JP5427367B2 - 矩形サセプタの非対称な接地 - Google Patents
矩形サセプタの非対称な接地 Download PDFInfo
- Publication number
- JP5427367B2 JP5427367B2 JP2008120346A JP2008120346A JP5427367B2 JP 5427367 B2 JP5427367 B2 JP 5427367B2 JP 2008120346 A JP2008120346 A JP 2008120346A JP 2008120346 A JP2008120346 A JP 2008120346A JP 5427367 B2 JP5427367 B2 JP 5427367B2
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- JP
- Japan
- Prior art keywords
- chamber
- electrode
- susceptor
- strap
- ground
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/458—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
- C23C16/4582—Rigid and flat substrates, e.g. plates or discs
- C23C16/4583—Rigid and flat substrates, e.g. plates or discs the substrate being supported substantially horizontally
- C23C16/4585—Devices at or outside the perimeter of the substrate support, e.g. clamping rings, shrouds
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/50—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
- C23C16/505—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges
- C23C16/509—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges using internal electrodes
- C23C16/5096—Flat-bed apparatus
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/32091—Radio frequency generated discharge the radio frequency energy being capacitively coupled to the plasma
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32532—Electrodes
- H01J37/32568—Relative arrangement or disposition of electrodes; moving means
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32532—Electrodes
- H01J37/32577—Electrical connecting means
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32623—Mechanical discharge control means
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32697—Electrostatic control
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45563—Gas nozzles
- C23C16/45565—Shower nozzles
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Analytical Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Chemical Vapour Deposition (AREA)
- Plasma Technology (AREA)
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US91583307P | 2007-05-03 | 2007-05-03 | |
| US60/915,833 | 2007-05-03 | ||
| US11/775,359 US7972470B2 (en) | 2007-05-03 | 2007-07-10 | Asymmetric grounding of rectangular susceptor |
| US11/775,359 | 2007-07-10 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2008274437A JP2008274437A (ja) | 2008-11-13 |
| JP2008274437A5 JP2008274437A5 (enExample) | 2011-02-17 |
| JP5427367B2 true JP5427367B2 (ja) | 2014-02-26 |
Family
ID=39939727
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2008120346A Active JP5427367B2 (ja) | 2007-05-03 | 2008-05-02 | 矩形サセプタの非対称な接地 |
Country Status (5)
| Country | Link |
|---|---|
| US (2) | US7972470B2 (enExample) |
| JP (1) | JP5427367B2 (enExample) |
| KR (2) | KR101011407B1 (enExample) |
| CN (2) | CN101906621B (enExample) |
| TW (2) | TWI376763B (enExample) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2021111760A1 (ja) | 2019-12-06 | 2021-06-10 | 株式会社アドバンテック | 対象物を加熱及び冷却するためのステージ |
| WO2022172848A1 (ja) | 2021-02-09 | 2022-08-18 | 株式会社アドバンテック | 対象物を加熱及び冷却するためのステージ |
Families Citing this family (68)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101374583B1 (ko) * | 2007-03-01 | 2014-03-17 | 어플라이드 머티어리얼스, 인코포레이티드 | Rf 셔터 |
| US7972470B2 (en) * | 2007-05-03 | 2011-07-05 | Applied Materials, Inc. | Asymmetric grounding of rectangular susceptor |
| US7988815B2 (en) * | 2007-07-26 | 2011-08-02 | Applied Materials, Inc. | Plasma reactor with reduced electrical skew using electrical bypass elements |
| CN101889325B (zh) * | 2007-12-06 | 2014-05-07 | 因特瓦克公司 | 用于衬底的两侧溅射蚀刻的系统和方法 |
| KR101166988B1 (ko) * | 2007-12-25 | 2012-07-24 | 어플라이드 머티어리얼스, 인코포레이티드 | 플라즈마 챔버의 전극에 대한 비대칭 rf 구동 |
| WO2010044895A2 (en) * | 2008-01-31 | 2010-04-22 | Applied Materials, Inc | Multiple phase rf power for electrode of plasma chamber |
| US20100136261A1 (en) * | 2008-12-03 | 2010-06-03 | Applied Materials, Inc. | Modulation of rf returning straps for uniformity control |
| WO2010065474A2 (en) * | 2008-12-03 | 2010-06-10 | Applied Materials, Inc. | Modulation of rf returning straps for uniformity control |
| KR101534024B1 (ko) * | 2008-12-10 | 2015-07-08 | 주성엔지니어링(주) | 기판처리장치 |
| WO2010094002A2 (en) * | 2009-02-13 | 2010-08-19 | Applied Materials, Inc. | Rf bus and rf return bus for plasma chamber electrode |
| US8466697B2 (en) * | 2009-04-28 | 2013-06-18 | Lam Research Corporation | Arrangements for detecting discontinuity of flexible connections for current flow and methods thereof |
| US9758869B2 (en) * | 2009-05-13 | 2017-09-12 | Applied Materials, Inc. | Anodized showerhead |
| JP2010287639A (ja) * | 2009-06-10 | 2010-12-24 | Hitachi High-Technologies Corp | プラズマ処理装置 |
| US8360003B2 (en) | 2009-07-13 | 2013-01-29 | Applied Materials, Inc. | Plasma reactor with uniform process rate distribution by improved RF ground return path |
| KR200476124Y1 (ko) * | 2009-09-29 | 2015-01-30 | 어플라이드 머티어리얼스, 인코포레이티드 | Rf전력공급 샤워헤드를 위한 편심 접지 복귀 |
| KR101127757B1 (ko) * | 2009-12-02 | 2012-03-23 | 주식회사 테스 | 서셉터 접지유닛, 이를 이용하여 서셉터 접지의 가변방법 및 이를 갖는 공정챔버 |
| JP5782226B2 (ja) * | 2010-03-24 | 2015-09-24 | 東京エレクトロン株式会社 | 基板処理装置 |
| CN102884610A (zh) * | 2010-05-12 | 2013-01-16 | 应用材料公司 | 局限工艺空间的pecvd腔室 |
| JP5375763B2 (ja) * | 2010-07-27 | 2013-12-25 | 三菱電機株式会社 | プラズマ装置およびこれを用いた半導体薄膜の製造方法 |
| CN102810770B (zh) * | 2011-05-31 | 2015-03-04 | 中微半导体设备(上海)有限公司 | 实现等离子体刻蚀腔体与阴极之间电连接的接地器件 |
| JP5824330B2 (ja) * | 2011-11-07 | 2015-11-25 | ルネサスエレクトロニクス株式会社 | 半導体装置及び半導体装置の製造方法 |
| US9083182B2 (en) | 2011-11-21 | 2015-07-14 | Lam Research Corporation | Bypass capacitors for high voltage bias power in the mid frequency RF range |
| US9263240B2 (en) * | 2011-11-22 | 2016-02-16 | Lam Research Corporation | Dual zone temperature control of upper electrodes |
| US8898889B2 (en) | 2011-11-22 | 2014-12-02 | Lam Research Corporation | Chuck assembly for plasma processing |
| US10586686B2 (en) | 2011-11-22 | 2020-03-10 | Law Research Corporation | Peripheral RF feed and symmetric RF return for symmetric RF delivery |
| US9396908B2 (en) | 2011-11-22 | 2016-07-19 | Lam Research Corporation | Systems and methods for controlling a plasma edge region |
| CN104024477B (zh) * | 2011-11-23 | 2016-05-18 | 朗姆研究公司 | 多区域气体注入上电极系统 |
| WO2013078434A1 (en) * | 2011-11-24 | 2013-05-30 | Lam Research Corporation | Plasma processing chamber with flexible symmetric rf return strap |
| CN102543641B (zh) * | 2012-01-20 | 2015-07-08 | 中微半导体设备(上海)有限公司 | 实现等离子体刻蚀腔体弹性接触的连接器件 |
| WO2013122954A1 (en) * | 2012-02-13 | 2013-08-22 | Applied Materials, Inc. | Linear pecvd apparatus |
| US8911588B2 (en) * | 2012-03-19 | 2014-12-16 | Lam Research Corporation | Methods and apparatus for selectively modifying RF current paths in a plasma processing system |
| US9245720B2 (en) * | 2012-06-12 | 2016-01-26 | Lam Research Corporation | Methods and apparatus for detecting azimuthal non-uniformity in a plasma processing system |
| KR102101192B1 (ko) * | 2012-07-27 | 2020-04-21 | 어플라이드 머티어리얼스, 인코포레이티드 | 조면화된 기판 지지부 |
| KR102017744B1 (ko) | 2012-12-12 | 2019-10-15 | 삼성디스플레이 주식회사 | 증착 장치, 이를 이용한 박막 형성 방법 및 유기 발광 표시 장치 제조 방법 |
| TW201437423A (zh) | 2013-02-21 | 2014-10-01 | Applied Materials Inc | 用於注射器至基板的空隙控制之裝置及方法 |
| WO2014164743A1 (en) * | 2013-03-11 | 2014-10-09 | Applied Materials, Inc. | High temperature process chamber lid |
| CN103474319B (zh) * | 2013-09-12 | 2015-11-18 | 武汉新芯集成电路制造有限公司 | 一种减少晶圆葡萄球状缺陷的离子注入机 |
| US20150211114A1 (en) * | 2014-01-30 | 2015-07-30 | Applied Materials, Inc. | Bottom pump and purge and bottom ozone clean hardware to reduce fall-on particle defects |
| JP6233209B2 (ja) * | 2014-06-30 | 2017-11-22 | 豊田合成株式会社 | サセプターとその製造方法 |
| CN104368288A (zh) * | 2014-11-25 | 2015-02-25 | 三明学院 | 低真空低温射频感性耦合等离子体反应器及其使用方法 |
| TW201629264A (zh) | 2015-01-22 | 2016-08-16 | 應用材料股份有限公司 | 用於間隙偵測的智能止動器及控制機制 |
| CN104947072B (zh) * | 2015-05-14 | 2017-12-05 | 昆山龙腾光电有限公司 | 在基板上制作氧化硅薄膜的方法以及薄膜晶体管阵列基板的制作方法 |
| US10597779B2 (en) | 2015-06-05 | 2020-03-24 | Applied Materials, Inc. | Susceptor position and rational apparatus and methods of use |
| TWI723024B (zh) | 2015-06-26 | 2021-04-01 | 美商應用材料股份有限公司 | 用於改良的氣體分配的遞迴注入設備 |
| KR102099382B1 (ko) * | 2015-10-07 | 2020-04-13 | 주식회사 원익아이피에스 | 기판처리장치 |
| US20170365449A1 (en) * | 2016-06-21 | 2017-12-21 | Applied Materials, Inc. | Rf return strap shielding cover |
| JP6972131B2 (ja) * | 2016-12-27 | 2021-11-24 | エヴァテック・アーゲー | 真空プラズマ加工対象物処理装置 |
| KR102399343B1 (ko) * | 2017-05-29 | 2022-05-19 | 삼성디스플레이 주식회사 | 화학기상 증착장치 |
| EP3588533A1 (en) * | 2018-06-21 | 2020-01-01 | Nederlandse Organisatie voor toegepast- natuurwetenschappelijk onderzoek TNO | Plasma source and method of operating the same |
| CN111326389B (zh) * | 2018-12-17 | 2023-06-16 | 中微半导体设备(上海)股份有限公司 | 一种电容耦合等离子体刻蚀设备 |
| CN111326387B (zh) | 2018-12-17 | 2023-04-21 | 中微半导体设备(上海)股份有限公司 | 一种电容耦合等离子体刻蚀设备 |
| KR102700366B1 (ko) * | 2019-01-29 | 2024-08-30 | 주성엔지니어링(주) | 샤워헤드 및 이를 포함하는 기판처리장치 |
| US12467139B2 (en) * | 2019-03-29 | 2025-11-11 | Applied Materials Inc. | Multizone flow distribution system |
| JP7446335B2 (ja) * | 2019-04-29 | 2024-03-08 | アプライド マテリアルズ インコーポレイテッド | 接地用ストラップアセンブリ |
| US11549183B2 (en) * | 2019-05-24 | 2023-01-10 | Applied Materials, Inc. | Showerhead with inlet mixer |
| CN110289235B (zh) * | 2019-07-09 | 2021-07-09 | 北京北方华创微电子装备有限公司 | 开盖装置和半导体加工设备 |
| CN112447475B (zh) * | 2019-09-05 | 2023-09-29 | 中微半导体设备(上海)股份有限公司 | 一种具有柔性电介质薄片的等离子体处理装置 |
| JP7413099B2 (ja) * | 2020-03-16 | 2024-01-15 | 東京エレクトロン株式会社 | 成膜方法および成膜装置 |
| US11443921B2 (en) * | 2020-06-11 | 2022-09-13 | Applied Materials, Inc. | Radio frequency ground system and method |
| KR20220031849A (ko) * | 2020-09-04 | 2022-03-14 | 삼성디스플레이 주식회사 | 증착 장치 |
| CN114203506B (zh) * | 2020-09-18 | 2024-03-12 | 中微半导体设备(上海)股份有限公司 | 一种等离子体处理装置及其方法 |
| CN114678247B (zh) * | 2020-12-24 | 2025-09-09 | 中微半导体设备(上海)股份有限公司 | 一种接地环及其调节方法及等离子体处理装置 |
| JP7560214B2 (ja) * | 2021-03-11 | 2024-10-02 | 東京エレクトロン株式会社 | 着火方法及びプラズマ処理装置 |
| JP7610034B2 (ja) * | 2021-04-01 | 2025-01-07 | アプライド マテリアルズ インコーポレイテッド | プラズマを使用した薄膜形成のグランドリターン |
| US12378669B2 (en) | 2022-01-28 | 2025-08-05 | Applied Materials, Inc. | Ground return for thin film formation using plasma |
| TWI817606B (zh) * | 2022-07-13 | 2023-10-01 | 友威科技股份有限公司 | 雙電極連續式電漿製程系統 |
| USD1080812S1 (en) | 2022-08-29 | 2025-06-24 | Applied Materials, Inc. | Gas mixer |
| CN120824211A (zh) * | 2024-04-09 | 2025-10-21 | 中微半导体设备(广州)有限公司 | 半导体处理设备及其工作方法 |
Family Cites Families (25)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US602404A (en) * | 1898-04-12 | John mueller | ||
| JPH08306670A (ja) | 1995-05-09 | 1996-11-22 | Sony Corp | プラズマアッシング装置 |
| JPH1079350A (ja) * | 1996-09-04 | 1998-03-24 | Kokusai Electric Co Ltd | プラズマ処理装置 |
| US6024044A (en) * | 1997-10-09 | 2000-02-15 | Applied Komatsu Technology, Inc. | Dual frequency excitation of plasma for film deposition |
| US6857387B1 (en) * | 2000-05-03 | 2005-02-22 | Applied Materials, Inc. | Multiple frequency plasma chamber with grounding capacitor at cathode |
| US6358376B1 (en) | 2000-07-10 | 2002-03-19 | Applied Materials, Inc. | Biased shield in a magnetron sputter reactor |
| WO2004040629A1 (ja) * | 2002-10-29 | 2004-05-13 | Mitsubishi Heavy Industries, Ltd. | プラズマ化学蒸着装置における高周波プラズマの大面積均一化方法及び装置 |
| US7083702B2 (en) * | 2003-06-12 | 2006-08-01 | Applied Materials, Inc. | RF current return path for a large area substrate plasma reactor |
| US7534301B2 (en) * | 2004-09-21 | 2009-05-19 | Applied Materials, Inc. | RF grounding of cathode in process chamber |
| US7354288B2 (en) * | 2005-06-03 | 2008-04-08 | Applied Materials, Inc. | Substrate support with clamping electrical connector |
| US20070221128A1 (en) * | 2006-03-23 | 2007-09-27 | Soo Young Choi | Method and apparatus for improving uniformity of large-area substrates |
| US8004293B2 (en) * | 2006-11-20 | 2011-08-23 | Applied Materials, Inc. | Plasma processing chamber with ground member integrity indicator and method for using the same |
| US8381677B2 (en) * | 2006-12-20 | 2013-02-26 | Applied Materials, Inc. | Prevention of film deposition on PECVD process chamber wall |
| US8076247B2 (en) * | 2007-01-30 | 2011-12-13 | Applied Materials, Inc. | Plasma process uniformity across a wafer by controlling RF phase between opposing electrodes |
| KR101374583B1 (ko) * | 2007-03-01 | 2014-03-17 | 어플라이드 머티어리얼스, 인코포레이티드 | Rf 셔터 |
| US7972470B2 (en) * | 2007-05-03 | 2011-07-05 | Applied Materials, Inc. | Asymmetric grounding of rectangular susceptor |
| US7964430B2 (en) * | 2007-05-23 | 2011-06-21 | Applied Materials, Inc. | Silicon layer on a laser transparent conductive oxide layer suitable for use in solar cell applications |
| US20080289686A1 (en) * | 2007-05-23 | 2008-11-27 | Tae Kyung Won | Method and apparatus for depositing a silicon layer on a transmitting conductive oxide layer suitable for use in solar cell applications |
| US20080302303A1 (en) * | 2007-06-07 | 2008-12-11 | Applied Materials, Inc. | Methods and apparatus for depositing a uniform silicon film with flow gradient designs |
| US8142606B2 (en) * | 2007-06-07 | 2012-03-27 | Applied Materials, Inc. | Apparatus for depositing a uniform silicon film and methods for manufacturing the same |
| US20090107955A1 (en) * | 2007-10-26 | 2009-04-30 | Tiner Robin L | Offset liner for chamber evacuation |
| CN101978473B (zh) * | 2008-03-20 | 2015-11-25 | 应用材料公司 | 具有滚轧成型表面的基座和制造所述基座的方法 |
| WO2010042860A2 (en) * | 2008-10-09 | 2010-04-15 | Applied Materials, Inc. | Rf return path for large plasma processing chamber |
| CN102308675B (zh) * | 2009-02-04 | 2016-01-13 | 应用材料公司 | 用于等离子体工艺的接地回流路径 |
| WO2013078434A1 (en) * | 2011-11-24 | 2013-05-30 | Lam Research Corporation | Plasma processing chamber with flexible symmetric rf return strap |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2021111760A1 (ja) | 2019-12-06 | 2021-06-10 | 株式会社アドバンテック | 対象物を加熱及び冷却するためのステージ |
| WO2022172848A1 (ja) | 2021-02-09 | 2022-08-18 | 株式会社アドバンテック | 対象物を加熱及び冷却するためのステージ |
Also Published As
| Publication number | Publication date |
|---|---|
| CN101906621B (zh) | 2012-10-31 |
| CN101298670B (zh) | 2012-02-01 |
| US8877301B2 (en) | 2014-11-04 |
| JP2008274437A (ja) | 2008-11-13 |
| TWI377638B (en) | 2012-11-21 |
| US7972470B2 (en) | 2011-07-05 |
| US20110236599A1 (en) | 2011-09-29 |
| KR101011407B1 (ko) | 2011-01-28 |
| TW200910497A (en) | 2009-03-01 |
| US20080274297A1 (en) | 2008-11-06 |
| CN101298670A (zh) | 2008-11-05 |
| KR20100090675A (ko) | 2010-08-16 |
| KR101274659B1 (ko) | 2013-06-17 |
| TWI376763B (en) | 2012-11-11 |
| CN101906621A (zh) | 2010-12-08 |
| KR20080097957A (ko) | 2008-11-06 |
| TW201042724A (en) | 2010-12-01 |
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