JP5259144B2 - レンズ枠形状測定装置 - Google Patents

レンズ枠形状測定装置 Download PDF

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Publication number
JP5259144B2
JP5259144B2 JP2007236032A JP2007236032A JP5259144B2 JP 5259144 B2 JP5259144 B2 JP 5259144B2 JP 2007236032 A JP2007236032 A JP 2007236032A JP 2007236032 A JP2007236032 A JP 2007236032A JP 5259144 B2 JP5259144 B2 JP 5259144B2
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JP
Japan
Prior art keywords
frame
lens
slider
lens frame
clamp
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2007236032A
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English (en)
Japanese (ja)
Other versions
JP2009068925A (ja
JP2009068925A5 (enExample
Inventor
善則 松山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nidek Co Ltd
Original Assignee
Nidek Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nidek Co Ltd filed Critical Nidek Co Ltd
Priority to JP2007236032A priority Critical patent/JP5259144B2/ja
Priority to KR1020080089408A priority patent/KR101523096B1/ko
Priority to US12/207,888 priority patent/US7631431B2/en
Priority to DE602008001540T priority patent/DE602008001540D1/de
Priority to EP08016016A priority patent/EP2037210B1/en
Priority to ES08016016T priority patent/ES2346372T3/es
Publication of JP2009068925A publication Critical patent/JP2009068925A/ja
Publication of JP2009068925A5 publication Critical patent/JP2009068925A5/ja
Application granted granted Critical
Publication of JP5259144B2 publication Critical patent/JP5259144B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/0002—Arrangements for supporting, fixing or guiding the measuring instrument or the object to be measured
    • G01B5/0004—Supports
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/20—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring contours or curvatures, e.g. determining profile
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/20—Measuring arrangements characterised by the use of mechanical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G02—OPTICS
    • G02C—SPECTACLES; SUNGLASSES OR GOGGLES INSOFAR AS THEY HAVE THE SAME FEATURES AS SPECTACLES; CONTACT LENSES
    • G02C13/00—Assembling; Repairing; Cleaning

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Ophthalmology & Optometry (AREA)
  • Optics & Photonics (AREA)
  • Eyeglasses (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
  • Grinding And Polishing Of Tertiary Curved Surfaces And Surfaces With Complex Shapes (AREA)
JP2007236032A 2007-09-11 2007-09-11 レンズ枠形状測定装置 Expired - Fee Related JP5259144B2 (ja)

Priority Applications (6)

Application Number Priority Date Filing Date Title
JP2007236032A JP5259144B2 (ja) 2007-09-11 2007-09-11 レンズ枠形状測定装置
US12/207,888 US7631431B2 (en) 2007-09-11 2008-09-10 Eyeglass frame measurement apparatus
KR1020080089408A KR101523096B1 (ko) 2007-09-11 2008-09-10 안경 프레임 형상 측정 장치
EP08016016A EP2037210B1 (en) 2007-09-11 2008-09-11 Eyeglass frame measurement apparatus
DE602008001540T DE602008001540D1 (de) 2007-09-11 2008-09-11 Vorrichtung zum Messen von Brillenrahmen
ES08016016T ES2346372T3 (es) 2007-09-11 2008-09-11 Aparato de medicion de montura de gafas.

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2007236032A JP5259144B2 (ja) 2007-09-11 2007-09-11 レンズ枠形状測定装置

Publications (3)

Publication Number Publication Date
JP2009068925A JP2009068925A (ja) 2009-04-02
JP2009068925A5 JP2009068925A5 (enExample) 2010-10-21
JP5259144B2 true JP5259144B2 (ja) 2013-08-07

Family

ID=40010743

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007236032A Expired - Fee Related JP5259144B2 (ja) 2007-09-11 2007-09-11 レンズ枠形状測定装置

Country Status (6)

Country Link
US (1) US7631431B2 (enExample)
EP (1) EP2037210B1 (enExample)
JP (1) JP5259144B2 (enExample)
KR (1) KR101523096B1 (enExample)
DE (1) DE602008001540D1 (enExample)
ES (1) ES2346372T3 (enExample)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20080031483A1 (en) * 2006-08-04 2008-02-07 Hill James W Insulated cooler with internal audio system docking station and integral speakers
EP2117772B1 (en) * 2007-02-06 2013-09-25 National Optronics, Inc. Holding mechanism for a spectacle frame for use with an ophtalmic tracer, and method
JP5204527B2 (ja) * 2008-03-28 2013-06-05 株式会社トプコン 玉型形状測定装置
JP5204597B2 (ja) * 2008-09-16 2013-06-05 株式会社トプコン 眼鏡レンズ枠形状測定装置
JP5435918B2 (ja) * 2008-09-30 2014-03-05 株式会社トプコン 玉型形状測定方法及びその装置
JP5586930B2 (ja) * 2009-12-09 2014-09-10 株式会社ニデック 眼鏡枠形状測定装置
JP5562624B2 (ja) * 2009-12-09 2014-07-30 株式会社ニデック 眼鏡枠形状測定装置
KR101917394B1 (ko) * 2011-09-21 2018-11-09 가부시키가이샤 니데크 안경 프레임 형상 측정 장치
JP5983139B2 (ja) * 2012-07-23 2016-08-31 株式会社ニデック 眼鏡枠形状測定装置
US9535269B2 (en) 2013-06-24 2017-01-03 Nidek Co., Ltd. Eyeglass frame shape measuring apparatus
CN105216489B (zh) * 2015-10-25 2017-01-18 济南大学 现场测绘用具组合
CN105216488B (zh) * 2015-10-25 2017-01-18 济南大学 现场测绘用具组合的应用
CN107179063A (zh) * 2016-03-11 2017-09-19 上海强精金属制品有限公司 一种按摩椅焊接框检测装置
JP6766400B2 (ja) * 2016-03-28 2020-10-14 株式会社ニデック 眼鏡レンズ加工装置、及び眼鏡レンズ加工プログラム
JP7276050B2 (ja) * 2019-09-30 2023-05-18 株式会社ニデック 眼鏡枠形状測定装置、及びレンズ加工装置
CN110579153B (zh) * 2019-10-23 2021-05-25 奇瑞汽车股份有限公司 机盖锁的检具
CN111442754A (zh) * 2020-03-27 2020-07-24 恒新增材制造研究中心(佛山)有限公司 一种三维扫描的工装夹具

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2925685B2 (ja) * 1990-08-02 1999-07-28 株式会社ニデック フレーム形状測定装置
US5121550A (en) * 1990-12-03 1992-06-16 Gerber Optial, Inc. Automatic surface tracer
JP2526584Y2 (ja) * 1991-12-25 1997-02-19 ホーヤ株式会社 フレーム形状測定装置
JPH0815706B2 (ja) * 1992-07-27 1996-02-21 株式会社トプコン レンズ枠形状測定装置
US5515612A (en) * 1993-01-08 1996-05-14 Hoya Corporation Apparatus for measuring the shape of a frame of spectacles
DE69713992T2 (de) * 1996-11-22 2003-04-30 Kabushiki Kaisha Topcon, Tokio/Tokyo Vorrichtung zum Messen des Umfangs einer linsenförmigen Schablone gefertigt zur Montage in den Rahmen eines Brillengestells
JP3819091B2 (ja) 1996-11-22 2006-09-06 株式会社トプコン 眼鏡フレームの玉型形状測定装置
JPH11129149A (ja) 1997-10-31 1999-05-18 Topcon Corp 眼鏡フレームの玉型形状測定装置
JP3695988B2 (ja) * 1999-04-30 2005-09-14 株式会社ニデック 眼鏡枠形状測定装置
JP2000314647A (ja) 1999-05-07 2000-11-14 Hitachi Ltd 空気流量測定装置
CA2283495A1 (en) * 1999-09-23 2001-03-23 Elision Technology Inc. Eyeglass frame and lens tracing apparatus and method
JP4588828B2 (ja) 1999-12-22 2010-12-01 株式会社トプコン 眼鏡の玉型形状測定装置
JP4566372B2 (ja) * 2000-07-19 2010-10-20 株式会社トプコン レンズ枠形状測定装置
JP4429535B2 (ja) * 2001-02-06 2010-03-10 株式会社トプコン レンズ形状測定装置
JP2003172618A (ja) * 2001-12-06 2003-06-20 Topcon Corp レンズ枠形状測定装置
JP2004003944A (ja) * 2002-04-08 2004-01-08 Hoya Corp 眼鏡枠形状測定装置
FR2870933B1 (fr) * 2004-05-28 2008-03-14 Essilor Int Appareil de lecture de contour comportant un capteur d'effort
FR2890189B1 (fr) * 2005-08-31 2008-02-01 Essilor Int Methode de pilotage de palpeur pour lecture de drageoir de monture de lunettes

Also Published As

Publication number Publication date
EP2037210A1 (en) 2009-03-18
JP2009068925A (ja) 2009-04-02
DE602008001540D1 (de) 2010-07-29
ES2346372T3 (es) 2010-10-14
US20090064512A1 (en) 2009-03-12
US7631431B2 (en) 2009-12-15
EP2037210B1 (en) 2010-06-16
KR101523096B1 (ko) 2015-05-26
KR20090027170A (ko) 2009-03-16

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