JP5427367B2 - 矩形サセプタの非対称な接地 - Google Patents

矩形サセプタの非対称な接地 Download PDF

Info

Publication number
JP5427367B2
JP5427367B2 JP2008120346A JP2008120346A JP5427367B2 JP 5427367 B2 JP5427367 B2 JP 5427367B2 JP 2008120346 A JP2008120346 A JP 2008120346A JP 2008120346 A JP2008120346 A JP 2008120346A JP 5427367 B2 JP5427367 B2 JP 5427367B2
Authority
JP
Japan
Prior art keywords
chamber
electrode
susceptor
strap
ground
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2008120346A
Other languages
English (en)
Japanese (ja)
Other versions
JP2008274437A5 (enExample
JP2008274437A (ja
Inventor
フルタ ガク
ヤング チョイ スー
ジン チョイ ヤング
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Applied Materials Inc
Original Assignee
Applied Materials Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Applied Materials Inc filed Critical Applied Materials Inc
Publication of JP2008274437A publication Critical patent/JP2008274437A/ja
Publication of JP2008274437A5 publication Critical patent/JP2008274437A5/ja
Application granted granted Critical
Publication of JP5427367B2 publication Critical patent/JP5427367B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/458—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
    • C23C16/4582—Rigid and flat substrates, e.g. plates or discs
    • C23C16/4583—Rigid and flat substrates, e.g. plates or discs the substrate being supported substantially horizontally
    • C23C16/4585—Devices at or outside the perimeter of the substrate support, e.g. clamping rings, shrouds
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/50—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
    • C23C16/505—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges
    • C23C16/509—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges using internal electrodes
    • C23C16/5096—Flat-bed apparatus
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32082—Radio frequency generated discharge
    • H01J37/32091—Radio frequency generated discharge the radio frequency energy being capacitively coupled to the plasma
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/32431—Constructional details of the reactor
    • H01J37/32532—Electrodes
    • H01J37/32568—Relative arrangement or disposition of electrodes; moving means
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/32431—Constructional details of the reactor
    • H01J37/32532—Electrodes
    • H01J37/32577—Electrical connecting means
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/32431—Constructional details of the reactor
    • H01J37/32623—Mechanical discharge control means
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/32431—Constructional details of the reactor
    • H01J37/32697—Electrostatic control
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45563—Gas nozzles
    • C23C16/45565—Shower nozzles

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • Analytical Chemistry (AREA)
  • Materials Engineering (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Vapour Deposition (AREA)
  • Plasma Technology (AREA)
JP2008120346A 2007-05-03 2008-05-02 矩形サセプタの非対称な接地 Active JP5427367B2 (ja)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US91583307P 2007-05-03 2007-05-03
US60/915,833 2007-05-03
US11/775,359 US7972470B2 (en) 2007-05-03 2007-07-10 Asymmetric grounding of rectangular susceptor
US11/775,359 2007-07-10

Publications (3)

Publication Number Publication Date
JP2008274437A JP2008274437A (ja) 2008-11-13
JP2008274437A5 JP2008274437A5 (enExample) 2011-02-17
JP5427367B2 true JP5427367B2 (ja) 2014-02-26

Family

ID=39939727

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008120346A Active JP5427367B2 (ja) 2007-05-03 2008-05-02 矩形サセプタの非対称な接地

Country Status (5)

Country Link
US (2) US7972470B2 (enExample)
JP (1) JP5427367B2 (enExample)
KR (2) KR101011407B1 (enExample)
CN (2) CN101298670B (enExample)
TW (2) TWI377638B (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2021111760A1 (ja) 2019-12-06 2021-06-10 株式会社アドバンテック 対象物を加熱及び冷却するためのステージ
WO2022172848A1 (ja) 2021-02-09 2022-08-18 株式会社アドバンテック 対象物を加熱及び冷却するためのステージ

Families Citing this family (72)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101647090B (zh) * 2007-03-01 2012-08-29 应用材料公司 射频遮板及沉积方法
US7972470B2 (en) * 2007-05-03 2011-07-05 Applied Materials, Inc. Asymmetric grounding of rectangular susceptor
US7988815B2 (en) * 2007-07-26 2011-08-02 Applied Materials, Inc. Plasma reactor with reduced electrical skew using electrical bypass elements
US8784622B2 (en) * 2007-12-06 2014-07-22 Intevac, Inc. System and method for dual-sided sputter etch of substrates
EP2232958A4 (en) * 2007-12-25 2011-01-19 Applied Materials Inc ASYMMETRIC RF CONTROL FOR THE ELECTRODE OF A PLASMA CHAMBER
JP5749020B2 (ja) * 2008-01-31 2015-07-15 アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated Rf電力をプラズマチャンバに結合するための装置
US20100136261A1 (en) * 2008-12-03 2010-06-03 Applied Materials, Inc. Modulation of rf returning straps for uniformity control
JP2012510727A (ja) * 2008-12-03 2012-05-10 アプライド マテリアルズ インコーポレイテッド 均一性制御のためのrf帰還用ストラップの調整
KR101534024B1 (ko) * 2008-12-10 2015-07-08 주성엔지니어링(주) 기판처리장치
CN102365906B (zh) * 2009-02-13 2016-02-03 应用材料公司 用于等离子体腔室电极的rf总线与rf回流总线
US8466697B2 (en) * 2009-04-28 2013-06-18 Lam Research Corporation Arrangements for detecting discontinuity of flexible connections for current flow and methods thereof
CN102460649B (zh) * 2009-05-13 2015-03-11 应用材料公司 经阳极处理的喷头
JP2010287639A (ja) * 2009-06-10 2010-12-24 Hitachi High-Technologies Corp プラズマ処理装置
US8360003B2 (en) * 2009-07-13 2013-01-29 Applied Materials, Inc. Plasma reactor with uniform process rate distribution by improved RF ground return path
KR200476124Y1 (ko) * 2009-09-29 2015-01-30 어플라이드 머티어리얼스, 인코포레이티드 Rf­전력공급 샤워헤드를 위한 편심 접지 복귀
KR101127757B1 (ko) * 2009-12-02 2012-03-23 주식회사 테스 서셉터 접지유닛, 이를 이용하여 서셉터 접지의 가변방법 및 이를 갖는 공정챔버
JP5782226B2 (ja) 2010-03-24 2015-09-24 東京エレクトロン株式会社 基板処理装置
US8778813B2 (en) * 2010-05-12 2014-07-15 Applied Materials, Inc. Confined process volume PECVD chamber
JP5375763B2 (ja) * 2010-07-27 2013-12-25 三菱電機株式会社 プラズマ装置およびこれを用いた半導体薄膜の製造方法
CN102810770B (zh) * 2011-05-31 2015-03-04 中微半导体设备(上海)有限公司 实现等离子体刻蚀腔体与阴极之间电连接的接地器件
JP5824330B2 (ja) * 2011-11-07 2015-11-25 ルネサスエレクトロニクス株式会社 半導体装置及び半導体装置の製造方法
US9508530B2 (en) 2011-11-21 2016-11-29 Lam Research Corporation Plasma processing chamber with flexible symmetric RF return strap
US9083182B2 (en) 2011-11-21 2015-07-14 Lam Research Corporation Bypass capacitors for high voltage bias power in the mid frequency RF range
US10586686B2 (en) 2011-11-22 2020-03-10 Law Research Corporation Peripheral RF feed and symmetric RF return for symmetric RF delivery
US8898889B2 (en) 2011-11-22 2014-12-02 Lam Research Corporation Chuck assembly for plasma processing
US9263240B2 (en) * 2011-11-22 2016-02-16 Lam Research Corporation Dual zone temperature control of upper electrodes
US9396908B2 (en) 2011-11-22 2016-07-19 Lam Research Corporation Systems and methods for controlling a plasma edge region
KR101971312B1 (ko) * 2011-11-23 2019-04-22 램 리써치 코포레이션 다중 존 가스 주입 상부 전극 시스템
CN102543641B (zh) * 2012-01-20 2015-07-08 中微半导体设备(上海)有限公司 实现等离子体刻蚀腔体弹性接触的连接器件
WO2013122954A1 (en) * 2012-02-13 2013-08-22 Applied Materials, Inc. Linear pecvd apparatus
US8911588B2 (en) * 2012-03-19 2014-12-16 Lam Research Corporation Methods and apparatus for selectively modifying RF current paths in a plasma processing system
US9245720B2 (en) * 2012-06-12 2016-01-26 Lam Research Corporation Methods and apparatus for detecting azimuthal non-uniformity in a plasma processing system
CN104508180A (zh) * 2012-07-27 2015-04-08 应用材料公司 粗糙化的基板支撑件
KR102017744B1 (ko) 2012-12-12 2019-10-15 삼성디스플레이 주식회사 증착 장치, 이를 이용한 박막 형성 방법 및 유기 발광 표시 장치 제조 방법
TW201437423A (zh) * 2013-02-21 2014-10-01 應用材料股份有限公司 用於注射器至基板的空隙控制之裝置及方法
TWI613412B (zh) * 2013-03-11 2018-02-01 Applied Materials, Inc. 高溫處理室蓋體
CN103474319B (zh) * 2013-09-12 2015-11-18 武汉新芯集成电路制造有限公司 一种减少晶圆葡萄球状缺陷的离子注入机
US20150211114A1 (en) * 2014-01-30 2015-07-30 Applied Materials, Inc. Bottom pump and purge and bottom ozone clean hardware to reduce fall-on particle defects
JP6233209B2 (ja) * 2014-06-30 2017-11-22 豊田合成株式会社 サセプターとその製造方法
CN104368288A (zh) * 2014-11-25 2015-02-25 三明学院 低真空低温射频感性耦合等离子体反应器及其使用方法
TW201629264A (zh) 2015-01-22 2016-08-16 應用材料股份有限公司 用於間隙偵測的智能止動器及控制機制
CN104947072B (zh) * 2015-05-14 2017-12-05 昆山龙腾光电有限公司 在基板上制作氧化硅薄膜的方法以及薄膜晶体管阵列基板的制作方法
KR20180006496A (ko) 2015-06-05 2018-01-17 어플라이드 머티어리얼스, 인코포레이티드 서셉터 포지션 및 회전 장치, 및 사용 방법들
TWI723024B (zh) 2015-06-26 2021-04-01 美商應用材料股份有限公司 用於改良的氣體分配的遞迴注入設備
KR102099382B1 (ko) * 2015-10-07 2020-04-13 주식회사 원익아이피에스 기판처리장치
CN109075007B (zh) * 2016-06-21 2021-07-06 应用材料公司 Rf返回条带屏蔽盖罩
EP3563402B1 (en) * 2016-12-27 2021-01-27 Evatec AG Rf capacitive coupled etch reactor and method of etching
KR102399343B1 (ko) * 2017-05-29 2022-05-19 삼성디스플레이 주식회사 화학기상 증착장치
EP3588533A1 (en) * 2018-06-21 2020-01-01 Nederlandse Organisatie voor toegepast- natuurwetenschappelijk onderzoek TNO Plasma source and method of operating the same
CN111326387B (zh) 2018-12-17 2023-04-21 中微半导体设备(上海)股份有限公司 一种电容耦合等离子体刻蚀设备
CN111326389B (zh) * 2018-12-17 2023-06-16 中微半导体设备(上海)股份有限公司 一种电容耦合等离子体刻蚀设备
KR102700366B1 (ko) * 2019-01-29 2024-08-30 주성엔지니어링(주) 샤워헤드 및 이를 포함하는 기판처리장치
US12467139B2 (en) * 2019-03-29 2025-11-11 Applied Materials Inc. Multizone flow distribution system
CN114008755B (zh) * 2019-04-29 2024-12-20 应用材料公司 接地带组件
US11549183B2 (en) * 2019-05-24 2023-01-10 Applied Materials, Inc. Showerhead with inlet mixer
CN110289235B (zh) * 2019-07-09 2021-07-09 北京北方华创微电子装备有限公司 开盖装置和半导体加工设备
CN112447475B (zh) * 2019-09-05 2023-09-29 中微半导体设备(上海)股份有限公司 一种具有柔性电介质薄片的等离子体处理装置
JP7413099B2 (ja) * 2020-03-16 2024-01-15 東京エレクトロン株式会社 成膜方法および成膜装置
US11443921B2 (en) 2020-06-11 2022-09-13 Applied Materials, Inc. Radio frequency ground system and method
KR102979812B1 (ko) * 2020-09-04 2026-06-24 삼성디스플레이 주식회사 증착 장치
CN114203506B (zh) * 2020-09-18 2024-03-12 中微半导体设备(上海)股份有限公司 一种等离子体处理装置及其方法
CN114678247B (zh) * 2020-12-24 2025-09-09 中微半导体设备(上海)股份有限公司 一种接地环及其调节方法及等离子体处理装置
JP7560214B2 (ja) * 2021-03-11 2024-10-02 東京エレクトロン株式会社 着火方法及びプラズマ処理装置
CN117355920A (zh) * 2021-04-01 2024-01-05 应用材料公司 用于使用等离子体形成薄膜的接地返回
US12378669B2 (en) 2022-01-28 2025-08-05 Applied Materials, Inc. Ground return for thin film formation using plasma
TWI817606B (zh) * 2022-07-13 2023-10-01 友威科技股份有限公司 雙電極連續式電漿製程系統
KR102945037B1 (ko) * 2022-07-19 2026-03-27 삼성디스플레이 주식회사 기판 가공 장치
USD1080812S1 (en) 2022-08-29 2025-06-24 Applied Materials, Inc. Gas mixer
US12644182B2 (en) 2022-08-29 2026-06-02 Applied Materials, Inc. Gas distribution apparatuses for improving mixing uniformity
JP2024100302A (ja) * 2023-01-16 2024-07-26 キオクシア株式会社 プラズマcvd(化学気相成長)装置及び成膜方法
US20250125121A1 (en) * 2023-10-16 2025-04-17 Uvat Technology Co.,Ltd. Two-electrode continuous plasma processing system
CN120824211A (zh) * 2024-04-09 2025-10-21 中微半导体设备(广州)有限公司 半导体处理设备及其工作方法

Family Cites Families (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US602404A (en) * 1898-04-12 John mueller
JPH08306670A (ja) 1995-05-09 1996-11-22 Sony Corp プラズマアッシング装置
JPH1079350A (ja) * 1996-09-04 1998-03-24 Kokusai Electric Co Ltd プラズマ処理装置
US6024044A (en) 1997-10-09 2000-02-15 Applied Komatsu Technology, Inc. Dual frequency excitation of plasma for film deposition
US6857387B1 (en) * 2000-05-03 2005-02-22 Applied Materials, Inc. Multiple frequency plasma chamber with grounding capacitor at cathode
US6358376B1 (en) 2000-07-10 2002-03-19 Applied Materials, Inc. Biased shield in a magnetron sputter reactor
EP1564794B1 (en) * 2002-10-29 2011-07-06 Mitsubishi Heavy Industries, Ltd. Method and device for generating uniform high- frequency plasma over large surface area
US7083702B2 (en) * 2003-06-12 2006-08-01 Applied Materials, Inc. RF current return path for a large area substrate plasma reactor
US7534301B2 (en) * 2004-09-21 2009-05-19 Applied Materials, Inc. RF grounding of cathode in process chamber
US7354288B2 (en) * 2005-06-03 2008-04-08 Applied Materials, Inc. Substrate support with clamping electrical connector
US20070221128A1 (en) * 2006-03-23 2007-09-27 Soo Young Choi Method and apparatus for improving uniformity of large-area substrates
US8004293B2 (en) * 2006-11-20 2011-08-23 Applied Materials, Inc. Plasma processing chamber with ground member integrity indicator and method for using the same
US8381677B2 (en) * 2006-12-20 2013-02-26 Applied Materials, Inc. Prevention of film deposition on PECVD process chamber wall
US7884025B2 (en) * 2007-01-30 2011-02-08 Applied Materials, Inc. Plasma process uniformity across a wafer by apportioning ground return path impedances among plural VHF sources
CN101647090B (zh) * 2007-03-01 2012-08-29 应用材料公司 射频遮板及沉积方法
US7972470B2 (en) * 2007-05-03 2011-07-05 Applied Materials, Inc. Asymmetric grounding of rectangular susceptor
US20080289686A1 (en) * 2007-05-23 2008-11-27 Tae Kyung Won Method and apparatus for depositing a silicon layer on a transmitting conductive oxide layer suitable for use in solar cell applications
US7964430B2 (en) * 2007-05-23 2011-06-21 Applied Materials, Inc. Silicon layer on a laser transparent conductive oxide layer suitable for use in solar cell applications
US8142606B2 (en) * 2007-06-07 2012-03-27 Applied Materials, Inc. Apparatus for depositing a uniform silicon film and methods for manufacturing the same
US20080302303A1 (en) * 2007-06-07 2008-12-11 Applied Materials, Inc. Methods and apparatus for depositing a uniform silicon film with flow gradient designs
US20090107955A1 (en) * 2007-10-26 2009-04-30 Tiner Robin L Offset liner for chamber evacuation
CN101978473B (zh) * 2008-03-20 2015-11-25 应用材料公司 具有滚轧成型表面的基座和制造所述基座的方法
TWI495402B (zh) * 2008-10-09 2015-08-01 應用材料股份有限公司 具有射頻迴流路徑之電漿處理腔室
TWI527930B (zh) * 2009-02-04 2016-04-01 應用材料股份有限公司 用於電漿製程的接地回流路徑
US9508530B2 (en) * 2011-11-21 2016-11-29 Lam Research Corporation Plasma processing chamber with flexible symmetric RF return strap

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2021111760A1 (ja) 2019-12-06 2021-06-10 株式会社アドバンテック 対象物を加熱及び冷却するためのステージ
US12680167B2 (en) 2019-12-06 2026-07-14 Advantec Co., Ltd. Stage for heating and cooling object
WO2022172848A1 (ja) 2021-02-09 2022-08-18 株式会社アドバンテック 対象物を加熱及び冷却するためのステージ

Also Published As

Publication number Publication date
KR20100090675A (ko) 2010-08-16
KR101011407B1 (ko) 2011-01-28
TW200910497A (en) 2009-03-01
US20080274297A1 (en) 2008-11-06
TWI377638B (en) 2012-11-21
US8877301B2 (en) 2014-11-04
CN101298670B (zh) 2012-02-01
CN101906621A (zh) 2010-12-08
KR20080097957A (ko) 2008-11-06
CN101298670A (zh) 2008-11-05
US20110236599A1 (en) 2011-09-29
TWI376763B (en) 2012-11-11
US7972470B2 (en) 2011-07-05
KR101274659B1 (ko) 2013-06-17
TW201042724A (en) 2010-12-01
JP2008274437A (ja) 2008-11-13
CN101906621B (zh) 2012-10-31

Similar Documents

Publication Publication Date Title
JP2008274437A (ja) 矩形サセプタの非対称な接地
TWI840341B (zh) 用於基板支撐件的處理套組
US12255052B2 (en) Process control for ion energy delivery using multiple generators and phase control
TWI388242B (zh) 用以增強電槳徑向分佈之磁性控制的電漿限制擋件及流動等化件
US20090197015A1 (en) Method and apparatus for controlling plasma uniformity
US20060228496A1 (en) Plasma uniformity control by gas diffuser curvature
US20070193513A1 (en) Plasma generating method, plasma generating apparatus, and plasma processing apparatus
TW202101525A (zh) 電漿處理裝置及電漿處理方法
US20160281225A1 (en) Plasma-enhanced chemical vapor deposition (pe-cvd) apparatus and method of operating the same
JPH11233292A (ja) プラズマ処理装置
US20040231797A1 (en) Apparatus for manufacturing semiconductor device
TWI890674B (zh) 接地帶組件
CN101855707B (zh) 等离子处理装置
US20130104803A1 (en) Thin film forming apparatus
CN103871819A (zh) 用于高均匀性hjt形成的大尺寸腔室
KR20100088996A (ko) 유도결합형 플라즈마 발생소스 전극 및 이를 포함하는 기판처리 장치
TW202427537A (zh) 用於基板支撐件的處理套組
JP4594770B2 (ja) プラズマcvd装置
JP3143290U (ja) プラズマ生成用電極
CN117355920A (zh) 用于使用等离子体形成薄膜的接地返回
CN118556275A (zh) 用于使用等离子体形成薄膜的接地回路
WO2011121778A1 (ja) 薄膜多結晶シリコン、その製造方法および薄膜多結晶シリコンを製造するプラズマ装置
CN101807508A (zh) 基板处理设备

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20101222

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20101222

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20121210

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20130115

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20130412

A602 Written permission of extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A602

Effective date: 20130417

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20130514

A602 Written permission of extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A602

Effective date: 20130517

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20130607

A602 Written permission of extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A602

Effective date: 20130612

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20130704

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20131105

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20131202

R150 Certificate of patent or registration of utility model

Free format text: JAPANESE INTERMEDIATE CODE: R150

Ref document number: 5427367

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250