JP5126730B2 - 電界効果型トランジスタの製造方法 - Google Patents
電界効果型トランジスタの製造方法 Download PDFInfo
- Publication number
- JP5126730B2 JP5126730B2 JP2005325369A JP2005325369A JP5126730B2 JP 5126730 B2 JP5126730 B2 JP 5126730B2 JP 2005325369 A JP2005325369 A JP 2005325369A JP 2005325369 A JP2005325369 A JP 2005325369A JP 5126730 B2 JP5126730 B2 JP 5126730B2
- Authority
- JP
- Japan
- Prior art keywords
- film
- substrate
- amorphous
- amorphous oxide
- oxygen
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
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Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
- H10D30/674—Thin-film transistors [TFT] characterised by the active materials
- H10D30/6755—Oxide semiconductors, e.g. zinc oxide, copper aluminium oxide or cadmium stannate
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
- H10D30/674—Thin-film transistors [TFT] characterised by the active materials
- H10D30/6755—Oxide semiconductors, e.g. zinc oxide, copper aluminium oxide or cadmium stannate
- H10D30/6756—Amorphous oxide semiconductors
Landscapes
- Thin Film Transistor (AREA)
- Dram (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2005325369A JP5126730B2 (ja) | 2004-11-10 | 2005-11-09 | 電界効果型トランジスタの製造方法 |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004326686 | 2004-11-10 | ||
| JP2004326686 | 2004-11-10 | ||
| JP2005325369A JP5126730B2 (ja) | 2004-11-10 | 2005-11-09 | 電界効果型トランジスタの製造方法 |
Related Child Applications (4)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2012058252A Division JP5401572B2 (ja) | 2004-11-10 | 2012-03-15 | 電界効果型トランジスタの製造方法 |
| JP2012058163A Division JP5401571B2 (ja) | 2004-11-10 | 2012-03-15 | 電界効果型トランジスタの製造方法 |
| JP2012058087A Division JP5451801B2 (ja) | 2004-11-10 | 2012-03-15 | 電界効果型トランジスタの製造方法 |
| JP2012058253A Division JP5401573B2 (ja) | 2004-11-10 | 2012-03-15 | 電界効果型トランジスタの製造方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2006165531A JP2006165531A (ja) | 2006-06-22 |
| JP2006165531A5 JP2006165531A5 (enExample) | 2008-12-25 |
| JP5126730B2 true JP5126730B2 (ja) | 2013-01-23 |
Family
ID=36667142
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2005325369A Expired - Lifetime JP5126730B2 (ja) | 2004-11-10 | 2005-11-09 | 電界効果型トランジスタの製造方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP5126730B2 (enExample) |
Families Citing this family (81)
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| JP5376750B2 (ja) * | 2005-11-18 | 2013-12-25 | 出光興産株式会社 | 半導体薄膜、及びその製造方法、並びに薄膜トランジスタ、アクティブマトリックス駆動表示パネル |
| JP2007311404A (ja) * | 2006-05-16 | 2007-11-29 | Fuji Electric Holdings Co Ltd | 薄膜トランジスタの製造方法 |
| JP4609797B2 (ja) | 2006-08-09 | 2011-01-12 | Nec液晶テクノロジー株式会社 | 薄膜デバイス及びその製造方法 |
| KR100787455B1 (ko) * | 2006-08-09 | 2007-12-26 | 삼성에스디아이 주식회사 | 투명 박막 트랜지스터의 제조방법 |
| KR100741136B1 (ko) * | 2006-08-09 | 2007-07-19 | 삼성에스디아이 주식회사 | 투명 박막 트랜지스터 및 그 제조방법 |
| JP5127183B2 (ja) | 2006-08-23 | 2013-01-23 | キヤノン株式会社 | アモルファス酸化物半導体膜を用いた薄膜トランジスタの製造方法 |
| JP5128792B2 (ja) * | 2006-08-31 | 2013-01-23 | 財団法人高知県産業振興センター | 薄膜トランジスタの製法 |
| EP2096188B1 (en) | 2006-12-13 | 2014-01-29 | Idemitsu Kosan Co., Ltd. | Sputtering target |
| KR101410926B1 (ko) | 2007-02-16 | 2014-06-24 | 삼성전자주식회사 | 박막 트랜지스터 및 그 제조방법 |
| US8436349B2 (en) | 2007-02-20 | 2013-05-07 | Canon Kabushiki Kaisha | Thin-film transistor fabrication process and display device |
| JP2008235871A (ja) * | 2007-02-20 | 2008-10-02 | Canon Inc | 薄膜トランジスタの形成方法及び表示装置 |
| WO2008105347A1 (en) * | 2007-02-20 | 2008-09-04 | Canon Kabushiki Kaisha | Thin-film transistor fabrication process and display device |
| US8530891B2 (en) | 2007-04-05 | 2013-09-10 | Idemitsu Kosan Co., Ltd | Field-effect transistor, and process for producing field-effect transistor |
| WO2008139860A1 (ja) | 2007-05-07 | 2008-11-20 | Idemitsu Kosan Co., Ltd. | 半導体薄膜、半導体薄膜の製造方法、および、半導体素子 |
| WO2008136505A1 (ja) | 2007-05-08 | 2008-11-13 | Idemitsu Kosan Co., Ltd. | 半導体デバイス及び薄膜トランジスタ、並びに、それらの製造方法 |
| JP5522889B2 (ja) | 2007-05-11 | 2014-06-18 | 出光興産株式会社 | In−Ga−Zn−Sn系酸化物焼結体、及び物理成膜用ターゲット |
| JP5354999B2 (ja) * | 2007-09-26 | 2013-11-27 | キヤノン株式会社 | 電界効果型トランジスタの製造方法 |
| US8384077B2 (en) | 2007-12-13 | 2013-02-26 | Idemitsu Kosan Co., Ltd | Field effect transistor using oxide semicondutor and method for manufacturing the same |
| WO2009081862A1 (ja) * | 2007-12-26 | 2009-07-02 | Konica Minolta Holdings, Inc. | 金属酸化物半導体およびその製造方法、半導体素子、薄膜トランジスタ |
| JP5219529B2 (ja) * | 2008-01-23 | 2013-06-26 | キヤノン株式会社 | 電界効果型トランジスタ及び、該電界効果型トランジスタを備えた表示装置 |
| WO2009093625A1 (ja) * | 2008-01-23 | 2009-07-30 | Idemitsu Kosan Co., Ltd. | 電界効果型トランジスタ及びその製造方法、それを用いた表示装置、並びに半導体装置 |
| JP2009206508A (ja) * | 2008-01-31 | 2009-09-10 | Canon Inc | 薄膜トランジスタ及び表示装置 |
| US7812346B2 (en) * | 2008-07-16 | 2010-10-12 | Cbrite, Inc. | Metal oxide TFT with improved carrier mobility |
| TWI500159B (zh) * | 2008-07-31 | 2015-09-11 | Semiconductor Energy Lab | 半導體裝置和其製造方法 |
| TWI642113B (zh) | 2008-08-08 | 2018-11-21 | 半導體能源研究所股份有限公司 | 半導體裝置的製造方法 |
| JP5307144B2 (ja) * | 2008-08-27 | 2013-10-02 | 出光興産株式会社 | 電界効果型トランジスタ、その製造方法及びスパッタリングターゲット |
| US8129718B2 (en) * | 2008-08-28 | 2012-03-06 | Canon Kabushiki Kaisha | Amorphous oxide semiconductor and thin film transistor using the same |
| US9082857B2 (en) | 2008-09-01 | 2015-07-14 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device comprising an oxide semiconductor layer |
| JP5627071B2 (ja) | 2008-09-01 | 2014-11-19 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
| KR101623224B1 (ko) | 2008-09-12 | 2016-05-20 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 반도체 장치의 제조 방법 |
| KR101603303B1 (ko) * | 2008-10-31 | 2016-03-14 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 도전성 산질화물 및 도전성 산질화물막의 제작 방법 |
| KR101631454B1 (ko) * | 2008-10-31 | 2016-06-17 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 논리회로 |
| TWI467663B (zh) * | 2008-11-07 | 2015-01-01 | Semiconductor Energy Lab | 半導體裝置和該半導體裝置的製造方法 |
| TWI476915B (zh) | 2008-12-25 | 2015-03-11 | 半導體能源研究所股份有限公司 | 半導體裝置及其製造方法 |
| KR101648927B1 (ko) * | 2009-01-16 | 2016-08-17 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 그 제작 방법 |
| JP2010205798A (ja) * | 2009-02-27 | 2010-09-16 | Japan Science & Technology Agency | 薄膜トランジスタの製造方法 |
| TWI529942B (zh) * | 2009-03-27 | 2016-04-11 | 半導體能源研究所股份有限公司 | 半導體裝置 |
| EP2256795B1 (en) * | 2009-05-29 | 2014-11-19 | Semiconductor Energy Laboratory Co., Ltd. | Manufacturing method for oxide semiconductor device |
| WO2011001715A1 (ja) * | 2009-06-29 | 2011-01-06 | シャープ株式会社 | 酸化物半導体、薄膜トランジスタアレイ基板及びその製造方法、並びに、表示装置 |
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| JP5640478B2 (ja) | 2009-07-09 | 2014-12-17 | 株式会社リコー | 電界効果型トランジスタの製造方法及び電界効果型トランジスタ |
| WO2011007682A1 (en) | 2009-07-17 | 2011-01-20 | Semiconductor Energy Laboratory Co., Ltd. | Method of manufacturing semiconductor device |
| JP5403464B2 (ja) * | 2009-08-14 | 2014-01-29 | Nltテクノロジー株式会社 | 薄膜デバイス及びその製造方法 |
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| CN102668096B (zh) | 2009-10-30 | 2015-04-29 | 株式会社半导体能源研究所 | 半导体装置及其制造方法 |
| KR101810254B1 (ko) * | 2009-11-06 | 2017-12-18 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 그 동작 방법 |
| WO2011062043A1 (en) * | 2009-11-20 | 2011-05-26 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing semiconductor device |
| JP5762723B2 (ja) * | 2009-11-20 | 2015-08-12 | 株式会社半導体エネルギー研究所 | 変調回路及びそれを備えた半導体装置 |
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| US8906739B2 (en) | 2010-04-06 | 2014-12-09 | Sharp Kabushiki Kaisha | Thin film transistor substrate and method for manufacturing same |
| WO2011132591A1 (en) * | 2010-04-23 | 2011-10-27 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing semiconductor device |
| DE112011101410B4 (de) * | 2010-04-23 | 2018-03-01 | Semiconductor Energy Laboratory Co., Ltd. | Verfahren zum Herstellen einer Halbleitervorrichtung |
| KR101877377B1 (ko) * | 2010-04-23 | 2018-07-11 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치의 제작 방법 |
| KR101540039B1 (ko) * | 2010-04-23 | 2015-07-28 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치의 제작 방법 |
| DE112011101395B4 (de) * | 2010-04-23 | 2014-10-16 | Semiconductor Energy Laboratory Co., Ltd. | Verfahren zum Herstellen einer Halbleitervorrichtung |
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| US8766252B2 (en) * | 2010-07-02 | 2014-07-01 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device comprising an oxide semiconductor |
| TWI621184B (zh) * | 2010-08-16 | 2018-04-11 | 半導體能源研究所股份有限公司 | 半導體裝置之製造方法 |
| JP5658978B2 (ja) * | 2010-11-10 | 2015-01-28 | 株式会社ジャパンディスプレイ | 薄膜トランジスタ回路基板及びその製造方法 |
| WO2012077682A1 (ja) | 2010-12-08 | 2012-06-14 | シャープ株式会社 | 半導体装置および表示装置 |
| EP2657974B1 (en) | 2010-12-20 | 2017-02-08 | Sharp Kabushiki Kaisha | Semiconductor device and display device |
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| KR101438642B1 (ko) * | 2013-11-04 | 2014-09-17 | 삼성전자주식회사 | 박막 트랜지스터 및 그 제조방법 |
| WO2015132697A1 (en) * | 2014-03-07 | 2015-09-11 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
| US10205008B2 (en) * | 2016-08-03 | 2019-02-12 | Semiconductor Energy Laboratory Co., Ltd. | Manufacturing method of semiconductor device |
| KR101934165B1 (ko) * | 2016-12-12 | 2018-12-31 | 연세대학교 산학협력단 | 산화물 박막, 이의 제조방법 및 이를 포함하는 산화물 박막 트랜지스터 |
| US10879064B2 (en) * | 2016-12-27 | 2020-12-29 | Sharp Kabushiki Kaisha | Method for manufacturing semiconductor device and film forming apparatus |
| KR102290124B1 (ko) * | 2019-06-20 | 2021-08-31 | 충북대학교 산학협력단 | Rf 파워 기반의 플라즈마 처리를 이용한 용액공정형 다채널 izo 산화물 박막 트랜지스터 및 그 제조 방법 |
| KR102245154B1 (ko) * | 2019-06-20 | 2021-04-26 | 충북대학교 산학협력단 | 다적층 구조 izo 박막 트랜지스터 및 그 제조 방법 |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH05251705A (ja) * | 1992-03-04 | 1993-09-28 | Fuji Xerox Co Ltd | 薄膜トランジスタ |
| JP4170454B2 (ja) * | 1998-07-24 | 2008-10-22 | Hoya株式会社 | 透明導電性酸化物薄膜を有する物品及びその製造方法 |
| JP3941316B2 (ja) * | 1999-11-29 | 2007-07-04 | セイコーエプソン株式会社 | 半導体装置の製造方法、電子機器の製造方法、半導体装置、および電子機器 |
| JP2002289859A (ja) * | 2001-03-23 | 2002-10-04 | Minolta Co Ltd | 薄膜トランジスタ |
| JP2003037268A (ja) * | 2001-07-24 | 2003-02-07 | Minolta Co Ltd | 半導体素子及びその製造方法 |
| JP4164562B2 (ja) * | 2002-09-11 | 2008-10-15 | 独立行政法人科学技術振興機構 | ホモロガス薄膜を活性層として用いる透明薄膜電界効果型トランジスタ |
| JP2004235180A (ja) * | 2003-01-28 | 2004-08-19 | Sanyo Electric Co Ltd | 半導体装置及びその製造方法 |
-
2005
- 2005-11-09 JP JP2005325369A patent/JP5126730B2/ja not_active Expired - Lifetime
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