JP5151651B2 - 酸素イオン注入装置 - Google Patents
酸素イオン注入装置 Download PDFInfo
- Publication number
- JP5151651B2 JP5151651B2 JP2008110807A JP2008110807A JP5151651B2 JP 5151651 B2 JP5151651 B2 JP 5151651B2 JP 2008110807 A JP2008110807 A JP 2008110807A JP 2008110807 A JP2008110807 A JP 2008110807A JP 5151651 B2 JP5151651 B2 JP 5151651B2
- Authority
- JP
- Japan
- Prior art keywords
- wafer
- lamp
- lamp group
- oxygen ion
- cap
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000001301 oxygen Substances 0.000 title claims description 46
- 229910052760 oxygen Inorganic materials 0.000 title claims description 46
- 235000012431 wafers Nutrition 0.000 claims description 118
- 229910052736 halogen Inorganic materials 0.000 claims description 44
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims description 31
- 238000005468 ion implantation Methods 0.000 claims description 24
- 239000000498 cooling water Substances 0.000 claims description 21
- 125000005843 halogen group Chemical group 0.000 claims description 2
- 150000002367 halogens Chemical class 0.000 description 42
- 230000000052 comparative effect Effects 0.000 description 16
- -1 oxygen ions Chemical class 0.000 description 13
- 230000002093 peripheral effect Effects 0.000 description 12
- 238000010438 heat treatment Methods 0.000 description 8
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 7
- 238000000034 method Methods 0.000 description 7
- 229910052710 silicon Inorganic materials 0.000 description 7
- 239000010703 silicon Substances 0.000 description 7
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 6
- 230000001133 acceleration Effects 0.000 description 4
- 238000010923 batch production Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 238000007789 sealing Methods 0.000 description 4
- 229910052786 argon Inorganic materials 0.000 description 3
- 239000007789 gas Substances 0.000 description 3
- 238000009826 distribution Methods 0.000 description 2
- 238000011156 evaluation Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 230000003111 delayed effect Effects 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 230000002542 deteriorative effect Effects 0.000 description 1
- 238000002513 implantation Methods 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 238000010884 ion-beam technique Methods 0.000 description 1
- 238000012856 packing Methods 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/48—Ion implantation
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/54—Controlling or regulating the coating process
- C23C14/541—Heating or cooling of the substrates
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physical Vapour Deposition (AREA)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2008110807A JP5151651B2 (ja) | 2008-04-22 | 2008-04-22 | 酸素イオン注入装置 |
| US12/402,584 US8293070B2 (en) | 2008-04-22 | 2009-03-12 | Oxygen ion implantation equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2008110807A JP5151651B2 (ja) | 2008-04-22 | 2008-04-22 | 酸素イオン注入装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2009266391A JP2009266391A (ja) | 2009-11-12 |
| JP2009266391A5 JP2009266391A5 (https=) | 2011-05-12 |
| JP5151651B2 true JP5151651B2 (ja) | 2013-02-27 |
Family
ID=41200047
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2008110807A Expired - Fee Related JP5151651B2 (ja) | 2008-04-22 | 2008-04-22 | 酸素イオン注入装置 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US8293070B2 (https=) |
| JP (1) | JP5151651B2 (https=) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5151651B2 (ja) * | 2008-04-22 | 2013-02-27 | 株式会社Sumco | 酸素イオン注入装置 |
| JP2010040593A (ja) * | 2008-07-31 | 2010-02-18 | Sumco Corp | イオン注入装置及び方法 |
| US9685303B2 (en) * | 2015-05-08 | 2017-06-20 | Varian Semiconductor Equipment Associates, Inc. | Apparatus for heating and processing a substrate |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5823156A (ja) * | 1981-07-31 | 1983-02-10 | Nec Corp | イオン注入装置 |
| JPH0728692Y2 (ja) * | 1988-06-25 | 1995-06-28 | 日新電機株式会社 | ウエハディスク |
| US5207835A (en) * | 1989-02-28 | 1993-05-04 | Moore Epitaxial, Inc. | High capacity epitaxial reactor |
| JPH0499274A (ja) * | 1990-08-10 | 1992-03-31 | Nec Corp | イオン注入装置 |
| JPH05190133A (ja) * | 1992-01-14 | 1993-07-30 | Nec Corp | イオン注入装置 |
| JPH0831368A (ja) * | 1994-07-21 | 1996-02-02 | Nippon Precision Circuits Kk | イオン注入装置 |
| JP3288554B2 (ja) * | 1995-05-29 | 2002-06-04 | 株式会社日立製作所 | イオン注入装置及びイオン注入方法 |
| US5930643A (en) | 1997-12-22 | 1999-07-27 | International Business Machines Corporation | Defect induced buried oxide (DIBOX) for throughput SOI |
| JP2000124195A (ja) * | 1998-10-14 | 2000-04-28 | Tokyo Electron Ltd | 表面処理方法及びその装置 |
| JP2004296558A (ja) * | 2003-03-26 | 2004-10-21 | Osaka Prefecture | 絶縁層埋め込み型単結晶炭化シリコン基板の製造方法及びその製造装置 |
| US7812325B2 (en) * | 2006-09-28 | 2010-10-12 | Varian Semiconductor Equipment Associates, Inc. | Implanting with improved uniformity and angle control on tilted wafers |
| JP5151651B2 (ja) * | 2008-04-22 | 2013-02-27 | 株式会社Sumco | 酸素イオン注入装置 |
| JP2010199569A (ja) * | 2009-02-02 | 2010-09-09 | Sumco Corp | Simoxウェーハの製造方法 |
-
2008
- 2008-04-22 JP JP2008110807A patent/JP5151651B2/ja not_active Expired - Fee Related
-
2009
- 2009-03-12 US US12/402,584 patent/US8293070B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JP2009266391A (ja) | 2009-11-12 |
| US20090260570A1 (en) | 2009-10-22 |
| US8293070B2 (en) | 2012-10-23 |
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| FPAY | Renewal fee payment (event date is renewal date of database) |
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| R150 | Certificate of patent or registration of utility model |
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| LAPS | Cancellation because of no payment of annual fees |