JP5542728B2 - 垂直tfetの製造方法 - Google Patents
垂直tfetの製造方法 Download PDFInfo
- Publication number
- JP5542728B2 JP5542728B2 JP2011088783A JP2011088783A JP5542728B2 JP 5542728 B2 JP5542728 B2 JP 5542728B2 JP 2011088783 A JP2011088783 A JP 2011088783A JP 2011088783 A JP2011088783 A JP 2011088783A JP 5542728 B2 JP5542728 B2 JP 5542728B2
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- Prior art keywords
- nanowire
- layer
- gate
- field effect
- effect transistor
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Classifications
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D12/00—Bipolar devices controlled by the field effect, e.g. insulated-gate bipolar transistors [IGBT]
- H10D12/211—Gated diodes
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D12/00—Bipolar devices controlled by the field effect, e.g. insulated-gate bipolar transistors [IGBT]
- H10D12/01—Manufacture or treatment
- H10D12/021—Manufacture or treatment of gated diodes, e.g. field-controlled diodes [FCD]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
- H10D62/117—Shapes of semiconductor bodies
- H10D62/118—Nanostructure semiconductor bodies
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/01—Manufacture or treatment
- H10D84/0123—Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs
- H10D84/0126—Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs the components including insulated gates, e.g. IGFETs
- H10D84/0165—Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs the components including insulated gates, e.g. IGFETs the components including complementary IGFETs, e.g. CMOS devices
- H10D84/0195—Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs the components including insulated gates, e.g. IGFETs the components including complementary IGFETs, e.g. CMOS devices the components including vertical IGFETs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/01—Manufacture or treatment
- H10D84/02—Manufacture or treatment characterised by using material-based technologies
- H10D84/03—Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology
- H10D84/038—Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology using silicon technology, e.g. SiGe
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/80—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials
- H10D62/82—Heterojunctions
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/80—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials
- H10D62/82—Heterojunctions
- H10D62/822—Heterojunctions comprising only Group IV materials heterojunctions, e.g. Si/Ge heterojunctions
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Nanotechnology (AREA)
- Physics & Mathematics (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Thin Film Transistor (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP10160382.7 | 2010-04-19 | ||
| EP10160382.7A EP2378557B1 (en) | 2010-04-19 | 2010-04-19 | Method of manufacturing a vertical TFET |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2011238909A JP2011238909A (ja) | 2011-11-24 |
| JP2011238909A5 JP2011238909A5 (enExample) | 2014-04-03 |
| JP5542728B2 true JP5542728B2 (ja) | 2014-07-09 |
Family
ID=42338418
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2011088783A Active JP5542728B2 (ja) | 2010-04-19 | 2011-04-13 | 垂直tfetの製造方法 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US8415209B2 (enExample) |
| EP (1) | EP2378557B1 (enExample) |
| JP (1) | JP5542728B2 (enExample) |
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| CN102184955B (zh) * | 2011-04-07 | 2012-12-19 | 清华大学 | 互补隧道穿透场效应晶体管及其形成方法 |
| US8685823B2 (en) * | 2011-11-09 | 2014-04-01 | International Business Machines Corporation | Nanowire field effect transistor device |
| US8872230B2 (en) * | 2011-12-21 | 2014-10-28 | Imec | Tunnel field-effect transistor and methods for manufacturing thereof |
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| US8916927B2 (en) * | 2012-07-19 | 2014-12-23 | Taiwan Semiconductor Manufacturing | Vertical tunnel field effect transistor (FET) |
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| US9209288B2 (en) * | 2012-12-21 | 2015-12-08 | Intel Corporation | Reduced scale resonant tunneling field effect transistor |
| US9536977B2 (en) * | 2013-01-18 | 2017-01-03 | Taiwan Semiconductor Manufacturing Company, Ltd. | Vertical tunneling field-effect transistor cell and fabricating the same |
| US9029940B2 (en) | 2013-01-18 | 2015-05-12 | Taiwan Semiconductor Manufacturing Company, Ltd. | Vertical tunneling field-effect transistor cell |
| US9159826B2 (en) * | 2013-01-18 | 2015-10-13 | Taiwan Semiconductor Manufacturing Company, Ltd. | Vertical tunneling field-effect transistor cell and fabricating the same |
| US8969145B2 (en) | 2013-01-19 | 2015-03-03 | International Business Machines Corporation | Wire-last integration method and structure for III-V nanowire devices |
| US8969949B2 (en) * | 2013-03-10 | 2015-03-03 | Taiwan Semiconductor Manufacturing Company, Ltd. | Structure and method for static random access memory device of vertical tunneling field effect transistor |
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| JP2016115686A (ja) * | 2013-04-01 | 2016-06-23 | 国立研究開発法人産業技術総合研究所 | トンネル電界効果トランジスタ |
| EP2808897B1 (en) * | 2013-05-30 | 2021-06-30 | IMEC vzw | Tunnel field effect transistor and method for making thereof |
| JP5999611B2 (ja) * | 2013-08-13 | 2016-09-28 | 国立大学法人北海道大学 | トンネル電界効果トランジスタ、その製造方法およびスイッチ素子 |
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| FR2923651A1 (fr) * | 2007-11-13 | 2009-05-15 | Commissariat Energie Atomique | Procede de realisation d'une jonction pn dans un nanofil, et d'un nanofil avec au moins une jonction pn. |
| JP2010093051A (ja) * | 2008-10-08 | 2010-04-22 | Fujitsu Microelectronics Ltd | 電界効果型半導体装置 |
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2010
- 2010-04-19 EP EP10160382.7A patent/EP2378557B1/en active Active
-
2011
- 2011-04-08 US US13/083,387 patent/US8415209B2/en active Active
- 2011-04-13 JP JP2011088783A patent/JP5542728B2/ja active Active
Also Published As
| Publication number | Publication date |
|---|---|
| EP2378557B1 (en) | 2015-12-23 |
| US8415209B2 (en) | 2013-04-09 |
| EP2378557A1 (en) | 2011-10-19 |
| US20110253981A1 (en) | 2011-10-20 |
| JP2011238909A (ja) | 2011-11-24 |
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