JP5457045B2 - 半導体装置及びその製造方法 - Google Patents

半導体装置及びその製造方法 Download PDF

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Publication number
JP5457045B2
JP5457045B2 JP2009029564A JP2009029564A JP5457045B2 JP 5457045 B2 JP5457045 B2 JP 5457045B2 JP 2009029564 A JP2009029564 A JP 2009029564A JP 2009029564 A JP2009029564 A JP 2009029564A JP 5457045 B2 JP5457045 B2 JP 5457045B2
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Japan
Prior art keywords
fin
region
impurity
type semiconductor
semiconductor device
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JP2009029564A
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English (en)
Japanese (ja)
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JP2010186852A5 (enExample
JP2010186852A (ja
Inventor
智洋 奥村
隆行 甲斐
雄一朗 佐々木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Corp
Panasonic Holdings Corp
Original Assignee
Panasonic Corp
Matsushita Electric Industrial Co Ltd
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Publication date
Application filed by Panasonic Corp, Matsushita Electric Industrial Co Ltd filed Critical Panasonic Corp
Priority to JP2009029564A priority Critical patent/JP5457045B2/ja
Priority to PCT/JP2010/000285 priority patent/WO2010092748A1/ja
Priority to US12/866,649 priority patent/US8324685B2/en
Publication of JP2010186852A publication Critical patent/JP2010186852A/ja
Publication of JP2010186852A5 publication Critical patent/JP2010186852A5/ja
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/22—Diffusion of impurity materials, e.g. doping materials, electrode materials, into or out of a semiconductor body, or between semiconductor regions; Interactions between two or more impurities; Redistribution of impurities
    • H01L21/223—Diffusion of impurity materials, e.g. doping materials, electrode materials, into or out of a semiconductor body, or between semiconductor regions; Interactions between two or more impurities; Redistribution of impurities using diffusion into or out of a solid from or into a gaseous phase
    • H01L21/2236—Diffusion of impurity materials, e.g. doping materials, electrode materials, into or out of a semiconductor body, or between semiconductor regions; Interactions between two or more impurities; Redistribution of impurities using diffusion into or out of a solid from or into a gaseous phase from or into a plasma phase
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00—Field-effect transistors [FET]
    • H10D30/01—Manufacture or treatment
    • H10D30/021—Manufacture or treatment of FETs having insulated gates [IGFET]
    • H10D30/024—Manufacture or treatment of FETs having insulated gates [IGFET] of fin field-effect transistors [FinFET]
    • H10D30/0241—Manufacture or treatment of FETs having insulated gates [IGFET] of fin field-effect transistors [FinFET] doping of vertical sidewalls, e.g. using tilted or multi-angled implants
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00—Field-effect transistors [FET]
    • H10D30/60—Insulated-gate field-effect transistors [IGFET]
    • H10D30/62—Fin field-effect transistors [FinFET]

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Thin Film Transistor (AREA)
  • Insulated Gate Type Field-Effect Transistor (AREA)
JP2009029564A 2009-02-12 2009-02-12 半導体装置及びその製造方法 Active JP5457045B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2009029564A JP5457045B2 (ja) 2009-02-12 2009-02-12 半導体装置及びその製造方法
PCT/JP2010/000285 WO2010092748A1 (ja) 2009-02-12 2010-01-20 半導体装置、その製造方法及びプラズマドーピングシステム
US12/866,649 US8324685B2 (en) 2009-02-12 2010-01-20 Semiconductor device having a fin-type semiconductor region

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2009029564A JP5457045B2 (ja) 2009-02-12 2009-02-12 半導体装置及びその製造方法

Publications (3)

Publication Number Publication Date
JP2010186852A JP2010186852A (ja) 2010-08-26
JP2010186852A5 JP2010186852A5 (enExample) 2012-02-09
JP5457045B2 true JP5457045B2 (ja) 2014-04-02

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JP2009029564A Active JP5457045B2 (ja) 2009-02-12 2009-02-12 半導体装置及びその製造方法

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US (1) US8324685B2 (enExample)
JP (1) JP5457045B2 (enExample)
WO (1) WO2010092748A1 (enExample)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5457045B2 (ja) 2009-02-12 2014-04-02 パナソニック株式会社 半導体装置及びその製造方法
JP2011129678A (ja) * 2009-12-17 2011-06-30 Panasonic Corp 半導体装置及びその製造方法
JP2013051221A (ja) * 2009-12-28 2013-03-14 Panasonic Corp 半導体装置の製造方法及びプラズマドーピング装置
US8637359B2 (en) * 2011-06-10 2014-01-28 International Business Machines Corporation Fin-last replacement metal gate FinFET process
JP6537341B2 (ja) 2014-05-07 2019-07-03 株式会社半導体エネルギー研究所 半導体装置
CN105633152B (zh) 2014-11-05 2019-12-10 联华电子股份有限公司 半导体结构及其制作方法
KR102427596B1 (ko) * 2015-09-03 2022-07-29 삼성전자주식회사 반도체 장치 및 이의 제조 방법
US10629494B2 (en) * 2017-06-26 2020-04-21 Taiwan Semiconductor Manufacturing Company, Ltd. Semiconductor device and method

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4912065A (en) * 1987-05-28 1990-03-27 Matsushita Electric Industrial Co., Ltd. Plasma doping method
JPH0758695B2 (ja) 1987-05-28 1995-06-21 松下電器産業株式会社 プラズマドーピング方法
KR930003857B1 (ko) * 1987-08-05 1993-05-14 마쯔시다덴기산교 가부시기가이샤 플라즈마 도우핑방법
JP3165304B2 (ja) * 1992-12-04 2001-05-14 株式会社半導体エネルギー研究所 半導体装置の作製方法及び半導体処理装置
JP3134910B2 (ja) * 1993-09-07 2001-02-13 株式会社半導体エネルギー研究所 半導体装置の作製方法および液晶ディスプレイ用集積回路の作製方法
US6855990B2 (en) * 2002-11-26 2005-02-15 Taiwan Semiconductor Manufacturing Co., Ltd Strained-channel multiple-gate transistor
US20040235281A1 (en) * 2003-04-25 2004-11-25 Downey Daniel F. Apparatus and methods for junction formation using optical illumination
US7981779B2 (en) * 2003-10-09 2011-07-19 Panasonic Corporation Method for making junction and processed material formed using the same
EP1826814B8 (en) * 2004-12-13 2011-04-13 Panasonic Corporation Plasma doping method
US7282766B2 (en) * 2005-01-17 2007-10-16 Fujitsu Limited Fin-type semiconductor device with low contact resistance
JP2006196821A (ja) 2005-01-17 2006-07-27 Fujitsu Ltd 半導体装置とその製造方法
EP1892765A1 (en) * 2006-08-23 2008-02-27 INTERUNIVERSITAIR MICROELEKTRONICA CENTRUM vzw (IMEC) Method for doping a fin-based semiconductor device
CN101601138B (zh) * 2007-01-22 2012-07-25 松下电器产业株式会社 半导体装置及其制造方法
US8063437B2 (en) * 2007-07-27 2011-11-22 Panasonic Corporation Semiconductor device and method for producing the same
US8004045B2 (en) * 2007-07-27 2011-08-23 Panasonic Corporation Semiconductor device and method for producing the same
JP4814960B2 (ja) 2007-07-27 2011-11-16 パナソニック株式会社 半導体装置の製造方法
JP2010050188A (ja) * 2008-08-20 2010-03-04 Panasonic Corp プラズマドーピング装置
JP5457045B2 (ja) 2009-02-12 2014-04-02 パナソニック株式会社 半導体装置及びその製造方法
JP4598886B1 (ja) 2009-07-27 2010-12-15 パナソニック株式会社 半導体装置の製造方法及びプラズマドーピング装置
WO2011013271A1 (ja) * 2009-07-27 2011-02-03 パナソニック株式会社 半導体装置の製造方法及びプラズマドーピング装置

Also Published As

Publication number Publication date
US8324685B2 (en) 2012-12-04
JP2010186852A (ja) 2010-08-26
US20110049628A1 (en) 2011-03-03
WO2010092748A1 (ja) 2010-08-19

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