JP5478890B2 - 回路インターフェースのための電気的マイクロフィラメント - Google Patents
回路インターフェースのための電気的マイクロフィラメント Download PDFInfo
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- JP5478890B2 JP5478890B2 JP2008545751A JP2008545751A JP5478890B2 JP 5478890 B2 JP5478890 B2 JP 5478890B2 JP 2008545751 A JP2008545751 A JP 2008545751A JP 2008545751 A JP2008545751 A JP 2008545751A JP 5478890 B2 JP5478890 B2 JP 5478890B2
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- microfilaments
- microfilament
- microelectronic circuit
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- substrate
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Description
また、方法は、束の第2の端部でコネクタを形成するステップを含み得る。例えば、第2の端部を互い違いに配置して、前述のように三次元の相互嵌合面を画定するようにしてもよい。コネクタを形成する際に、第2の端部の近傍でマイクロフィラメントの部分を互いに固定して、コネクタに構造的な一体性を付与することが有用である。同様の技術を使用して、組み合わせコネクタをマイクロフィラメントから製造することができる。マイクロフィラメントから製造されるコネクタは極めて微小なサイズを持つことができるので、一対の嵌め合いコネクタの差し込みは、嵌合治具の使用によって容易にされる。方法は更に、適合する(例えば、嵌め合い)コネクタを有する第2のマイクロフィラメント束にコネクタを差し込むステップを含む。
Claims (27)
- 超小型電子回路への電気的接続のためのボンドパッドを備える基板を有する前記超小型回路のための電気的相互接続の方法(90)であって、
マイクロフィラメントおよび絶縁性マイクロフィラメントの束を形成するステップであって、該マイクロフィラメントおよび該絶縁性マイクロフィラメントは各々分離可能な構造を備えており、該マイクロフィラメントのうちの少なくとも2つがそれらの長さに沿って延びる導電性部分を含む、該マイクロフィラメントおよび絶縁性マイクロフィラメントの束を形成するステップ(92)と、
前記少なくとも2つのマイクロフィラメントを対応するボンドパッドで前記超小型電子回路の基板に接合して、前記少なくとも2つのマイクロフィラメントの前記導電性部分と前記対応するボンドパッドとの間に電気的接続を形成するステップ(94)と
を含む方法。 - 前記マイクロフィラメントの側面と前記超小型電子回路の基板とを接触させるように前記少なくとも2つのマイクロフィラメントを位置決めするステップを更に含む、請求項1に記載の方法。
- 前記少なくとも2つのマイクロフィラメントを第2の電子部品に接続するステップを更に含む、請求項1に記載の方法。
- 前記束の端部にコネクタを形成するステップを更に含む、請求項1に記載の方法。
- コネクタを形成するステップが、
前記束の前記端部に三次元の相互嵌合面を画定するように、前記マイクロフィラメントの端部を互い違いに位置決めするステップと、
前記束の前記端部近傍の前記マイクロフィラメント部分を互いに固定して前記コネクタを形成するステップと
を含む、請求項4に記載の方法。 - 適合するコネクタを有するマイクロフィラメントの第2の束に前記コネクタを嵌め込むステップを更に含む、請求項5に記載の方法。
- マイクロフィラメントおよび絶縁性マイクロフィラメントの束を形成するステップが、各マイクロフィラメントが少なくとも1つの隣接するマイクロフィラメントに接触するように前記マイクロフィラメントを配置するステップを含む、請求項1に記載の方法。
- マイクロフィラメントおよび絶縁性マイクロフィラメントの束を形成するステップが、導電性部分を有する前記少なくとも2つのマイクロフィラメントの各々を複数の絶縁性マイクロフィラメントで囲むステップを含む、請求項1に記載の方法。
- マイクロフィラメントおよび絶縁性マイクロフィラメントの束を形成するステップが、前記導電性部分を前記少なくとも2つのマイクロフィラメントの外表面上に形成するステップを含む、請求項1に記載の方法。
- 超小型電子回路(10)であって、
複数のボンドパッド(14)を含む超小型電子回路が配置された基板(12)と、
マイクロフィラメントおよび絶縁性マイクロフィラメントの束であって、該マイクロフィラメントおよび該絶縁性マイクロフィラメントは各々分離可能な構造を備えており、該マイクロフィラメントの少なくとも第1のサブセットが、長手方向に延びる導電性部分を有する信号搬送用マイクロフィラメント(20)である、前記マイクロフィラメントおよび絶縁性マイクロフィラメントの束(16)と、
を備え、前記信号搬送用マイクロフィラメントがそれに対応するボンドパッドに直接接合されて、前記対応するボンドパッドと、前記信号搬送用マイクロフィラメントの前記長手方向に延びる導電性部分との間が電気的に接続される超小型電子回路。 - 前記信号搬送用マイクロフィラメントの第1の端部(26)が前記基板に接合される、請求項10に記載の超小型電子回路。
- 前記マイクロフィラメントの第2のサブセットが絶縁性マイクロフィラメント(22)である、請求項10に記載の超小型電子回路。
- 前記信号搬送用マイクロフィラメントが少なくとも1つの絶縁性マイクロフィラメントによって互いに分離される、請求項11に記載の超小型電子回路。
- 前記長手方向に延びる導電性部分が前記マイクロフィラメントの端部の近傍に配置された周囲リング(66)を含む、請求項10に記載の超小型電子回路。
- 前記複数のボンドパッドの少なくとも1つが前記基板の内側(24)に配置される、請求項10に記載の超小型電子回路。
- リード接続部(46)を備えるリードフレーム(44)を有し、前記基板が内部に配置されるパッケージを更に備え、
前記信号搬送用マイクロフィラメントが前記リードフレームの対応するリード接続部に接合されて、前記信号搬送用マイクロフィラメントの前記長手方向に延びる導電性部分と、前記リードフレームの前記リード接続部との間が電気的に接続される、請求項10に記載の超小型電子回路。 - 前記マイクロフィラメントの束の第2の端部(48)がコネクタ(50)に形成される、請求項10に記載の超小型電子回路。
- 前記束の前記第2の端部が互い違いに配置されて、三次元の相互嵌合面を画定する、請求項17に記載の超小型電子回路。
- 複数の第2のボンドパッド(14’)を含む超小型電子回路が配置された第2の基板(12b)を更に備え、
前記信号搬送用マイクロフィラメントがそれに対応する第2のボンドパッドに直接接合されて、前記長手方向に延びる導電性部分と前記対応する第2のボンドパッドとの間が電気的に接続される、請求項10に記載の超小型電子回路。 - 前記少なくとも1つの信号搬送用マイクロフィラメントが、複数の長手方向に延びる導電性部分を含み、前記少なくとも1つの信号搬送用マイクロフィラメントが前記複数の長手方向に延びる導電性部分と前記対応する複数のボンドパッドとの間を電気的に接続する、請求項10に記載の超小型電子回路。
- 前記基板がシリコン基板である、請求項10に記載の超小型電子回路。
- 前記基板がプリント回路板である、請求項10に記載の超小型電子回路。
- 前記ボンドパッドが孔を介してメッキされる、請求項10に記載の超小型電子回路。
- 前記マイクロフィラメントが、円形、楕円形、三角形、正方形、長方形、五角形、六角形及び多角形からなる形状群から選択される断面を有する、請求項10に記載の超小型電子回路。
- 前記マイクロフィラメントが、マイクロワイヤ、絶縁性マイクロワイヤ及びガラス繊維からなるフィラメント構造群から選択される、請求項10に記載の超小型電子回路。
- 前記マイクロフィラメントが15マイクロメートル未満の断面直径を有する、請求項10に記載の超小型電子回路。
- 全部の前記マイクロフィラメントの断面寸法が実質的に等しい、請求項10に記載の超小型電子回路。
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US74987305P | 2005-12-12 | 2005-12-12 | |
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US60/749,777 | 2005-12-12 | ||
US60/749,873 | 2005-12-12 | ||
US11/637,380 US7626123B2 (en) | 2005-12-12 | 2006-12-11 | Electrical microfilament to circuit interface |
US11/637,380 | 2006-12-11 | ||
PCT/US2006/047432 WO2007070533A2 (en) | 2005-12-12 | 2006-12-12 | Electrical microfilament to circuit interface |
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Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7626123B2 (en) * | 2005-12-12 | 2009-12-01 | Raytheon Sarcos, Llc | Electrical microfilament to circuit interface |
US7333699B2 (en) | 2005-12-12 | 2008-02-19 | Raytheon Sarcos, Llc | Ultra-high density connector |
US9179579B2 (en) * | 2006-06-08 | 2015-11-03 | International Business Machines Corporation | Sheet having high thermal conductivity and flexibility |
US8688231B2 (en) | 2010-11-25 | 2014-04-01 | Sapiens Steering Brain Stimulation B.V. | Medical probe and a method of providing a medical probe |
US20120228759A1 (en) * | 2011-03-07 | 2012-09-13 | Wen-Jeng Fan | Semiconductor package having interconnection of dual parallel wires |
US8683870B2 (en) | 2012-03-15 | 2014-04-01 | Meggitt (Orange County), Inc. | Sensor device with stepped pads for connectivity |
KR101488616B1 (ko) * | 2013-09-06 | 2015-02-06 | (주) 아이씨티케이 | 식별키 생성 장치 및 방법 |
CN108064417B (zh) * | 2015-06-26 | 2022-01-18 | 英特尔公司 | 具有聚集的绝缘线的封装组合件 |
EP3745425B1 (en) * | 2019-05-31 | 2022-12-21 | Aptiv Technologies Limited | Communications cables for autonomous vehicles |
Family Cites Families (58)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3337838A (en) * | 1964-12-16 | 1967-08-22 | Burndy Corp | Wiping contact |
US3601759A (en) * | 1969-02-07 | 1971-08-24 | Component Mfg Service Inc | Electrical connector |
FR2344853A1 (fr) * | 1976-02-27 | 1977-10-14 | Thomson Csf | Fiche d'interconnexion de cables a fibres optiques |
FR2393329A1 (fr) * | 1977-05-31 | 1978-12-29 | Cables De Lyon Geoffroy Delore | Dispositif de raccordement global en bout de deux groupes de sept fibres optiques |
US4236171A (en) * | 1978-07-17 | 1980-11-25 | International Rectifier Corporation | High power transistor having emitter pattern with symmetric lead connection pads |
GB2039421B (en) | 1979-01-08 | 1983-01-26 | Johansson O | Connector |
US4369104A (en) * | 1979-10-22 | 1983-01-18 | Hitco | Continuous filament graphite composite electrodes |
JPS57104235A (en) * | 1980-12-22 | 1982-06-29 | Hitachi Ltd | Semiconductor device |
JPS59175736A (ja) * | 1983-03-25 | 1984-10-04 | Fujitsu Ltd | ワイヤボンデイング装置 |
US5052105A (en) * | 1990-06-05 | 1991-10-01 | Hutchinson Technology, Inc. | Micro-cable interconnect |
US5270485A (en) * | 1991-01-28 | 1993-12-14 | Sarcos Group | High density, three-dimensional, intercoupled circuit structure |
US5451774A (en) * | 1991-12-31 | 1995-09-19 | Sarcos Group | High density, three-dimensional, intercoupled optical sensor circuit |
JP2763445B2 (ja) * | 1992-04-03 | 1998-06-11 | 三菱電機株式会社 | 高周波信号用配線及びそのボンディング装置 |
US5599615A (en) * | 1995-11-09 | 1997-02-04 | Xerox Corporation | High performance electric contacts |
US6110354A (en) * | 1996-11-01 | 2000-08-29 | University Of Washington | Microband electrode arrays |
JPH10172628A (ja) * | 1996-12-13 | 1998-06-26 | Sony Corp | コネクタ機構 |
US5861662A (en) * | 1997-02-24 | 1999-01-19 | General Instrument Corporation | Anti-tamper bond wire shield for an integrated circuit |
JP3958451B2 (ja) * | 1997-11-12 | 2007-08-15 | Necトーキン株式会社 | アンテナコイル付icカード |
US6128527A (en) * | 1997-12-03 | 2000-10-03 | University Of Iowa Research Foundation | Apparatus and method of analyzing electrical brain activity |
US6020747A (en) * | 1998-01-26 | 2000-02-01 | Bahns; John T. | Electrical contact probe |
US6330466B1 (en) * | 1998-02-23 | 2001-12-11 | California Institute Of Technology | Using a multi-electrode probe in creating an electrophysiological profile during stereotactic neurosurgery |
GB9809918D0 (en) * | 1998-05-08 | 1998-07-08 | Isis Innovation | Microelectrode biosensor and method therefor |
US6503231B1 (en) * | 1998-06-10 | 2003-01-07 | Georgia Tech Research Corporation | Microneedle device for transport of molecules across tissue |
JP2000031461A (ja) * | 1998-07-09 | 2000-01-28 | Asahi Optical Co Ltd | 半導体デバイスおよび半導体組立装置 |
JP2000173718A (ja) | 1998-12-04 | 2000-06-23 | Olympus Optical Co Ltd | 電気的コネクタ |
US6289187B1 (en) * | 1999-02-04 | 2001-09-11 | Xerox Corporation | Carbon fiber commutator brush for a toner developing device and method for making |
JP2000323907A (ja) * | 1999-05-07 | 2000-11-24 | Nec Corp | マイクロ波ic接続線路 |
US6565387B2 (en) | 1999-06-30 | 2003-05-20 | Teradyne, Inc. | Modular electrical connector and connector system |
US6444102B1 (en) * | 2000-02-07 | 2002-09-03 | Micro Contacts Inc. | Carbon fiber electrical contacts |
US6829498B2 (en) * | 2000-03-29 | 2004-12-07 | Arizona Board Of Regents | Device for creating a neural interface and method for making same |
US6722896B2 (en) * | 2001-03-22 | 2004-04-20 | Molex Incorporated | Stitched LGA connector |
US20040080056A1 (en) * | 2001-03-30 | 2004-04-29 | Lim David Chong Sook | Packaging system for die-up connection of a die-down oriented integrated circuit |
US6560472B2 (en) * | 2001-06-21 | 2003-05-06 | Microhelix, Inc. | Multi-channel structurally robust brain probe and method of making the same |
US7010356B2 (en) * | 2001-10-31 | 2006-03-07 | London Health Sciences Centre Research Inc. | Multichannel electrode and methods of using same |
US6979215B2 (en) * | 2001-11-28 | 2005-12-27 | Molex Incorporated | High-density connector assembly with flexural capabilities |
US6924439B1 (en) * | 2001-12-21 | 2005-08-02 | Network Engines, Inc. | Signal conducting applique and method for use with printed circuit board |
US6515346B1 (en) * | 2002-01-02 | 2003-02-04 | Zoltan A. Kemeny | Microbar and method of its making |
US7056139B2 (en) * | 2002-01-15 | 2006-06-06 | Tribotek, Inc. | Electrical connector |
US7077662B2 (en) * | 2002-01-15 | 2006-07-18 | Tribotek, Inc. | Contact woven connectors |
US6993392B2 (en) * | 2002-03-14 | 2006-01-31 | Duke University | Miniaturized high-density multichannel electrode array for long-term neuronal recordings |
US7750446B2 (en) * | 2002-04-29 | 2010-07-06 | Interconnect Portfolio Llc | IC package structures having separate circuit interconnection structures and assemblies constructed thereof |
JP4038402B2 (ja) * | 2002-06-26 | 2008-01-23 | アルプス電気株式会社 | 摺動接点と摺動型電気部品及びセンサ |
US6946851B2 (en) * | 2002-07-03 | 2005-09-20 | The Regents Of The University Of California | Carbon nanotube array based sensor |
US7105858B2 (en) * | 2002-08-26 | 2006-09-12 | Onscreen Technologies | Electronic assembly/system with reduced cost, mass, and volume and increased efficiency and power density |
DE10240508A1 (de) * | 2002-09-03 | 2004-03-11 | Schott Glas | Verfahren zur Herstellung eines Geätzten Optischen Faserbündels sowie verbessertes Geätztes Optisches Faserbündel |
US20040094328A1 (en) * | 2002-11-16 | 2004-05-20 | Fjelstad Joseph C. | Cabled signaling system and components thereof |
JP4406697B2 (ja) | 2003-01-17 | 2010-02-03 | 財団法人生産技術研究奨励会 | フレキシブル神経プローブおよびその製造方法 |
US6956286B2 (en) | 2003-08-05 | 2005-10-18 | International Business Machines Corporation | Integrated circuit package with overlapping bond fingers |
US7052763B2 (en) * | 2003-08-05 | 2006-05-30 | Xerox Corporation | Multi-element connector |
US20050029646A1 (en) * | 2003-08-07 | 2005-02-10 | Matsushita Electric Industrial Co., Ltd. | Semiconductor device and method for dividing substrate |
WO2005039696A1 (en) * | 2003-10-21 | 2005-05-06 | The Regents Of The University Of Michigan | Intracranial neural interface system |
JP4138689B2 (ja) * | 2004-03-30 | 2008-08-27 | 株式会社東芝 | インターフェイスモジュール付lsiパッケージ及びlsiパッケージ |
US7148428B2 (en) * | 2004-09-27 | 2006-12-12 | Intel Corporation | Flexible cable for high-speed interconnect |
US7626123B2 (en) * | 2005-12-12 | 2009-12-01 | Raytheon Sarcos, Llc | Electrical microfilament to circuit interface |
US7603153B2 (en) * | 2005-12-12 | 2009-10-13 | Sterling Investments Lc | Multi-element probe array |
US7333699B2 (en) * | 2005-12-12 | 2008-02-19 | Raytheon Sarcos, Llc | Ultra-high density connector |
US7837654B2 (en) * | 2005-12-15 | 2010-11-23 | The United States Of America As Represented By The Secretary Of The Army | Precision sensing and treatment delivery device for promoting healing in living tissue |
FR2908922B1 (fr) * | 2006-11-22 | 2011-04-08 | Nexans | Cable de controle electrique |
-
2006
- 2006-12-11 US US11/637,380 patent/US7626123B2/en not_active Expired - Fee Related
- 2006-12-12 EP EP06847580.5A patent/EP1982354A4/en not_active Withdrawn
- 2006-12-12 JP JP2008545751A patent/JP5478890B2/ja not_active Expired - Fee Related
- 2006-12-12 WO PCT/US2006/047432 patent/WO2007070533A2/en active Application Filing
-
2009
- 2009-11-09 US US12/615,202 patent/US8026447B2/en not_active Expired - Fee Related
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2011
- 2011-08-18 US US13/213,001 patent/US8217269B2/en not_active Expired - Fee Related
Also Published As
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WO2007070533A3 (en) | 2008-06-05 |
EP1982354A2 (en) | 2008-10-22 |
EP1982354A4 (en) | 2013-10-09 |
US7626123B2 (en) | 2009-12-01 |
WO2007070533A2 (en) | 2007-06-21 |
JP2009519611A (ja) | 2009-05-14 |
US20110310577A1 (en) | 2011-12-22 |
US8026447B2 (en) | 2011-09-27 |
US20070132109A1 (en) | 2007-06-14 |
US20100116869A1 (en) | 2010-05-13 |
US8217269B2 (en) | 2012-07-10 |
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