JP5274622B2 - 欠陥検査装置及び方法 - Google Patents

欠陥検査装置及び方法 Download PDF

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Publication number
JP5274622B2
JP5274622B2 JP2011141426A JP2011141426A JP5274622B2 JP 5274622 B2 JP5274622 B2 JP 5274622B2 JP 2011141426 A JP2011141426 A JP 2011141426A JP 2011141426 A JP2011141426 A JP 2011141426A JP 5274622 B2 JP5274622 B2 JP 5274622B2
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Japan
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defect
image
defect image
laminated film
pseudo
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Expired - Fee Related
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JP2011141426A
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English (en)
Japanese (ja)
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JP2013007689A (ja
Inventor
一平 高橋
瑠依子 福島
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Fujifilm Corp
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Fujifilm Corp
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Priority to JP2011141426A priority Critical patent/JP5274622B2/ja
Priority to KR1020120066124A priority patent/KR101358481B1/ko
Priority to TW101122729A priority patent/TWI418779B/zh
Publication of JP2013007689A publication Critical patent/JP2013007689A/ja
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Publication of JP5274622B2 publication Critical patent/JP5274622B2/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing

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  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Nonlinear Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Mathematical Physics (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP2011141426A 2011-06-27 2011-06-27 欠陥検査装置及び方法 Expired - Fee Related JP5274622B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2011141426A JP5274622B2 (ja) 2011-06-27 2011-06-27 欠陥検査装置及び方法
KR1020120066124A KR101358481B1 (ko) 2011-06-27 2012-06-20 결함 검사 장치 및 방법
TW101122729A TWI418779B (zh) 2011-06-27 2012-06-26 缺陷檢查裝置及方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2011141426A JP5274622B2 (ja) 2011-06-27 2011-06-27 欠陥検査装置及び方法

Publications (2)

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JP2013007689A JP2013007689A (ja) 2013-01-10
JP5274622B2 true JP5274622B2 (ja) 2013-08-28

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JP2011141426A Expired - Fee Related JP5274622B2 (ja) 2011-06-27 2011-06-27 欠陥検査装置及び方法

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JP (1) JP5274622B2 (ko)
KR (1) KR101358481B1 (ko)
TW (1) TWI418779B (ko)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6182806B2 (ja) * 2013-06-04 2017-08-23 住友化学株式会社 欠陥検査システム及びフィルムの製造装置
JP6156820B2 (ja) * 2013-08-22 2017-07-05 住友化学株式会社 欠陥検査装置、光学部材の製造システム及び光学表示デバイスの生産システム
TWI487895B (zh) * 2013-09-10 2015-06-11 Benq Materials Corp 隔離膜的針孔瑕疵檢測系統及其檢測方法
JP2015160282A (ja) * 2014-02-27 2015-09-07 中央発條株式会社 カバレージ測定方法及びカバレージ測定装置
KR101697071B1 (ko) * 2014-04-18 2017-01-17 동우 화인켐 주식회사 광학 필름의 결함 판별 방법
KR101702841B1 (ko) * 2014-09-01 2017-02-06 동우 화인켐 주식회사 편광 필름의 결함 모니터링 방법
CN104655648B (zh) * 2015-03-18 2017-03-01 常州工学院 一种用于缺陷检测的硬件移植装置和软件移植方法
JP6456235B2 (ja) * 2015-05-11 2019-01-23 株式会社クラレ 偏光フィルムの検査方法
JP6749321B2 (ja) * 2015-06-05 2020-09-02 住友化学株式会社 光透過性フィルムの欠陥検査方法、直線偏光子フィルムの製造方法及び偏光板の製造方法
JP6784540B2 (ja) * 2015-09-30 2020-11-11 日東電工株式会社 偏光板の検査方法および検査装置
JP6898492B2 (ja) * 2015-09-30 2021-07-07 日東電工株式会社 偏光子の検査方法および偏光板の製造方法
CN105842885B (zh) * 2016-03-21 2018-11-27 凌云光技术集团有限责任公司 一种液晶屏缺陷分层定位方法及装置
CN110431406B (zh) * 2017-02-28 2022-04-01 东洋玻璃株式会社 容器的检查装置和容器的检查方法
KR102475056B1 (ko) * 2017-03-03 2022-12-06 스미또모 가가꾸 가부시키가이샤 결함 마킹 방법 및 결함 마킹 장치, 원반의 제조 방법 및 원반, 그리고 시트의 제조 방법 및 시트
CN107764835A (zh) * 2017-09-30 2018-03-06 长沙派数控股份有限公司 一种电子产品玻璃盖板检测装置及方法
JP2020173188A (ja) * 2019-04-11 2020-10-22 住友化学株式会社 検査装置、検査方法、及び、フィルムの製造方法
CN110132981A (zh) * 2019-05-21 2019-08-16 东莞市瑞图新智科技有限公司 一种滤光片中片外观和尺寸一体化检测设备及检测方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1130591A (ja) * 1997-07-11 1999-02-02 Asahi Chem Ind Co Ltd フィルムシート欠陥検査方法及びフィルムシート欠陥検査装置
JP2001349839A (ja) * 2000-06-07 2001-12-21 Sumitomo Chem Co Ltd 偏光フィルムの欠陥検査方法
JP2003344302A (ja) * 2002-05-31 2003-12-03 Sumitomo Chem Co Ltd 偏光フィルムの検査法および検査装置
JP2004198163A (ja) * 2002-12-17 2004-07-15 Sumitomo Chem Co Ltd 保護フィルム粘着偏光板の欠陥検査方法
JP4396160B2 (ja) * 2003-07-31 2010-01-13 住友化学株式会社 透明性フィルムの異物検査方法
JP2006275843A (ja) * 2005-03-30 2006-10-12 Nitto Denko Corp 配線回路基板用絶縁フィルムの異物検査方法
JP5051874B2 (ja) * 2006-01-11 2012-10-17 日東電工株式会社 積層フィルムの製造方法、積層フィルムの欠陥検出方法、積層フィルムの欠陥検出装置
JP4842034B2 (ja) * 2006-07-12 2011-12-21 株式会社日本マイクロニクス 液晶パネルの検査方法および画像処理装置
JP5248052B2 (ja) * 2006-10-11 2013-07-31 日東電工株式会社 光学フィルムを有するシート状製品の欠点検査装置、その検査データ処理装置、その切断装置及びその製造システム

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Publication number Publication date
KR101358481B1 (ko) 2014-02-05
KR20130001683A (ko) 2013-01-04
JP2013007689A (ja) 2013-01-10
TW201300766A (zh) 2013-01-01
TWI418779B (zh) 2013-12-11

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