JP5684455B2 - 成長中にp型ドーパントがドープされたp型半極性III窒化物半導体を使用して、該III窒化物デバイスまたはIII窒化物半導体を製造する方法、半極性III窒化物半導体、および、p型III窒化物半導体を製造する方法 - Google Patents
成長中にp型ドーパントがドープされたp型半極性III窒化物半導体を使用して、該III窒化物デバイスまたはIII窒化物半導体を製造する方法、半極性III窒化物半導体、および、p型III窒化物半導体を製造する方法 Download PDFInfo
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- JP5684455B2 JP5684455B2 JP2008554403A JP2008554403A JP5684455B2 JP 5684455 B2 JP5684455 B2 JP 5684455B2 JP 2008554403 A JP2008554403 A JP 2008554403A JP 2008554403 A JP2008554403 A JP 2008554403A JP 5684455 B2 JP5684455 B2 JP 5684455B2
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- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/26—Bombardment with radiation
- H01L21/263—Bombardment with radiation with high-energy radiation
- H01L21/265—Bombardment with radiation with high-energy radiation producing ion implantation
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- H01L21/02365—Forming inorganic semiconducting materials on a substrate
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- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/20—Deposition of semiconductor materials on a substrate, e.g. epitaxial growth solid phase epitaxy
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- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/40—Crystalline structures
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- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/80—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials
- H10D62/81—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials of structures exhibiting quantum-confinement effects, e.g. single quantum wells; of structures having periodic or quasi-periodic potential variation
- H10D62/815—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials of structures exhibiting quantum-confinement effects, e.g. single quantum wells; of structures having periodic or quasi-periodic potential variation of structures having periodic or quasi-periodic potential variation, e.g. superlattices or multiple quantum wells [MQW]
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- H10D62/85—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials being Group III-V materials, e.g. GaAs
- H10D62/8503—Nitride Group III-V materials, e.g. AlN or GaN
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- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
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- H10D62/85—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials being Group III-V materials, e.g. GaAs
- H10D62/854—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials being Group III-V materials, e.g. GaAs further characterised by the dopants
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- Crystallography & Structural Chemistry (AREA)
- High Energy & Nuclear Physics (AREA)
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- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Chemical Vapour Deposition (AREA)
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Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US77218406P | 2006-02-10 | 2006-02-10 | |
| US60/772,184 | 2006-02-10 | ||
| PCT/US2007/003607 WO2007095137A2 (en) | 2006-02-10 | 2007-02-09 | Method for conductivity control of (al,in,ga,b)n |
Related Child Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2013081851A Division JP2013191851A (ja) | 2006-02-10 | 2013-04-10 | (Al,In,Ga,B)Nの伝導性制御方法 |
| JP2014245563A Division JP2015046640A (ja) | 2006-02-10 | 2014-12-04 | (Al,In,Ga,B)Nの伝導性制御方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2009526405A JP2009526405A (ja) | 2009-07-16 |
| JP2009526405A5 JP2009526405A5 (enExample) | 2015-01-29 |
| JP5684455B2 true JP5684455B2 (ja) | 2015-03-11 |
Family
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Family Applications (3)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2008554403A Active JP5684455B2 (ja) | 2006-02-10 | 2007-02-09 | 成長中にp型ドーパントがドープされたp型半極性III窒化物半導体を使用して、該III窒化物デバイスまたはIII窒化物半導体を製造する方法、半極性III窒化物半導体、および、p型III窒化物半導体を製造する方法 |
| JP2013081851A Pending JP2013191851A (ja) | 2006-02-10 | 2013-04-10 | (Al,In,Ga,B)Nの伝導性制御方法 |
| JP2014245563A Withdrawn JP2015046640A (ja) | 2006-02-10 | 2014-12-04 | (Al,In,Ga,B)Nの伝導性制御方法 |
Family Applications After (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2013081851A Pending JP2013191851A (ja) | 2006-02-10 | 2013-04-10 | (Al,In,Ga,B)Nの伝導性制御方法 |
| JP2014245563A Withdrawn JP2015046640A (ja) | 2006-02-10 | 2014-12-04 | (Al,In,Ga,B)Nの伝導性制御方法 |
Country Status (5)
| Country | Link |
|---|---|
| US (3) | US8193079B2 (enExample) |
| EP (1) | EP1984940A4 (enExample) |
| JP (3) | JP5684455B2 (enExample) |
| KR (1) | KR101416838B1 (enExample) |
| WO (1) | WO2007095137A2 (enExample) |
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| JP5743127B2 (ja) | 2005-06-01 | 2015-07-01 | ザ リージェンツ オブ ザ ユニバーシティ オブ カリフォルニア | 半極性(Ga,Al,In,B)N薄膜、ヘテロ構造およびデバイスの成長と作製のための方法及び装置 |
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| US8193020B2 (en) * | 2006-11-15 | 2012-06-05 | The Regents Of The University Of California | Method for heteroepitaxial growth of high-quality N-face GaN, InN, and AlN and their alloys by metal organic chemical vapor deposition |
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2007
- 2007-02-09 KR KR1020087021910A patent/KR101416838B1/ko active Active
- 2007-02-09 EP EP07750442A patent/EP1984940A4/en not_active Withdrawn
- 2007-02-09 WO PCT/US2007/003607 patent/WO2007095137A2/en not_active Ceased
- 2007-02-09 US US11/673,426 patent/US8193079B2/en active Active
- 2007-02-09 JP JP2008554403A patent/JP5684455B2/ja active Active
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| Publication number | Publication date |
|---|---|
| US20070190758A1 (en) | 2007-08-16 |
| US20120187415A1 (en) | 2012-07-26 |
| WO2007095137A8 (en) | 2008-09-18 |
| US8193079B2 (en) | 2012-06-05 |
| US8709925B2 (en) | 2014-04-29 |
| WO2007095137A3 (en) | 2008-11-20 |
| EP1984940A2 (en) | 2008-10-29 |
| KR101416838B1 (ko) | 2014-07-08 |
| WO2007095137A2 (en) | 2007-08-23 |
| KR20080108985A (ko) | 2008-12-16 |
| US20140191244A1 (en) | 2014-07-10 |
| JP2009526405A (ja) | 2009-07-16 |
| EP1984940A4 (en) | 2010-11-10 |
| JP2013191851A (ja) | 2013-09-26 |
| JP2015046640A (ja) | 2015-03-12 |
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