JP5324598B2 - 非直角粒子検出システム及び方法 - Google Patents

非直角粒子検出システム及び方法 Download PDF

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JP5324598B2
JP5324598B2 JP2010537010A JP2010537010A JP5324598B2 JP 5324598 B2 JP5324598 B2 JP 5324598B2 JP 2010537010 A JP2010537010 A JP 2010537010A JP 2010537010 A JP2010537010 A JP 2010537010A JP 5324598 B2 JP5324598 B2 JP 5324598B2
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electromagnetic radiation
scattered
axis
particles
dimensional detector
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JP2011505577A (ja
JP2011505577A5 (enExample
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ジョン ミッチェル，
ジョン サンドバーグ，
ドゥワイト エー． セーラー，
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パーティクル・メージャーリング・システムズ・インコーポレーテッド
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/14—Optical investigation techniques, e.g. flow cytometry
    • G01N15/1429—Signal processing
    • G01N15/1433—Signal processing using image recognition
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/14—Optical investigation techniques, e.g. flow cytometry
    • G01N15/1456—Optical investigation techniques, e.g. flow cytometry without spatial resolution of the texture or inner structure of the particle, e.g. processing of pulse signals
    • G01N15/1459—Optical investigation techniques, e.g. flow cytometry without spatial resolution of the texture or inner structure of the particle, e.g. processing of pulse signals the analysis being performed on a sample stream
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N2015/0038—Investigating nanoparticles
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution
    • G01N15/0205—Investigating particle size or size distribution by optical means
    • G01N2015/025—Methods for single or grouped particles
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/14—Optical investigation techniques, e.g. flow cytometry
    • G01N2015/1402—Data analysis by thresholding or gating operations performed on the acquired signals or stored data

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  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Dispersion Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Immunology (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Optical Measuring Cells (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
JP2010537010A 2007-12-04 2008-12-02 非直角粒子検出システム及び方法 Active JP5324598B2 (ja)

Applications Claiming Priority (7)

Application Number Priority Date Filing Date Title
US533607P 2007-12-04 2007-12-04
US99219207P 2007-12-04 2007-12-04
US60/992,192 2007-12-04
US61/005,336 2007-12-04
US10739708P 2008-10-22 2008-10-22
US61/107,397 2008-10-22
PCT/US2008/085236 WO2009073649A1 (en) 2007-12-04 2008-12-02 Non-orthogonal particle detection systems and methods

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JP2011505577A JP2011505577A (ja) 2011-02-24
JP2011505577A5 JP2011505577A5 (enExample) 2011-12-22
JP5324598B2 true JP5324598B2 (ja) 2013-10-23

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JP2010537010A Active JP5324598B2 (ja) 2007-12-04 2008-12-02 非直角粒子検出システム及び方法
JP2010537012A Active JP5478501B2 (ja) 2007-12-04 2008-12-02 粒子検出用の２次元光学画像化方法及びシステム
JP2012261043A Active JP5610167B2 (ja) 2007-12-04 2012-11-29 粒子検出用の２次元光学画像化方法及びシステム

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JP2010537012A Active JP5478501B2 (ja) 2007-12-04 2008-12-02 粒子検出用の２次元光学画像化方法及びシステム
JP2012261043A Active JP5610167B2 (ja) 2007-12-04 2012-11-29 粒子検出用の２次元光学画像化方法及びシステム

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US (5) US8154724B2 (enExample)
EP (2) EP2232231A4 (enExample)
JP (3) JP5324598B2 (enExample)
CN (2) CN101910821B (enExample)
WO (2) WO2009073652A1 (enExample)

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WO2009073652A1 (en) 2009-06-11
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