JP5748787B2 - 太陽電池及びその製造方法 - Google Patents
太陽電池及びその製造方法 Download PDFInfo
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- 238000004519 manufacturing process Methods 0.000 title claims description 24
- 230000031700 light absorption Effects 0.000 claims description 81
- 229910052738 indium Inorganic materials 0.000 claims description 53
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 claims description 51
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims description 42
- 239000000758 substrate Substances 0.000 claims description 41
- 238000000034 method Methods 0.000 claims description 37
- 229910002601 GaN Inorganic materials 0.000 claims description 36
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 claims description 36
- 229910052751 metal Inorganic materials 0.000 claims description 32
- 239000002184 metal Substances 0.000 claims description 32
- 239000011669 selenium Substances 0.000 claims description 29
- 238000001704 evaporation Methods 0.000 claims description 23
- 229910052757 nitrogen Inorganic materials 0.000 claims description 21
- 229910052733 gallium Inorganic materials 0.000 claims description 20
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 claims description 18
- 239000010949 copper Substances 0.000 claims description 17
- 230000008020 evaporation Effects 0.000 claims description 16
- BUGBHKTXTAQXES-UHFFFAOYSA-N Selenium Chemical compound [Se] BUGBHKTXTAQXES-UHFFFAOYSA-N 0.000 claims description 15
- 229910052711 selenium Inorganic materials 0.000 claims description 15
- 238000010549 co-Evaporation Methods 0.000 claims description 11
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 10
- 229910052802 copper Inorganic materials 0.000 claims description 10
- 239000013078 crystal Substances 0.000 claims description 10
- 238000004544 sputter deposition Methods 0.000 claims description 10
- 239000000203 mixture Substances 0.000 claims description 7
- NWAIGJYBQQYSPW-UHFFFAOYSA-N azanylidyneindigane Chemical compound [In]#N NWAIGJYBQQYSPW-UHFFFAOYSA-N 0.000 claims description 6
- 239000010410 layer Substances 0.000 description 234
- 239000010408 film Substances 0.000 description 55
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 40
- 239000010409 thin film Substances 0.000 description 31
- 239000011787 zinc oxide Substances 0.000 description 20
- 229910052782 aluminium Inorganic materials 0.000 description 9
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 9
- 239000000463 material Substances 0.000 description 9
- 239000005361 soda-lime glass Substances 0.000 description 8
- 230000015572 biosynthetic process Effects 0.000 description 7
- 229910052980 cadmium sulfide Inorganic materials 0.000 description 7
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 6
- 238000000224 chemical solution deposition Methods 0.000 description 6
- 229910052750 molybdenum Inorganic materials 0.000 description 6
- 239000011733 molybdenum Substances 0.000 description 6
- 239000004065 semiconductor Substances 0.000 description 6
- 238000002834 transmittance Methods 0.000 description 6
- 238000007740 vapor deposition Methods 0.000 description 5
- 239000012298 atmosphere Substances 0.000 description 4
- 229910052951 chalcopyrite Inorganic materials 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 3
- 238000000231 atomic layer deposition Methods 0.000 description 3
- 229910052796 boron Inorganic materials 0.000 description 3
- 239000000919 ceramic Substances 0.000 description 3
- -1 chalcopyrite compound Chemical class 0.000 description 3
- 238000005229 chemical vapour deposition Methods 0.000 description 3
- 230000000052 comparative effect Effects 0.000 description 3
- 150000001875 compounds Chemical class 0.000 description 3
- 230000007423 decrease Effects 0.000 description 3
- 239000011521 glass Substances 0.000 description 3
- 229920006254 polymer film Polymers 0.000 description 3
- 229910001220 stainless steel Inorganic materials 0.000 description 3
- 239000010935 stainless steel Substances 0.000 description 3
- 229910052984 zinc sulfide Inorganic materials 0.000 description 3
- WUPHOULIZUERAE-UHFFFAOYSA-N 3-(oxolan-2-yl)propanoic acid Chemical group OC(=O)CCC1CCCO1 WUPHOULIZUERAE-UHFFFAOYSA-N 0.000 description 2
- 229910004613 CdTe Inorganic materials 0.000 description 2
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 description 2
- 229910021417 amorphous silicon Inorganic materials 0.000 description 2
- 238000000151 deposition Methods 0.000 description 2
- 230000008021 deposition Effects 0.000 description 2
- 238000003912 environmental pollution Methods 0.000 description 2
- 229910052708 sodium Inorganic materials 0.000 description 2
- 239000011734 sodium Substances 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 229910052793 cadmium Inorganic materials 0.000 description 1
- BDOSMKKIYDKNTQ-UHFFFAOYSA-N cadmium atom Chemical compound [Cd] BDOSMKKIYDKNTQ-UHFFFAOYSA-N 0.000 description 1
- DVRDHUBQLOKMHZ-UHFFFAOYSA-N chalcopyrite Chemical compound [S-2].[S-2].[Fe+2].[Cu+2] DVRDHUBQLOKMHZ-UHFFFAOYSA-N 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 229910021419 crystalline silicon Inorganic materials 0.000 description 1
- 238000005137 deposition process Methods 0.000 description 1
- 238000005566 electron beam evaporation Methods 0.000 description 1
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 1
- 239000012299 nitrogen atmosphere Substances 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 231100000167 toxic agent Toxicity 0.000 description 1
- 239000003440 toxic substance Substances 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
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- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/0256—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by the material
- H01L31/0264—Inorganic materials
- H01L31/032—Inorganic materials including, apart from doping materials or other impurities, only compounds not provided for in groups H01L31/0272 - H01L31/0312
- H01L31/0322—Inorganic materials including, apart from doping materials or other impurities, only compounds not provided for in groups H01L31/0272 - H01L31/0312 comprising only AIBIIICVI chalcopyrite compounds, e.g. Cu In Se2, Cu Ga Se2, Cu In Ga Se2
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Description
110 金属電極層
120 光吸収層
130 バッファ層
140 透明電極層
150 反射防止膜
Claims (7)
- 基板上に金属電極層を形成することと、
前記金属電極層上に光吸収層を形成することと、
前記光吸収層上にインジウムガリウム窒化膜(InXGa1−XN、0<X<1)を含み、膜厚が10〜1000Åのバッファ層を形成することと、
前記バッファ層上に透明電極層を形成することと、を含み、
前記インジウムガリウム窒化膜(InXGa1−XN)と前記光吸収層との間にシード層を形成することをさらに含み、
前記シード層を形成することは、セレンと窒素を交互に蒸発させて前記光吸収層の表面を窒素処理し、前記光吸収層の表面のインジウムと窒素を反応させてインジウム窒化膜InNを形成することを含み、
前記インジウムガリウム窒化膜(In X Ga 1−X N)は、前記光吸収層から離れるほどXが漸次的に小さくなるように組成比を調節して形成されることを特徴とする太陽電池の製造方法。 - 前記バッファ層は、前記光吸収層と同一の方法に形成されることを特徴とする請求項1に記載の太陽電池の製造方法。
- 前記バッファ層は、同時蒸発法に形成されることを特徴とする請求項1または請求項2に記載の太陽電池の製造方法。
- 前記光吸収層は、インジウムIn、銅Cu、セレンSe、ガリウムGa及び窒素Nを同時に蒸発させて形成し、前記バッファ層は、インジウム、ガリウム及び窒素を同時に蒸発させて形成されることを特徴とする請求項3に記載の太陽電池の製造方法。
- 前記インジウムガリウム窒化膜(InXGa1−XN)は、前記光吸収層から離れるほどエネルギバンドギャップが漸次的に増加するように形成されることを特徴とする請求項1乃至請求項4のいずれかに記載の太陽電池の製造方法。
- 前記バッファ層と前記透明電極層は、同一な結晶構造に形成されることを特徴とする請求項1乃至請求項5のいずれかに記載の太陽電池の製造方法。
- 前記基板は、スパッタリングチャンバと同時蒸発チャンバを具備するクラスタ装備にローディングされ、
前記金属電極層及び透明電極層は、スパッタリングチャンバで形成され、前記光吸収層と前記バッファ層は、同時蒸発チャンバで形成されることを特徴とする請求項1に記載の太陽電池の製造方法。
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KR10-2009-0055080 | 2009-06-19 | ||
KR1020090055080A KR101245371B1 (ko) | 2009-06-19 | 2009-06-19 | 태양전지 및 그 제조방법 |
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US (1) | US20100319777A1 (ja) |
JP (2) | JP2011003877A (ja) |
KR (1) | KR101245371B1 (ja) |
DE (1) | DE102009045929A1 (ja) |
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US20110203655A1 (en) * | 2010-02-22 | 2011-08-25 | First Solar, Inc. | Photovoltaic device protection layer |
US8298849B2 (en) * | 2011-01-31 | 2012-10-30 | Intermolecular, Inc. | Nitrogen reactive sputtering of Cu-In-Ga-N for solar cells |
CN102646744A (zh) * | 2011-02-18 | 2012-08-22 | 张一熙 | 可利用红外光发电的太阳能电池及其涂料层解决方案 |
KR101221394B1 (ko) * | 2011-04-11 | 2013-01-16 | (주) 다쓰테크 | Cigs태양전지 제조 방법 |
GB2493022B (en) | 2011-07-21 | 2014-04-23 | Ilika Technologies Ltd | Vapour deposition process for the preparation of a phosphate compound |
GB2493020B (en) * | 2011-07-21 | 2014-04-23 | Ilika Technologies Ltd | Vapour deposition process for the preparation of a chemical compound |
KR101262573B1 (ko) * | 2011-07-29 | 2013-05-08 | 엘지이노텍 주식회사 | 태양전지 및 그의 제조방법 |
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2009
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- 2009-10-22 DE DE102009045929A patent/DE102009045929A1/de not_active Withdrawn
- 2009-10-23 US US12/604,450 patent/US20100319777A1/en not_active Abandoned
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KR101245371B1 (ko) | 2013-03-19 |
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US20100319777A1 (en) | 2010-12-23 |
JP2011003877A (ja) | 2011-01-06 |
JP2013062547A (ja) | 2013-04-04 |
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