JP5131706B2 - 減衰全反射(atr)分光方法 - Google Patents
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
- G01N21/552—Attenuated total reflection
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/24—Base structure
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/24—Base structure
- G02B21/26—Stages; Adjusting means therefor
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/32—Micromanipulators structurally combined with microscopes
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N2021/3595—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using FTIR
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- Investigating Or Analysing Materials By Optical Means (AREA)
- Microscoopes, Condenser (AREA)
- Sampling And Sample Adjustment (AREA)
Description
a)最大赤外線エネルギーが結晶に透過される位置を見いだすことによって推定される最初の垂直変位で、赤外線画像が入手される。これは、最も適切な焦点位置と同じでなくてもよい。
b)この画像は、試料が強力に吸収する波長における吸光度の空間マップを抽出するためにスペクトル・フィルタリングされる。これは、材料特性の関数である。
c)画像中の空間的に鮮鋭な特徴構造を、本件の場合では重合体と空気との間の縁部を横切る、この波長における吸光度マップの断面が抽出される。
d)この断面は、傾き情報を抽出するために数学的に微分され、最大の傾きが画像中の認識可能な特徴構造に関して測定される。
e)結晶の変位は、所与の特徴構造における断面の傾きを最大化するように繰り返し調節される。最大の傾きが得られる垂直結晶位置は、試料の画像が最も適切に合焦している位置である。この値(指標標識を基準にして測定された)は、使用者に供給される結晶高さパラメータとして記録される。
f)新たな/置換え結晶はいずれも、使用者が機器の制御ソフトウェアに入力しなければならない新たな較正値を有する。
(i)試料をプレート67の上に取り付けてアンビル60の上に配置し、
(ii)副ステージのみを使用して、すなわち、調節ねじ70、71を使用してアンビル(60)の位置を調節して試料位置を調節し(これは試料を視覚的に観察しながら実施される)、
(iii)結晶106が顕微鏡の光軸上に配置されるようにアーム100を定位置に振り戻してアーム100を降下させ、それによって結晶106を降下させてプレート67上の試料と接触させ、
(iv)試料が結晶に押し合わされるように加圧機構80を使用して圧力をアンビル60の上部の下側に加えることである。
Claims (9)
- 可動ステージとATR測定を実施する付属品とを有する顕微鏡を動作させる方法であって、
前記付属品は前記顕微鏡の可動ステージ上に取り付けられうる支持体と、試料接触領域を有するATR結晶が内部に取り付けられる取付け部材と、位置決め標示であって、前記位置決め標示が前記試料接触領域に対して固定されるように配置された位置決め標示とを含み、
前記顕微鏡は前記可動ステージの移動を制御する処理手段を含み、前記処理手段は前記ATR結晶の高さに関する所定の較正パラメータを内部に記録しており、前記方法は、前記位置決め標示に焦点を合わせるために前記顕微鏡の前記ステージを最初に移動させるステップと、前記試料接触領域に接触する試料に焦点を合わせるために、前記パラメータによって画定された所定の垂直距離だけ前記ステージを移動させるステップと、を含む方法。 - 前記ATR結晶は、前記接触領域に対向する概ね半球状の表面を有し、前記位置決め標示は、前記半球状の表面の頂点領域に配置される、請求項1に記載の方法。
- 前記位置決め標示は、前記半球状の表面上の平坦部または前記半球状の表面上の標識を備える、請求項2に記載の方法。
- 顕微鏡に使用するATR結晶のための較正パラメータを決定する方法であって、前記顕微鏡は可動ステージと付属品とを含み、前記付属品は前記顕微鏡の可動ステージ上に取り付けられうる支持体と、試料接触領域を有するATR結晶が内部に取り付けられる取付け部材と、位置決め標示であって、前記位置決め標示が前記試料接触領域に対して固定されるように配置された位置決め標示とを含み、
前記顕微鏡のスペクトル範囲内で強力な吸収を呈しかつATR結晶によって接触されるときに鮮鋭な空間縁部を創出する幾何学的形状を有する試験試料を選択するステップを含む方法であって、前記ATR結晶の前記試料接触領域を前記試験試料に接触させるステップと、前記ATR結晶の最初の垂直位置で前記試験試料の赤外画像を獲得するステップと、前記空間縁部に関する傾き情報を抽出するために前記画像を処理するステップと、前記ATR結晶の異なる垂直位置に関して前記処理を繰り返すステップと、最適の垂直位置を最大の傾きを呈する位置として識別するステップと、前記識別された最適位置にしたがって前記ATR結晶に関する較正パラメータを導出するステップとを含む方法。 - 前記処理するステップは、前記試験試料が強力に吸収する波長における吸光度の空間マップを抽出するために、垂直位置ごとに、前記獲得された画像をスペクトル・フィルタリングするステップを含む、請求項4に記載の方法。
- 前記試験試料が強力に吸収する波長における前記吸光度マップの空間的に鮮鋭な特徴構造を横切る断面を抽出するステップを含む、請求項5に記載の方法。
- 傾きデータを抽出するために前記断面を微分するステップと、前記画像中の認識可能な特徴構造に関する最大の傾きを測定するステップとを含む、請求項6に記載の方法。
- 前記試験試料はプラスチック材料である、請求項4〜7のいずれか1項に記載の方法。
- 前記試験試料は、バイキュイティ輝度強化フィルムのような微細エンボス加工された重合体である、請求項8に記載の方法。
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GBGB0608258.0A GB0608258D0 (en) | 2006-04-26 | 2006-04-26 | Spectroscopy using attenuated total internal reflectance (ATR) |
GB0608258.0 | 2006-04-26 | ||
PCT/GB2007/001530 WO2007122416A1 (en) | 2006-04-26 | 2007-04-26 | Accessory for attenuated total internal reflectance (atr) spectroscopy |
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JP2009534684A JP2009534684A (ja) | 2009-09-24 |
JP5131706B2 true JP5131706B2 (ja) | 2013-01-30 |
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JP2009507164A Active JP5234369B2 (ja) | 2006-04-26 | 2007-04-26 | 減衰全反射(atr)分光法用の付属品 |
JP2009507162A Expired - Fee Related JP5403515B2 (ja) | 2006-04-26 | 2007-04-26 | 減衰全反射(atr)分光法用の付属品 |
JP2009507163A Expired - Fee Related JP5131706B2 (ja) | 2006-04-26 | 2007-04-26 | 減衰全反射(atr)分光方法 |
JP2009507161A Active JP5316807B2 (ja) | 2006-04-26 | 2007-04-26 | 減衰全反射(atr)分光法用の付属品 |
JP2013057955A Active JP5696950B2 (ja) | 2006-04-26 | 2013-03-21 | 減衰全反射(atr)分光法及びシステム |
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JP2009507162A Expired - Fee Related JP5403515B2 (ja) | 2006-04-26 | 2007-04-26 | 減衰全反射(atr)分光法用の付属品 |
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JP2013057955A Active JP5696950B2 (ja) | 2006-04-26 | 2013-03-21 | 減衰全反射(atr)分光法及びシステム |
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US (5) | US8400711B2 (ja) |
EP (6) | EP2021855B1 (ja) |
JP (5) | JP5234369B2 (ja) |
CN (5) | CN101479638B (ja) |
AU (4) | AU2007242600B2 (ja) |
CA (5) | CA2649592C (ja) |
GB (1) | GB0608258D0 (ja) |
SG (3) | SG173416A1 (ja) |
WO (4) | WO2007125329A2 (ja) |
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