JP5458236B2 - 電気ヒューズ判定回路及び判定方法 - Google Patents

電気ヒューズ判定回路及び判定方法 Download PDF

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Publication number
JP5458236B2
JP5458236B2 JP2007286414A JP2007286414A JP5458236B2 JP 5458236 B2 JP5458236 B2 JP 5458236B2 JP 2007286414 A JP2007286414 A JP 2007286414A JP 2007286414 A JP2007286414 A JP 2007286414A JP 5458236 B2 JP5458236 B2 JP 5458236B2
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JP
Japan
Prior art keywords
electric fuse
fuse element
voltage level
determination
electrical
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Expired - Fee Related
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JP2007286414A
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English (en)
Japanese (ja)
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JP2009117478A (ja
JP2009117478A5 (https=
Inventor
宏 赤松
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PS4 Luxco SARL
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PS4 Luxco SARL
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Priority to JP2007286414A priority Critical patent/JP5458236B2/ja
Priority to US12/289,588 priority patent/US7791402B2/en
Publication of JP2009117478A publication Critical patent/JP2009117478A/ja
Publication of JP2009117478A5 publication Critical patent/JP2009117478A5/ja
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    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C17/00—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
    • G11C17/14—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards in which contents are determined by selectively establishing, breaking or modifying connecting links by permanently altering the state of coupling elements, e.g. PROM
    • G11C17/18—Auxiliary circuits, e.g. for writing into memory

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  • Semiconductor Integrated Circuits (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
  • Read Only Memory (AREA)
JP2007286414A 2007-11-02 2007-11-02 電気ヒューズ判定回路及び判定方法 Expired - Fee Related JP5458236B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2007286414A JP5458236B2 (ja) 2007-11-02 2007-11-02 電気ヒューズ判定回路及び判定方法
US12/289,588 US7791402B2 (en) 2007-11-02 2008-10-30 Electric fuse determination circuit and determination method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2007286414A JP5458236B2 (ja) 2007-11-02 2007-11-02 電気ヒューズ判定回路及び判定方法

Publications (3)

Publication Number Publication Date
JP2009117478A JP2009117478A (ja) 2009-05-28
JP2009117478A5 JP2009117478A5 (https=) 2010-11-18
JP5458236B2 true JP5458236B2 (ja) 2014-04-02

Family

ID=40587498

Family Applications (1)

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JP2007286414A Expired - Fee Related JP5458236B2 (ja) 2007-11-02 2007-11-02 電気ヒューズ判定回路及び判定方法

Country Status (2)

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US (1) US7791402B2 (https=)
JP (1) JP5458236B2 (https=)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013004668A (ja) * 2011-06-15 2013-01-07 Elpida Memory Inc 半導体装置および判定方法
US11469223B2 (en) * 2019-05-31 2022-10-11 Analog Devices International Unlimited Company High precision switched capacitor MOSFET current measurement technique

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4837520A (en) * 1985-03-29 1989-06-06 Honeywell Inc. Fuse status detection circuit
JP2991575B2 (ja) * 1992-10-08 1999-12-20 沖電気工業株式会社 半導体集積回路
JPH07169293A (ja) * 1993-12-14 1995-07-04 Mitsubishi Electric Corp 半導体記憶装置
US6023431A (en) * 1996-10-03 2000-02-08 Micron Technology, Inc. Low current redundancy anti-fuse method and apparatus
US5889414A (en) * 1997-04-28 1999-03-30 Mosel Vitelic Corporation Programmable circuits
JP2007116045A (ja) * 2005-10-24 2007-05-10 Elpida Memory Inc 半導体装置
JP2007158104A (ja) * 2005-12-06 2007-06-21 Nec Electronics Corp ヒューズ回路を有する半導体集積回路及びその製造方法

Also Published As

Publication number Publication date
JP2009117478A (ja) 2009-05-28
US7791402B2 (en) 2010-09-07
US20090115493A1 (en) 2009-05-07

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