JP5930579B2 - 基板加工装置 - Google Patents
基板加工装置 Download PDFInfo
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- JP5930579B2 JP5930579B2 JP2010251589A JP2010251589A JP5930579B2 JP 5930579 B2 JP5930579 B2 JP 5930579B2 JP 2010251589 A JP2010251589 A JP 2010251589A JP 2010251589 A JP2010251589 A JP 2010251589A JP 5930579 B2 JP5930579 B2 JP 5930579B2
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- 239000000758 substrate Substances 0.000 title claims description 150
- 239000007789 gas Substances 0.000 claims description 133
- 238000010438 heat treatment Methods 0.000 claims description 28
- 238000002347 injection Methods 0.000 claims description 16
- 239000007924 injection Substances 0.000 claims description 16
- 239000012495 reaction gas Substances 0.000 claims description 7
- 238000007789 sealing Methods 0.000 claims 1
- 238000000034 method Methods 0.000 description 20
- 239000010409 thin film Substances 0.000 description 10
- 238000005229 chemical vapour deposition Methods 0.000 description 5
- 238000000231 atomic layer deposition Methods 0.000 description 4
- 239000004973 liquid crystal related substance Substances 0.000 description 3
- 238000004518 low pressure chemical vapour deposition Methods 0.000 description 3
- 238000005240 physical vapour deposition Methods 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 2
- 238000000151 deposition Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000010408 film Substances 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 239000011159 matrix material Substances 0.000 description 2
- 238000000623 plasma-assisted chemical vapour deposition Methods 0.000 description 2
- 238000005507 spraying Methods 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 239000011147 inorganic material Substances 0.000 description 1
- 229910010272 inorganic material Inorganic materials 0.000 description 1
- 239000011368 organic material Substances 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
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Classifications
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45563—Gas nozzles
- C23C16/45565—Shower nozzles
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/46—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for heating the substrate
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/458—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
- C23C16/4582—Rigid and flat substrates, e.g. plates or discs
- C23C16/4583—Rigid and flat substrates, e.g. plates or discs the substrate being supported substantially horizontally
- C23C16/4586—Elements in the interior of the support, e.g. electrodes, heating or cooling devices
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/0262—Reduction or decomposition of gaseous compounds, e.g. CVD
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
- H01L21/67109—Apparatus for thermal treatment mainly by convection
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/673—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere using specially adapted carriers or holders; Fixing the workpieces on such carriers or holders
- H01L21/67303—Vertical boat type carrier whereby the substrates are horizontally supported, e.g. comprising rod-shaped elements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/673—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere using specially adapted carriers or holders; Fixing the workpieces on such carriers or holders
- H01L21/67303—Vertical boat type carrier whereby the substrates are horizontally supported, e.g. comprising rod-shaped elements
- H01L21/67309—Vertical boat type carrier whereby the substrates are horizontally supported, e.g. comprising rod-shaped elements characterized by the substrate support
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/673—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere using specially adapted carriers or holders; Fixing the workpieces on such carriers or holders
- H01L21/6732—Vertical carrier comprising wall type elements whereby the substrates are horizontally supported, e.g. comprising sidewalls
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- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Chemical Vapour Deposition (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Description
[第1実施形態]
(第2実施形態)
112、212 第2ガス配管
120、220 基板ホルダー
122、222 第1ガス配管
130、230 加工チャンバー
140、240 移送部
150、250 第1加熱手段
160、260 ガス供給部
161、261 第3ガス配管
Claims (14)
- 基板を支持するための基板支持台、および一つまたは複数の噴射口が形成された第1ガス配管を含む基板ホルダー;
複数の基板ホルダーが積載され、前記第1ガス配管に連結される第2ガス配管を含むボート;
前記ボートに積載された複数の基板を加工するための空間を提供する加工チャンバー;
前記ボートを前記加工チャンバーの内部に搬入および搬出させるための移送部;
前記加工チャンバーの外側に位置する第1加熱手段;および
前記第2ガス配管に連結される第3ガス配管を含み、前記第2ガス配管に加熱または冷却されたガスを供給するためのガス供給部;
を含み、
前記基板ホルダーは、各前記噴射口に位置し、前記基板支持台の表面を基準として一定の傾斜角を有するノズルをさらに含み、
前記第1ガス配管は、前記基板支持台の下面に密着し、蛇行状に設けられており、
前記第1ガス配管は、互いに一定の距離で離隔して位置し、
前記一定の距離は、前記基板ホルダーを前記ボートに積載するロボットアームの幅以上である基板加工装置。 - 前記第2ガス配管は、前記ボートの内側に位置することを特徴とする請求項1に記載の基板加工装置。
- 前記第1ガス配管と前記第2ガス配管との間に位置する第1連結部材をさらに含むことを特徴とする請求項1に記載の基板加工装置。
- 前記第2ガス配管と第3ガス配管との間に位置する第2連結部材をさらに含むことを特徴とする請求項1に記載の基板加工装置。
- 前記基板ホルダーは、前記第1ガス配管を通じて供給されたガスを複数の方向に噴射するノズルを含むことを特徴とする請求項1に記載の基板加工装置。
- 前記移送部は、断熱部をさらに含むことを特徴とする請求項1に記載の基板加工装置。
- 前記断熱部は、一つまたは複数の断熱板、および前記断熱板を支持するための断熱ホルダーを含むことを特徴とする請求項6に記載の基板加工装置。
- 前記移送部は、前記断熱部と前記ボートの間に位置する第2加熱手段をさらに含むことを特徴とする請求項6に記載の基板加工装置。
- 前記加工チャンバーは、複数の前記基板に外部空気が流入しないようにするための第1チューブ、および前記第1チューブの下部に位置し、前記ボートが搬入および搬出されるマニホールドを含むことを特徴とする請求項1に記載の基板加工装置。
- 前記マニホールドと移送部との間に位置し、前記第3ガス配管が通過する第1ホールが形成される第2チューブをさらに含むことを特徴とする請求項9に記載の基板加工装置。
- 前記マニホールドを通過し、反応ガスを供給するための第4配管に連結されて複数の前記基板に反応ガスを噴射するためのガス噴射手段をさらに含むことを特徴とする請求項9に記載の基板加工装置。
- 前記マニホールドを通過する排気配管に連結されて、前記加工チャンバーの内部を真空状態に維持するための排気ポンプをさらに含む、請求項9に記載の基板加工装置。
- 前記第1チューブと前記ボートとの間に位置する第2チューブをさらに含むことを特徴とする請求項9に記載の基板加工装置。
- 前記加工チャンバーの下部に位置し、前記加工チャンバーを密閉するためのシャッターをさらに含むことを特徴とする請求項1に記載の基板加工装置。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2010-0062876 | 2010-06-30 | ||
KR1020100062876A KR101223489B1 (ko) | 2010-06-30 | 2010-06-30 | 기판 가공 장치 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2012015476A JP2012015476A (ja) | 2012-01-19 |
JP5930579B2 true JP5930579B2 (ja) | 2016-06-08 |
Family
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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JP2010251589A Expired - Fee Related JP5930579B2 (ja) | 2010-06-30 | 2010-11-10 | 基板加工装置 |
Country Status (4)
Country | Link |
---|---|
US (1) | US20120000425A1 (ja) |
JP (1) | JP5930579B2 (ja) |
KR (1) | KR101223489B1 (ja) |
TW (1) | TWI517279B (ja) |
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JP2008034463A (ja) * | 2006-07-26 | 2008-02-14 | Hitachi Kokusai Electric Inc | 基板処理装置 |
JP4994197B2 (ja) * | 2007-11-16 | 2012-08-08 | 株式会社日立国際電気 | 半導体装置の製造方法及び基板処理装置 |
JP4531833B2 (ja) * | 2007-12-05 | 2010-08-25 | 株式会社日立国際電気 | 基板処理装置、半導体装置の製造方法及びクリーニング方法 |
TWI415206B (zh) * | 2008-01-31 | 2013-11-11 | Hitachi Int Electric Inc | A substrate processing apparatus, and a method of manufacturing the semiconductor device |
JP4985449B2 (ja) * | 2008-02-13 | 2012-07-25 | 東京エレクトロン株式会社 | 成膜装置 |
JP5049302B2 (ja) * | 2008-03-17 | 2012-10-17 | 東京エレクトロン株式会社 | 熱処理装置、熱処理装置の温度調整方法、及び、プログラム |
JP5608333B2 (ja) * | 2008-09-19 | 2014-10-15 | 株式会社日立国際電気 | 熱処理装置及び半導体装置の製造方法 |
KR101041143B1 (ko) * | 2009-04-16 | 2011-06-13 | 삼성모바일디스플레이주식회사 | 기판 가공 장치 |
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2010
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- 2010-11-10 JP JP2010251589A patent/JP5930579B2/ja not_active Expired - Fee Related
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2011
- 2011-01-06 US US12/985,649 patent/US20120000425A1/en active Granted
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TWI517279B (zh) | 2016-01-11 |
KR20120002139A (ko) | 2012-01-05 |
JP2012015476A (ja) | 2012-01-19 |
US20120000425A1 (en) | 2012-01-05 |
TW201201305A (en) | 2012-01-01 |
KR101223489B1 (ko) | 2013-01-17 |
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