JP5153865B2 - ディジタル・システムの信頼性を監視するシステム、およびその監視する方法 - Google Patents

ディジタル・システムの信頼性を監視するシステム、およびその監視する方法 Download PDF

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Publication number
JP5153865B2
JP5153865B2 JP2010504615A JP2010504615A JP5153865B2 JP 5153865 B2 JP5153865 B2 JP 5153865B2 JP 2010504615 A JP2010504615 A JP 2010504615A JP 2010504615 A JP2010504615 A JP 2010504615A JP 5153865 B2 JP5153865 B2 JP 5153865B2
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ring oscillator
oscillator sensor
logic
digital
digital system
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JP2010504615A
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Japanese (ja)
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JP2010527174A (ja
JP2010527174A5 (enExample
Inventor
キム・デ・イク
キム・ジョンヘ
キム・モン・ジュ
モウリック・ジェームズ・ランダル
ソン・ホン・フア
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International Business Machines Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31937—Timing aspects, e.g. measuring propagation delay
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31725—Timing aspects, e.g. clock distribution, skew, propagation delay
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Manipulation Of Pulses (AREA)
  • Logic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Organic Low-Molecular-Weight Compounds And Preparation Thereof (AREA)
  • Geophysics And Detection Of Objects (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
JP2010504615A 2007-04-30 2008-04-10 ディジタル・システムの信頼性を監視するシステム、およびその監視する方法 Expired - Fee Related JP5153865B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US11/742,018 2007-04-30
US11/742,018 US7495519B2 (en) 2007-04-30 2007-04-30 System and method for monitoring reliability of a digital system
PCT/EP2008/054345 WO2008132033A1 (en) 2007-04-30 2008-04-10 Monitoring reliability of a digital system

Publications (3)

Publication Number Publication Date
JP2010527174A JP2010527174A (ja) 2010-08-05
JP2010527174A5 JP2010527174A5 (enExample) 2012-08-09
JP5153865B2 true JP5153865B2 (ja) 2013-02-27

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JP2010504615A Expired - Fee Related JP5153865B2 (ja) 2007-04-30 2008-04-10 ディジタル・システムの信頼性を監視するシステム、およびその監視する方法

Country Status (9)

Country Link
US (1) US7495519B2 (enExample)
EP (1) EP2150827B1 (enExample)
JP (1) JP5153865B2 (enExample)
KR (1) KR20090099536A (enExample)
CN (1) CN101669037B (enExample)
AT (1) ATE501438T1 (enExample)
DE (1) DE602008005445D1 (enExample)
TW (1) TWI409623B (enExample)
WO (1) WO2008132033A1 (enExample)

Families Citing this family (63)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE112005003788T5 (de) * 2005-12-30 2008-09-25 Intel Corp., Santa Clara Dynamische Abschätzung der Lebensdauer einer Halbleitereinrichtung
US20090033155A1 (en) * 2007-06-08 2009-02-05 Renesas Technology Corp. Semiconductor integrated circuits
US9569330B2 (en) 2007-06-22 2017-02-14 Red Hat, Inc. Performing dependency analysis on nodes of a business application service group
US9495152B2 (en) * 2007-06-22 2016-11-15 Red Hat, Inc. Automatic baselining of business application service groups comprised of virtual machines
US9678803B2 (en) 2007-06-22 2017-06-13 Red Hat, Inc. Migration of network entities to a cloud infrastructure
US9727440B2 (en) 2007-06-22 2017-08-08 Red Hat, Inc. Automatic simulation of virtual machine performance
US7889013B2 (en) * 2007-08-28 2011-02-15 Intel Corporation Microelectronic die having CMOS ring oscillator thereon and method of using same
US20090250698A1 (en) * 2008-04-08 2009-10-08 Nagaraj Savithri Fabrication management system
US20090288092A1 (en) * 2008-05-15 2009-11-19 Hiroaki Yamaoka Systems and Methods for Improving the Reliability of a Multi-Core Processor
DE102008059502A1 (de) * 2008-11-28 2010-06-10 Advanced Micro Devices, Inc., Sunnyvale Kompensation der Leistungsbeeinträchtigung von Halbleiterbauelementen durch Anpassung des Tastgrades des Taktsignals
US8260708B2 (en) 2009-04-17 2012-09-04 Empire Technology Development Llc Usage metering based upon hardware aging
KR101321487B1 (ko) * 2009-04-21 2013-10-23 에이저 시스템즈 엘엘시 기입 검증을 사용한 코드들의 에러-플로어 완화
JP5439964B2 (ja) * 2009-06-12 2014-03-12 富士通セミコンダクター株式会社 遅延比較回路、遅延比較方法、遅延回路および半導体集積回路
US8154309B2 (en) * 2009-06-23 2012-04-10 International Business Machines Corporation Configurable PSRO structure for measuring frequency dependent capacitive loads
JP2011165796A (ja) * 2010-02-08 2011-08-25 Renesas Electronics Corp 劣化検出回路
US8456243B2 (en) * 2010-03-26 2013-06-04 Microchip Technology Incorporated Failsafe oscillator monitor and alarm
WO2012015433A1 (en) 2010-07-30 2012-02-02 Empire Technology Development, Llc. Aging-based usage metering of components
CN101980220B (zh) * 2010-10-15 2012-06-20 清华大学 一种基于近似概率转换的电路性能可靠性的估计方法
US8729920B2 (en) 2010-11-24 2014-05-20 International Business Machines Corporation Circuit and method for RAS-enabled and self-regulated frequency and delay sensor
US8935143B2 (en) 2010-12-15 2015-01-13 IP Cube Partners Co., Ltd. Semiconductor sensor reliability
US8680523B2 (en) 2010-12-16 2014-03-25 IP Cube Partners (ICP) Co., Ltd. Sensor for semiconductor degradation monitoring and modeling
US8373482B2 (en) * 2011-01-13 2013-02-12 Texas Instruments Incorporated Temperature sensor programmable ring oscillator, processor, and pulse width modulator
KR20120096329A (ko) 2011-02-22 2012-08-30 삼성전자주식회사 신호 분석 회로를 포함하는 집적 시스템
US8457835B2 (en) * 2011-04-08 2013-06-04 General Electric Company System and method for use in evaluating an operation of a combustion machine
US20130002297A1 (en) * 2011-06-28 2013-01-03 Texas Instruments, Incorporated Bias temperature instability-resistant circuits
US9098561B2 (en) 2011-08-30 2015-08-04 Intel Corporation Determining an effective stress level on a processor
CN105842602B (zh) * 2011-09-28 2019-01-11 英特尔公司 自主式通道级老化监控装置和方法
US9141159B2 (en) 2011-11-03 2015-09-22 International Business Machines Corporation Minimizing aggregate cooling and leakage power with fast convergence
US9823990B2 (en) * 2012-09-05 2017-11-21 Nvidia Corporation System and process for accounting for aging effects in a computing device
US9112484B1 (en) * 2012-12-20 2015-08-18 Mie Fujitsu Semiconductor Limited Integrated circuit process and bias monitors and related methods
US8766695B1 (en) * 2012-12-28 2014-07-01 Sandisk Technologies Inc. Clock generation and delay architecture
US9520292B2 (en) 2013-01-06 2016-12-13 Empire Technology Development Llc Aging-based leakage energy reduction method and system
US9310424B2 (en) 2013-02-25 2016-04-12 International Business Machines Corporation Monitoring aging of silicon in an integrated circuit device
US8713490B1 (en) 2013-02-25 2014-04-29 International Business Machines Corporation Managing aging of silicon in an integrated circuit device
DE102013204272A1 (de) * 2013-03-12 2014-09-18 Robert Bosch Gmbh Verfahren zum Erkennen einer Korrelation
US9317389B2 (en) 2013-06-28 2016-04-19 Intel Corporation Apparatus and method for controlling the reliability stress rate on a processor
US10145896B2 (en) 2013-08-06 2018-12-04 Global Unichip Corporation Electronic device, performance binning system and method, voltage automatic calibration system
US9477568B2 (en) 2013-09-27 2016-10-25 International Business Machines Corporation Managing interconnect electromigration effects
US9494641B2 (en) * 2014-01-24 2016-11-15 Nvidia Corporation Degradation detector and method of detecting the aging of an integrated circuit
US9246501B2 (en) 2014-04-29 2016-01-26 Honeywell International Inc. Converter for analog inputs
US9791499B2 (en) 2014-05-20 2017-10-17 International Business Machines Corporation Circuit to detect previous use of computer chips using passive test wires
EP2988141A1 (en) * 2014-08-19 2016-02-24 Nagravision S.A. Aging control of a system on chip
US9904339B2 (en) 2014-09-10 2018-02-27 Intel Corporation Providing lifetime statistical information for a processor
US9704598B2 (en) 2014-12-27 2017-07-11 Intel Corporation Use of in-field programmable fuses in the PCH dye
TWI557414B (zh) 2015-08-04 2016-11-11 財團法人工業技術研究院 電子電路監測系統及電子電路監測方法
US10247769B2 (en) 2015-09-02 2019-04-02 International Business Machines Corporation Measuring individual device degradation in CMOS circuits
JP6703398B2 (ja) * 2015-12-25 2020-06-03 ルネサスエレクトロニクス株式会社 半導体装置
JP2018050219A (ja) * 2016-09-23 2018-03-29 ルネサスエレクトロニクス株式会社 半導体装置
CN107957773B (zh) * 2016-10-17 2024-02-06 北京诺亦腾科技有限公司 穿戴装置、手套、动作捕捉装置及虚拟现实系统
US10747258B1 (en) * 2017-02-28 2020-08-18 Amazon Technologies, Inc. Distributed digital ring oscillators in a digital system
US10126354B1 (en) 2017-06-28 2018-11-13 Globalfoundries Inc. Assessment of HCI in logic circuits based on AC stress in discrete FETs
GB2567420B (en) * 2017-10-02 2020-07-08 Advanced Risc Mach Ltd Adaptive voltage scaling methods and systems therefor
US11068589B2 (en) * 2017-12-22 2021-07-20 The Boeing Company Interference detecting ring oscillators
US10964649B2 (en) * 2018-08-03 2021-03-30 Arm Limited Tamper detection in integrated circuits
JP2020042416A (ja) * 2018-09-07 2020-03-19 ルネサスエレクトロニクス株式会社 半導体装置及びコンピュータシステム
US11531385B2 (en) 2018-09-17 2022-12-20 Samsung Electronics Co., Ltd. Voltage droop monitoring circuits, system-on chips and methods of operating the system-on chips
TWI670943B (zh) * 2018-10-25 2019-09-01 創意電子股份有限公司 晶片與效能監控方法
CN109856525A (zh) * 2018-11-07 2019-06-07 宁波大学 一种基于查找表的电路老化检测传感器
US11169585B2 (en) * 2019-08-16 2021-11-09 Apple Inc. Dashboard with push model for receiving sensor data
CN110609188B (zh) * 2019-09-25 2022-07-15 潍柴动力股份有限公司 油量计量单元老化的检测方法、装置及设备
FR3107983B1 (fr) * 2020-03-05 2022-05-27 St Microelectronics Sa Dispositif de surveillance d'un circuit digital
CN115166462B (zh) * 2022-07-04 2023-08-22 赖俊生 一种半导体芯片全生命周期持续检测方法、装置和设备
DE102024108214B4 (de) * 2024-03-22 2025-10-09 Infineon Technologies Ag Systeme, Vorrichtungen und Verfahren für Fehlererkennung

Family Cites Families (39)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59111514A (ja) * 1982-12-17 1984-06-27 Hitachi Ltd 半導体集積回路
US5493572A (en) * 1981-04-17 1996-02-20 Hitachi, Ltd. Semiconductor integrated circuit with voltage limiter having different output ranges for normal operation and performing of aging tests
US5566185A (en) * 1982-04-14 1996-10-15 Hitachi, Ltd. Semiconductor integrated circuit
JPH04274100A (ja) * 1991-03-01 1992-09-30 Nec Corp テスト回路内蔵のメモリーｌｓｉ
JP3020754B2 (ja) * 1992-10-02 2000-03-15 株式会社東芝 遅延時間測定回路
JP3484462B2 (ja) * 1996-04-11 2004-01-06 株式会社ルネサステクノロジ フローティングｓｏｉ−ｍｏｓｆｅｔの寿命を予測する方法
JPH10135298A (ja) * 1996-10-31 1998-05-22 Mitsubishi Electric Corp 配線の信頼性評価装置及びその方法
FR2764991B1 (fr) * 1997-06-24 1999-09-03 Sgs Thomson Microelectronics Procede de test fonctionnel et circuit comprenant des moyens de mise en oeuvre du procede
JP2000012639A (ja) * 1998-06-24 2000-01-14 Toshiba Corp モニターｔｅｇのテスト回路
US6285449B1 (en) * 1999-06-11 2001-09-04 University Of Chicago Optical method and apparatus for detection of defects and microstructural changes in ceramics and ceramic coatings
JP3452849B2 (ja) * 1999-09-21 2003-10-06 ローム株式会社 遅延時間が設定可能な遅延回路およびその遅延時間測定方法
JP3415524B2 (ja) * 1999-12-14 2003-06-09 エヌイーシーマイクロシステム株式会社 ジッタ自動測定回路
US6535014B2 (en) * 2000-01-19 2003-03-18 Lucent Technologies, Inc. Electrical parameter tester having decoupling means
JP4334105B2 (ja) * 2000-03-15 2009-09-30 パナソニック株式会社 半導体集積回路および遅延時間測定方法
JP2002006003A (ja) * 2000-04-20 2002-01-09 Texas Instr Inc <Ti> 位相ロック・ループ用全ディジタル内蔵自己検査回路および検査方法
US6476632B1 (en) * 2000-06-22 2002-11-05 International Business Machines Corporation Ring oscillator design for MOSFET device reliability investigations and its use for in-line monitoring
JP3405713B2 (ja) * 2000-06-27 2003-05-12 松下電器産業株式会社 半導体装置の寿命推定方法および信頼性シミュレーション方法
JP3820172B2 (ja) * 2002-03-26 2006-09-13 松下電器産業株式会社 半導体装置の寿命推定方法および信頼性シミュレーション方法
US7126365B2 (en) * 2002-04-16 2006-10-24 Transmeta Corporation System and method for measuring negative bias thermal instability with a ring oscillator
US7212022B2 (en) * 2002-04-16 2007-05-01 Transmeta Corporation System and method for measuring time dependent dielectric breakdown with a ring oscillator
US6903564B1 (en) * 2003-11-12 2005-06-07 Transmeta Corporation Device aging determination circuit
US7292955B2 (en) * 2002-04-24 2007-11-06 Semiconductor Energy Laboratory Co., Ltd. Method and apparatus for examining semiconductor apparatus and method for designing semiconductor apparatus
JP4360825B2 (ja) * 2002-04-24 2009-11-11 株式会社半導体エネルギー研究所 半導体装置の寿命予測方法
US6724214B2 (en) * 2002-09-13 2004-04-20 Chartered Semiconductor Manufacturing Ltd. Test structures for on-chip real-time reliability testing
US7054787B2 (en) * 2003-01-23 2006-05-30 Sun Microsystems, Inc. Embedded integrated circuit aging sensor system
DE10342997A1 (de) * 2003-09-17 2005-04-28 Infineon Technologies Ag Elektronischer Schaltkreis, Schaltkreis-Testanordnung und Verfahren zum Ermitteln der Funktionsfähigkeit eines elektronischen Schaltkreises
TWI259415B (en) * 2003-10-24 2006-08-01 Chi-Fang Lin Integrated digital surveillance system structure and method thereof
US7282937B2 (en) * 2003-12-31 2007-10-16 Intel Corporation On-chip frequency degradation compensation
TWI246321B (en) * 2004-01-28 2005-12-21 Chunghwa Telecom Co Ltd Remote video-on-demand digital monitor system
US7129800B2 (en) * 2004-02-04 2006-10-31 Sun Microsystems, Inc. Compensation technique to mitigate aging effects in integrated circuit components
US7231310B2 (en) * 2004-05-20 2007-06-12 Semiconductor Energy Laboratory Co., Ltd. Method for evaluating semiconductor device
US7026838B2 (en) * 2004-06-18 2006-04-11 Texas Instruments Incorporated Versatile system for accelerated stress characterization of semiconductor device structures
US7005871B1 (en) * 2004-06-29 2006-02-28 Nvidia Corporation Apparatus, system, and method for managing aging of an integrated circuit
CN1312881C (zh) * 2004-09-09 2007-04-25 复旦大学 实时监测流数据突变的方法
US7157948B2 (en) * 2004-09-10 2007-01-02 Lsi Logic Corporation Method and apparatus for calibrating a delay line
US7085658B2 (en) * 2004-10-20 2006-08-01 International Business Machines Corporation Method and apparatus for rapid inline measurement of parameter spreads and defects in integrated circuit chips
US7106088B2 (en) * 2005-01-10 2006-09-12 Taiwan Semiconductor Manufacturing Company, Ltd. Method of predicting high-k semiconductor device lifetime
US7338817B2 (en) * 2005-03-31 2008-03-04 Intel Corporation Body bias compensation for aged transistors
US7190233B2 (en) * 2005-07-12 2007-03-13 International Business Machines Corporation Methods and apparatus for measuring change in performance of ring oscillator circuit

Also Published As

Publication number Publication date
CN101669037A (zh) 2010-03-10
ATE501438T1 (de) 2011-03-15
JP2010527174A (ja) 2010-08-05
WO2008132033A1 (en) 2008-11-06
US20080270049A1 (en) 2008-10-30
EP2150827B1 (en) 2011-03-09
TWI409623B (zh) 2013-09-21
CN101669037B (zh) 2012-12-05
EP2150827A1 (en) 2010-02-10
KR20090099536A (ko) 2009-09-22
DE602008005445D1 (en) 2011-04-21
TW200905463A (en) 2009-02-01
US7495519B2 (en) 2009-02-24

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