JP5086567B2 - 照明装置及び照明方法 - Google Patents

照明装置及び照明方法 Download PDF

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Publication number
JP5086567B2
JP5086567B2 JP2006174447A JP2006174447A JP5086567B2 JP 5086567 B2 JP5086567 B2 JP 5086567B2 JP 2006174447 A JP2006174447 A JP 2006174447A JP 2006174447 A JP2006174447 A JP 2006174447A JP 5086567 B2 JP5086567 B2 JP 5086567B2
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JP
Japan
Prior art keywords
light
electron
electron beam
lens
light source
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Expired - Fee Related
Application number
JP2006174447A
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English (en)
Japanese (ja)
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JP2008004452A (ja
JP2008004452A5 (https=
Inventor
宏也 福山
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Olympus Corp
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Olympus Corp
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Publication date
Application filed by Olympus Corp filed Critical Olympus Corp
Priority to JP2006174447A priority Critical patent/JP5086567B2/ja
Priority to PCT/JP2007/061427 priority patent/WO2007148532A1/ja
Priority to EP07744770A priority patent/EP2048429A4/en
Priority to US12/308,619 priority patent/US8129687B2/en
Publication of JP2008004452A publication Critical patent/JP2008004452A/ja
Publication of JP2008004452A5 publication Critical patent/JP2008004452A5/ja
Application granted granted Critical
Publication of JP5086567B2 publication Critical patent/JP5086567B2/ja
Expired - Fee Related legal-status Critical Current
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J63/00Cathode-ray or electron-stream lamps
    • H01J63/06Lamps with luminescent screen excited by the ray or stream
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y15/00Nanotechnology for interacting, sensing or actuating, e.g. quantum dots as markers in protein assays or molecular motors
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y20/00Nanooptics, e.g. quantum optics or photonic crystals
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B1/00Optical elements characterised by the material of which they are made; Optical coatings for optical elements
    • G02B1/002Optical elements characterised by the material of which they are made; Optical coatings for optical elements made of materials engineered to provide properties not available in nature, e.g. metamaterials
    • G02B1/007Optical elements characterised by the material of which they are made; Optical coatings for optical elements made of materials engineered to provide properties not available in nature, e.g. metamaterials made of negative effective refractive index materials

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  • Chemical & Material Sciences (AREA)
  • Nanotechnology (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biophysics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Molecular Biology (AREA)
  • General Physics & Mathematics (AREA)
  • Electron Sources, Ion Sources (AREA)
  • Discharge Lamps And Accessories Thereof (AREA)
JP2006174447A 2006-06-23 2006-06-23 照明装置及び照明方法 Expired - Fee Related JP5086567B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2006174447A JP5086567B2 (ja) 2006-06-23 2006-06-23 照明装置及び照明方法
PCT/JP2007/061427 WO2007148532A1 (ja) 2006-06-23 2007-06-06 照明装置、照明方法、光検出装置及び光検出方法
EP07744770A EP2048429A4 (en) 2006-06-23 2007-06-06 LIGHTING DEVICE, LIGHTING METHOD, LIGHT DETECTOR, AND LIGHT DETECTION METHOD
US12/308,619 US8129687B2 (en) 2006-06-23 2007-06-06 Lighting system, method of lighting, optical detector, and method of optical detection

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006174447A JP5086567B2 (ja) 2006-06-23 2006-06-23 照明装置及び照明方法

Publications (3)

Publication Number Publication Date
JP2008004452A JP2008004452A (ja) 2008-01-10
JP2008004452A5 JP2008004452A5 (https=) 2011-06-02
JP5086567B2 true JP5086567B2 (ja) 2012-11-28

Family

ID=38833274

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006174447A Expired - Fee Related JP5086567B2 (ja) 2006-06-23 2006-06-23 照明装置及び照明方法

Country Status (4)

Country Link
US (1) US8129687B2 (https=)
EP (1) EP2048429A4 (https=)
JP (1) JP5086567B2 (https=)
WO (1) WO2007148532A1 (https=)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102007016588B4 (de) * 2007-04-05 2014-10-09 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Mikroskop mit Subwellenlängenauflösung und Verfahren zum Erzeugen eines Bilds eines Objekts
US20110133565A1 (en) * 2009-12-03 2011-06-09 Koon Hoo Teo Wireless Energy Transfer with Negative Index Material
US20110133568A1 (en) * 2009-12-03 2011-06-09 Bingnan Wang Wireless Energy Transfer with Metamaterials
US9461505B2 (en) * 2009-12-03 2016-10-04 Mitsubishi Electric Research Laboratories, Inc. Wireless energy transfer with negative index material
US20110133566A1 (en) * 2009-12-03 2011-06-09 Koon Hoo Teo Wireless Energy Transfer with Negative Material
US20120223245A1 (en) * 2011-03-01 2012-09-06 John Bennett Electron beam source system and method
NL2014683A (en) * 2014-05-07 2016-03-31 Asml Netherlands Bv Diamond-based monitoring apparatus for lithographic apparatus, and a lithographic apparatus comprising diamond-based monitoring apparatus.
US10466470B2 (en) * 2016-08-04 2019-11-05 Abl Ip Holding Llc Configurable optical transducers using an optical modulator and one or more lenses
US10619826B2 (en) 2016-08-04 2020-04-14 Abl Ip Holding Llc Configurable lighting device using a light source, optical modulator, and one or more lenses
CA3036100A1 (en) 2016-09-06 2018-03-15 Bnnt, Llc Transition radiation light sources
CN111366338B (zh) * 2020-04-24 2021-11-19 华中科技大学 一种成虚像光学系统的成像质量检测装置及方法

Family Cites Families (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5477060A (en) * 1977-12-01 1979-06-20 Hitachi Ltd Electron microscope
JPH0679110B2 (ja) * 1985-05-08 1994-10-05 オリンパス光学工業株式会社 内視鏡装置
FR2591357A1 (fr) * 1985-12-10 1987-06-12 Labo Electronique Physique Dispositif d'insolation pour la generation de masques
JPS63252350A (ja) * 1987-04-09 1988-10-19 Fuji Xerox Co Ltd 光書き込みヘツド
JPH04312752A (ja) * 1991-04-11 1992-11-04 Hamamatsu Photonics Kk 電子管装置
WO1993006616A1 (fr) * 1991-09-26 1993-04-01 Seiko Epson Corporation Dispositif d'eclairage et dispositif d'affichage d'images
JPH0588165A (ja) * 1991-09-26 1993-04-09 Canon Inc カラー投写装置用光源
CA2094051A1 (en) 1992-04-30 1993-10-31 James T. Connors, Jr. Filter for filtering an aggressive fluid
JPH0831303A (ja) * 1994-07-14 1996-02-02 Oki Electric Ind Co Ltd 微小電界放射電子源の構造及びその製造方法
US6078643A (en) * 1998-05-07 2000-06-20 Infimed, Inc. Photoconductor-photocathode imager
JP2000081494A (ja) * 1998-09-07 2000-03-21 Hitachi Ltd 水冷却型原子炉の燃料集合体
JP2000208089A (ja) * 1999-01-12 2000-07-28 Canon Inc 電子顕微鏡装置
JP2002296117A (ja) * 2001-03-30 2002-10-09 Toshiba Corp 撮像素子
JP2003149119A (ja) * 2001-11-07 2003-05-21 Nippon Telegr & Teleph Corp <Ntt> 導電透明プローブ
JP2004227822A (ja) * 2003-01-21 2004-08-12 Hitachi Displays Ltd 画像表示装置
TWM252948U (en) 2003-09-09 2004-12-11 Optimax Tech Corp Control film structure of light-beam
KR100981996B1 (ko) * 2004-02-05 2010-09-13 삼성에스디아이 주식회사 전계방출형 백라이트 장치
US7304789B2 (en) * 2004-02-24 2007-12-04 Olympus Corporation Microscope system and objective unit
JP4678832B2 (ja) * 2004-07-27 2011-04-27 日本碍子株式会社 光源
US7511798B2 (en) * 2004-07-30 2009-03-31 Asml Holding N.V. Off-axis catadioptric projection optical system for lithography
JP2006040835A (ja) * 2004-07-30 2006-02-09 Orc Mfg Co Ltd 電子ビーム照射装置
US7529030B2 (en) * 2004-09-06 2009-05-05 Olympus Corporation Optical apparatus with optical element made of a medium exhibiting negative refraction
JP2006072237A (ja) * 2004-09-06 2006-03-16 Olympus Corp レンズ、光学系、並びに光学装置
JP4947889B2 (ja) 2004-10-15 2012-06-06 オリンパス株式会社 光学系及び光学装置
JP2006112985A (ja) * 2004-10-18 2006-04-27 Canon Inc 光強度検出方法及び該方法を用いたセンシング方法、光強度検出装置及び該装置によって構成したセンシング装置
JP2006145985A (ja) 2004-11-22 2006-06-08 Olympus Corp 光学装置
JP2008046470A (ja) * 2006-08-18 2008-02-28 Olympus Corp 照明装置、照明方法、及び走査型光学顕微鏡

Also Published As

Publication number Publication date
JP2008004452A (ja) 2008-01-10
EP2048429A1 (en) 2009-04-15
WO2007148532A1 (ja) 2007-12-27
EP2048429A4 (en) 2010-11-10
US20100230611A1 (en) 2010-09-16
US8129687B2 (en) 2012-03-06

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