JP5579812B2 - エッジホイール構造 - Google Patents
エッジホイール構造 Download PDFInfo
- Publication number
- JP5579812B2 JP5579812B2 JP2012220347A JP2012220347A JP5579812B2 JP 5579812 B2 JP5579812 B2 JP 5579812B2 JP 2012220347 A JP2012220347 A JP 2012220347A JP 2012220347 A JP2012220347 A JP 2012220347A JP 5579812 B2 JP5579812 B2 JP 5579812B2
- Authority
- JP
- Japan
- Prior art keywords
- edge wheel
- substrate
- edge
- fluid
- wheel structure
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/67034—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for drying
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F26—DRYING
- F26B—DRYING SOLID MATERIALS OR OBJECTS BY REMOVING LIQUID THEREFROM
- F26B7/00—Drying solid materials or objects by processes using a combination of processes not covered by a single one of groups F26B3/00 and F26B5/00
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F26—DRYING
- F26B—DRYING SOLID MATERIALS OR OBJECTS BY REMOVING LIQUID THEREFROM
- F26B13/00—Machines and apparatus for drying fabrics, fibres, yarns, or other materials in long lengths, with progressive movement
- F26B13/24—Arrangements of devices using drying processes not involving heating
- F26B13/30—Arrangements of devices using drying processes not involving heating for applying suction
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F26—DRYING
- F26B—DRYING SOLID MATERIALS OR OBJECTS BY REMOVING LIQUID THEREFROM
- F26B17/00—Machines or apparatus for drying materials in loose, plastic, or fluidised form, e.g. granules, staple fibres, with progressive movement
- F26B17/24—Machines or apparatus for drying materials in loose, plastic, or fluidised form, e.g. granules, staple fibres, with progressive movement with movement performed by shooting or throwing the materials, e.g. after which the materials are subject to impact
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F26—DRYING
- F26B—DRYING SOLID MATERIALS OR OBJECTS BY REMOVING LIQUID THEREFROM
- F26B5/00—Drying solid materials or objects by processes not involving the application of heat
- F26B5/08—Drying solid materials or objects by processes not involving the application of heat by centrifugal treatment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6838—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping with gripping and holding devices using a vacuum; Bernoulli devices
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- General Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Mechanical Engineering (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Molecular Biology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Textile Engineering (AREA)
- Health & Medical Sciences (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Drying Of Solid Materials (AREA)
Description
Claims (5)
- 円板状基板の処理装置用のエッジホイール構造であって、
エッジホイールであって、前記基板の端部に係合するように外周部に溝が形成されたホイール体と、前記エッジホイールの軸に形成された貫通孔と、前記溝から前記ホイール体内部に伸張する放射状チャネルと、を備えるエッジホイールと、
前記貫通孔を貫通するピンと、を備え、
前記エッジホイールが、前記エッジホイールとの間に環状空間を形成するカバーを備え、
少なくとも一本の前記放射状チャネルが、前記溝から前記環状空間に伸張し、
前記カバーと前記エッジホイールとが互いに回転可能なように、前記カバーが前記エッジホイールを密閉し、
前記カバーは、前記環状空間に流体ラインを接続するためのポートを前記カバー上に備える、
エッジホイール構造。 - 請求項1に記載のエッジホイール構造であって、
さらに、前記エッジホイールに固定される滑車を備える、エッジホイール構造。 - 請求項1に記載のエッジホイール構造であって、
さらに、真空源を備え、
前記放射状チャネルが、前記真空源に、流体の通過が可能なように連通する、エッジホイール構造。 - 請求項1に記載のエッジホイール構造であって、
前記エッジホイールが、回転力を入力することにより、前記エッジホイールを回転させて、その結果、前記基板を回転させる駆動手段を備える、エッジホイール構造。 - 請求項1に記載のエッジホイール構造であって、
さらに、流体供給源を備え、
前記放射状チャネルが、前記流体供給源に、流体の通過が可能なように連通する、エッジホイール構造。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/957,146 US7089687B2 (en) | 2004-09-30 | 2004-09-30 | Wafer edge wheel with drying function |
US10/957,146 | 2004-09-30 |
Related Parent Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2007534636A Division JP5238254B2 (ja) | 2004-09-30 | 2005-09-16 | エッジホイール構造 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2013038442A JP2013038442A (ja) | 2013-02-21 |
JP5579812B2 true JP5579812B2 (ja) | 2014-08-27 |
Family
ID=36097413
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2007534636A Expired - Fee Related JP5238254B2 (ja) | 2004-09-30 | 2005-09-16 | エッジホイール構造 |
JP2012220347A Expired - Fee Related JP5579812B2 (ja) | 2004-09-30 | 2012-10-02 | エッジホイール構造 |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2007534636A Expired - Fee Related JP5238254B2 (ja) | 2004-09-30 | 2005-09-16 | エッジホイール構造 |
Country Status (7)
Country | Link |
---|---|
US (2) | US7089687B2 (ja) |
JP (2) | JP5238254B2 (ja) |
KR (1) | KR101182618B1 (ja) |
CN (1) | CN100565063C (ja) |
SG (1) | SG141469A1 (ja) |
TW (1) | TWI278905B (ja) |
WO (1) | WO2006039127A2 (ja) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20040031167A1 (en) | 2002-06-13 | 2004-02-19 | Stein Nathan D. | Single wafer method and apparatus for drying semiconductor substrates using an inert gas air-knife |
US7350315B2 (en) | 2003-12-22 | 2008-04-01 | Lam Research Corporation | Edge wheel dry manifold |
US20060000494A1 (en) * | 2004-06-30 | 2006-01-05 | Lam Research Corporation | Self-draining edge wheel system and method |
US7089687B2 (en) * | 2004-09-30 | 2006-08-15 | Lam Research Corporation | Wafer edge wheel with drying function |
US8211242B2 (en) * | 2005-02-07 | 2012-07-03 | Ebara Corporation | Substrate processing method, substrate processing apparatus, and control program |
DE102005057109A1 (de) * | 2005-11-26 | 2007-05-31 | Kunze-Concewitz, Horst, Dipl.-Phys. | Vorrichtung und Verfahren für mechanisches Prozessieren flacher, dünner Substrate im Durchlaufverfahren |
US20110296634A1 (en) * | 2010-06-02 | 2011-12-08 | Jingdong Jia | Wafer side edge cleaning apparatus |
JP6144531B2 (ja) * | 2013-04-23 | 2017-06-07 | 株式会社荏原製作所 | 基板処理装置及び処理基板の製造方法 |
US20160372317A1 (en) * | 2014-03-06 | 2016-12-22 | Imt Co., Ltd | Device and method for cleaning backside or edge of wafer |
JP2024107709A (ja) * | 2023-01-30 | 2024-08-09 | 株式会社Screenホールディングス | 基板処理装置およびチャックピン |
Family Cites Families (51)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4838289A (en) | 1982-08-03 | 1989-06-13 | Texas Instruments Incorporated | Apparatus and method for edge cleaning |
IT1226303B (it) * | 1988-07-26 | 1990-12-27 | Montedipe Spa | Processo ed apparato per la devolatilizzazione di soluzioni di polimeri. |
JPH02130922A (ja) * | 1988-11-11 | 1990-05-18 | Toshiba Corp | 半導体基板エッチング装置 |
JPH0712035B2 (ja) | 1989-04-20 | 1995-02-08 | 三菱電機株式会社 | 噴流式液処理装置 |
JPH02309638A (ja) | 1989-05-24 | 1990-12-25 | Fujitsu Ltd | ウエハーエッチング装置 |
JPH0693449B2 (ja) * | 1989-12-25 | 1994-11-16 | 佳英 柴野 | 温純水引上方式に於ける乾燥装置 |
US5271774A (en) | 1990-03-01 | 1993-12-21 | U.S. Philips Corporation | Method for removing in a centrifuge a liquid from a surface of a substrate |
US5620525A (en) * | 1990-07-16 | 1997-04-15 | Novellus Systems, Inc. | Apparatus for supporting a substrate and introducing gas flow doximate to an edge of the substrate |
US5088441A (en) | 1990-08-23 | 1992-02-18 | Belport Co., Inc. | Cord impregnator |
JP3118737B2 (ja) * | 1992-10-23 | 2000-12-18 | 東京エレクトロン株式会社 | 被処理体の処理方法 |
US5705223A (en) | 1994-07-26 | 1998-01-06 | International Business Machine Corp. | Method and apparatus for coating a semiconductor wafer |
FR2733036B1 (fr) * | 1995-04-14 | 1997-07-04 | Unir | Dispositif de protection anti-contamination rapprochee |
US5660642A (en) | 1995-05-26 | 1997-08-26 | The Regents Of The University Of California | Moving zone Marangoni drying of wet objects using naturally evaporated solvent vapor |
KR0175278B1 (ko) | 1996-02-13 | 1999-04-01 | 김광호 | 웨이퍼 세정장치 |
JPH09270412A (ja) * | 1996-04-01 | 1997-10-14 | Canon Inc | 洗浄装置及び洗浄方法 |
DE19622015A1 (de) | 1996-05-31 | 1997-12-04 | Siemens Ag | Verfahren zum Ätzen von Zerstörungszonen an einem Halbleitersubstratrand sowie Ätzanlage |
US5724748A (en) * | 1996-07-24 | 1998-03-10 | Brooks; Ray G. | Apparatus for packaging contaminant-sensitive articles and resulting package |
TW357406B (en) | 1996-10-07 | 1999-05-01 | Tokyo Electron Ltd | Method and apparatus for cleaning and drying a substrate |
US5868857A (en) | 1996-12-30 | 1999-02-09 | Intel Corporation | Rotating belt wafer edge cleaning apparatus |
US5967882A (en) * | 1997-03-06 | 1999-10-19 | Keltech Engineering | Lapping apparatus and process with two opposed lapping platens |
JP3549141B2 (ja) * | 1997-04-21 | 2004-08-04 | 大日本スクリーン製造株式会社 | 基板処理装置および基板保持装置 |
JPH1131672A (ja) * | 1997-07-10 | 1999-02-02 | Hitachi Ltd | 基板処理方法および基板処理装置 |
WO1999016109A1 (en) | 1997-09-24 | 1999-04-01 | Interuniversitair Micro-Elektronica Centrum Vereniging Zonder Winstbejag | Method and apparatus for removing a liquid from a surface |
EP0905746A1 (en) | 1997-09-24 | 1999-03-31 | Interuniversitair Micro-Elektronica Centrum Vzw | Method of removing a liquid from a surface of a rotating substrate |
US6491764B2 (en) | 1997-09-24 | 2002-12-10 | Interuniversitair Microelektronics Centrum (Imec) | Method and apparatus for removing a liquid from a surface of a rotating substrate |
US6398975B1 (en) | 1997-09-24 | 2002-06-04 | Interuniversitair Microelektronica Centrum (Imec) | Method and apparatus for localized liquid treatment of the surface of a substrate |
US6102777A (en) * | 1998-03-06 | 2000-08-15 | Keltech Engineering | Lapping apparatus and method for high speed lapping with a rotatable abrasive platen |
JPH11350169A (ja) | 1998-06-10 | 1999-12-21 | Chemitoronics Co | ウエットエッチング装置およびウエットエッチングの方法 |
EP1052682B1 (de) * | 1999-04-28 | 2002-01-09 | SEZ Semiconductor-Equipment Zubehör für die Halbleiterfertigung AG | Vorrichtung und Verfahren zur Flüssigkeitsbehandlung von scheibenförmigen Gegenständen |
JP4413383B2 (ja) * | 1999-06-30 | 2010-02-10 | Hoya株式会社 | スクラブ洗浄装置及びスクラブ洗浄方法、並びに情報記録媒体の製造方法 |
JP3978296B2 (ja) * | 1999-08-05 | 2007-09-19 | 株式会社カイジョー | 基板端面用超音波励振装置及びこれを備えた基板端面用超音波洗浄装置 |
JP4481394B2 (ja) * | 1999-08-13 | 2010-06-16 | 株式会社荏原製作所 | 半導体基板の洗浄装置及びその洗浄方法 |
US20020121290A1 (en) | 1999-08-25 | 2002-09-05 | Applied Materials, Inc. | Method and apparatus for cleaning/drying hydrophobic wafers |
US6622334B1 (en) | 2000-03-29 | 2003-09-23 | International Business Machines Corporation | Wafer edge cleaning utilizing polish pad material |
US6186873B1 (en) * | 2000-04-14 | 2001-02-13 | International Business Machines Corporation | Wafer edge cleaning |
US7000622B2 (en) * | 2002-09-30 | 2006-02-21 | Lam Research Corporation | Methods and systems for processing a bevel edge of a substrate using a dynamic liquid meniscus |
US6550091B1 (en) | 2000-10-04 | 2003-04-22 | Lam Research Corporation | Double-sided wafer edge scrubbing apparatus and method for using the same |
JP2002124508A (ja) * | 2000-10-13 | 2002-04-26 | Nec Corp | 基板用スピン処理装置 |
EP1372186B1 (de) | 2000-10-31 | 2008-12-10 | Sez Ag | Vorrichtung zur Flüssigkeitsbehandlung von scheibenförmigen Gegenständen |
JP4114188B2 (ja) | 2001-06-12 | 2008-07-09 | アクリオン テクノロジーズ, インコーポレイテッド | メガソニック洗浄乾燥システム |
US6907637B1 (en) * | 2001-06-29 | 2005-06-21 | Lam Research Corporation | Edge wheel assembly in a substrate processing brush box |
JP3944368B2 (ja) * | 2001-09-05 | 2007-07-11 | 株式会社荏原製作所 | 基板処理装置及び基板処理方法 |
JP3535853B2 (ja) * | 2001-09-18 | 2004-06-07 | エム・エフエスアイ株式会社 | 基板の支持固定具、及びこれを用いた基板表面の乾燥方法 |
CA2461307C (en) * | 2001-09-24 | 2011-01-11 | Imx Labs, Inc. | Apparatus and method for custom cosmetic dispensing |
JP2003151943A (ja) * | 2001-11-19 | 2003-05-23 | Speedfam Clean System Co Ltd | スクラブ洗浄装置 |
JP4026750B2 (ja) * | 2002-04-24 | 2007-12-26 | 東京エレクトロン株式会社 | 基板処理装置 |
JP2004063796A (ja) * | 2002-07-29 | 2004-02-26 | Tatsumo Kk | 平板状角型基板の裏面洗浄装置 |
JP2005150468A (ja) * | 2003-11-17 | 2005-06-09 | Ebara Corp | 基板乾燥装置及び基板研磨装置 |
US7350315B2 (en) * | 2003-12-22 | 2008-04-01 | Lam Research Corporation | Edge wheel dry manifold |
US20060000494A1 (en) * | 2004-06-30 | 2006-01-05 | Lam Research Corporation | Self-draining edge wheel system and method |
US7089687B2 (en) * | 2004-09-30 | 2006-08-15 | Lam Research Corporation | Wafer edge wheel with drying function |
-
2004
- 2004-09-30 US US10/957,146 patent/US7089687B2/en not_active Expired - Lifetime
-
2005
- 2005-09-16 JP JP2007534636A patent/JP5238254B2/ja not_active Expired - Fee Related
- 2005-09-16 SG SG200802526-4A patent/SG141469A1/en unknown
- 2005-09-16 KR KR1020077007691A patent/KR101182618B1/ko not_active IP Right Cessation
- 2005-09-16 WO PCT/US2005/033301 patent/WO2006039127A2/en active Application Filing
- 2005-09-16 CN CNB2005800333969A patent/CN100565063C/zh not_active Expired - Fee Related
- 2005-09-21 TW TW094132655A patent/TWI278905B/zh not_active IP Right Cessation
-
2006
- 2006-03-31 US US11/395,893 patent/US7254900B2/en not_active Expired - Fee Related
-
2012
- 2012-10-02 JP JP2012220347A patent/JP5579812B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JP5238254B2 (ja) | 2013-07-17 |
CN101031765A (zh) | 2007-09-05 |
KR20070072513A (ko) | 2007-07-04 |
SG141469A1 (en) | 2008-04-28 |
KR101182618B1 (ko) | 2012-09-14 |
TW200616015A (en) | 2006-05-16 |
WO2006039127A3 (en) | 2007-01-11 |
US7254900B2 (en) | 2007-08-14 |
TWI278905B (en) | 2007-04-11 |
US20060174510A1 (en) | 2006-08-10 |
US7089687B2 (en) | 2006-08-15 |
WO2006039127A2 (en) | 2006-04-13 |
JP2013038442A (ja) | 2013-02-21 |
CN100565063C (zh) | 2009-12-02 |
US20060064894A1 (en) | 2006-03-30 |
JP2008515227A (ja) | 2008-05-08 |
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