High intensity, small diameter x-ray beam, capillary optic system
US7104686B2 (en) 2001-05-30 2006-09-12 Canon Kabushiki Kaisha Radiographic apparatus
US6782076B2 (en) * 2001-12-07 2004-08-24 Bede Scientific Instruments Limited X-ray topographic system
JP3639826B2 (ja) 2002-04-03 2005-04-20 キヤノン株式会社 放射線撮影装置、プログラム、コンピュータ可読記憶媒体、及び放射線撮影システム
JP2004089445A (ja) 2002-08-30 2004-03-25 Konica Minolta Holdings Inc Ｘ線発生装置およびｘ線画像撮像システム
JP4439882B2 (ja) 2003-11-14 2010-03-24 キヤノン株式会社 放射線画像処理装置及び処理方法
JP4549093B2 (ja) 2004-04-12 2010-09-22 キヤノン株式会社 画像処理装置及びその方法、プログラム
JP4497997B2 (ja) 2004-04-21 2010-07-07 キヤノン株式会社 放射線画像撮影装置及びその制御方法
US8018067B2 (en) * 2005-08-26 2011-09-13 Koninklijke Philips Electronics N.V. Electrically shielded through-wafer interconnect
JP4878311B2 (ja) 2006-03-03 2012-02-15 キヤノン株式会社 マルチｘ線発生装置
US7742566B2 (en) 2007-12-07 2010-06-22 General Electric Company Multi-energy imaging system and method using optic devices
JP5294653B2 (ja) 2008-02-28 2013-09-18 キヤノン株式会社 マルチｘ線発生装置及びｘ線撮影装置
JP5398157B2 (ja) 2008-03-17 2014-01-29 キヤノン株式会社 Ｘ線撮影装置及びその制御方法
JP5361336B2 (ja) 2008-11-06 2013-12-04 キヤノン株式会社 Ｘ線乳房撮影装置
JP5247363B2 (ja) 2008-11-11 2013-07-24 キヤノン株式会社 Ｘ線撮影装置
JP5455446B2 (ja) * 2009-06-02 2014-03-26 キヤノン株式会社 放射線撮影装置、放射線撮影装置の制御方法及びプログラム
JP5576631B2 (ja) 2009-09-09 2014-08-20 キヤノン株式会社 放射線撮影装置、放射線撮影方法、及びプログラム
JP2011122826A (ja) * 2009-12-08 2011-06-23 Yokogawa Electric Corp Ｘ線照射装置
JP5416006B2 (ja) 2010-03-23 2014-02-12 キヤノン株式会社 Ｘ線発生装置及びその制御方法
US8311184B2 (en) * 2010-08-30 2012-11-13 General Electric Company Fan-shaped X-ray beam imaging systems employing graded multilayer optic devices
JP5661432B2 (ja) 2010-11-17 2015-01-28 キヤノン株式会社 Ｘ線発生装置
JP5800578B2 (ja) 2011-05-31 2015-10-28 キヤノン株式会社 Ｘ線管
JP2013002887A (ja) 2011-06-14 2013-01-07 Canon Inc 放射線検出パネルおよび放射線撮影装置
JP5956727B2 (ja) 2011-06-29 2016-07-27 キヤノン株式会社 Ｘ線撮影装置
JP5804821B2 (ja) 2011-07-25 2015-11-04 キヤノン株式会社 放射線撮影装置及びその制御方法
JP2013128661A (ja) 2011-12-21 2013-07-04 Canon Inc ステレオｘ線撮影装置、ステレオｘ線撮影方法
JP5988598B2 (ja) 2012-01-31 2016-09-07 キヤノン株式会社 被検体情報取得装置および被検体情報取得方法

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Publication number Publication date
JP2013190269A (ja) 2013-09-26
US9020098B2 (en) 2015-04-28
US20130243156A1 (en) 2013-09-19

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