ATE501438T1 - Überwachung der zuverlässigkeit eines digitalen systems - Google Patents
Überwachung der zuverlässigkeit eines digitalen systemsInfo
- Publication number
- ATE501438T1 ATE501438T1 AT08736066T AT08736066T ATE501438T1 AT E501438 T1 ATE501438 T1 AT E501438T1 AT 08736066 T AT08736066 T AT 08736066T AT 08736066 T AT08736066 T AT 08736066T AT E501438 T1 ATE501438 T1 AT E501438T1
- Authority
- AT
- Austria
- Prior art keywords
- digital system
- ring oscillator
- oscillator sensor
- measured
- logic
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
- G01R31/31937—Timing aspects, e.g. measuring propagation delay
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31725—Timing aspects, e.g. clock distribution, skew, propagation delay
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Semiconductor Integrated Circuits (AREA)
- Manipulation Of Pulses (AREA)
- Testing Or Calibration Of Command Recording Devices (AREA)
- Logic Circuits (AREA)
- Organic Low-Molecular-Weight Compounds And Preparation Thereof (AREA)
- Geophysics And Detection Of Objects (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/742,018 US7495519B2 (en) | 2007-04-30 | 2007-04-30 | System and method for monitoring reliability of a digital system |
PCT/EP2008/054345 WO2008132033A1 (en) | 2007-04-30 | 2008-04-10 | Monitoring reliability of a digital system |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE501438T1 true ATE501438T1 (de) | 2011-03-15 |
Family
ID=39688937
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT08736066T ATE501438T1 (de) | 2007-04-30 | 2008-04-10 | Überwachung der zuverlässigkeit eines digitalen systems |
Country Status (9)
Country | Link |
---|---|
US (1) | US7495519B2 (de) |
EP (1) | EP2150827B1 (de) |
JP (1) | JP5153865B2 (de) |
KR (1) | KR20090099536A (de) |
CN (1) | CN101669037B (de) |
AT (1) | ATE501438T1 (de) |
DE (1) | DE602008005445D1 (de) |
TW (1) | TWI409623B (de) |
WO (1) | WO2008132033A1 (de) |
Families Citing this family (62)
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US9678803B2 (en) | 2007-06-22 | 2017-06-13 | Red Hat, Inc. | Migration of network entities to a cloud infrastructure |
US9727440B2 (en) | 2007-06-22 | 2017-08-08 | Red Hat, Inc. | Automatic simulation of virtual machine performance |
US7889013B2 (en) * | 2007-08-28 | 2011-02-15 | Intel Corporation | Microelectronic die having CMOS ring oscillator thereon and method of using same |
US20090250698A1 (en) * | 2008-04-08 | 2009-10-08 | Nagaraj Savithri | Fabrication management system |
US20090288092A1 (en) * | 2008-05-15 | 2009-11-19 | Hiroaki Yamaoka | Systems and Methods for Improving the Reliability of a Multi-Core Processor |
DE102008059502A1 (de) * | 2008-11-28 | 2010-06-10 | Advanced Micro Devices, Inc., Sunnyvale | Kompensation der Leistungsbeeinträchtigung von Halbleiterbauelementen durch Anpassung des Tastgrades des Taktsignals |
US8260708B2 (en) | 2009-04-17 | 2012-09-04 | Empire Technology Development Llc | Usage metering based upon hardware aging |
JP5432367B2 (ja) * | 2009-04-21 | 2014-03-05 | アギア システムズ インコーポレーテッド | 書込み検証を使用した符号のエラーフロア軽減 |
JP5439964B2 (ja) * | 2009-06-12 | 2014-03-12 | 富士通セミコンダクター株式会社 | 遅延比較回路、遅延比較方法、遅延回路および半導体集積回路 |
US8154309B2 (en) * | 2009-06-23 | 2012-04-10 | International Business Machines Corporation | Configurable PSRO structure for measuring frequency dependent capacitive loads |
JP2011165796A (ja) * | 2010-02-08 | 2011-08-25 | Renesas Electronics Corp | 劣化検出回路 |
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WO2012015433A1 (en) | 2010-07-30 | 2012-02-02 | Empire Technology Development, Llc. | Aging-based usage metering of components |
CN101980220B (zh) * | 2010-10-15 | 2012-06-20 | 清华大学 | 一种基于近似概率转换的电路性能可靠性的估计方法 |
US8729920B2 (en) | 2010-11-24 | 2014-05-20 | International Business Machines Corporation | Circuit and method for RAS-enabled and self-regulated frequency and delay sensor |
US8935143B2 (en) | 2010-12-15 | 2015-01-13 | IP Cube Partners Co., Ltd. | Semiconductor sensor reliability |
US8680523B2 (en) * | 2010-12-16 | 2014-03-25 | IP Cube Partners (ICP) Co., Ltd. | Sensor for semiconductor degradation monitoring and modeling |
US8373482B2 (en) * | 2011-01-13 | 2013-02-12 | Texas Instruments Incorporated | Temperature sensor programmable ring oscillator, processor, and pulse width modulator |
KR20120096329A (ko) | 2011-02-22 | 2012-08-30 | 삼성전자주식회사 | 신호 분석 회로를 포함하는 집적 시스템 |
US8457835B2 (en) * | 2011-04-08 | 2013-06-04 | General Electric Company | System and method for use in evaluating an operation of a combustion machine |
US20130002297A1 (en) * | 2011-06-28 | 2013-01-03 | Texas Instruments, Incorporated | Bias temperature instability-resistant circuits |
US9098561B2 (en) | 2011-08-30 | 2015-08-04 | Intel Corporation | Determining an effective stress level on a processor |
CN105842602B (zh) * | 2011-09-28 | 2019-01-11 | 英特尔公司 | 自主式通道级老化监控装置和方法 |
US9141159B2 (en) | 2011-11-03 | 2015-09-22 | International Business Machines Corporation | Minimizing aggregate cooling and leakage power with fast convergence |
US9823990B2 (en) * | 2012-09-05 | 2017-11-21 | Nvidia Corporation | System and process for accounting for aging effects in a computing device |
US9112484B1 (en) | 2012-12-20 | 2015-08-18 | Mie Fujitsu Semiconductor Limited | Integrated circuit process and bias monitors and related methods |
US8766695B1 (en) * | 2012-12-28 | 2014-07-01 | Sandisk Technologies Inc. | Clock generation and delay architecture |
US9520292B2 (en) | 2013-01-06 | 2016-12-13 | Empire Technology Development Llc | Aging-based leakage energy reduction method and system |
US8713490B1 (en) | 2013-02-25 | 2014-04-29 | International Business Machines Corporation | Managing aging of silicon in an integrated circuit device |
US9310424B2 (en) | 2013-02-25 | 2016-04-12 | International Business Machines Corporation | Monitoring aging of silicon in an integrated circuit device |
DE102013204272A1 (de) * | 2013-03-12 | 2014-09-18 | Robert Bosch Gmbh | Verfahren zum Erkennen einer Korrelation |
US9317389B2 (en) | 2013-06-28 | 2016-04-19 | Intel Corporation | Apparatus and method for controlling the reliability stress rate on a processor |
US10145896B2 (en) | 2013-08-06 | 2018-12-04 | Global Unichip Corporation | Electronic device, performance binning system and method, voltage automatic calibration system |
US9477568B2 (en) | 2013-09-27 | 2016-10-25 | International Business Machines Corporation | Managing interconnect electromigration effects |
US9494641B2 (en) * | 2014-01-24 | 2016-11-15 | Nvidia Corporation | Degradation detector and method of detecting the aging of an integrated circuit |
US9246501B2 (en) | 2014-04-29 | 2016-01-26 | Honeywell International Inc. | Converter for analog inputs |
US9791499B2 (en) | 2014-05-20 | 2017-10-17 | International Business Machines Corporation | Circuit to detect previous use of computer chips using passive test wires |
EP2988141A1 (de) * | 2014-08-19 | 2016-02-24 | Nagravision S.A. | Alterungssteuerung eines Systems auf einem Chip |
US9904339B2 (en) | 2014-09-10 | 2018-02-27 | Intel Corporation | Providing lifetime statistical information for a processor |
US9704598B2 (en) | 2014-12-27 | 2017-07-11 | Intel Corporation | Use of in-field programmable fuses in the PCH dye |
TW201708835A (zh) | 2015-08-04 | 2017-03-01 | 財團法人工業技術研究院 | 電子電路監測系統及電子電路監測方法 |
US10247769B2 (en) | 2015-09-02 | 2019-04-02 | International Business Machines Corporation | Measuring individual device degradation in CMOS circuits |
JP6703398B2 (ja) * | 2015-12-25 | 2020-06-03 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
JP2018050219A (ja) * | 2016-09-23 | 2018-03-29 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
CN107957773B (zh) * | 2016-10-17 | 2024-02-06 | 北京诺亦腾科技有限公司 | 穿戴装置、手套、动作捕捉装置及虚拟现实系统 |
US10747258B1 (en) * | 2017-02-28 | 2020-08-18 | Amazon Technologies, Inc. | Distributed digital ring oscillators in a digital system |
US10126354B1 (en) | 2017-06-28 | 2018-11-13 | Globalfoundries Inc. | Assessment of HCI in logic circuits based on AC stress in discrete FETs |
GB2567420B (en) * | 2017-10-02 | 2020-07-08 | Advanced Risc Mach Ltd | Adaptive voltage scaling methods and systems therefor |
US11068589B2 (en) * | 2017-12-22 | 2021-07-20 | The Boeing Company | Interference detecting ring oscillators |
US10964649B2 (en) * | 2018-08-03 | 2021-03-30 | Arm Limited | Tamper detection in integrated circuits |
JP2020042416A (ja) * | 2018-09-07 | 2020-03-19 | ルネサスエレクトロニクス株式会社 | 半導体装置及びコンピュータシステム |
US11531385B2 (en) | 2018-09-17 | 2022-12-20 | Samsung Electronics Co., Ltd. | Voltage droop monitoring circuits, system-on chips and methods of operating the system-on chips |
TWI670943B (zh) * | 2018-10-25 | 2019-09-01 | 創意電子股份有限公司 | 晶片與效能監控方法 |
CN109856525A (zh) * | 2018-11-07 | 2019-06-07 | 宁波大学 | 一种基于查找表的电路老化检测传感器 |
US11169585B2 (en) * | 2019-08-16 | 2021-11-09 | Apple Inc. | Dashboard with push model for receiving sensor data |
CN110609188B (zh) * | 2019-09-25 | 2022-07-15 | 潍柴动力股份有限公司 | 油量计量单元老化的检测方法、装置及设备 |
FR3107983B1 (fr) * | 2020-03-05 | 2022-05-27 | St Microelectronics Sa | Dispositif de surveillance d'un circuit digital |
CN115166462B (zh) * | 2022-07-04 | 2023-08-22 | 赖俊生 | 一种半导体芯片全生命周期持续检测方法、装置和设备 |
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-
2007
- 2007-04-30 US US11/742,018 patent/US7495519B2/en not_active Expired - Fee Related
-
2008
- 2008-04-10 KR KR1020097013131A patent/KR20090099536A/ko active IP Right Grant
- 2008-04-10 CN CN200880014008.6A patent/CN101669037B/zh active Active
- 2008-04-10 AT AT08736066T patent/ATE501438T1/de not_active IP Right Cessation
- 2008-04-10 JP JP2010504615A patent/JP5153865B2/ja not_active Expired - Fee Related
- 2008-04-10 WO PCT/EP2008/054345 patent/WO2008132033A1/en active Application Filing
- 2008-04-10 TW TW097112967A patent/TWI409623B/zh not_active IP Right Cessation
- 2008-04-10 EP EP08736066A patent/EP2150827B1/de not_active Not-in-force
- 2008-04-10 DE DE602008005445T patent/DE602008005445D1/de active Active
Also Published As
Publication number | Publication date |
---|---|
CN101669037B (zh) | 2012-12-05 |
US20080270049A1 (en) | 2008-10-30 |
TWI409623B (zh) | 2013-09-21 |
JP5153865B2 (ja) | 2013-02-27 |
KR20090099536A (ko) | 2009-09-22 |
JP2010527174A (ja) | 2010-08-05 |
DE602008005445D1 (en) | 2011-04-21 |
US7495519B2 (en) | 2009-02-24 |
EP2150827B1 (de) | 2011-03-09 |
EP2150827A1 (de) | 2010-02-10 |
CN101669037A (zh) | 2010-03-10 |
TW200905463A (en) | 2009-02-01 |
WO2008132033A1 (en) | 2008-11-06 |
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Legal Events
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RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |