JP5156671B2 - 磁界検出装置および計測装置 - Google Patents

磁界検出装置および計測装置 Download PDF

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Publication number
JP5156671B2
JP5156671B2 JP2009045026A JP2009045026A JP5156671B2 JP 5156671 B2 JP5156671 B2 JP 5156671B2 JP 2009045026 A JP2009045026 A JP 2009045026A JP 2009045026 A JP2009045026 A JP 2009045026A JP 5156671 B2 JP5156671 B2 JP 5156671B2
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magnetic field
terminal
voltage
signal
circuit
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Japanese (ja)
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JP2010197318A5 (enExample
JP2010197318A (ja
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睦三 鈴木
信康 金川
雅通 山田
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Hitachi Ltd
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Hitachi Ltd
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Priority to JP2009045026A priority Critical patent/JP5156671B2/ja
Priority to EP10153888A priority patent/EP2228663B1/en
Priority to US12/708,259 priority patent/US8717017B2/en
Publication of JP2010197318A publication Critical patent/JP2010197318A/ja
Publication of JP2010197318A5 publication Critical patent/JP2010197318A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/09—Magnetoresistive devices
    • G01R33/091—Constructional adaptation of the sensor to specific applications
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D1/00—Measuring arrangements giving results other than momentary value of variable, of general application
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D15/00—Component parts of recorders for measuring arrangements not specially adapted for a specific variable
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D21/00—Measuring or testing not otherwise provided for

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Transmission And Conversion Of Sensor Element Output (AREA)
  • Measuring Magnetic Variables (AREA)
  • Measuring Fluid Pressure (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
JP2009045026A 2009-02-27 2009-02-27 磁界検出装置および計測装置 Active JP5156671B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2009045026A JP5156671B2 (ja) 2009-02-27 2009-02-27 磁界検出装置および計測装置
EP10153888A EP2228663B1 (en) 2009-02-27 2010-02-17 Magnetic field detection apparatus and measurement apparatus
US12/708,259 US8717017B2 (en) 2009-02-27 2010-02-18 Magnetic field detection apparatus and measurement apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2009045026A JP5156671B2 (ja) 2009-02-27 2009-02-27 磁界検出装置および計測装置

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JP2010197318A JP2010197318A (ja) 2010-09-09
JP2010197318A5 JP2010197318A5 (enExample) 2011-03-10
JP5156671B2 true JP5156671B2 (ja) 2013-03-06

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JP2009045026A Active JP5156671B2 (ja) 2009-02-27 2009-02-27 磁界検出装置および計測装置

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US (1) US8717017B2 (enExample)
EP (1) EP2228663B1 (enExample)
JP (1) JP5156671B2 (enExample)

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US9176159B2 (en) * 2013-10-03 2015-11-03 Freescale Semiconductor Inc. Variable reluctance sensor interfaces with signal pre-processing and methods of their operation
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CN104656045B (zh) * 2013-11-17 2018-01-09 爱盛科技股份有限公司 磁场感测模块、测量方法及磁场感测模块的制作方法
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EP2955492B1 (en) * 2014-06-13 2017-05-10 Nxp B.V. Sensor system with a full bridge configuration of four resistive sensing elements
KR101990221B1 (ko) * 2014-08-25 2019-06-17 엔에스디 가부시끼가이샤 회전 검출기
DE102016103518B4 (de) * 2016-02-29 2024-10-24 Robert Bosch Gmbh Verfahren und Vorrichtung zur Rotorlagendiagnose in einem elektromotorischen Antrieb
JP2018146280A (ja) * 2017-03-02 2018-09-20 Tdk株式会社 磁気センサ
JP7396913B2 (ja) * 2020-01-30 2023-12-12 アズビル株式会社 圧力測定装置
JP7341926B2 (ja) 2020-03-11 2023-09-11 株式会社東芝 磁気センサ
CN112729622B (zh) * 2020-12-17 2022-07-22 上海电气集团股份有限公司 一种应力无损检测方法、装置及设备
CN112817143A (zh) * 2020-12-31 2021-05-18 歌尔股份有限公司 Mems扫描镜
CN114879544B (zh) * 2021-02-05 2025-08-26 彩虹无人机科技有限公司 推扭一体传感器信号采集系统
EP4108483B1 (en) * 2021-06-21 2025-08-27 Volvo Truck Corporation A payload monitoring device for a motor vehicle
CN113607329B (zh) * 2021-07-13 2022-10-18 复旦大学 压力传感器信号温度补偿方法及压力传感器
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Publication number Publication date
US8717017B2 (en) 2014-05-06
EP2228663A3 (en) 2010-12-01
US20100219822A1 (en) 2010-09-02
JP2010197318A (ja) 2010-09-09
EP2228663A2 (en) 2010-09-15
EP2228663B1 (en) 2012-06-27

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