JP5036311B2 - ミラーm3の前にレンズを伴う複数のミラーを含む投影対物レンズ - Google Patents
ミラーm3の前にレンズを伴う複数のミラーを含む投影対物レンズ Download PDFInfo
- Publication number
- JP5036311B2 JP5036311B2 JP2006522918A JP2006522918A JP5036311B2 JP 5036311 B2 JP5036311 B2 JP 5036311B2 JP 2006522918 A JP2006522918 A JP 2006522918A JP 2006522918 A JP2006522918 A JP 2006522918A JP 5036311 B2 JP5036311 B2 JP 5036311B2
- Authority
- JP
- Japan
- Prior art keywords
- optical path
- curved mirror
- mirror
- last
- lens
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B17/00—Systems with reflecting surfaces, with or without refracting elements
- G02B17/08—Catadioptric systems
- G02B17/0892—Catadioptric systems specially adapted for the UV
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B17/00—Systems with reflecting surfaces, with or without refracting elements
- G02B17/08—Catadioptric systems
- G02B17/0836—Catadioptric systems using more than three curved mirrors
- G02B17/0844—Catadioptric systems using more than three curved mirrors off-axis or unobscured systems in which all of the mirrors share a common axis of rotational symmetry
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B17/00—Systems with reflecting surfaces, with or without refracting elements
- G02B17/08—Catadioptric systems
- G02B17/0856—Catadioptric systems comprising a refractive element with a reflective surface, the reflection taking place inside the element, e.g. Mangin mirrors
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70225—Optical aspects of catadioptric systems, i.e. comprising reflective and refractive elements
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Lenses (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/639,780 | 2003-08-12 | ||
| US10/639,780 US7085075B2 (en) | 2003-08-12 | 2003-08-12 | Projection objectives including a plurality of mirrors with lenses ahead of mirror M3 |
| PCT/EP2004/007910 WO2005015283A1 (en) | 2003-08-12 | 2004-07-16 | Projection objectives including a plurality of curved mirrors with lenses ahead of the last but one mirror |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2007502019A JP2007502019A (ja) | 2007-02-01 |
| JP2007502019A5 JP2007502019A5 (cg-RX-API-DMAC7.html) | 2007-08-16 |
| JP5036311B2 true JP5036311B2 (ja) | 2012-09-26 |
Family
ID=34135943
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2006522918A Expired - Fee Related JP5036311B2 (ja) | 2003-08-12 | 2004-07-16 | ミラーm3の前にレンズを伴う複数のミラーを含む投影対物レンズ |
Country Status (5)
| Country | Link |
|---|---|
| US (2) | US7085075B2 (cg-RX-API-DMAC7.html) |
| EP (1) | EP1654577A1 (cg-RX-API-DMAC7.html) |
| JP (1) | JP5036311B2 (cg-RX-API-DMAC7.html) |
| TW (1) | TW200508818A (cg-RX-API-DMAC7.html) |
| WO (1) | WO2005015283A1 (cg-RX-API-DMAC7.html) |
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| TW201348689A (zh) * | 2012-05-23 | 2013-12-01 | Altek Corp | 遠景檢測裝置及其遠景檢測方法 |
| CN103424979A (zh) * | 2012-05-23 | 2013-12-04 | 华晶科技股份有限公司 | 远景检测装置及其远景检测方法 |
| US10545314B1 (en) | 2014-03-16 | 2020-01-28 | Navitar Industries, Llc | Optical assembly for a compact wide field of view digital camera with low lateral chromatic aberration |
| US9316820B1 (en) | 2014-03-16 | 2016-04-19 | Hyperion Development, LLC | Optical assembly for a wide field of view point action camera with low astigmatism |
| US9995910B1 (en) | 2014-03-16 | 2018-06-12 | Navitar Industries, Llc | Optical assembly for a compact wide field of view digital camera with high MTF |
| US9726859B1 (en) | 2014-03-16 | 2017-08-08 | Navitar Industries, Llc | Optical assembly for a wide field of view camera with low TV distortion |
| US9316808B1 (en) | 2014-03-16 | 2016-04-19 | Hyperion Development, LLC | Optical assembly for a wide field of view point action camera with a low sag aspheric lens element |
| US9494772B1 (en) | 2014-03-16 | 2016-11-15 | Hyperion Development, LLC | Optical assembly for a wide field of view point action camera with low field curvature |
| US10139595B1 (en) | 2014-03-16 | 2018-11-27 | Navitar Industries, Llc | Optical assembly for a compact wide field of view digital camera with low first lens diameter to image diagonal ratio |
| US10386604B1 (en) | 2014-03-16 | 2019-08-20 | Navitar Industries, Llc | Compact wide field of view digital camera with stray light impact suppression |
| US9091843B1 (en) | 2014-03-16 | 2015-07-28 | Hyperion Development, LLC | Optical assembly for a wide field of view point action camera with low track length to focal length ratio |
| CN104062746B (zh) * | 2014-06-23 | 2016-08-24 | 中国科学院光电技术研究所 | 一种大数值孔径的折反射浸没投影光学系统 |
| CN105807410B (zh) * | 2014-12-31 | 2018-11-09 | 上海微电子装备(集团)股份有限公司 | 一种基于高数值孔径的折反射式投影物镜 |
| US9835835B1 (en) | 2015-04-10 | 2017-12-05 | Navitar Industries, Llc | Projection zoom lens and camera |
| DE102016209847A1 (de) | 2016-06-03 | 2016-07-28 | Carl Zeiss Smt Gmbh | Projektionsbelichtungsanlage für die Halbleiterlithographie mit optischer Korrekturenanordnung und Verfahren zum Betrieb einer Projektionsbelichtungsanlage |
| JP6882053B2 (ja) * | 2016-12-05 | 2021-06-02 | キヤノン株式会社 | カタディオプトリック光学系、照明光学系、露光装置および物品製造方法 |
| US11043239B2 (en) | 2019-03-20 | 2021-06-22 | Kla Corporation | Magneto-optic Kerr effect metrology systems |
| US11650487B2 (en) * | 2020-01-28 | 2023-05-16 | Daniel Joseph Reiley | Front converter optical assembly for camera |
| CN113627344B (zh) * | 2021-08-11 | 2025-02-25 | 上海乐闪闪智能科技有限公司 | 双重生物特征检测系统、安全识别方法、应用及电子设备 |
Family Cites Families (36)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2963537D1 (en) | 1979-07-27 | 1982-10-07 | Tabarelli Werner W | Optical lithographic method and apparatus for copying a pattern onto a semiconductor wafer |
| US4509852A (en) | 1980-10-06 | 1985-04-09 | Werner Tabarelli | Apparatus for the photolithographic manufacture of integrated circuit elements |
| US4346164A (en) | 1980-10-06 | 1982-08-24 | Werner Tabarelli | Photolithographic method for the manufacture of integrated circuits |
| US4469414A (en) * | 1982-06-01 | 1984-09-04 | The Perkin-Elmer Corporation | Restrictive off-axis field optical system |
| US4695464A (en) * | 1984-10-09 | 1987-09-22 | The Dow Chemical Company | Sustained release dosage form based on highly plasticized cellulose ether gels |
| JPS61156737A (ja) * | 1984-12-27 | 1986-07-16 | Canon Inc | 回路の製造方法及び露光装置 |
| US5052763A (en) * | 1990-08-28 | 1991-10-01 | International Business Machines Corporation | Optical system with two subsystems separately correcting odd aberrations and together correcting even aberrations |
| US5537260A (en) * | 1993-01-26 | 1996-07-16 | Svg Lithography Systems, Inc. | Catadioptric optical reduction system with high numerical aperture |
| US5323263A (en) * | 1993-02-01 | 1994-06-21 | Nikon Precision Inc. | Off-axis catadioptric projection system |
| JP3690819B2 (ja) * | 1993-02-03 | 2005-08-31 | 株式会社ニコン | 投影光学系、それを用いた露光装置及び露光方法 |
| US5592329A (en) * | 1993-02-03 | 1997-01-07 | Nikon Corporation | Catadioptric optical system |
| JPH06235863A (ja) * | 1993-02-12 | 1994-08-23 | Nikon Corp | 反射屈折光学系 |
| US5515207A (en) * | 1993-11-03 | 1996-05-07 | Nikon Precision Inc. | Multiple mirror catadioptric optical system |
| JP3395801B2 (ja) * | 1994-04-28 | 2003-04-14 | 株式会社ニコン | 反射屈折投影光学系、走査型投影露光装置、及び走査投影露光方法 |
| DE4417489A1 (de) * | 1994-05-19 | 1995-11-23 | Zeiss Carl Fa | Höchstaperturiges katadioptrisches Reduktionsobjektiv für die Miktrolithographie |
| US5815310A (en) * | 1995-12-12 | 1998-09-29 | Svg Lithography Systems, Inc. | High numerical aperture ring field optical reduction system |
| JPH103041A (ja) * | 1996-06-14 | 1998-01-06 | Nikon Corp | 反射屈折縮小光学系 |
| JPH1020195A (ja) * | 1996-06-28 | 1998-01-23 | Nikon Corp | 反射屈折光学系 |
| US6169627B1 (en) * | 1996-09-26 | 2001-01-02 | Carl-Zeiss-Stiftung | Catadioptric microlithographic reduction objective |
| US6631036B2 (en) | 1996-09-26 | 2003-10-07 | Carl-Zeiss-Stiftung | Catadioptric objective |
| DE10002626A1 (de) | 2000-01-22 | 2001-07-26 | Zeiss Carl | Katadioptrisches Objektiv mit Asphären |
| DE19639586A1 (de) * | 1996-09-26 | 1998-04-02 | Zeiss Carl Fa | Katadioptrisches Mikrolithographie-Reduktionsobjektiv |
| JP3747566B2 (ja) | 1997-04-23 | 2006-02-22 | 株式会社ニコン | 液浸型露光装置 |
| EP1293832A1 (en) * | 1998-06-08 | 2003-03-19 | Nikon Corporation | Projection exposure apparatus and method |
| KR20000034967A (ko) * | 1998-11-30 | 2000-06-26 | 헨켈 카르스텐 | 수정-렌즈를 갖는 오브젝티브 및 투사 조명 장치 |
| EP1035445B1 (de) * | 1999-02-15 | 2007-01-31 | Carl Zeiss SMT AG | Mikrolithographie-Reduktionsobjektiveinrichtung sowie Projektionsbelichtungsanlage |
| JP2003535356A (ja) * | 1999-12-29 | 2003-11-25 | カール・ツアイス・スティフツング・トレーディング・アズ・カール・ツアイス | 非球面レンズ表面が隣接して配置されている投影対物レンズ |
| TW538256B (en) * | 2000-01-14 | 2003-06-21 | Zeiss Stiftung | Microlithographic reduction projection catadioptric objective |
| JP2001228401A (ja) * | 2000-02-16 | 2001-08-24 | Canon Inc | 投影光学系、および該投影光学系による投影露光装置、デバイス製造方法 |
| KR20010113527A (ko) | 2000-06-19 | 2001-12-28 | 시마무라 테루오 | 투영 광학계, 그 제조 방법 및 투영 노광 장치 |
| JP4245286B2 (ja) * | 2000-10-23 | 2009-03-25 | 株式会社ニコン | 反射屈折光学系および該光学系を備えた露光装置 |
| JP2004514943A (ja) * | 2000-11-28 | 2004-05-20 | カール・ツアイス・エスエムテイ・アーゲー | 157nmリソグラフィ用の反射屈折投影系 |
| US7333245B2 (en) * | 2001-07-16 | 2008-02-19 | Hewlett-Packard Development Company, L.P. | System and method for printing retained print jobs |
| JP2003114387A (ja) | 2001-10-04 | 2003-04-18 | Nikon Corp | 反射屈折光学系および該光学系を備える投影露光装置 |
| US20040075894A1 (en) * | 2001-12-10 | 2004-04-22 | Shafer David R. | Catadioptric reduction objective |
| EP2722703A3 (en) | 2003-05-06 | 2014-07-23 | Nikon Corporation | Projection optical system, and exposure apparatus and exposure method |
-
2003
- 2003-08-12 US US10/639,780 patent/US7085075B2/en not_active Expired - Fee Related
-
2004
- 2004-07-14 TW TW093121047A patent/TW200508818A/zh unknown
- 2004-07-16 WO PCT/EP2004/007910 patent/WO2005015283A1/en not_active Ceased
- 2004-07-16 JP JP2006522918A patent/JP5036311B2/ja not_active Expired - Fee Related
- 2004-07-16 EP EP04741072A patent/EP1654577A1/en not_active Withdrawn
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2006
- 2006-02-16 US US11/356,525 patent/US7190530B2/en not_active Expired - Lifetime
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| US20050036213A1 (en) | 2005-02-17 |
| JP2007502019A (ja) | 2007-02-01 |
| WO2005015283A1 (en) | 2005-02-17 |
| EP1654577A1 (en) | 2006-05-10 |
| US20060171040A1 (en) | 2006-08-03 |
| US7190530B2 (en) | 2007-03-13 |
| TW200508818A (en) | 2005-03-01 |
| US7085075B2 (en) | 2006-08-01 |
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